IEC 61326-2-1-2012 Electrical equipment for measurement control and laboratory use - EMC requirements - Part 2-1 Particular requirements - Test configurations operational condition.pdf

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1、 IEC 61326-2-1 Edition 2.0 2012-10 INTERNATIONAL STANDARD NORME INTERNATIONALE Electrical equipment for measurement, control and laboratory use EMC requirements Part 2-1: Particular requirements Test configurations, operational conditions and performance criteria for sensitive test and measurement e

2、quipment for EMC unprotected applications Matriel lectrique de mesure, de commande et de laboratoire Exigences relatives la CEM Partie 2-1: Exigences particulires Configurations dessai, conditions fonctionnelles et critres de performance pour essai de sensibilit et quipement de mesure pour les appli

3、cations non protges de la CEM IEC 61326-2-1:2012 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2012 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including

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5、ur local IEC member National Committee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les mi

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17、26-2-1 Edition 2.0 2012-10 INTERNATIONAL STANDARD NORME INTERNATIONALE Electrical equipment for measurement, control and laboratory use EMC requirements Part 2-1: Particular requirements Test configurations, operational conditions and performance criteria for sensitive test and measurement equipment

18、 for EMC unprotected applications Matriel lectrique de mesure, de commande et de laboratoire Exigences relatives la CEM Partie 2-1: Exigences particulires Configurations dessai, conditions fonctionnelles et critres de performance pour essai de sensibilit et quipement de mesure pour les applications

19、non protges de la CEM INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE H ICS 17.220; 25.040.40; 33.100 PRICE CODE CODE PRIX ISBN 978-2-83220-390-3 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique

20、Internationale Warning! Make sure that you obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr. 2 61326-2-1 IEC:2012 CONTENTS FOREWORD . 3 1 Scope . 5 2 Normative references . 5 3 Terms and definiti

21、ons . 5 4 General 5 5 EMC test plan . 5 5.1 General . 5 5.2 Configuration of EUT during testing . 6 5.3 Operation conditions of EUT during testing 6 5.4 Specification of functional performance . 7 5.5 Test description . 7 6 Immunity requirements . 7 6.1 Conditions during the tests 7 6.2 Immunity tes

22、t requirements . 7 6.3 Random aspects 7 6.4 Performance criteria 7 7 Emission requirements . 7 8 Test results and test report . 7 9 Instructions for use . 7 61326-2-1 IEC:2012 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ ELECTRICAL EQUIPMENT FOR MEASUREMENT, CONTROL AND LABORATORY USE EMC REQUIREME

23、NTS Part 2-1: Particular requirements Test configurations, operational conditions and performance criteria for sensitive test and measurement equipment for EMC unprotected applications FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization com

24、prising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Sta

25、ndards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this pre

26、paratory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organ

27、izations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form

28、of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretati

29、on by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regi

30、onal publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out

31、by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees

32、for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the N

33、ormative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held re

34、sponsible for identifying any or all such patent rights. International Standard IEC 61326-2-1 has been prepared by subcommittee 65A: System aspects, of IEC technical committee 65: Industrial-process measurement, control and automation. This second edition cancels and replaces the first edition publi

35、shed in 2005. This edition constitutes a technical revision. 4 61326-2-1 IEC:2012 The main technical changes with regard to the previous edition are as follows: Update with respect to IEC 61326-1:2012. The text of this standard is based on the following documents: FDIS Report on voting 65A/641/FDIS

36、65A/652/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. This part of IEC 61326 series is to be used in conjunction with IEC 613

37、26-1:2012 and follows the same numbering of clauses, subclauses, tables and figures. When a particular subclause of IEC 61326-1 is not mentioned in this part, that subclause applies as far as is reasonable. When this standard states “addition”, “modification” or “replacement”, the relevant text in I

38、EC 61326-1 is to be adapted accordingly. NOTE The following numbering system is used: subclauses, tables and figures that are numbered starting from 101 are additional to those in IEC 61326-1; unless notes are in a new subclause or involve notes in IEC 61326-1, they are numbered starting from 101 in

39、cluding those in a replaced clause or subclause; additional annexes are lettered AA, BB, etc. A list of all parts of IEC 61326 series, under the general title Electrical equipment for measurement, control and laboratory use EMC requirements can be found on the IEC website. The committee has decided

40、that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. 6

41、1326-2-1 IEC:2012 5 ELECTRICAL EQUIPMENT FOR MEASUREMENT, CONTROL AND LABORATORY USE EMC REQUIREMENTS Part 2-1: Particular requirements Test configurations, operational conditions and performance criteria for sensitive test and measurement equipment for EMC unprotected applications 1 Scope In additi

42、on to the scope of IEC 61326-1, this part of IEC 61326 specifies more detailed test configurations, operational conditions and performance criteria for equipment with test and measurement circuits (both internal and/or external to the equipment) that are not EMC protected for operational and/or func

43、tional reasons, as specified by the manufacturer. The manufacturer specifies the environment for which the product is intended to be used and selects the appropriate test level specifications of IEC 61326-1. NOTE Examples of equipment include, but are not limited to, oscilloscopes, logic analysers,

44、spectrum analysers, network analysers, analogue instruments, digital multimeters (DMM) and board test systems. 2 Normative references The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the ed

45、ition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. Clause 2 of IEC 61326-1 applies, except as follows: Addition: IEC 61326-1: 2012, Electrical equipment for measurement, control and laboratory use EMC requirements Part 1: Ge

46、neral requirements 3 Terms and definitions For the purposes of this document, the terms and definitions given in IEC 61326-1 and IEC 60050-161 apply. 4 General Clause 4 of IEC 61326-1 applies. 5 EMC test plan 5.1 General Subclause 5.1 of IEC 61326-1 applies. 6 61326-2-1 IEC:2012 5.2 Configuration of

47、 EUT during testing Subclause 5.2 of IEC 61326-1 applies, except as follows: Addition: 5.2.4.101 I/O ports for test and measurement purposes Test and measurement input ports shall be capped and shorted unless this leads to an operating condition unsuitable for measuring the emission and immunity per

48、formance of the product. If an input signal is needed, an appropriate input signal shall be applied using test leads or probes as specified by the manufacturer. Test and measurement output ports not needed to evaluate the essential functions of the EUT shall be capped and/or terminated. Electrostati

49、c discharges shall be applied to the housing shield, but not to the inner pins of shielded port or cable connectors. Examples include: BNC, D-subminiature, IEEE 488 (IEC 60488), RS232 and IEEE 1284-B (parallel printer port), etc. NOTE 1 Probes and/or test leads not used to apply an input signal during test to the test and measurement ports do not need to be connected. Such test leads can vary substa