TIA-526-27-1998 OFSTP-27 Procedure for System-Level Temperature Cycle Endurance Test《OFSTP-27 系统级温度循环耐久力测试程序》.pdf
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1、 TIA DOCUMENT OFSTP-27 Procedure for System-Level Temperature Cycle Endurance Test TIA-526-27 JULY 1998 TELECOMMUNICATIONS INDUSTRY ASSOCIATION The Telecommunications Industry Association represents the communications sector of NOTICE TIA Engineering Standards and Publications are designed to serve
2、the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for their particular need. The existence of such P
3、ublications shall not in any respect preclude any member or non-member of TIA from manufacturing or selling products not conforming to such Publications. Neither shall the existence of such Documents preclude their voluntary use by non-TIA members, either domestically or internationally. TIA DOCUMEN
4、TS TIA Documents contain information deemed to be of technical value to the industry, and are published at the request of the originating Committee without necessarily following the rigorous public review and resolution of comments which is a procedural part of the development of a American National
5、 Standard (ANS). Further details of the development process are available in the TIA Engineering Manual, located at http:/www.tiaonline.org/standards/sfg/engineering_manual.cfm TIA Documents shall be reviewed on a five year cycle by the formulating Committee and a decision made on whether to reaffir
6、m, revise, withdraw, or proceed to develop an American National Standard on this subject. Suggestions for revision should be directed to: Standards they may serve as warnings of some potential problems. They may also be useful for reliability design improvements . 6.2 Fail Criteria The system fails
7、the test if any of the following occur: Any parameters exceed the suppliers specifications as measured during the test or at its end Any circuit packs require replacement due to performance degradation (outside the suppliers specifications) or total failure, as determined by the systems internal dia
8、gnostics or by parametric measurements made during the test or at its end 0 Protection switching automatically occurs as a result of any internally detected problem. 10 TINEIA-526-27 7 Documentation 7.1 Reporting requirements Report the following information for each test: 7.1.1 Date of test 7.1.2 P
9、rocedure used for test (OFSTP-6) 7.1.3 SUT identification SUT Identification. The SUT shall be identified by manufacturer name, product name, application speed (e.g., OC-12), and serial code (if available). 7.1.4 Test results Test results documented in the report shall include parameters measured be
10、fore, during, and after the temperature-cycle test, and how the measurements compared to the pass/fail criteria. A statement of whether the criteria are met (see 6.2) shall also be included. 7.2 US military applications United States military applications require that the following information also
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