IEC 62429-2007 Reliability growth - Stress testing for early failures in unique complex systems《可靠性增长.在特定综合系统中的早期失效压力测试 n》.pdf

《IEC 62429-2007 Reliability growth - Stress testing for early failures in unique complex systems《可靠性增长.在特定综合系统中的早期失效压力测试 n》.pdf》由会员分享，可在线阅读，更多相关《IEC 62429-2007 Reliability growth - Stress testing for early failures in unique complex systems《可靠性增长.在特定综合系统中的早期失效压力测试 n》.pdf（76页珍藏版）》请在麦多课文档分享上搜索。

1、 IEC 62429Edition 1.0 2007-11INTERNATIONAL STANDARD NORME INTERNATIONALEReliability growth Stress testing for early failures in unique complex systems Croissance de fiabilit Essais de contraintes pour rvler les dfaillances prcoces dun systme complexe et unique IEC62429:2007THIS PUBLICATION IS COPYRI

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16、il: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 62429Edition 1.0 2007-11INTERNATIONAL STANDARD NORME INTERNATIONALEReliability growth Stress testing for early failures in unique complex systems Croissance de fiabilit Essais de contraintes pour rvler les dfaillances prcoces dun systme c

17、omplexe et unique INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE WICS 03.120.01; 03.120.99 PRICE CODECODE PRIXISBN 2-8318-9427-1 2 62429 IEC:2007 CONTENTS FOREWORD.4 1 Scope.6 2 Normative references .6 3 Terms, definitions, abbreviations and symbols7 3.1 Terms a

18、nd definitions 7 3.2 Acronyms 9 3.3 Symbols 9 4 General 10 5 Planning and performing a reliability growth test.13 5.1 Step 1 Should a reliability growth test be used? .13 5.2 Step 2 Failure definitions and data collection13 5.3 Step 3 Stress levels14 5.3.1 General .14 5.3.2 Increased operating load

19、.14 5.3.3 Increased environmental stress .15 5.4 Step 4 Failure analysis and classification of failures .15 5.4.1 General .15 5.4.2 Relevant failures .16 5.4.3 Non-relevant failures .17 5.5 Step 5 Stop criteria.17 5.5.1 General .17 5.5.2 Method 1 Fixed testing programs17 5.5.3 Method 2 Graphical ana

20、lysis.18 5.5.4 Method 3 Success ratio test19 5.5.5 Method 4 Estimation of reliability 21 5.5.6 Method 5 Comparison with acceptable instantaneous failure intensity.22 5.5.7 Method 6 Estimation of remaining latent faults24 5.5.8 Method 7 Reliability indicator testing 24 5.6 Step 6 Verification of repa

21、irs and reliability growth .25 5.7 Step 7 Reporting and feedback.26 Annex A (informative) Practical example of method 3 Success ratio test.27 Annex B (informative) Practical example of method 5 Comparison with acceptable instantaneous failure intensity.28 Annex C (informative) Practical example of m

22、ethod 6 Estimation of remaining latent faults 31 Bibliography33 Figure 1 The bathtub curve 12 Figure 2 Evaluating whether the cumulative failure curve has levelled out18 Figure 3 Method 219 Figure B.1 A reliability growth plot of the data from Table B.1 29 62429 IEC:2007 3 Table 1 Probability that a

23、 system with failure probability of 0,001 will pass N successive tests .21 Table 2 Probability that a system with failure probability of 0,000 001 will pass N successive tests .21 Table 3 Correct and incorrect decisions using reliability indicators.25 Table B.1 Reliability growth and stopping times

24、for the practical example 28 Table C.1 Determining when to stop the test32 4 62429 IEC:2007 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ RELIABILITY GROWTH STRESS TESTING FOR EARLY FAILURES IN UNIQUE COMPLEX SYSTEMS FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organi

25、zation for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, I

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33、er, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publicatio

34、ns is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard

35、 IEC 62429 has been prepared by IEC technical committee 56: Dependability. The text of this standard is based on the following documents: FDIS Report on voting 56/1232/FDIS 56/1249/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in

36、the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. The committee has decided that the contents of this publication will remain unchanged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data relate

37、d to the specific publication. At this date, the publication will be 62429 IEC:2007 5 reconfirmed, withdrawn, replaced by a revised edition, or amended. 6 62429 IEC:2007 RELIABILITY GROWTH STRESS TESTING FOR EARLY FAILURES IN UNIQUE COMPLEX SYSTEMS 1 Scope This International Standard gives guidance

38、for reliability growth during final testing or acceptance testing of unique complex systems. It gives guidance on accelerated test conditions and criteria for stopping these tests. “Unique” means that no information exists on similar systems, and the small number of produced systems means that infor

39、mation deducted from the test has limited use for future production. This standard concerns reliability growth of repairable complex systems consisting of hardware with embedded software. It can be used for describing the procedure for acceptance testing, “running-in“, and to ensure that reliability

40、 of a delivered system is not compromised by coding errors, workmanship errors or manufacturing errors. It only covers the early failure period of the system life cycle and neither the constant failure period, nor the wear out failure period. It can also be used when a company wants to optimize the

41、duration of internal production testing during manufacturing of prototypes, single systems or small series. It is applicable mainly to large hardware/software systems, but does not cover large networks, for example telecommunications and power networks, since new parts of such systems cannot usually

42、 be isolated during the testing. It does not cover software tested alone, but the methods can be used during testing of large embedded software programs in operational hardware, when simulated operating loads are used. It addresses growth testing before or at delivery of a finished system. The testi

43、ng can therefore take place at the manufacturers or at the end users premises. If the user of a system performs reliability growth by a policy of updating hardware and software with improved versions, this standard can be used to guide the growth process. This standard covers a wide field of applica

44、tions, but is not applicable to health or safety aspects of systems. This standard does not apply to systems that are covered by IEC 6227939. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited

45、 applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60050-191:1990, International Electrotechnical Vocabulary Chapter 191: Dependability and quality of service IEC 60300-3-5, Dependability management Part 3-5: Application guide Reli

46、ability test conditions and statistical test principles IEC 60605-2, Equipment reliability testing Part 2 Design of test cycles 62429 IEC:2007 7 IEC 61163-1:2006, Reliability stress screening Part 1: Repairable assemblies manufactured in lots IEC 61163-2, Reliability stress screening Part 2: Electro

47、nic components IEC 61164, Reliability growth Statistical test and estimation methods IEC 61710, Power law model Goodness-of-fit and estimation methods 3 Terms, definitions, abbreviations and symbols 3.1 Terms and definitions For the purposes of this document, the terms and definitions given in IEC 6

48、0050-191, as well as the following, apply. 3.1.1 time compression reducing test time by testing with higher use time than in the field NOTE An example is testing a system that is used 8 h a day for 24 h a day. 3.1.2 accelerated test test in which the applied stress level is chosen to exceed that sta

49、ted in the reference conditions in order to shorten the time duration required to observe the stress response of the item, or to magnify the response in a given time duration NOTE To be valid, an accelerated test should not alter the basic fault modes and failure mechanisms, or their relative prevalence. IEV 191-14-07 3.1.3 (time) acceleration factor r