IEC 62586-2-2017 Power quality measurement in power supply systems - Part 2 Functional tests and uncertainty requirements《供电系统中的电能质量测量 第2部分 功能试验和不确定性要求》.pdf

《IEC 62586-2-2017 Power quality measurement in power supply systems - Part 2 Functional tests and uncertainty requirements《供电系统中的电能质量测量 第2部分 功能试验和不确定性要求》.pdf》由会员分享，可在线阅读，更多相关《IEC 62586-2-2017 Power quality measurement in power supply systems - Part 2 Functional tests and uncertainty requirements《供电系统中的电能质量测量 第2部分 功能试验和不确定性要求》.pdf（146页珍藏版）》请在麦多课文档分享上搜索。

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10、ore.iec.ch/csc If you wish to give us your feedback on this publication or need further assistance, please contact the Customer Service Centre: csciec.ch. IEC 62586-2 Edition 2.0 2017-03 INTERNATIONAL STANDARD Power quality measurement in power supply systems Part 2: Functional tests and uncertainty

11、 requirements INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 17.220.20 ISBN 978-2-8322-4052-6 Registered trademark of the International Electrotechnical Commission Warning! Make sure that you obtained this publication from an authorized distributor. colour inside 2 IEC 62586-2:2017 IEC 2017 CONTENTS

12、FOREWORD . 9 INTRODUCTION . 11 1 Scope 12 2 Normative references 12 3 Terms, definitions, abbreviated terms, notations and symbols . 13 3.1 General terms and definitions . 13 3.2 Terms and definitions related to uncertainty 13 3.3 Notations 14 3.3.1 Functions . 14 3.3.2 Symbols and abbreviated terms

13、 . 14 3.3.3 Indices . 14 4 Requirements 14 4.1 Requirements for products complying with class A 14 4.2 Requirements for products complying with class S 15 5 Functional type tests common requirements 17 5.1 General philosophy for testing 17 5.1.1 System topology 17 5.1.2 Stabilization time . 17 5.1.3

14、 Measuring ranges 17 5.1.4 Single “power-system influence quantities“ 19 5.1.5 “External influence quantities“ . 21 5.1.6 Test criteria . 21 5.2 Testing procedure . 22 5.2.1 Device under test. 22 5.2.2 Testing conditions . 22 5.2.3 Testing equipment . 22 6 Functional testing procedure for instrument

15、s complying with class A according to IEC 61000-4-30 . 22 6.1 Power frequency . 22 6.1.1 General . 22 6.1.2 Measurement method 23 6.1.3 Measurement uncertainty and measuring range . 23 6.1.4 Measurement evaluation 24 6.1.5 Measurement aggregation . 24 6.2 Magnitude of supply voltage 24 6.2.1 Measure

16、ment method 24 6.2.2 Measurement uncertainty and measuring range . 24 6.2.3 Measurement evaluation 25 6.2.4 Measurement aggregation . 25 6.3 Flicker . 27 6.4 Supply voltage interruptions, dips and swells 27 6.4.1 General . 27 6.4.2 Check dips / interruptions in polyphase system 35 6.4.3 Check swells

17、 in polyphase system . 37 6.5 Supply voltage unbalance . 38 6.5.1 General . 38 IEC 62586-2:2017 IEC 2017 3 6.5.2 Measurement method, measurement uncertainty and measuring range . 39 6.5.3 Aggregation . 39 6.6 Voltage harmonics 39 6.6.1 Measurement method 39 6.6.2 Measurement uncertainty and measurin

18、g range . 40 6.6.3 Measurement evaluation 41 6.6.4 Measurement aggregation . 41 6.7 Voltage interharmonics . 43 6.7.1 Measurement method 43 6.7.2 Measurement uncertainty and measuring range . 44 6.7.3 Measurement evaluation 45 6.7.4 Measurement aggregation . 45 6.8 Mains signalling voltages on the s

19、upply voltage 47 6.8.1 Measurement method 47 6.8.2 Measurement uncertainty and measuring range . 49 6.8.3 Aggregation . 50 6.9 Measurement of underdeviation and overdeviation parameters . 50 6.9.1 Measurement method 50 6.9.2 Measurement uncertainty and measuring range . 52 6.9.3 Measurement evaluati

20、on 53 6.9.4 Measurement aggregation . 53 6.10 Flagging 56 6.11 Clock uncertainty testing . 58 6.12 Variations due to external influence quantities 58 6.12.1 General . 58 6.12.2 Influence of temperature 59 6.12.3 Influence of power supply voltage 61 6.13 Rapid voltage changes (RVC) . 62 6.13.1 RVC pa

21、rameters and evaluation 62 6.13.2 General . 62 6.13.3 “No RVC” tests 64 6.13.4 “RVC threshold and setup” test 68 6.13.5 “RVC parameters” test . 70 6.13.6 “RVC polyphase” tests . 72 6.13.7 “Voltage is in steady-state condition” tests . 74 6.14 Magnitude of current . 77 6.15 Harmonic current 77 6.16 I

22、nterharmonic currents 77 6.17 Current unbalance 77 6.17.1 General . 77 6.17.2 Measurement method, measurement uncertainty and measuring range . 78 7 Functional testing procedure for instruments complying with class S according to IEC 61000-4-30 . 78 7.1 Power frequency . 78 7.1.1 General . 78 7.1.2

23、Measurement method 79 7.1.3 Measurement uncertainty and measuring range . 79 7.1.4 Measurement evaluation 80 7.1.5 Measurement aggregation . 80 4 IEC 62586-2:2017 IEC 2017 7.2 Magnitude of the supply voltage 80 7.2.1 Measurement method 80 7.2.2 Measurement uncertainty and measuring range . 80 7.2.3

24、Measurement evaluation 81 7.2.4 Measurement aggregation . 81 7.3 Flicker . 83 7.4 Supply voltage interruptions, dips and swells 83 7.4.1 General requirements 84 7.4.2 Check dips / interruptions in polyphase system 89 7.4.3 Check swells in polyphase system . 91 7.5 Supply voltage unbalance . 92 7.5.1

25、 General . 92 7.5.2 Measurement method, measurement uncertainty and measuring range . 93 7.5.3 Aggregation . 93 7.6 Voltage harmonics 93 7.6.1 General . 93 7.6.2 Measurement method 94 7.6.3 Measurement method, measurement uncertainty and measuring range . 95 7.6.4 Measurement evaluation 96 7.6.5 Mea

26、surement aggregation . 96 7.7 Voltage interharmonics . 98 7.8 Mains signalling voltages on the supply voltage 98 7.8.1 General . 98 7.8.2 Measurement method 99 7.8.3 Measurement uncertainty and measuring range . 99 7.8.4 Aggregation . 99 7.9 Measurement of underdeviation and overdeviation parameters

27、 . 99 7.10 Flagging 99 7.11 Clock uncertainty testing . 101 7.12 Variations due to external influence quantities 102 7.12.1 General . 102 7.12.2 Influence of temperature 103 7.12.3 Influence of power supply voltage 105 7.13 Rapid voltage changes 106 7.14 Magnitude of current . 106 7.15 Harmonic curr

28、ent 106 7.16 Interharmonic currents 106 7.17 Current unbalance 106 7.17.1 General . 106 7.17.2 Measurement method, measurement uncertainty and measuring range . 107 8 Calculation of measurement uncertainty and operating uncertainty 108 Annex A (normative) Intrinsic uncertainty and operating uncertai

29、nty, . 110 A.1 General . 110 A.2 Measurement uncertainty 110 A.3 Operating uncertainty 111 Annex B (informative) Overall system uncertainty 112 Annex C (normative) Calculation of measurement and operating uncertainty for voltage magnitude and power frequency . 113 IEC 62586-2:2017 IEC 2017 5 C.1 Sel

30、ection of test points to verify operating uncertainty and uncertainty under reference conditions . 113 C.2 Class A calculation examples 113 C.2.1 General . 113 C.2.2 Parameter: magnitude of supply voltage, U din= 230 V, 50/60Hz, rated range of temperature 25 C to +55 C 113 C.2.3 Parameter: power fre

31、quency 50/60 Hz, rated range of temperature 25 C to +55 C . 114 Annex D (informative) Further test on dips (amplitude and phase angles changes) 116 D.1 Phase-to-phase or phase-to-neutral testing . 116 D.2 Test method 116 Annex E (informative) Further tests on dips (polyphase): test procedure 118 E.1

32、 General . 118 E.2 Phase voltage dips and interruptions 119 E.3 Phase swells . 119 Annex F (normative) Gapless measurements of voltage amplitude and harmonics test 121 F.1 Purpose of the test 121 F.2 Test set up 121 F.3 Voltage amplitude . 121 F.3.1 Test signal . 121 F.3.2 Result evaluation . 121 F.

33、4 Harmonics 122 F.4.1 Test signal . 122 F.4.2 Result evaluation . 122 F.5 Inter-harmonics . 123 F.5.1 Test signal . 123 F.5.2 Result evaluation . 123 Annex G (informative) Gapless measurements of voltage amplitude and harmonics. 124 Annex H (informative) Testing equipment recommendations 133 H.1 Tes

34、ting range 133 H.2 Uncertainty and stability of source and reference meter 133 H.2.1 Uncertainty of source and reference meter 133 H.2.2 Stability of the source 134 H.3 Time synchronisation 134 H.4 Power quality functions of source and reference meter . 134 H.5 Traceability . 135 Annex I (informativ

35、e) Recommendations related to a declaration of conformity (DoC) and a test report . 136 I.1 Definitions. 136 I.2 Recommendations 136 I.3 Example of IEC 62586-1 declaration of conformity 136 I.4 Example of IEC 62586-2 declaration . 138 I.4.1 General . 138 I.4.2 Recommendation for IEC 62586-2 test rep

36、ort 139 I.4.3 Recommendation for IEC 62586-2 test summary . 140 I.4.4 Recommendation for IEC 62586-2 test equipment information . 140 I.4.5 Recommendation for IEC 62586-2 tested functions 140 Bibliography 141 6 IEC 62586-2:2017 IEC 2017 Figure 1 Overview of test for dips according to test A4.1.1 . 3

37、0 Figure 2 Detail 1 of waveform for test of dips according to test A4.1.1 . 31 Figure 3 Detail 2 of waveform for tests of dips according to A4.1.1 31 Figure 4 Detail 3 of waveform for tests of dips according to test A4.1.1 32 Figure 5 Detail 1 of waveform for test of dips according to test A4.1.2 .

38、32 Figure 6 Detail 2 of waveform for tests of dips according to test A4.1.2 33 Figure 7 Detail 1 of waveform for test of swells according to test A4.1.2 33 Figure 8 Detail 2 of waveform for tests of swells according to test A4.1.2 34 Figure 9 Sliding reference voltage test . 34 Figure 10 Sliding ref

39、erence start up condition 35 Figure 11 Detail 1 of waveform for test of polyphase dips/interruptions 36 Figure 12 Detail 2 of waveform for test of polyphase dips/interruptions 36 Figure 13 Detail 3 of waveform for test of polyphase dips/interruptions 37 Figure 14 Detail 1 of waveform for test of pol

40、yphase swells . 38 Figure 15 Detail 2 of waveform for test of polyphase swells . 38 Figure 16 Flagging test for class A . 57 Figure 17 Clock uncertainty testing 58 Figure 18 Example of RVC event . 62 Figure 19 A13.1.1 waveform 65 Figure 20 A13.1.1 waveform with RVC limits and arithmetic mean . 65 Fi

41、gure 21 A13.1.2 waveform 66 Figure 22 A13.1.2 waveform with RVC limits and arithmetic means 67 Figure 23 A13.1.3 waveform 68 Figure 24 A13.1.3 waveform with RVC limits and arithmetic mean . 68 Figure 25 A13.2.1 waveform 69 Figure 26 A13.2.1 waveform with RVC limits and arithmetic mean . 70 Figure 27

42、 A13.3.1 waveform 71 Figure 28 A13.3.1 waveform with RVC limits and arithmetic mean . 72 Figure 29 A13.4.1 waveform 73 Figure 30 A13.5.1 waveform 75 Figure 31 A13.5.1 waveform with RVC limits and arithmetic mean 75 Figure 32 A13.5.2 waveform 76 Figure 33 A13.5.2 waveform with RVC limits and arithmet

43、ic mean . 77 Figure 34 Detail 1 of waveform for test of dips according to test S4.1.2 . 86 Figure 35 Detail 2 of waveform for tests of dips according to test S4.1.2 87 Figure 36 Detail 1 of waveform for test of swells according to test S4.1.2 87 Figure 37 Detail 2 of waveform for tests of swells acc

44、ording to test S4.1.2 . 88 Figure 38 Sliding reference voltage test . 88 Figure 39 Sliding reference start-up condition 89 Figure 40 Detail 1 of waveform for test of polyphase dips/interruptions 90 Figure 41 Detail 2 of waveform for test of polyphase dips/interruptions 90 Figure 42 Detail 3 of wavef

45、orm for test of polyphase dips/interruptions 91 IEC 62586-2:2017 IEC 2017 7 Figure 43 Detail 1 of waveform for test of polyphase swells . 92 Figure 44 Detail 2 of waveform for test of polyphase swells . 92 Figure 45 Flagging test for class S . 101 Figure 46 Clock uncertainty testing 102 Figure A.1 D

46、ifferent kinds of uncertainties 110 Figure D.1 Phase-to-neutral testing on three-phase systems . 116 Figure D.2 Phase-to-phase testing on three-phase systems . 116 Figure E.1 Example for one phase of a typical N cycle injection . 118 Figure E.2 Dip/interruption accuracy (amplitude and timing) test 1

47、19 Figure E.3 Swell accuracy (amplitude and timing) test . 120 Figure G.1 Simulated signal under noisy conditions . 124 Figure G.2 Waveform for checking gapless RMS voltage measurement . 125 Figure G.3 2,3 Hz frequency fluctuation . 125 Figure G.4 Spectral leakage effects for a missing sample 126 Fi

48、gure G.5 Illustration of Q RMSfor missing samples 127 Figure G.6 Detection of a single missing sample 127 Figure G.7 Q RMSfor an ideal signal, sampling error = 300 10 6128 Figure G.8 Q RMSfor an ideal signal, sampling error = 400 10 6128 Figure G.9 Q RMSfor an ideal signal, sampling error = 200 10 6

49、129 Figure G.10 Q H (5) with ideal test signal and perfect sampling frequency synchronization . 130 Figure G.11 Q H (5) with 300 10 6sampling frequency error and 100 10 6modulation frequency error . 130 Figure G.12 Q RMSwith a 20/24-cycle sliding window with an output every 10/12 cycles . 131 Figure G.13 Amplitude test for fluctuating component 131 Table 1 Summary of type tests for class A