IEC 62215-3-2013 Integrated circuits - Measurement of impulse immunity - Part 3 Non-synchronous transient injection method《集成电路.脉冲抗干扰度测量.第3部分 非同步瞬时注射法》.pdf

《IEC 62215-3-2013 Integrated circuits - Measurement of impulse immunity - Part 3 Non-synchronous transient injection method《集成电路.脉冲抗干扰度测量.第3部分 非同步瞬时注射法》.pdf》由会员分享，可在线阅读，更多相关《IEC 62215-3-2013 Integrated circuits - Measurement of impulse immunity - Part 3 Non-synchronous transient injection method《集成电路.脉冲抗干扰度测量.第3部分 非同步瞬时注射法》.pdf（70页珍藏版）》请在麦多课文档分享上搜索。

1、 IEC 62215-3 Edition 1.0 2013-07 INTERNATIONAL STANDARD NORME INTERNATIONALE Integrated circuits Measurement of impulse immunity Part 3: Non-synchronous transient injection method Circuits intgrs Mesure de limmunit aux impulsions Partie 3: Mthode dinjection de transitoires non synchrones IEC62215-3:

2、2013 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2013 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permiss

3、ion in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or your local IEC member National Committee for f

4、urther information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de la CEI ou du

5、Comit national de la CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national de la CEI de votre pays de rsidence. IEC Central Office Tel.:

6、 +41 22 919 02 11 3, rue de Varemb Fax: +41 22 919 03 00 CH-1211 Geneva 20 infoiec.ch Switzerland www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrical, electronic and rel

7、ated technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. Useful links: IEC publications search - www.iec.ch/searchpub The ad

8、vanced search enables you to find IEC publications by a variety of criteria (reference number, text, technical committee,). It also gives information on projects, replaced and withdrawn publications. IEC Just Published - webstore.iec.ch/justpublished Stay up to date on all new IEC publications. Just

9、 Published details all new publications released. Available on-line and also once a month by email. Electropedia - www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 30 000 terms and definitions in English and French, with equivalent ter

10、ms in additional languages. Also known as the International Electrotechnical Vocabulary (IEV) on-line. Customer Service Centre - webstore.iec.ch/csc If you wish to give us your feedback on this publication or need further assistance, please contact the Customer Service Centre: csciec.ch. A propos de

11、 la CEI La Commission Electrotechnique Internationale (CEI) est la premire organisation mondiale qui labore et publie des Normes internationales pour tout ce qui a trait llectricit, llectronique et aux technologies apparentes. A propos des publications CEI Le contenu technique des publications de la

12、 CEI est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Liens utiles: Recherche de publications CEI - www.iec.ch/searchpub La recherche avance vous permet de trouver des publications CEI en utilisant diffrents critres

13、 (numro de rfrence, texte, comit dtudes,). Elle donne aussi des informations sur les projets et les publications remplaces ou retires. Just Published CEI - webstore.iec.ch/justpublished Restez inform sur les nouvelles publications de la CEI. Just Published dtaille les nouvelles publications parues.

14、Disponible en ligne et aussi une fois par mois par email. Electropedia - www.electropedia.org Le premier dictionnaire en ligne au monde de termes lectroniques et lectriques. Il contient plus de 30 000 termes et dfinitions en anglais et en franais, ainsi que les termes quivalents dans les langues add

15、itionnelles. Egalement appel Vocabulaire Electrotechnique International (VEI) en ligne. Service Clients - webstore.iec.ch/csc Si vous dsirez nous donner des commentaires sur cette publication ou si vous avez des questions contactez-nous: csciec.ch. IEC 62215-3 Edition 1.0 2013-07 INTERNATIONAL STAND

16、ARD NORME INTERNATIONALE Integrated circuits Measurement of impulse immunity Part 3: Non-synchronous transient injection method Circuits intgrs Mesure de limmunit aux impulsions Partie 3: Mthode dinjection de transitoires non synchrones INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTEC

17、HNIQUE INTERNATIONALE V ICS 31.200 PRICE CODE CODE PRIX ISBN 978-2-8322-0994-3 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale Warning! Make sure that you obtained this publication from an authorized distributor. Att

18、ention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr. 2 62215-3 IEC:2013 CONTENTS FOREWORD . 4 1 Scope . 6 2 Normative references . 6 3 Terms and definitions . 6 4 General 8 5 Coupling networks 9 5.1 General on coupling networks . 9 5.2 Supply injection networ

19、k 9 5.2.1 Direct injection 9 5.2.2 Capacitive coupling . 10 5.3 Input injection 10 5.4 Output injection . 11 5.5 Simultaneous multiple pin injection 12 6 IC configuration and evaluation 12 6.1 IC configuration and operating modes . 12 6.2 IC monitoring . 13 6.3 IC performance classes . 13 7 Test con

20、ditions . 14 7.1 General . 14 7.2 Ambient electromagnetic environment . 14 7.3 Ambient temperature . 14 7.4 IC supply voltage . 14 8 Test equipment . 14 8.1 General requirements for test equipment . 14 8.2 Cables . 14 8.3 Shielding . 14 8.4 Transient generator . 14 8.5 Power supply . 14 8.6 Monitori

21、ng and stimulation equipment . 14 8.7 Control unit . 15 9 Test set up . 15 9.1 General . 15 9.2 EMC test board . 15 10 Test procedure . 17 10.1 Test plan . 17 10.2 Test preparation 17 10.3 Characterization of coupled impulses 17 10.4 Impulse immunity measurement 17 10.5 Interpretation and comparison

22、 of results 18 10.6 Transient immunity acceptance level . 18 11 Test report 18 Annex A (informative) Test board recommendations 19 Annex B (informative) Selection hints for coupling and decoupling network values . 24 Annex C (informative) Industrial and consumer applications 26 Annex D (informative)

23、 Vehicle applications 29 62215-3 IEC:2013 3 Figure 1 Typical pin injection test implementation 9 Figure 2 Supply pin direct injection test implementation . 10 Figure 3 Supply pin capacitive injection test implementation 10 Figure 4 Input pin injection test implementation . 11 Figure 5 Output pin inj

24、ection test implementation . 12 Figure 6 Multiple pin injection test implementation . 12 Figure 7 Test set-up diagram . 15 Figure 8 Example of the routing from the injection port to a pin of the DUT . 16 Figure A.1 Typical EMC test board topology. 22 Figure A.2 Example of implementation of multiple

25、injection structures . 23 Table A.1 Position of vias over the board . 19 Table C.1 Definition of pin types 26 Table C.2 Test circuit values 27 Table C.3 Example of IC impulse test level (IEC 61000-4-4) 28 Table D.1 IC pin type definition 29 Table D.2 Transient test level 12 V (ISO 7637-2) . 30 Table

26、 D.3 Transient test level 24 V (ISO 7637-2) . 31 Table D.4 Example of transient test specification . 32 4 62215-3 IEC:2013 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ INTEGRATED CIRCUITS MEASUREMENT OF IMPULSE IMMUNITY Part 3: Non-synchronous transient injection method FOREWORD 1) The International

27、Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fie

28、lds. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IE

29、C National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardizat

30、ion (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has represent

31、ation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC can

32、not be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publicatio

33、ns. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, ac

34、cess to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including in

35、dividual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upo

36、n, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements

37、of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 62215-3 has been prepared by subcommittee 47A: Integrated circuits, of IEC technical committee 47: Semiconductor devices. The text

38、of this standard is based on the following documents: CDV Report on voting 47A/881/CDV 47A/890/RVC Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Dire

39、ctives, Part 2. A list of all parts in the IEC 62215 series, published under the general title Integrated circuits Measurement of impulse immunity can be found on the IEC website. 62215-3 IEC:2013 5 The committee has decided that the contents of this publication will remain unchanged until the stabi

40、lity date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. 6 62215-3 IEC:2013 INTEGRATED CIRCUITS MEASUREMENT OF IMPULSE IMMUNITY Part

41、3: Non-synchronous transient injection method 1 Scope This part of IEC 62215 specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily synchronized to the operation of the device under te

42、st (DUT), are applied to the IC pins via coupling networks. This method enables understanding and classification of interaction between conducted transient disturbances and performance degradation induced in ICs regardless of transients within or beyond the specified operating voltage range. 2 Norma

43、tive references The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments)

44、applies. IEC 60050 (all parts), International Electrotechnical Vocabulary (IEV) (available at ) IEC 61000-4-4:2012, Electromagnetic compatibility (EMC) Part 4-4: Testing and measurement techniques Electrical fast transient/burst immunity test IEC 61000-4-5:2005, Electromagnetic compatibility (EMC) P

45、art 4-5: Testing and measurement techniques Surge immunity test IEC 62132-4:2006, Integrated circuits Measurement of electromagnetic immunity 150 kHz to 1 GHz Part 4: Direct RF power injection method ISO 7637-2:2011, Road vehicles Electrical disturbances from conduction and coupling Part 2: Electric

46、al transient conduction along supply lines only 3 Terms and definitions For the purposes of this document, the terms and definitions given in IEC 60050-131 and IEC 60050-161, some of which have been added for convenience, as well as the following apply. 3.1 auxiliary equipment equipment not under te

47、st but is indispensable for setting up all the functions and assessing the correct performance (operation) of the equipment under test (EUT) during its exposure to the disturbance 3.2 burst sequence of a limited number of distinct impulses or an oscillation of limited duration 62215-3 IEC:2013 7 3.3

48、 coupling network electrical circuit for transferring energy from one circuit to another with well-defined impedance and known transfer characteristics 3.4 performance degradation undesired departure in the operational performance of any device, equipment or system from its intended performance Note

49、 1 to entry: The term “degradation” can apply to temporary or permanent failure. 3.5 DUT device under test device, equipment or system being evaluated Note 1 to entry: In this part of IEC 62215, it refers to a semiconductor device being tested. Note 2 to entry: This note applies to the French language only. 3.6 EMC electromagnetic compatibility ability of an equipment or syste