IEEE 1407-2007 en Guide for Accelerated Aging Tests for Medium-Voltage (5 kV C35 kV) Extruded Electric Power Cables Using Water-Filled Tanks《用充水罐的中压(5kV~35kV)挤制.pdf
《IEEE 1407-2007 en Guide for Accelerated Aging Tests for Medium-Voltage (5 kV C35 kV) Extruded Electric Power Cables Using Water-Filled Tanks《用充水罐的中压(5kV~35kV)挤制.pdf》由会员分享,可在线阅读,更多相关《IEEE 1407-2007 en Guide for Accelerated Aging Tests for Medium-Voltage (5 kV C35 kV) Extruded Electric Power Cables Using Water-Filled Tanks《用充水罐的中压(5kV~35kV)挤制.pdf(54页珍藏版)》请在麦多课文档分享上搜索。
1、IEEE Std 1407-2007(Revision of IEEE Std 1407-1998)IEEE Guide for Accelerated AgingTests for Medium-Voltage (5 kV35 kV)Extruded Electric Power Cables UsingWater-Filled TanksIEEE3 Park Avenue New York, NY 10016-5997, USA15 February 2008IEEE Power Engineering SocietySponsored by theInsulated Conductors
2、 Committee 1407TMIEEE Std 1407-2007(Revision ofIEEE Std 1407-1998)IEEE Guide for Accelerated Aging Tests for Medium-Voltage (5 kV35 kV) Extruded Electric Power Cables Using Water-Filled TanksSponsor Insulated Conductors Committeeof theIEEE Power Engineering SocietyApproved 6 December 2007IEEE SA-Sta
3、ndards BoardThe Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997, USACopyright 2008 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 15 February 2008. Printed in the United States of America.IEEE is a registered
4、 trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions ofany individual standard for educational classroom use can also be obtained through the Copyright ClearanceCenter.iv Copyright 2008 IEEE. All rights reserved.IntroductionThis guide addresses accelerated aging tests of e
5、xtruded medium-voltage cables using water-filled tanks.Information is provided on the equipment, cable samples, test conditions, and measurements to perform theaccelerated aging tests. The guide identifies the critical test parameters and describes techniques for theirmeasurement and control. The im
6、plementation of the techniques will allow test data obtained by differentlaboratories at different times to be better compared. Specific test values (e.g., voltage) are given in thisguide, and the range in test values (e.g., maximum temperature) are more limited than stated in the previousversion of
7、 this guide.Notice to usersLaws and regulationsUsers of these documents should consult all applicable laws and regulations. Compliance with theprovisions of this guide does not imply compliance to any applicable regulatory requirements. Implementersof the guide are responsible for observing or refer
8、ring to the applicable regulatory requirements. IEEE doesnot, by the publication of its standards, intend to urge action that is not in compliance with applicable laws,and these documents may not be construed as doing so. CopyrightsThis document is copyrighted by the IEEE. It is made available for a
9、 wide variety of both public and privateuses. These include both use, by reference, in laws and regulations, and use in private self-regulation,standardization, and the promotion of engineering practices and methods. By making this documentavailable for use and adoption by public authorities and pri
10、vate users, the IEEE does not waive any rights incopyright to this document.Updating of IEEE documentsUsers of IEEE standards should be aware that these documents may be superseded at any time by theissuance of new editions or may be amended from time to time through the issuance of amendments,corri
11、genda, or errata. An official IEEE document at any point in time consists of the current edition of thedocument together with any amendments, corrigenda, or errata then in effect. In order to determine whethera given document is the current edition and whether it has been amended through the issuanc
12、e ofamendments, corrigenda, or errata, visit the IEEE Standards Association Web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously.For more information about the IEEE Standards Association or the IEEE standards development process,visit the IEEE
13、-SA Web site at http:/standards.ieee.org.ErrataErrata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL forerrata periodically.This introduction is not part of IEEE S
14、td 1407-2007, IEEE Guide for Accelerated Aging Tests for Medium-Voltage(5 kV35 kV) Extruded Electric Power Cables Using Water-Filled Tanks.Copyright 2008 IEEE. All rights reserved. vInterpretationsCurrent interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/int
15、erp/index.html.PatentsAttention is called to the possibility that implementation of this guide may require use of subject mattercovered by patent rights. By publication of this guide, no position is taken with respect to the existence orvalidity of any patent rights in connection therewith. The IEEE
16、 is not responsible for identifying EssentialPatent Claims for which a license may be required, for conducting inquiries into the legal validity or scopeof Patents Claims or determining whether any licensing terms or conditions provided in connection withsubmission of a Letter of Assurance, if any,
17、or in any licensing agreements are reasonable or non-discriminatory. Users of this guide are expressly advised that determination of the validity of any patentrights, and the risk of infringement of such rights, is entirely their own responsibility. Further informationmay be obtained from the IEEE S
18、tandards Association.ParticipantsThe work of preparing this guide was carried out by Task Force A13W of Subcommittee A (CableConstruction and Design) of the Insulated Conductors Committee of the IEEE Power Engineering Society. At the time this guide was submitted to the IEEE-SA Standards Board for a
19、pproval, the Task Force had thefollowing members:John R. Densley,ChairMark D. Walton, Vice ChairThe following members of the individual balloting committee voted on this guide. Balloters may have votedfor approval, disapproval, or abstention. Bruce S. BernsteinJan-Ove BostromRay O. Bristol Laurence
20、H. Gross Richard A. HartleinJohn L. Hinkle Stanley R. Howell Carlos KatzFrank KrajickFrank Kutchta Carl C. Landinger Eric P. MarsdenWilliam M. McDermid Harry E. Orton Serge PlissouTimothy J. Person Haridoss Sarma John T. Smith III Steve Szaniszlo William S. Temple Dennis WedamStan Arnot Michael P. B
21、aldwin William G. Bloethe A. James Braun Kent W. BrownNissan M. BursteinWilliam A. Byrd Tommy P. Cooper John R. Densley Donald G. Dunn Gary Engmann Rabiz N. FodaMarcel Fortin Steven N. Graham Randall C. Groves Richard Harp Jeffrey L. Hartenberger Wolfgang B. Haverkamp Gary A. Heuston Lauri J. Hiival
22、a David A. Horvath Gael Kennedy Jim Kulchisky Chung-Yiu Lam Benjamin T. Lanz Eric P. Marsden William M. McDermid John E. MerandoGary L. Michel Jerry R. Murphy Michael S. Newman Serge Plissou Iulian E. Profir Bartien Sayogo Michael J. Smalley Jerry W. Smith John A. Vergis Martin J. Von Herrmann Mark
23、D. Walton William D. Wilkens Timmy S. WrightAhmed F. Zobaa vi Copyright 2008 IEEE. All rights reserved.When the IEEE-SA Standards Board approved this guide on 6 December 2007, it had the followingmembership:Steve M. Mills,ChairRobert M. Grow, Vice ChairDon Wright,Past ChairJudith Gorman,Secretary*Me
24、mber EmeritusAlso included are the following nonvoting IEEE-SA Standards Board liaisons:Satish K. Aggarwal, NRC RepresentativeAlan H. Cookson, NIST RepresentativeDon MessinaIEEE Standards Program Manager, Document DevelopmentMatthew J. CegliaIEEE Standards Program Manager, Technical Program Developm
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