IEC 61300-3-47-2014 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 3-47 Examinations and measurements - End face geometry.pdf
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1、 IEC 61300-3-47 Edition 1.0 2014-07 INTERNATIONAL STANDARD Fibre optic interconnecting devices and passive components Basic test and measurement procedures Part 3-47: Examinations and measurements End face geometry of PC/APC spherically polished ferrules using interferometry IEC 61300-3-47:2014-07(e
2、n) colour inside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2014 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, wit
3、hout permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or your local IEC member National Com
4、mittee for further information. IEC Central Office Tel.: +41 22 919 02 11 3, rue de Varemb Fax: +41 22 919 03 00 CH-1211 Geneva 20 infoiec.ch Switzerland www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes Intern
5、ational Standards for all electrical, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. IEC Catalog
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8、tions. Just Published details all new publications released. Available online and also once a month by email. Electropedia - www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 30 000 terms and definitions in English and French, with equi
9、valent terms in 14 additional languages. Also known as the International Electrotechnical Vocabulary (IEV) online. IEC Glossary - std.iec.ch/glossary More than 55 000 electrotechnical terminology entries in English and French extracted from the Terms and Definitions clause of IEC publications issued
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11、300-3-47 Edition 1.0 2014-07 INTERNATIONAL STANDARD Fibre optic interconnecting devices and passive components Basic test and measurement procedures Part 3-47: Examinations and measurements End face geometry of PC/APC spherically polished ferrules using interferometry INTERNATIONAL ELECTROTECHNICAL
12、COMMISSION Q ICS 33.180.20 PRICE CODE ISBN 978-2-8322-1708-5 Registered trademark of the International Electrotechnical Commission Warning! Make sure that you obtained this publication from an authorized distributor. colour inside 2 IEC 61300-3-47:2014 IEC 2014 CONTENTS FOREWORD . 3 1 Scope 5 2 Term
13、s and definitions 5 3 Measurement by interferometer . 7 3.1 General . 7 3.2 Ferrule/connector holder . 7 3.3 Optical interferometric system . 8 3.4 Microscope with camera 8 4 Requirements for the interferometer 8 4.1 XY calibration (radius of curvature) . 8 4.2 Z calibration (fibre height) . 8 4.3 A
14、lignment of ferrule axis with the interferometers optical axis (apex offset calibration) 8 4.4 Tilt and key angle . 8 5 Measurement method 8 5.1 General . 8 5.2 Measurement regions . 9 5.3 Measurement procedure for the radius of curvature 9 5.4 Measurement procedure for the dome eccentricity (apex o
15、ffset) 10 5.5 Measurement procedure for fibre height 10 6 Details to be specified . 13 Annex A (normative) Calibration for the interferometer . 14 A.1 XY calibration . 14 A.2 Z calibration 14 A.3 Alignment of the ferule axis with the optical axis of the interferometer (“apex offset calibration”) . 1
16、4 A.4 Tilt and key angle . 14 Annex B (informative) Measurement procedure for end face “angle error” of angled convex polished ferrules . 15 Annex C (informative) Formula for calculating ferrule end face geometry . 17 Figure 1 Radius of curvature of a spherically polished ferrule end face 5 Figure 2
17、 Apex offset of a spherically polished ferrule end face . 6 Figure 3 Fibre height of a spherically polished ferrule end face 6 Figure 4 Ferrule end face angle for spherically polished ferrules 7 Figure 5 Interferometer 7 Figure 6 Ferrule end face and measurement regions . 9 Figure 7 Ferrule end face
18、 surface 11 Figure 8 Fitting region and averaging region of the ferrule end face surface 11 Figure 9 Converted end face surface of the ferrule . 12 Figure 10 Converted ferrule end face surface without the extracting region 12 Figure B.1 Example of key error calculated from interference pattern for a
19、 convex polished ferrule . 15 IEC 61300-3-47:2014 IEC 2014 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ FIBRE OPTIC INTERCONNECTING DEVICES AND PASSIVE COMPONENTS BASIC TEST AND MEASUREMENT PROCEDURES Part 3-47: Examinations and measurements End face geometry of PC/APC spherically polished ferrules
20、 using interferometry FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning
21、standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their prep
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23、 with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant
24、subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the techn
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