JEDEC JESD209-2F-2012 Low Power Double Data Rate 2 (LPDDR2).pdf
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1、JEDEC SOLID STATE TECHNOLOGY ASSOCIATIONJESD209-2FJUNE 2012JEDECSTANDARDLow Power Double Data Rate 2(LPDDR2)(Revision of JESD209-2E, April 2011)SPECIAL DISCLAIMER: JEDEC has received information that certain patents or patent applications may be essential to this standard. However, as of the publica
2、tion date of this standard, no statements regarding an assurance or refusal to license such patents or patent applications have been provided. Contact JEDEC for further information.JEDEC does not make any determination as to the validity or relevancy of such patents or patent applications. Anyone ma
3、king use of the standard assumes all liability resulting from such use. JEDEC disclaims any representation or warranty, express or implied, relating to the standard and its use. NOTICEJEDEC standards and publications contain material that has been prepared, reviewed, and approved through the JEDEC B
4、oard of Directors level and subsequently reviewed and approved by the JEDEC legal counsel.JEDEC standards and publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products
5、, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for use by those other than JEDEC members, whether the standard is to be used either domestically or internationally.JEDEC standards and publications are adopted without regard to whether or not their adop
6、tion may involve patents or articles, materials, or processes. By such action JEDEC does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the JEDEC standards or publications.The information included in JEDEC standards and publications repre
7、sents a sound approach to product specification and application, principally from the solid state device manufacturer viewpoint. Within the JEDEC organization there are procedures whereby a JEDEC standard or publication may be further processed and ultimately become an ANSI standard.No claims to be
8、in conformance with this standard may be made unless all requirements stated in the standard are met.Inquiries, comments, and suggestions relative to the content of this JEDEC standard or publication should be addressed to JEDEC at the address below, or refer to www.jedec.org under Standards and Doc
9、uments for alternative contact information.Published byJEDEC Solid State Technology Association 20133103 North 10th StreetSuite 240 SouthArlington, VA 22201-2107This document may be downloaded free of charge; however JEDEC retains thecopyright on this material. By downloading this file the individua
10、l agrees not tocharge for or resell the resulting material.PRICE: Contact JEDECPrinted in the U.S.A. All rights reservedPLEASE!DONT VIOLATETHELAW!This document is copyrighted by the JEDEC and may not bereproduced without permission.For information, contact:JEDEC Solid State Technology Association310
11、3 North 10th Street, Suite 240 SouthArlington, Virginia 22201-2107or call (703) 907-7559or refer to www.jedec.org under Standards and Document/Copyright Information.Special Disclaimer JEDEC has received information that certain patents or patent applications may be essential to this standard. Howeve
12、r, as of the publication date of this standard, no statements regarding an assurance or refusal to license such patents or patent applications have been provided. Contact JEDEC for further information. JEDEC does not make any determination as to the validity or relevancy of such patents or patent ap
13、plications. Anyone making use of the standard assumes all liability resulting from such use. JEDEC disclaims any representation or warranty, express or implied, relating to the standard and its use.JEDEC Standard No. 209-2FContents-i-Scope. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
14、 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1Package ballout DQS1_t and DQS1_c to the data on DQ8 - DQ15.For x32 DQS0_t and DQS0_c correspond to the data on DQ0 - DQ7, DQS1_t and DQS1_c to the data on DQ8 - DQ15, DQS2_t and DQS2_c to the data on DQ16 - DQ23, DQ
15、S3_t and DQS3_c to the data on DQ24 - DQ31.DM0(x8)DM0-DM1(x16)DM0 - DM3 (x32)Input Input Data Mask: For LPDDR2 devices that do not support the DNV feature, DM is the input mask signal for write data. Input data is masked when DM is sampled HIGH coincident with that input data during a Write access.
16、DM is sampled on both edges of DQS_t. Although DM is for input only, the DM loading shall match the DQ and DQS_t (or DQS_c). DM0 is the input data mask signal for the data on DQ0-7.For x16 and x32 devices, DM1 is the input data mask signal for the data on DQ8-15.For x32 devices, DM2 is the input dat
17、a mask signal for the data on DQ16-23 and DM3 is the input data mask signal for the data on DQ24-31.JEDEC Standard No. 209-2FPage 14NOTE 1 Data includes DQ and DM.DM0/DNV0(x8)DM0/DNV0-DM1/DNV1(x16)DM0/DNV0 - DM3/DNV3 (x32)I/0 Input Data Mask/Data Not Valid: For LPDDR2 devices that support the DNV fe
18、ature, DM/DNV is bidirectional (used for write and read data). It is output with read data, input with write data. DM/DNV is the input mask signal for write data and is an output signal validating a read burst. For data write accesses:Input data is masked when DM/DNV is sampled HIGH coincident with
19、DQ input data during a WRITE access.DM0 is the input data mask signal for the data on DQ0-7.For x16 and x32 devices, DM1 is the input data mask signal for the data on DQ8-15.For x32 devices, DM2 is the input data mask signal for the data on DQ16-23 and DM3 is the input data mask signal for the data
20、on DQ24-31.For data read accesses:See 5.4.2 for detailed description of DNV functionality.DNV0, DNV1, DNV2, and DNV3 are driven coincident with output read data. DNV0, DNV1, DNV2, and DNV3 are driven with the same value and shall be sampled with DQS0, DQS1, DQS2, and DQS3 respectively.The DM/DNV loa
21、ding shall match the DQ and DQS_t (or DQS_c) loading. VDD1Supply Core Power Supply 1: Core power supply for LPDDR2-N and LPDDR2-SX devices.VDD2Supply Core Power Supply 2: Core power supply for LPDDR2-S2B, LPDDR2-S4 and LPDDR2-N-B devices. VDDCASupply Input Receiver Power Supply: Power supply for CA0
22、-9, CKE, CS_n, CK_t, and CK_c input buffers.VDDQSupply I/O Power Supply: Power supply for Data input/output buffers. VACCSupply NVM Acceleration Supply: NVM device specific embedded operation acceleration. VACCenables some NVM device specific functionality. When not used for NVM device specific func
23、tionality, VACC shall be driven to a level of VDD1.VREF(CA)Supply Reference Voltage for CA Command and Control Input Receiver: Reference voltage for all CA0-9, CKE, CS_n, CK_t, and CK_c input buffers.VREF(DQ)Supply Reference Voltage for DQ Input Receiver: Reference voltage for all Data input buffers
24、.VSSSupply GroundVSSCASupply Ground for Input ReceiversVSSQSupply I/O GroundZQ I/O Reference Pin for Output Drive Strength CalibrationName Type DescriptionJEDEC Standard No. 209-2FPage 152.13 LPDDR2 SDRAM AddressingTable 3 LPDDR2 SDRAM AddressingNOTE 1 The least-significant column address C0 is not
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