IEC 61193-2-2007 Quality assessment systems - Part 2 Selection and use of sampling plans for inspection of electronic components and packages《质量评估系统.第2部分 电子元件和包装件检验用抽样检验方法的选择和使用》.pdf
《IEC 61193-2-2007 Quality assessment systems - Part 2 Selection and use of sampling plans for inspection of electronic components and packages《质量评估系统.第2部分 电子元件和包装件检验用抽样检验方法的选择和使用》.pdf》由会员分享,可在线阅读,更多相关《IEC 61193-2-2007 Quality assessment systems - Part 2 Selection and use of sampling plans for inspection of electronic components and packages《质量评估系统.第2部分 电子元件和包装件检验用抽样检验方法的选择和使用》.pdf(22页珍藏版)》请在麦多课文档分享上搜索。
1、 IEC 61193-2 Edition 1.0 2007-08 INTERNATIONAL STANDARD Quality assessment systems Part 2: Selection and use of sampling plans for inspection of electronic components and packages IEC 61193-2:2007(E) THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2007 IEC, Geneva, Switzerland All rights reserved.
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7、dia: www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions in English and French, with equivalent terms in additional languages. Also known as the International Electrotechnical Vocabulary online. Customer Servi
8、ce Centre: www.iec.ch/webstore/custserv If you wish to give us your feedback on this publication or need further assistance, please visit the Customer Service Centre FAQ or contact us: Email: csciec.ch Tel.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 61193-2 Edition 1.0 2007-08 INTERNATIONAL STANDAR
9、D Quality assessment systems Part 2: Selection and use of sampling plans for inspection of electronic components and packages INTERNATIONAL ELECTROTECHNICAL COMMISSION R ICS 31.190 PRICE CODE ISBN 2-8318-9297-X 2 61193-2 IEC:2007(E) CONTENTS FOREWORD.3 INTRODUCTION.5 1 Scope.6 2 Normative references
10、 .6 3 Terms and definitions .6 4 Sampling system 7 4.1 Formation and identification of lots7 4.2 Drawing of samples.7 4.2.1 Selection of sample items7 4.2.2 Process of sampling 7 4.3 Sampling plans7 4.3.1 Inspection level .7 4.3.2 Sampling plan for normal inspection 8 4.3.3 Acceptance number.8 4.3.4
11、 Tightened or reduced inspection8 5 Acceptance and rejection .9 5.1 Acceptability criteria 9 5.2 Disposition of rejected lots 9 6 Statistical verified quality limit (SVQL)9 6.1 General .9 6.2 Calculation of the SVQL 10 Annex A (informative) Estimation of the statistical verified quality limit (SVQL)
12、 in nonconforming items per million (10 -6 ) at a confidence limit 60 %.11 Annex B (informative) Relationship between this standard and ISO 2859-115 Annex C (informative) Example of application of this standard (lot-by-lot inspection of assessment level EZ in IEC/TC 40).17 Bibliography18 Table 1 Sam
13、ple size 8 Table 2 Sample size code letters .9 Table 3 Coefficients for confidence level 60 % (see also A.5) 10 Table A.1 Statistical verified quality limits in nonconforming items per million (10 -6 ) 12 Table A.2 np with confidence limit of 60 % for accumulated number of non- conforming items and
14、coefficient C L .14 Table B.1 Sampling plans corresponding to Table 2-A of ISO 2859-1.15 Table B.2 Tabulated values for operating characteristic curves (p: per cent nonconforming).16 Table C.1 Lot-by-lot inspection of assessment level EZ IEC/TC 40 .17 61193-2 IEC:2007(E) 3 INTERNATIONAL ELECTROTECHN
15、ICAL COMMISSION _ QUALITY ASSESSMENT SYSTEMS Part 2: Selection and use of sampling plans for inspection of electronic components and packages FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical commi
16、ttees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical
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