NAVY MIL-I-81453 A-1977 INTERROGATOR SET AN APX-76B(V)《AN APX-76B(V)型询问器设备》.pdf
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1、F-0/-25 MIL-I-81453A(AS) 10 June 1977 bUperSed+ng 15 DeceIrber 1966 . MIL-1-81453 (AS) MILITARY SPE CIE1 CATION INTERROGATOR SET AN/APX- 76A (V) This specification has been approved by the Naval Air Systems Command, Department of the Navy. 1, SCOPE 1.1 Scope - The equipment covered by this specifica
2、tion shall provide an Air-by-Air IFF Interrogator i RECWWOATIWS WICH tl4 iE OF USE IN IWROVIEjG MIS IXXWENT MY E? SENI TO ME PEEPARING ACTIVITY WHW A SELF-AWRESSED STILIDPRDIZ4TIOT DOCVIEM IMwEmNT PRWOSAL (00 FOR4 1426) APPEARS AT THE END OF WIS DQCUIENT, OR BY . 1; f - _- ETTER ADCMSSED TO TIE CW4I
3、ZN ACTIVITY. I ,A th Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-HIL-I-4iY53A 59 U3l 9999906 0076464 9 MIL-I- 814 5 3A (AS ) 1.2.1 Eauipment Confisurations - The AN/APX-7EA(V) is capable of various configurations, depending on the control used :
4、Configuration Equipnient Items (VI 1 C-7383/APX-76 (V) 1 RT-868A/APX-76 (V) I SA-1568A/APX-76 (V) I SN-416A/APX-76 (V) (VI 2 C-7959/APX-76A(V) RT-868A/APX-76 (V) I SNL416A/APX-7 6 (V) (VI 3 C-7994/APX-76A(V) I RT-868A/APX-76 (V) I SAm1568A/APX-76 (V) I SN-416A/APX-76 (V) 1.3 Associated I_ Equipment
5、- The interrogator set is intended to operate with the following associated equipment: Common Name Used in Item this Specification (1 1 Interrogator Computer KLR-A/TSEC Interrogator Computer (2 1 Antenna AS-l9.00/Ai?Q-72 (Radar Antenna Modi- fication Kit) or equivalent Interrogator Antenna (3) Radar
6、 Modification - Kit: Appl. Para. 6.11.1 6.11.2 6.11.3 (4) Radome Modification Kit 6.11.4 * The information contained in paragraphs 6.11.2, 6.11.3 and 6.11.4 is applicable only to the F-4B system. Detailed specifications for these requirements should be obtained from cognizant radar and antenna.perso
7、nne1. 2 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-1-814 53A (AS I *2. APPLICAl3LE DOCUmNTS Jc2.1 The following.:documents, of issue in effect, on date Of invitation for bids, KEFK oYnei-crise specifisc, this specif icatiori :to the extent s
8、pecified herein. form a part of SPECIFICATIONS Military MIL-C-17 2 Cases, Bases, Mounting; and Mounts, Vibration MIL-W-5088 Wiring; Aircraft, Installation of MIL-E-5400 P Electronic Equipment, Aircraft, General Specification for MIL-T-5422 Testing, Environrnental, Aircraft Electronic Equipn?ent MIL-
9、1-6181 MIL-C-6781 MIL-P-7788 MIL-M-7793 Interference Control Requirements, Aircraft Equipment Control Panel: Aircraft Equi.pment Rack or Console Mounted Plate, Plastic, Lighting Meter, Time Totalizing MIL-E-17555 Electronic and Electrical Equipment and Associated Repair Parts, Preparation for Delive
10、ry of MIL-T-18303 Test Procedures, Preproduction and Inspection for Aircraft Electronic Equipment, format for MIL-N-18307 Nomenclature and Nameplates for Aeronautical Electronic and Associated Equipment 3 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,
11、-,- - MIL-1-81453A 59 W 499790b 007b970 2 MIL-1-81453A (AS) MIL-F-23103 MIL-S-23603 Naval Air Systems Command AR-5 AR- 3 4 Thermal Performance Evaluation, Airborne Electronic Equipment; General Requirement for System Readiness/Maintainability; Avionic Systems Design, General Specification for Microe
12、lectronic Devices Used in Avionic Equipment, Procedures for Selection and Approval of Failure Classification for Reli- ability Testing, General Requirements for DOD-AIMS System Program Office DOD-ATMS 64-900A DD-AIMS 65-1000 DOD-AIMS 69-253 F.-111 Aircraft Exhibit SENX-LM-66-1 dated 5 Aug 66 4 Mode
13、4 Input/Output data, KIR/KXT-A/TSEC. Technical Standard for the ATCRBS/IFF Mark XII systems Performance/Design and Qualification Requirements, Interrogator Set AN/APX-83 (V) Panels-Integrally Illuminated, White F-111 Aircraft Provided by IHSNot for ResaleNo reproduction or networking permitted witho
14、ut license from IHS-,-,-STANDARDS Military MIL-STD-704 MIL-STD-781 Electric Power, Aircraft, Characteristics and Utilization of Reliability Tests, Exponential Distribution MIL-STD-785 MIL-STD-794 MS- 17 3 2 2 Requirements for Reliability Program (For Systems and Equipments) Parts and Equipment, Proc
15、edure for Packaging and Packing of Meter, Time Totalizing, 115 Volt, 400-cycle, Rev. B DRAKNGS DD/AIMS Drawing ins tallat ion in f onnation Wiring NO. X-6CH-1675 Diagram, Interrogator Set AN/APX-76 OTHER Naval Air Systems Command EI-516A Avionics Installation Instructions for Interrogator Set AN/APX
16、-76A(V) and Receive r-Transmitter RT- 9 8 8/A, dated March 31, 1972, ET-516A Bench, Preflight ent of major design objec- tives shall bo the prime consideration. factors shall govern : *3.2.1 Solid State Processes and Microelectronic Modular Assemblies_ - The electronic portion of the equipment shall
17、 be con- structed using solid state processes and microelectronic modular assemblies to the greatest extent possible. microelectronic modular assemblies produced by industrial pro- ducers of demonstrated competence shall be used. In the event production type microelectronic modular assemblies are no
18、t available, the contractor shall first consider establishing (either at the contractors facilities or any other industrial pro8ucers faci- lities) a production line for the microelectronics modular assemblies required, He may utilize conventional electron devices provided the nonsuitability of micr
19、oelectronic modular assemblies is clearly established by the contractor and approved by NAVAIR. In the design and conctmction of microelectronic functional dvices, Specifica- tion AR-5 shall apply. niques, defined as follows, shall be selected in the order of precedence shown : In so doing, the foll
20、owing Production type 3.2.1.1 Microelectronic Techniques - Microelectronic tech- (1) Integrated circuits - An integrated circuit is an assembly in which all of the functional elements, active and passive, are forfied in place by basically the same process techniques. (a) Semiconductor - The function
21、al elements are formed by semiconductor techniques, i.e., diffusion, alloying doping, conductor patterns are deposited. 6 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-NIL-I-81Y53A 57 U 7977706 0076973 MIL-I- 81 45 3A (AS) (b) Thin film - All eleme
22、nts formed by deposi- tion processes. (2) Hybrid circuit - a hybrid circuit is however, provision shall be made internal to the synchronizer SN-416A/APX-76 for disabling the ISLS control. pulse, Intemogations shall be generated for a maximum of five to tien seconds upon each initiation by the operat
23、or except as n-oted in paragraph 3.4.2.3. The interrogation rate shall be timed by a trigger input from the radar and shall be counted down by We interrogatoz as follows: Nominal Radar PRF Range Count Down Ratio 0-400 4 O 0-85 O 850-1250 1250-1650 1650-2OOO 1: 3. 2:1 3:Ji 4:l 5:1 (For prfs above 220
24、0 the SIF and Mode 4 pretriggers will be counted down by at least 2:1 by the trigger delay circuitry in the synchronizer before application to the interrogation count- down circuitry. rate be greater than 450.) In no case shall the resulting interrogation 12 Provided by IHSNot for ResaleNo reproduct
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