IEEE 1232 3-2014 en Guide for the Use of Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE)《所有测试环境下的人工智能交换与服务联络(AI-ESTATE)的使用.pdf
《IEEE 1232 3-2014 en Guide for the Use of Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE)《所有测试环境下的人工智能交换与服务联络(AI-ESTATE)的使用.pdf》由会员分享,可在线阅读,更多相关《IEEE 1232 3-2014 en Guide for the Use of Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE)《所有测试环境下的人工智能交换与服务联络(AI-ESTATE)的使用.pdf(102页珍藏版)》请在麦多课文档分享上搜索。
1、 IEEE Guide for the Use of Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE) Sponsored by the IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Standards Coordinating Committee
2、 20 IEEE Std 1232.3-2014 IEEE Std 1232.3-2014 IEEE Guide for the Use of Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE) Sponsored by the IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems Approved 20 August 2014 IEEE-SA Standar
3、ds Board Abstract: Guidance to developers of IEEE Std 1232-conformant applications is provided in this guide. A simple doorbell is used as an example system under test to illustrate how the static model constructs of Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTAT
4、E) are used to form a diagnostic reasoner knowledge base. Each of AI-ESTATEs knowledge base types is discussed in conceptual terms, and how those concepts are represented in exchange files is shown. Also, some of the nuanced aspects of diagnostic knowledge bases in AI-ESTATE are clarified. An exampl
5、e reasoner session is provided to illustrate the use of AI-ESTATE services. Keywords: AI-ESTATE, Bayesian Network, diagnosis, diagnostic inference, diagnostic model, diagnostic services, D-matrix, fault tree, IEEE 1232.3, knowledge exchange, reasoner, system test The Institute of Electrical and Elec
6、tronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2014 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 10 October 2014. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent fitness for a p
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