ANSI IEEE C57 142-2010 Guide to Describe the Occurrence and Mitigation of Switching Transients Induced by Transformers Switching Device and System Interaction《由.pdf

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1、 IEEE Guide to Describe the Occurrence and Mitigation of Switching Transients Induced by Transformers, Switching Device, and System Interaction Sponsored by the Transformers and Switchgear Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA 27 April 2011IEEE Power +1 978 750 8400. Permission to

2、 photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Copyright 2011 IEEE. All rights reserved. ivIntroduction This introduction is not part of IEEE Std C57.142-2010, IEEE Guide to Describe the Occurrence and Mitigat

3、ion of Switching Transients Induced by Transformers, Switching Device, and System Interaction. Recent attention has focused on the transient voltage interaction of a switching device, system characteristics, and transformer due to a number of transformer internal winding failure reports. The conditi

4、ons causing the event are of considerable practical interest because the transformers that failed had passed all standard induced, high potential, and impulse voltage tests required in transformer standards. Additionally, these transformers were further protected with surge arresters. It has been un

5、derstood for some time that switching events can generate transient voltages on the terminals of the transformer. These transients voltages can be damped, oscillatory, triangular, or exponential, and can occur as a combination of these forms. Generally, these transient voltages are below the maximum

6、 arrester protective levels. Because of this, it was felt that these wave forms could not produce any damage to the insulation structure of the transformer. However, even with a much lower magnitude, these oscillatory switching voltages have the potential to produce very large internal voltages if t

7、he oscillatory frequency is near one of the winding natural frequencies. This situation can take place at any voltage but primarily occurs at 38 kV and below. These facts were brought to the attention of the industry in a paper by Musil, et al., B26.aThe authors suggest that the internal transformer

8、 insulation may well be overstressed when an oscillatory voltage is applied at the winding terminal, even if the voltage magnitude is below the surge arresters protective level or transformer terminal insulation level. This situation was studied by the IEEE PES Switchgear Committee, and resulted in

9、changes incorporated in 5.17.1 of IEEE Std C37.010-1999, where readers were advised of the issue. The IEEE PES Transformers Committee began studying this situation in 1996, and formed a Working Group on Switching Transients Induced by Transformer/Switching Device Interaction in 1997, and started wor

10、k on a guide under an original project authorization request (PAR) approved by the IEEE-SA Standards Board in 2000. This project expired in 2006, and a replacement project authorization (PAR) was approved by the IEEE-SA Standards Board in 2007 under joint sponsorship by the Transformer Committee and

11、 the Switchgear Committee. This Guide is the product of the work of this jointly sponsored Working Group. Notice to users Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any

12、 applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may no

13、t be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineeri

14、ng practices and methods. By making this document available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. aInformation on in brackets can be found in Annex D. Copyright 2011 IEEE. All rights reserved. vUpdating of IEEE

15、 documents Users of IEEE standards should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current

16、edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE Standards Association web site a

17、t http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit the IEEE-SA web site at http:/standards.ieee.org. Errata Errata, if any, for this and all ot

18、her standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/int

19、erp/ index.html. Patents Attention is called to the possibility that implementation of this guide may require use of subject matter covered by patent rights. By publication of this guide, no position is taken with respect to the existence or validity of any patent rights in connection therewith. A p

20、atent holder or patent applicant has filed a statement of assurance that it will grant licenses under these rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licens

21、es. Other Essential Patent Claims may exist for which a statement of assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims or determining wh

22、ether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this guide are expressly advised that determination of the validity of any patent rights, and the risk of inf

23、ringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Copyright 2011 IEEE. All rights reserved. viParticipants At the time this IEEE guide was completed, the Working Group of the Performance Characteristics Subcommitt

24、ee of the IEEE Transformers Committee and the Working Group of the IEEE Switchgear Committee had the following membership: Robert Degeneff, Chair Bill Griesacker, Vice Chair Transformers Committee David Aho Raj Ahuja Dennis Allan Raymond Allusitiarti Stephen Antosz Jim Antweiller Javier Arteaga Robe

25、rto Asano, Jr Peter Balma Enrique Betancourt Gene Blackburn Carl Bush Alvaro Cancino Bill Chiu Mark Christini Donald Chu Larry Coffeen Craig Colopy Jerry Corkran Dom Corsi John Crouse Joseph Cultrera Eric Davis Bob Del Vecchio Dieter Dohnal Richard Dudley Derek Foster Jim Fyvie Bob Ganser Eduardo Ga

26、rcia Harry Gianakouros Ramsis Girgis Rosselli Girolamo Markku Hakanen Ernst Hanique Roger Hayes Peter Gomez-Heinzig Thang Hochanh Philip Hopkinson Anthony Jonnatti Lars-Erik Juhlin Iaszlo Kadac Dave Keithly Gael Kennedy Sheldon Kennedy Alexander Kline Bernhard Kurth Mike Lau Boyd Leuenberger Tamyres

27、 Machapo Jim McBride Nigel McQuin Sam Mehta Authut Molden Van Nhi Nguyen Samuel Oriti Klaus Papp Bipin Patel Dhiru Patel Dan Perco Paul Pillitteri Christoph Ploetner Gustav Preininger Bertrand Poulin Jeewan Puri Dilip Purohit Jeff Ray George Ritter Randu Rensi Volker Ricter Pierre Riffon John Rosset

28、ti Hemchan Shertukde Ibrahim Shteyh Jin Sim Manuel Silveste Len Stensland Robert Tillman Shubhash Tuli Bob Tillman Robert Veitch Loren Wagenaar Albert Walls Dave Weigand Chris Wickersham Peter Zhao Walkermar Ziomek Switchgear Committee W. J. Bill Bergman Marcel Fortin Steve R. Lambert Ted Olsen H. M

29、elvin Smith R. Kirkland Smith Thomas J. Tobin Copyright 2011 IEEE. All rights reserved. viiThe following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. William J. Ackerman S. Aggarwal Samuel Aguirre Roy Alexander

30、Jim Antweiler Mauricio Aristizabal Donald Ayers Peter Balma William Bartley G Bartok W. J. Bill Bergman Steven Bezner Wallace Binder Thomas Bishop Thomas Blackburn William Bloethe Anne Bosma Dieter Braun Jeffrey Britton Steven Brown Ted Burse Carl Bush Bill Chiu Craig Colopy Michael Comber Tommy Coo

31、per Jerry Corkran Luis Coronado John Crouse Alan Darwin Robert Degeneff Dieter Dohnal Gary Donner Richard Dudley Denis Dufournet Kenneth Edwards Gary Engmann C. Erven James Fairris Donald Fallon Joseph Foldi Paul Forquer Bruce Forsyth Marcel Fortin Derek Foster George Gela Eduardo Gomez-Hennig Willi

32、am Griesacker Randall Groves David Harris Roger Hayes Peter Heinzig Steven Hensley Gary Heuston Scott Hietpas Gary Hoffman Philip Hopkinson Ronald W. Hotchkiss James Houston James Huddleston, III Clark Jacobson Charles Johnson Gerald Johnson Andrew Jones Lars-Erik Juhlin Gael Kennedy Sheldon Kennedy

33、 Yuri Khersonsky Chad Kiger Joseph L. Koepfinger Jim Kulchisky Saumen Kundu John Lackey Chung-Yiu Lam Stephen Lambert John Leach Hua Liu Albert Livshitz R. Long Federico Lopez William Lowe Thomas Lundquist Greg Luri Keith Malmedal Richard Marek J. Dennis Marlow John W. Matthews Lee Matthews Omar Maz

34、zoni Susan Mcnelly Jeffrey Merryman Georges Montillet Daniel Mulkey Jerry Murphy Arthur Neubauer Joe Nims Ted Olsen Donald Parker Bansi Patel Shawn Patterson David Peelo Brian Penny Paul Pillitteri Alvaro Portillo Bertrand Poulin Paulette Payne Powell Gustav Preininger Iulian Profir John Randolph Ti

35、mothy Charles Raymond Jean-Christophe Riboud Johannes Rickmann Pierre Riffon Michael Roberts Charles Rogers Marnie Roussell Thomas Rozek Dinesh Sankarakurup Steven Sano Roderick Sauls Bartien Sayogo Devki Sharma Gil Shultz Hyeong Sim H. Smith James Smith Jerry Smith R. Kirkland Smith Steve Snyder Jo

36、hn Sullivan S. Thamilarasan T. Tobin John Vergis Jane Verner Waldemar Von Miller Keith Wallace Reigh Walling Barry Ward James Wilson Larry Yonce Richard York Janusz Zawadzki Waldemar Ziomek Copyright 2011 IEEE. All rights reserved. viiiWhen the IEEE-SA Standards Board approved this guide on 9 Decemb

37、er 2010, it had the following membership: Robert M. Grow, Chair Richard H. Hulett, Vice Chair Steve M. Mills, Past Chair Judith Gorman, Secretary Karen Bartleson Victor Berman Ted Burse Clint Chaplin Andy Drozd Alexander Gelman Jim Hughes Young Kyun Kim Joseph L. Koepfinger* John Kulick David J. Law

38、 Hung Ling Oleg Logvinov Ted Olsen Ronald C. Petersen Thomas Prevost Jon Walter Rosdahl Sam Sciacca Mike Seavey Curtis Siller Don Wright *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish Aggarwal, NRC Representative Richard DeBlasio, DOE Representati

39、ve Michael Janezic, NIST Representative Michelle Turner IEEE Standards Program Manager, Document Development Matthew Ceglia IEEE Standards Program Manager, Technical Program Development Copyright 2011 IEEE. All rights reserved. ixContents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 2 2. Definitions 2 3.

40、 System configurations of concern 3 3.1 Supply characteristics 4 3.2 Circuit components between switching device and transformer 4 3.3 Load characteristics . 5 4. Transformer characteristics 5 4.1 Impedance versus frequency characteristics 6 4.2 Internal voltage developed near resonance 8 4.3 Insula

41、tion integrity under high frequency voltage stress . 11 4.4 Methods to obtain required performance characteristics . 14 5. Switching device characteristics. 14 5.1 Current chopping . 16 5.2 Reignitions. 18 6. System and transformer switching response. 20 6.1 Closing to energize the circuit . 20 6.2

42、Interruption with single reignition . 23 6.3 Interruption with single reignition . 24 6.4 Interruption with repetitive reignition 25 6.5 Transformer internal voltage response. 26 7. Mitigation methods. 27 7.1 Resistor-capacitor snubber. 27 7.2 Other mitigation methods 29 Annex A (informative) Exampl

43、es. 31 Annex B (informative) Natural frequencies analytic methods to compute impedance versus frequency characteristics of transformers. 40 Annex C (informative) Statistical methods applied to switch studies 42 Annex D (informative) Bibliography . 44 Copyright 2011 IEEE. All rights reserved. 1IEEE G

44、uide to Describe the Occurrence and Mitigation of Switching Transients Induced by Transformers, Switching Device, and System Interaction IMPORTANT NOTICE: This standard is not intended to ensure safety, security, health, or environmental protection. Implementers of the standard are responsible for d

45、etermining appropriate safety, security, environmental, and health practices or regulatory requirements. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found

46、 under the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. 1. Overview 1.1 Scope This guide addresses the application of transformers in the presenc

47、e of oscillatory switching transients. These oscillatory transients are typically produced by the interaction of the switching device, transformer, load, and system. This guide defines operating conditions that may produce switching voltages damaging to the transformer insulation system. It discusse

48、s the electrical characteristics of the system source, switching device, transformer, and load and the nature of their transient interaction. It outlines several mitigation methods. Two examples are included. This guide recognizes that many devices and/or system operations can produce oscillatory tr

49、ansient waveforms. The focus of this guide is on the interaction between a transformer, the system, and a switching device as a result of several reports of transformer internal winding failures. This guide focuses only on mechanical switching devices and does not cover semiconductor switching devices. Transformers that are inductively loaded (reactors, or stalled or accelerating motors) are not covered by this document but are addressed by several other referenced publications. IEEE Std C57.142-2010 IEEE Guide for to Describe the Occurrence and Mitigation of Switching