UL 1557 CRD-2017 UL Standard for Safety Electrically Isolated Semiconductor Devices Section Paragraph Reference 14 Subject Production Line Dielectric Voltage-Withstand Test Caddit.pdf
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1、UL COPYRIGHTED MATERIAL NOT AUTHORIZED FOR FURTHER REPRODUCTION ORDISTRIBUTION WITHOUT PERMISSION FROM ULUNDERWRITERS LABORATORIES INC. CERTIFICATION REQUIREMENT DECISIONThis Certification Requirement Decision is prepared by UL LLC. It is normative for the applicable ULProduct Certification Program(
2、s); however, it is currently not part of the UL Standard(s) referencedbelow.Product Category (CCN): QQQX2Standard Number: UL 1557Standard Title: Standard for Electrically Isolated Semiconductor DevicesEdition Date: December 29, 2011Edition Number: 5Section / Paragraph Reference: 14Subject: Productio
3、n Line Dielectric Voltage-Withstand Test addition of dc testDECISION:MANUFACTURING AND PRODUCTION-LINE TEST14 Dielectric Voltage-Withstand Test14.1 Each product shall withstand without electrical breakdown, as a routine production-line test, theapplication of a potential at a frequency within the ra
4、nge of 40 - 70 Hz between live parts and accessibledead metal partsException: A dc potential equal to 1.414 times the specified 40 - 70 Hz potential may be used.14.2 The production-line test potential shall be the rated isolation rms voltage for 60 seconds or 120percent of the rated isolation rms vo
5、ltage for one second.Exception: For a dc test potential:1.414 times the rated isolation rms voltage for one minute or1.414(1.2) times the rated isolation rms voltage for one second.14.3 The product may be in a heated or unheated condition for the test.14.4 For an ac test, tThe test equipment shall i
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