NAVY MIL-T-24387 A-1973 TEMPERATURE MEASUREMENT EQUIPMENT SIGNAL CONDITIONER AND POWER SUPPLY (ELECTRICAL) (NAVAL SHIPBOARD USE)《温度测量仪器信号调理和供电(电业) (海军舰载使用)》.pdf

《NAVY MIL-T-24387 A-1973 TEMPERATURE MEASUREMENT EQUIPMENT SIGNAL CONDITIONER AND POWER SUPPLY (ELECTRICAL) (NAVAL SHIPBOARD USE)《温度测量仪器信号调理和供电(电业) (海军舰载使用)》.pdf》由会员分享，可在线阅读，更多相关《NAVY MIL-T-24387 A-1973 TEMPERATURE MEASUREMENT EQUIPMENT SIGNAL CONDITIONER AND POWER SUPPLY (ELECTRICAL) (NAVAL SHIPBOARD USE)《温度测量仪器信号调理和供电(电业) (海军舰载使用)》.pdf（17页珍藏版）》请在麦多课文档分享上搜索。

1、so MIL-T-24387A bb 7777706 0422620 MIL-T-24 387A (SHIPS) SUPERSEDING 1 June 1973 # MILITARY SPECIFICATION MIL-T-2 4387 (SHIPS 1 2 June 1969 TE3PERATURE MEASUREMENT EQUIPNENT SIGNAL CONDITIONER AND POWER SUPPLY . (ELECTRICAL) (NAVAL SIIIPBOARD USE) 1. SCOPE 1.1 This specification covers the requireme

2、nts for signal conditioners and power supplies (electrical) used in conjunction with thermocouples and resistance tempera- ture element assemblies for Naval ships. It does not inclqde the design of the sensing eleuents and wells or the requirements for the readout or display. 1.2 Classification. 1.2

3、.1 The classification shall be of the following format, as specified (see 6.2.1): TRE 400 I I we Input! range (see 1.2.1.1) (see 1.2.1.2) 1.2.1.1 w. Temperature measurement equipment shall be designated by the three . letter symbols as follows: TRE - Temperature resistance equipment, platinum. TTE -

4、 Temperature thermocouple equipment, type K. 1.2.1.2 In ut range. The temperature range in degrees Fahrenheit (OF) shall be designated by d%merical value (see 3.5.1.1 and 3.5.2 .i) . 2. APPLICABLE DOCUNENTS # 2.1 The following documents of the issuein effect on date of invitation for bids or request

5、 for proposal, form a part of the specification to the extent specified herein. SPECIFICATIONS FEDERAL PPP-B-566 - Boxes, Folding, Paperboard. PPP-B-636 - Boxes, Shipping, Fiberboard. PPP-B-640 - Boxes, Fiberboard, Corrugated, Triple-Wail. PPP-B-665 - Boxes; Paperboard, Metal Stayed (Including Stay

6、Material). PPP-B-676 - Boxes, Setup. PPP-T-45 - Tape, Gummed, Paper, Reinforced and Plain, for Sealing and Securing. HILITARY MIL-P-116 - Preservation-Packaging, Methods of. MIL-S-901 - Shock Tests, H. I. (High-Impact) ; Shipboard Hachinery, Equipment and Systems, Requirements for. MIL-D-1000 - Draw

7、ings, Engineering and Associated Lists. HIL-D-1000/2 - Drawings, Engineering and Associated Lists. MIL-N-15071 - 4anuals , Technical, rquipment and Systems ,Content Requirements for. MIL-P-15137 - Provisioning Technical Documentation for Repair Parts for Electrical and Mechanical Equipment (Naval Sh

8、ipboard Use). MIL-E-17555 - Electronic and Electrical Equipment, Accessories, and Repair Parts; Packaging and Packing of. MIL-S-19500 - Semiconductor Devicest General Specification for. FSC 6685 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-2 MIL-T

9、-24387A (SHIPS) MILITARY (Con t d) MIL-J-24142 - Junction Eoxes for Electrical Fittings and Fixtures, General Specification for. MIL-J-24142/3 - Junction Box, Submersible, Size 6 by 9 MIL-,T-24388 - Thermocouples and Resistance Temperature Element Assemblies (Naval Shipboard Use). MIL-P-24423 - Prop

10、uigion and Auxiliary Control Consoles and Associated Control and Instrumentation Equipment, Naval Shipboard UEe, Basic Design Requirements. MIL-1-45208 - Inspection System Requirements. MIL-P-55110 - Printea WLringBoards. MIL-T-55164 - Terminal bards, Molded, Barrier, Scr.ew and Stud Types, and Asso

11、ciated Accessories, General Specification for. STANDARDS I4ILITARY MIL-STD-129 - Marking for Shipment and Storage. MIL-STD-167 - Hechanical Vibrations of Shipboard Equipment. MIL-STD-275 - Printed Wiring for Electronic Equipment. MIL-STD-701 - Lists of Standard Semiconductor Devices. MIL-STD-758 - P

12、ackaging Proc.edures for Submarine Repair Parts Utilizing Transparent, Flexible, Heat Sealable Film. MIL-STD-831 - Test Reports, Preparation of. MIL-HDBK-Ji-1 - Cross-Inder of Chemical by Equivalent Specifications and Identifi- (CopieS.of specifications, standards, drawings, and publications require

13、d by suppliera HANDBOOK cation Code (Ferrous and Nonferrous alloys). in connection With specific procurement functions should be obtained from the procuring activity or as directed by the congrpcting 0ffi.cer.j the extentwi- Unless othexwise indiciited, the issue in effect on date of inoitation for

14、bids or request for proposal shall apply. 2.2 Other ublicatione. Thg foll Penn (Technical society and technical association specifications apd ssandards are generally Sheraton Hotel, 530 William Penn Place, Pittsburgh, Pa. 15219.) available for reference from librariel. and using Federal agencies.)

15、. They are algo digtributed among technical groups 3, REQUIREMENTS 3.1 Qualification. The tempgrsture Reasurement equipmnt furnished under this speci- fication shall be products which are qualitied for listing on the appXcable qualified products list at the time set for .opening of bids (see 4.3 an

16、6.41. Practiie 3mppIy, except tis ig0dified by the definitions listed as follows: (41 TherPiocau le. Shall be as defined byWIL-T-24388. (b) hdtemwfatureelement. Shall be as defined by MIL-T-24388. (cl %reats for zerc ani! sran shall be provided for changeable assembly or internai adjust.nents. calib

17、ration purposes. fiic! number OC adjustncntn s!ial ire kcrt to a miriinuz consictent with the operation and maintenance of t!ie equipnient an8 t!w sliwnltion fnr tix selective matching of parts. the autput shardrive upscale cr down;calc, 1t.c c:ioii:c CE !:i.ic.:i shi-1 Lc! r-ii.lc by ceans of a lin

18、k. 3.4.2.6 Failsafe OJL. IF t:.c- ol(s) ancl piece nder. 2. :.iaximun collector to emitter voltage volts. 3. Maximum collector to base hltage volts. 4. 3aximum collcctor current . ma. 5. .iaximum base .current ma. 6. :taximum collector power dissipation m. 7. riaximum ambient temrerature (include in

19、ternal heat rise at 8. Maximum case temperature of transistor at 50C, equipnent design ambient and any condition of required equipment ooeration C. (Piliere rating is based on case teinperature.) 9. Cm plate size, thickness and material where so mounted. 10. Description of insulating hardware if ins

20、iilated from a cooling ence diode (s) : . volts to volts. d. Transistors: transistor at 5OoC, design ambient , Cl. plate. e. Silicon controlled rectifiers: i. Circuit synhol(s) and piece number. 2. :Ioninal working peak fcnrard and rcvcrcc voltages. 3, Repetitive peak foniarc! and reverse vnitaacs (

21、maximum). 4. :onrcpatitive peak forward and rcvcrsc! voLt.i-wS (maximum). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-._ - MIL-T-24387A bb W 97777Ob 0422b27 O NIL-T-24387A (SIIIPS) 5. 6. 7. 8. * 9. 10. 11. 12. 13. 14. 15. 16, 17. False firing, or

22、 self-firing, restrictins. Repetitive peak forward current (noniinal an6 maximum values), Siirgc current (peak for nonrepetitive value occurring within the conduction portion of a single cycle but after turn-on has occurred, effective amplitude and cycles duration for multi- cycle surges, or amplitu

23、de and duration for sub-cycle pulse duration). Peak current and maxini : . . present clearLy the aparatipn o the equipment. The following features shall be incorporated in the diagram: a. In preparation of the schematic, enphasisshall oc placed qn simpli- city end ease of understanding of circuit op

24、cration. ment of components and conncctinq wiring mo.; b? irnorccl in the interest O simplicity and clari ty of ti:is dii MIL-T-2437A bb U 7797906 0422631 2 1 MIL-T-24387A (SHIPS) .Table I - Qualification inspection (contad). I Examination and tests I Requirement paragraph I Test paragraph I Tempera

25、ture error Response time Supply voltage and frequency (transient) Tempera Cure Insulation resistance Vibration Shock 3.10.9 3.10.10 3.10.11 3.10.12 3.10.13 3.10.14 3.10.15 4.8.15 I 4.8,9 4.8.10 4.8.11 4.8.12 4.8.13 4.8.14 4.4 Qualit conformance ins ection. All temperature measurement equipment offer

26、ed for delivedl be subjectehxamination and tests listed in table II and shall be conducted in the order listed. ments of this specification shall be cause for rejection. , Failure of any temperature equipment to meet the require- # Table II - Quality conformance inspection. I Examination and tests 1

27、 Requirement paragraph I Test paragraph I I- I I l i General examination output Static error band and repeatability Ripple Input resistance (thermocouple Insulation resistance sensing technique only) 3.4 4.6 3.4.2.2 4.8.1 3.10.1 and 3.10.2 4.8.1 3.10.4 4.8.4 3.10.7 ! 48.7 3.10.13 4.8.12 4.4.1 Qualit

28、y conformance inspecti? rports. passed“ or “not passed“ for each examhation and test, the requirement paragraph and appli- A test report shall be packed with each unit to attest to the perfermance o prts shall include a complete identification of the equipment with a check notation of cable test par

29、agraph. the requirements of 3.10.1-and 3.10.2. which have satisfacmy passed the tests in 4.4 from each lot offered for delivery and shall be subjected to the tests in table III. shall be accepted for quality conformance inspection until the manufacturer has determined the cause of the defect and has

30、 taken the necessary action to correct or eliminate the de- fect from all units on hand. Govermient shall be repeated to demonstrate that the corrective action will enable the equipment to conform to the requirements of this specification. t e examination and tests specified in 4.4. Re- i calibratio

31、n record shall be included to determine conformance with Three campies shall be selected at random out of every 100 units 4.5 Periodic tests. If any sample fails in any test, no deliveries The failed test and any other periodic test required by the I Table III - Periodic tests. Tests I Requirement p

32、aragraph 1 Test paragraph 4.8.7 Input resistance 3.10.j supply voltage and frequency (steady state) 3.10.8 4.8.8 Temperature error 3.10.9 4.8.15 3.10.10 4.8.9. Response time Temperature . 3.10 .,12 4.8.11 Insulation resistance 3.10.13 4.8.12 4.5.1 Periodic test re rts. A complete report on all perio

33、dic tests conducted as The format and content of the speciiied in 4.5 shalm s-ed to NAVSEC for review. report shall conform to MIL-STD-831. 4.6 General examination. The completed equipment shall be given a thorough.examination to determin- it conforms to this specification and applicable drawing8 wi

34、th respct to rmterial, finish, workmanship, construction, assembly, dimensions, weight, marking of identi- fication and information plates. This examination shall be limited to those examinations I 12 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-M

35、IL-T-24387A bb m 9777706 0422632 4 m MIL-T-24387A (SHIPS) that may be pcrformed without disassembling the unit in such a mannet that its performance, durability or appearance would be affected. operating controls and adjustments, as applicable (see 3.4, 3.4.2.5, and 3.4.2.6). 4.7 Test conditions. Ex

36、cept where the following factors are the variables, the tests speciffed in 4.8 shall he conducted with the equipment operating under the following conditions : This examination-shall include a check of all (a) Ambient temperature shall be 25. + SOC nominal, (b) Relptive hwdity shall be ienE npmiqpl.

37、 (c) Supply voltage shall be 115 volts nominal. (d) Supply frequency shall be 60 Hz nominal. (e) Control positions shall be neutral or normal. (f) Specified external load (see 3.4.2.2). 4.8 Tests. 4.8.1 Static error band and re eatabilit . Prior to the start of this test, the test sample and amthtes

38、Eu;w energized for a period of two hours. The test sample shall first be cycled over its full temperature range by slowly increasing and de- creasing the input for six continuous cycles. The calibration measurements shall be made at a minimum of 5 equally spaced intervals over the entire range (both

39、 upscale and downscale). Precaution shall be taken to avoid overshoot. This calibration procedure shall be applied three successive times to determine repeatability. Static error band of all calibrations . shall met the requirements of 3.10.1. Repeatability shall meet the requirements of 3.10.2. . 4

40、.8.2 Reference measurement. The following reference measurement shall be conducted when specified in the individual test: ia) A one trial calibration with at least five equally spaced intervals over the entire-input range both upscale and downscale. 4.8.3 Determination of threshold and deadband. Thr

41、eshold and deadband shall be deter- mined with 8b + 5 percent ture interval kyond this point required to produce a detectable change in.output and the temperature interval in the opposite direction to return the output to the original value shall be determined in each direction. Threshold is the fir

42、st temperature interval. The second temperature intemalis the sum of the threshold and deadband. form to the requirements of 3.10.3. cent of the te tolerances in operating character- istics shall be as specified in the individual equipment specification: Hold room temperature at Oo + 2.C for at leas

43、t 24 hours. (a) (b) Increase room temperature insteps of 10 degrees each, ait 30 minutes per step, until + 65 t. 2OC is reached, and hold at that temperature for at least 4 hours. (c) Reduce room temperature in steps of loo each, at 30 minutes per step, until + 25O + 2OC is reached, and hold at that

44、 temperature for at least 4 hours. At eacfi temperature plateau (OOC, 65% and 2SoC), a reference measurement (see 4.8.2) shall be made. Performance shall conform to 3.10.12. Tempera- ture error shall be as specified in 3.10.9. 4.8.12 Insulation resistance. The insulation resistance of the equipment

45、shall he determined by applying 50 volts dc between electrical input and output circuits and between these circuits and ground (see 3.10.13). mental vibration) of MIL-STD-167 except that the upper limit of the frequency range shall be 100 Hz. If no resonances are obsemed, the two hour endurance test

46、 shall be conducted at 100 Hz. test, an input equal to 80 + 5 percent of the temperature spantshall bo applied to the test sample. 3.10.14. # 4.8.13 Vibration. The equipment shall be tested in accordance with type I (environ- # The amplitudes of vibration shall be in accordance with table IV. The ou

47、tput during the test shall be monitored. During the vibration Performance shall conform to Table IV - Amplitudes of vib7ation. Frequency range f Table amplitude SI2 Inch I 5 to 20 0.030 2 0.006 21 to 50 0.020 2 0.004 51 to 100 0.010 0.002 - ,. . . P I4 Provided by IHSNot for ResaleNo reproduction or

48、 networking permitted without license from IHS-,-,-RIL-T-Zq37A bb 7777706 0422b34 t i MIL-T-24387A (SHIPS) 4.0.14 Shock. The shock test shall be conducted in accordance with MIL-C-901, grade LI class I, type C. During the test an input equal to 80 + Spercent of the temperature span shall be applied

49、to the equipment. The test sample Otput during the test shall be monitor packed level A, B, or Cxdxd in accordance with XIL-E-17555. Level A preservation and packaging methods shall be modified in accordance with MIL-STD-758 for items that ban be stored in bins M drawers. Re air parts (subinarine, onboard and stock). Repair parts shall be preserved 6. NOTES 6.1 .ntended use. This equipment is intended to provide control input and monitoring 6.2 Ordering data. of