IEC 61967-2-2005 Integrated circuits - Measurement of electromagnetic emissions 150 kHz to 1 GHz - Part 2 Measurement of radiated emissions - TEM cell and wideb.pdf

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1、 NORME INTERNATIONALECEIIECINTERNATIONAL STANDARD 61967-2Premire ditionFirst edition2005-09Circuits intgrs Mesure des missions lectromagntiques, 150 kHz 1 GHz Partie 2: Mesure des missions rayonnes Mthode de cellule TEM et cellule TEM large bande Integrated circuits Measurement of electromagnetic em

2、issions, 150 kHz to 1 GHz Part 2: Measurement of radiated emissions TEM cell and wideband TEM cell method Numro de rfrence Reference number CEI/IEC 61967-2:2005 Numrotation des publications Depuis le 1er janvier 1997, les publications de la CEI sont numrotes partir de 60000. Ainsi, la CEI 34-1 devie

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15、e, please contact the Customer Service Centre: Email: custserviec.ch Tel: +41 22 919 02 11 Fax: +41 22 919 03 00 . NORME INTERNATIONALECEIIECINTERNATIONAL STANDARD 61967-2Premire ditionFirst edition2005-09Circuits intgrs Mesure des missions lectromagntiques, 150 kHz 1 GHz Partie 2: Mesure des missio

16、ns rayonnes Mthode de cellule TEM et cellule TEM large bande Integrated circuits Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 2: Measurement of radiated emissions TEM cell and wideband TEM cell method Pour prix, voir catalogue en vigueur For price, see current catalogue IEC 2005 D

17、roits de reproduction rservs Copyright - all rights reserved Aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de lditeur. No part of this publi

18、cation may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from the publisher. International Electrotechnical Commission, 3, rue de Varemb, PO Box 131, CH-1211 Geneva 20, SwitzerlandTelephone: +41 22

19、 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmailiec.ch Web: www.iec.ch CODE PRIX PRICE CODE S Commission Electrotechnique InternationaleInternational Electrotechnical Commission 2 61967-2 CEI:2005 SOMMAIRE AVANT-PROPOS6 1 Domaine dapplication 10 2 Rfrences normatives.10 3 Termes et dfinitions 12

20、4 Gnralits.12 5 Conditions dessai 12 5.1 Gnralits12 5.2 Tension dalimentation.12 5.3 Gamme de frquences 12 6 Equipement dessai 12 6.1 Gnralits12 6.2 Blindage12 6.3 Appareil de mesure RF12 6.4 Pramplificateur 14 6.5 Cellule TEM 14 6.6 Cellule TEM/GTEM large bande .14 6.7 Terminaison de 50 .14 6.8 Gai

21、n du systme .14 7 Montage dessai .14 7.1 Gnralits14 7.2 Configuration dessai.14 7.3 PCB dessai 16 8 Procdure dessai.22 8.1 Gnralits22 8.2 Conditions ambiantes 22 8.3 Vrification oprationnelle du DEE 22 8.4 Mesure des missions du DEE 22 9 Rapport dessai 24 9.1 Gnralits24 9.2 Conditions de mesure24 10

22、 Niveaux de rfrence des missions du CI .24 Annexe A (informative) Exemple de formulaire de vrification de ltalonnage et du montage .26 Annexe B (informative) Descriptions de la cellule TEM et de la cellule TEM large bande .28 B.1 Cellule TEM.28 B.2 Cellule TEM large bande.28 Annexe C (informative) C

23、alcul du moment de diple partir des donnes mesures 30 C.1 Gnralits 30 C.2 Calcul du moment de diple.30 61967-2 IEC:2005 3 CONTENTS FOREWORD.7 1 Scope.11 2 Normative references .11 3 Terms and definitions .13 4 General 13 5 Test conditions .13 5.1 General .13 5.2 Supply voltage.13 5.3 Frequency range

24、 .13 6 Test equipment.13 6.1 General .13 6.2 Shielding .13 6.3 RF measuring instrument 13 6.4 Preamplifier.15 6.5 TEM cell15 6.6 Wideband TEM/GTEM cell.15 6.7 50-Ohm termination.15 6.8 System gain 15 7 Test set-up .15 7.1 General .15 7.2 Test configuration15 7.3 Test PCB.17 8 Test procedure .23 8.1

25、General .23 8.2 Ambient measurement.23 8.3 DUT operational check 23 8.4 DUT emissions measurement23 9 Test report25 9.1 General .25 9.2 Measurement conditions25 10 IC emissions reference levels.25 Annex A (informative) Example calibration la CEI ne peut pas tre tenue responsable de lventuelle mauvai

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32、i de tels droits de proprit et de ne pas avoir signal leur existence. La Norme internationale CEI 61967-2 a t tablie par le sous-comit 47A: Circuits intgrs, du comit dtudes 47 de la CEI: Dispositifs semiconducteurs. Le texte de cette norme est issu des documents suivants: FDIS Rapport de vote 47A/72

33、2/FDIS 47A/729/RVDLe rapport de vote indiqu dans le tableau ci-dessus donne toute information sur le vote ayant abouti lapprobation de cette norme. 61967-2 IEC:2005 7 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ INTEGRATED CIRCUITS MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 kHz TO 1 GHz Part 2: Me

34、asurement of radiated emissions TEM cell and wideband TEM cell method FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote interna

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44、EC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61967-2 has been prepared by subcommittee 47A: Integrated circuits, of IEC technical committee 47: Semiconductor devices. The text of this s

45、tandard is based on the following documents: FDIS Report on voting 47A/722/FDIS 47A/729/RVDFull information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. 8 61967-2 CEI:2005 Cette publication a t rdige selon les Directives ISO/CEI,

46、Partie 2. La prsente partie de la CEI 61967 doit tre lue conjointement la CEI 61967-1. La CEI 61967 comprend les parties suivantes, regroupes sous le titre gnral Circuits intgrs Mesure des missions lectromagntiques, 150 kHz 1 GHz: Partie 1: Conditions gnrales et dfinitions Partie 2: Mesure des missi

47、ons rayonnes Mthode de cellule TEM et cellule TEM large bande Partie 3: Mesure des missions rayonnes Mthode de scrutation surfacique Partie 4: Mesure des missions conduites Mthode par couplage direct 1 /150 Partie 5: Mesure des missions conduites Mthode de la cage de Faraday sur banc de travail Part

48、ie 6: Mesure des missions conduites Mthode de la sonde magntique Le comit a dcid que le contenu de cette publication ne sera pas modifi avant la date de maintenance indique sur le site web de la CEI sous http:/webstore.iec.ch dans les donnes relatives la publication recherche. A cette date, la publication sera reconduite; supprime; remplace par une dition rvise, ou amende. 61967-2 IEC:2005 9 This publication has been drafted in accordance with