IEC 61967-4 CORR 1-2017 Integrated circuits - Measurement of electromagnetic emissions 150 kHz to 1 GHz - Part 4 Measurement of conducted emissions 1 150 direct.pdf

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1、IEC 61967-4:2002/COR1:2017 1 IEC 2017 INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION LECTROTECHNIQUE INTERNATIONALE _ IEC 61967-4 Edition 1.0 2002-04 Integrated circuits Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 4: Measurement of conducted emissions 1 /150 direct coupling

2、 method IEC 61967-4 dition 1.0 2002-04 Circuits intgrs Mesure des missions lectromagntiques, 150 kHz 1 GHz Partie 4: Mesure des missions conduites Mthode par couplage direct 1 /150 CORRIGENDUM 1 Corrections to the French version appear after the English text. Les corrections la version franaise sont

3、 donnes aprs le texte anglais. 7.1 General test configuration Replace the existing Figure 5 by the following new Figure 5: Figure 5 General test configuration IEC Measuring equipment C5 C1 Gnd V supply120 R3 C4 6,8 nF 51 Z L= 150 I/O Q C3 C2 R1* IC Gnd Gnd 0 V +5 V * pull up / pull down may be requi

4、red depending on application Impedance matching network Power supply V RFZ L= 50 R2 51 RF current probe IC IEC 61967-4:2002-04/COR1:2017-06 (en-fr) 2 IEC 1967-4:2002/COR1:2017 IEC 2017 7.1 Configuration gnrale dessai Remplacer la Figure 5 existante par la nouvelle Figure 5 suivante: Figure 5 Configu

5、ration gnrale dessai IEC C5 C1 120 R3 C4 6,8 nF 51 Z L= 150 I/O Q C3 C2 R1* Masse CI 0 V +5 V V RFZ L= 50 R2 51 IC Appareillage de mesure Masse V alimentationMasse * Une rsistance de polarisation lalimentation/ la masse peut tre requise en fonction de lapplication Rseau dadaptation dimpdance Alimentation Sonde courant RF