IEC TS 61189-3-301-2016 Test methods for electrical materials printed boards and other interconnection structures and assemblies - Part 3-301 Test methods for interconnection struc.pdf

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1、 IEC TS 61189-3-301 Edition 1.0 2016-07 TECHNICAL SPECIFICATION Test methods for electrical materials, printed boards and other interconnection structures and assemblies Part 3-301: Test methods for interconnection structures (printed boards) Appearance inspection method for plated surfaces on PWB I

2、EC TS 61189-3-301:2016-07(en) colour inside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2016 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including phot

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8、date on all new IEC publications. Just Published details all new publications released. Available online and also once a month by email. Electropedia - www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing 20 000 terms and definitions in English and

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11、 IEC TS 61189-3-301 Edition 1.0 2016-07 TECHNICAL SPECIFICATION Test methods for electrical materials, printed boards and other interconnection structures and assemblies Part 3-301: Test methods for interconnection structures (printed boards) Appearance inspection method for plated surfaces on PWB I

12、NTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 31.180 ISBN 978-2-8322-3550-8 Registered trademark of the International Electrotechnical Commission Warning! Make sure that you obtained this publication from an authorized distributor. colour inside 2 IEC TS 61189-3-301:2016 IEC 2016 CONTENTS FOREWORD .

13、3 1 Scope 5 2 Normative references. 5 3 Terms and definitions 5 4 Test specimens . 5 5 Equipment / apparatus . 5 5.1 Evaluation of lustre non-uniformity . 5 5.2 Evaluation of colour non-uniformity 6 6 Procedure . 6 6.1 Outline of the method 6 6.2 Specimen preparation . 6 6.3 Imaging of surface rough

14、ness/chromaticity distribution . 6 6.4 Binarization of images . 6 6.5 Extraction of feature quantities 7 6.6 Derivation of discriminant function . 7 6.7 System registration . 7 7 Report . 8 8 Additional information 8 Annex A (informative) Example of equipment and tested result for lustre non- unifor

15、mity . 9 A.1 Equipment for lustre non-uniformity inspection . 9 A.2 Tested result . 9 A.2.1 Surface roughness image . 9 A.2.2 Binarized image and feature extraction . 11 A.2.3 Frequency analysis of feature quantities . 12 A.2.4 Final estimate 12 Annex B (informative) Example of tested result for col

16、our non-uniformity inspection 13 B.1 Image analysis of colour non-uniformity . 13 B.2 Feature extraction and discriminant analysis 14 Bibliography . 16 Figure 1 Flow chart of the test procedure 6 Figure A.1 Equipment prototype . 9 Figure A.2 Images of gold-plating of non-defective and defective prod

17、ucts 10 Figure A.3 Images of S- and P-polarized components, and for gold- plating with lustre non-uniformity . 11 Figure A.4 Image examples of gold-plating with lustre non-uniformity 11 Figure A.5 Example of frequency analysis of feature quantity 12 Figure A.6 Example of the final estimate of the qu

18、ality of gold-plating . 12 Figure B.1 Images of gold-plating pads . 13 Figure B.2 Images of colour distribution 14 Figure B.3 Frequency analysis example of a feature quantity 14 Figure B.4 Example of the discriminant analysis result 15 IEC TS 61189-3-301:2016 IEC 2016 3 INTERNATIONAL ELECTROTECHNICA

19、L COMMISSION _ TEST METHODS FOR ELECTRICAL MATERIALS, PRINTED BOARDS AND OTHER INTERCONNECTION STRUCTURES AND ASSEMBLIES Part 3-301: Test methods for interconnection structures (printed boards) Appearance inspection method for plated surfaces on PWB FOREWORD 1) The International Electrotechnical Com

20、mission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and

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29、tion or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publica

30、tion may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. The main task of IEC technical committees is to prepare International Standards. In exceptional circumstances, a technical committee may propose the publication of a technical s

31、pecification when the required support cannot be obtained for the publication of an International Standard, despite repeated efforts, or the subject is still under technical development or where, for any other reason, there is the future but no immediate possibility of an agreement on an Internation

32、al Standard. Technical specifications are subject to review within three years of publication to decide whether they can be transformed into International Standards. IEC TS 61189-3-301, which is a technical specification, has been prepared by IEC technical committee 91: Electronics assembly technolo

33、gy. 4 IEC TS 61189-3-301:2016 IEC 2016 The text of this technical specification is based on the following documents: Enquiry draft Report on voting 91/1348/DTS 91/1376/RVC Full information on the voting for the approval of this technical specification can be found in the report on voting indicated i

34、n the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts in the IEC 61189 series, published under the general title Test methods for electrical materials, printed boards and other interconnection structures and assemblies, can be fou

35、nd on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC website under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be transformed into an

36、International standard, reconfirmed, withdrawn, replaced by a revised edition, or amended. A bilingual version of this publication may be issued at a later date. IMPORTANT The colour inside logo on the cover page of this publication indicates that it contains colours which are considered to be usefu

37、l for the correct understanding of its contents. Users should therefore print this document using a colour printer. IEC TS 61189-3-301:2016 IEC 2016 5 TEST METHODS FOR ELECTRICAL MATERIALS, PRINTED BOARDS AND OTHER INTERCONNECTION STRUCTURES AND ASSEMBLIES Part 3-301: Test methods for interconnectio

38、n structures (printed boards) Appearance inspection method for plated surfaces on PWB 1 Scope This part of IEC 61189 outlines a way to determine the appearance non-uniformity of both the lustre and colour on plated metal surfaces in printed wiring boards (PWBs). The method is applicable to gold, nic

39、kel and copper plating in PWBs. 2 Normative references There are no normative references in this document. 3 Terms and definitions For the purposes of this document, the following terms and definitions apply. ISO and IEC maintain terminological databases for use in standardization at the following a

40、ddresses: IEC Electropedia: available at http:/www.electropedia.org/ ISO Online browsing platform: available at http:/www.iso.org/obp 3.1 lustre non-uniformity abnormal roughness distribution in plated surfaces leading to irregular brightness of reflected light 3.2 colour non-uniformity irregular re

41、flection spectrum Note 1 to entry: Colour non-uniformity is caused by other influences than roughness change, such as abnormal components, adhesion of foreign matter and oxidation in plated surfaces. 4 Test specimens 4.1 Specimen dimensions and forms should be in accordance with the test system. 4.2

42、 Specimens of non-defective and of defective products, of several tens to one hundred, at least of ten, are required as teacher data for each series of evaluation. 5 Equipment / apparatus 5.1 Evaluation of lustre non-uniformity For the evaluation of the lustre non-uniformity, a test system capable o

43、f measuring the surface roughness distribution should be used. As for an optical method, CCD (charge- 6 IEC TS 61189-3-301:2016 IEC 2016 coupled device), or CMOS (complementary metal oxide semiconductor) camera systems, or as for a mechanical method, stylus type tester shall be used, respectively. 5

44、.2 Evaluation of colour non-uniformity For the evaluation of the colour non-uniformity, an optical system capable of measuring the chromaticity distribution shall be used. 6 Procedure 6.1 Outline of the method The method is outlined by the flow chart in Figure 1. The numbers indicate the subclause r

45、eferences. Figure 1 Flow chart of the test procedure In this method, the procedures of the evaluation of lustre non-uniformity and colour non- uniformity are basically the same. 6.2 Specimen preparation Requirements for specimens are specified in Clause 4. 6.3 Imaging of surface roughness/chromatici

46、ty distribution Acquire the images of surface roughness for the lustre non-uniformity, and/or of chromaticity distribution for the colour non-uniformity, by the apparatus / equipment mentioned in Clause 5. 6.4 Binarization of images Obtain the binary images by the threshold processing. The region gi

47、ving values significantly deviating from the average value of the whole image concerned is counted to be 1 (white pixels) as abnormal, and the others to be 0 (black pixels) as normal. IEC 6.2 Specimen preparation 6.3 Imaging of surface roughness/ chromaticity distribution 6.4 Binarizing of images 6.

48、5 Extraction of feature quantities 6.6 Derivation of discriminant function 6.7 System registration IEC TS 61189-3-301:2016 IEC 2016 7 The threshold setting should be agreed upon between the parties. 6.5 Extraction of feature quantities Extract the feature quantities of abnormal regions from the bina

49、rized images by image analysis of the size, area, shape, and distribution, etc. of the irregularities. For example, the diagonal length of the minimum rectangles bounding the clusters of abnormal regions, and change in the number of pixels by the binary image contraction of repetition can be used as feature quantities. The type and number of feature quantities to be used should be agreed upon between the parties. 6.6 Derivation of discriminant function Discriminant a