IEC 61193-2-2007 Quality assessment systems - Part 2 Selection and use of sampling plans for inspection of electronic components and packages《质量评估系统.第2部分 电子元件和包装件检验用抽样检验方法的选择和使用》.pdf

《IEC 61193-2-2007 Quality assessment systems - Part 2 Selection and use of sampling plans for inspection of electronic components and packages《质量评估系统.第2部分 电子元件和包装件检验用抽样检验方法的选择和使用》.pdf》由会员分享，可在线阅读，更多相关《IEC 61193-2-2007 Quality assessment systems - Part 2 Selection and use of sampling plans for inspection of electronic components and packages《质量评估系统.第2部分 电子元件和包装件检验用抽样检验方法的选择和使用》.pdf（22页珍藏版）》请在麦多课文档分享上搜索。

1、 IEC 61193-2 Edition 1.0 2007-08 INTERNATIONAL STANDARD Quality assessment systems Part 2: Selection and use of sampling plans for inspection of electronic components and packages IEC 61193-2:2007(E) THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2007 IEC, Geneva, Switzerland All rights reserved.

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9、D Quality assessment systems Part 2: Selection and use of sampling plans for inspection of electronic components and packages INTERNATIONAL ELECTROTECHNICAL COMMISSION R ICS 31.190 PRICE CODE ISBN 2-8318-9297-X 2 61193-2 IEC:2007(E) CONTENTS FOREWORD.3 INTRODUCTION.5 1 Scope.6 2 Normative references

10、 .6 3 Terms and definitions .6 4 Sampling system 7 4.1 Formation and identification of lots7 4.2 Drawing of samples.7 4.2.1 Selection of sample items7 4.2.2 Process of sampling 7 4.3 Sampling plans7 4.3.1 Inspection level .7 4.3.2 Sampling plan for normal inspection 8 4.3.3 Acceptance number.8 4.3.4

11、 Tightened or reduced inspection8 5 Acceptance and rejection .9 5.1 Acceptability criteria 9 5.2 Disposition of rejected lots 9 6 Statistical verified quality limit (SVQL)9 6.1 General .9 6.2 Calculation of the SVQL 10 Annex A (informative) Estimation of the statistical verified quality limit (SVQL)

12、 in nonconforming items per million (10 -6 ) at a confidence limit 60 %.11 Annex B (informative) Relationship between this standard and ISO 2859-115 Annex C (informative) Example of application of this standard (lot-by-lot inspection of assessment level EZ in IEC/TC 40).17 Bibliography18 Table 1 Sam

13、ple size 8 Table 2 Sample size code letters .9 Table 3 Coefficients for confidence level 60 % (see also A.5) 10 Table A.1 Statistical verified quality limits in nonconforming items per million (10 -6 ) 12 Table A.2 np with confidence limit of 60 % for accumulated number of non- conforming items and

14、coefficient C L .14 Table B.1 Sampling plans corresponding to Table 2-A of ISO 2859-1.15 Table B.2 Tabulated values for operating characteristic curves (p: per cent nonconforming).16 Table C.1 Lot-by-lot inspection of assessment level EZ IEC/TC 40 .17 61193-2 IEC:2007(E) 3 INTERNATIONAL ELECTROTECHN

15、ICAL COMMISSION _ QUALITY ASSESSMENT SYSTEMS Part 2: Selection and use of sampling plans for inspection of electronic components and packages FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical commi

16、ttees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical

17、 Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental

18、and non- governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agree

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20、nd are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote

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24、expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9)

25、Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61193-2 has been prepared by IEC technical committee 91: Electronic

26、s assembly technology. The text of this standard is based on the following documents: FDIS Report on voting 91/690/FDIS 91/723/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in

27、accordance with the ISO/IEC Directives, Part 2. 4 61193-2 IEC:2007(E) A list of all the parts in the IEC 61193 series, under the general title Quality assessment systems, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the

28、maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. A bilingual version of this publication may be issued at a lat

29、er date. 61193-2 IEC:2007(E) 5 INTRODUCTION To obtain a high quality level of products, process controls like 100 % testing of significant characteristics and statistical methods are needed to stabilize, monitor, and improve processes. Sampling inspection is one of the methods to verify whether the

30、process control is effective, and the quality level of a suppliers product by a customer or third party. Today the quality level of products for use in electric and electronic equipment is expected to be equal or close to zero defects. But, the assessment of a quality level close to zero defects by

31、sampling only would lead to an unreasonable increase of cost for inspection. A combination of process control and zero acceptance number sampling plans is indispensable. This standard provides a sampling system and plans for the inspection of electronic components, packages and modules, manufactured

32、 under suitable process control, which prevents the outflow of nonconforming products. NOTE The sampling system provided by this standard is extracted from ISO 2859-1, and is intended to be used for the inspection of final products, either by the manufacturer, a customer, or a third party. 6 61193-2

33、 IEC:2007(E) QUALITY ASSESSMENT SYSTEMS Part 2: Selection and use of sampling plans for inspection of electronic components and packages 1 Scope This part of IEC 61193 applies to the inspection of electronic components, packages, and also modules (referred to as “products” in this standard) for use

34、in electronic and electric equipment. It specifies sampling plans for inspection by attributes on the assumption that the acceptance number is zero (Ac = 0), including criteria for sample selection and procedures. The zero acceptance number sampling plans provided by this standard apply to the inspe

35、ction of products, that are manufactured under suitable process control with the target of a “zero- defect” quality level before sampling inspection. In addition, this standard provides a method for the calculation of the expected value of the statistical verified quality limit (SVQL) at a confidenc

36、e level of 60 %. Amongst other things, this method can be used to verify the effectiveness of the suppliers process control. NOTE In this standard the term “module” is used for products which are modules according to the definition in IEC 60194. 2 Normative references The following referenced docume

37、nts are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60194: Printed board design, manufacture and assembly Terms and definitions

38、ISO 2859-1:1999, Sampling procedures for inspection by attributes Part 1: Sampling schemes indexed by acceptance quality limit (AQL) for lot-by-lot inspection ISO 3534-2:2006, Statistics Vocabulary and symbols Part 2: Applied statistics 3 Terms and definitions For the purposes of this document, the

39、terms and definitions given in IEC 60194, ISO 2859-1 and ISO 3534-2, as well as the following, apply. 3.1 electronic component individual component which includes electronic, optoelectronic and/or micro-electro- mechanical systems (MEMS) element 3.2 electronic package individual electronic element o

40、r elements in a container which protects the contents to assure the reliability and provides terminals to interconnect the container to an outer circuit 61193-2 IEC:2007(E) 7 3.3 electronic module functional block which contains individual electronic elements and /or electronic packages, to be used

41、in a next level assembly 3.4 inspection level IL level to define sample size for lot size NOTE Sample size of lots depends on the severity of inspection level. 3.5 nonconforming item item with one or more nonconformities NOTE A nonconforming item is a product which cannot satisfy the requirement (vi

42、sual examination or electrical performance, etc.) in the lot-by-lot inspection or periodic test, etc. 3.6 structurally similar products products manufactured by the same manufacturer with the same materials, manufacturing processes and methods NOTE Products are structurally similar, even when there

43、are differences e.g. in case size and rated values. Results from designated tests conducted on items of one lot of these products can be accumulated with results of other lots in the same group of structural similarity. 4 Sampling system The procedure and sampling plans described in this clause are

44、based on an acceptance number zero (Ac = 0). 4.1 Formation and identification of lots The products shall be assembled into identifiable lots or sub-lots. Each lot shall, as far as practicable, consist of items of a single type, grade, class, size and composition, manufactured under uniform condition

45、s at essentially the same time. 4.2 Drawing of samples 4.2.1 Selection of sample items The items selected for the sample shall be drawn from the lot by simple random sampling (see 3.1.3.4 in ISO 3534-2). However, when the lot consists of sub-lots or strata, identified by some rational criterion, str

46、atified sampling shall be used in such a way that the size of the subsample from each sublot or stratum is proportional to the size of that sublot or stratum. 4.2.2 Process of sampling Samples may be drawn after the lot has been produced, or during production of the lot. 4.3 Sampling plans 4.3.1 Ins

47、pection level The inspection level designates the relative severity of inspection. Three inspection levels, I, II and III, are given for general use. Unless otherwise specified, level II shall be used. Level I may be used when less discrimination is needed or level III when greater discrimination is

48、 required. Four additional special levels, S-1, S-2, S-3 and S-4 may be used where relatively 8 61193-2 IEC:2007(E) small sizes are necessary and larger sampling risks can be tolerated, such as destructive inspection or valuable products. The inspection level shall be specified in accordance with th

49、e detail specification or an agreement with a supplier and a user. 4.3.2 Sampling plan for normal inspection Unless otherwise specified in the detail specification, single sampling plans for normal inspection according to Table 1 of this standard shall be applied (see also Annex B). NOTE Table 1 is adapted from ISO 2859-1. Table 1 Sample size Special inspection levels General inspection levels Lot size S-1 S-2 S-3 S-4 2 to 8 2 2 2 2 2 2 3 9 to 15 2 2 2 2 2 3 5