ISA ADV REACT MEAS CNTRL-2015 Advances in Reactor Measurement and Control.pdf
《ISA ADV REACT MEAS CNTRL-2015 Advances in Reactor Measurement and Control.pdf》由会员分享,可在线阅读,更多相关《ISA ADV REACT MEAS CNTRL-2015 Advances in Reactor Measurement and Control.pdf(324页珍藏版)》请在麦多课文档分享上搜索。
1、Advances in ReactorMeasurement andControlMcMillan-ARCM2015.book Page i Thursday, October 16, 2014 12:12 PMMcMillan-ARCM2015.book Page ii Thursday, October 16, 2014 12:12 PMAdvances in ReactorMeasurement andControlby Gregory K. McMillanMcMillan-ARCM2015.book Page iii Thursday, October 16, 2014 12:12
2、PMNoticeThe information presented in this publication is for the general education of the reader. Because nei-ther the author nor the publisher has any control over the use of the information by the reader, both theauthor and the publisher disclaim any and all liability of any kind arising out of su
3、ch use. The reader isexpected to exercise sound professional judgment in using any of the information presented in a particu-lar application.Additionally, neither the author nor the publisher has investigated or considered the effect of anypatents on the ability of the reader to use any of the infor
4、mation in a particular application. The reader isresponsible for reviewing any possible patents that may affect any particular use of the information pre-sented.Any references to commercial products in the work are cited as examples only. Neither the authornor the publisher endorses any referenced c
5、ommercial product. Any trademarks or tradenames refer-enced belong to the respective owner of the mark or name. Neither the author nor the publisher makesany representation regarding the availability of any referenced commercial product at any time. Themanufacturers instructions on use of any commer
6、cial product must be followed at all times, even if inconflict with the information in this publication.Copyright 2015 International Society of Automation (ISA)All rights reserved. Printed in the United States of America. 10 9 8 7 6 5 4 3 2ISBN 978-0-87664-089-0No part of this work may be reproduced
7、, stored in a retrieval system, or transmitted in any form or byany means, electronic, mechanical, photocopying, recording or otherwise, without the prior written per-mission of the publisher.ISA67 Alexander DriveP.O. Box 12277Research Triangle Park, NC 27709Library of Congress Cataloging-in-Publica
8、tion Data in process.McMillan-ARCM2015.book Page iv Thursday, October 16, 2014 12:12 PMvAcknowledgmentsPublications by Bill Luyben and Greg Shinskey are the source of most of mydeep knowledge in reactor control, particularly in dealing with recycleseffects and open loop unstable processes. Most of t
9、he rest of my knowledgehas been gained by working with and simulating continuous fluidized bedreactors for monomers and batch reactors for polymers, specialty chemicals,ethanol, and biologics.There were many Monsanto and Solutia Directors and Senior Fellows whoplayed a key role, technically and pers
10、onally in my journey as an automationprofessional. Foremost among those who shaped my career was the late Dr.Jim Fair, Honorary Professor Emeritus at the University of Texas, the creatorand first director of the Engineering Technology (ET) Department. Being partof the ET Department allowed access to
11、 the best technical minds in the world,along with the freedom to explore and the encouragement to publish. My sec-ond ET director, Dr. Stan Proctor, shared his extensive knowledge in model-ing and control and provided direction and support. The appreciation of myindependence and humor by my last ET
12、director, Dr. Adrian Hutton, anotherTexan, enabled me to publish many funny and creative articles and books.The knowledge I inherited from the late Vernon Trevathan and gained fromconversations with Senior Fellows at Solutia and Monsanto, including Dr.Henry Chien, Dr. Bob Otto, Dr. Terry Tolliver, a
13、nd Stan Weiner, has been ofinestimable value. When I retired from Solutia, I was fortunate to have the opportunity tobecome a consultant to Emerson Process Management at their headquarters inAustin in 2003. Here I have had access to some of the best minds on the sup-plier side, including James Beall
14、, Terry Blevins, Mark Coughran, LouHeavner, Mike Ott, and Willy Wojsznis. Jim Cahill has helped me to effec-tively use social media. The support by Mark Nixon, manager of DeltaV R there is essentially no inverse response orprocess time constant in these gas reactors. The process dead time, the resi-
15、dence time (volume/flow), is a few seconds for the high flow rate in thesehigh capacity processes. The largest time constant in the loop is the tempera-ture sensor, which leads to possible attenuation and deception. Other gas flowreactors have recycle streams and heat integration that introduce comp
16、lex andfast dynamics. The tuning objective for these reactors is to minimize suddenchanges and overshoot in the PID output rather than in disturbance rejection.PID gains in the range of 1 to 4 are used, as larger sensor lags offer the abilityto increase the PID gain and reduce the amplitude of proce
17、ss oscillations, giv-ing an illusion of better control. This illusion can lead to product quality prob-lems and an increase in the lag by sensor selection, installation, andmaintenance practices. Liquid well-mixed continuous reactors have completely different dynamicsand tuning. The process time con
18、stant is the residence time. The process timeMcMillan-ARCM2015.book Page xi Thursday, October 16, 2014 12:12 PMxii Advances in Reactor Measurement and Controlconstant is large, approaching an hour for slow reactions. The process deadtime is of the turnover time and is generally just a few seconds. I
19、n thesereactors, the process time constant is 100 times or more the process dead time.The tuning rules minimize excursions of the process variable, maximizing dis-turbance rejection. The PID output is changed aggressively to minimize errorsin the PID input. Overshoot of the PID output is necessary t
20、o reach setpoint ina reasonable time frame with PID gains of 10 to 40 being common. The processresponse is approximated as near-integrating, and the integrating process tun-ing rules developed for batch processes are used. Batch processes have an extremely slow response and even more aggressivechang
21、es in the PID output are employed. Overshoot is necessary for the PIDinput to reach a new setpoint. PID gains of 20 to 80 are used for tight control.Runaway processes require high gains for stability. A key feature to enable tight control without upsetting utility systems fromaggressive changes in t
22、he PID output is external reset feedback, while ratelimits on the setpoint being manipulated by the PID output provide direc-tional move suppression. This PID feature will be shown to be helpful inmany other ways for control and optimization of all types of reactors. Despite the importance of reacto
23、r control and the wide variety of processresponses, which leads to a considerable spectrum of control strategies andtuning objectives, this is the first book dedicated to the subject of reactor mea-surement and control from a practitioners perspective. Concepts are devel-oped to help the reader unde
24、rstand the fundamental differences in reactorapplications and provide the ability to improve the performance of nearly alltypes of reactors. McMillan-ARCM2015.book Page xii Thursday, October 16, 2014 12:12 PM1System DynamicsMcMillan-ARCM2015.book Page 1 Thursday, October 16, 2014 12:12 PMMcMillan-AR
- 1.请仔细阅读文档,确保文档完整性,对于不预览、不比对内容而直接下载带来的问题本站不予受理。
- 2.下载的文档,不会出现我们的网址水印。
- 3、该文档所得收入(下载+内容+预览)归上传者、原创作者;如果您是本文档原作者,请点此认领!既往收益都归您。
下载文档到电脑,查找使用更方便
10000 积分 1人已下载
下载 | 加入VIP,交流精品资源 |
- 配套讲稿:
如PPT文件的首页显示word图标,表示该PPT已包含配套word讲稿。双击word图标可打开word文档。
- 特殊限制:
部分文档作品中含有的国旗、国徽等图片,仅作为作品整体效果示例展示,禁止商用。设计者仅对作品中独创性部分享有著作权。
- 关 键 词:
- ISAADVREACTMEASCNTRL2015ADVANCESINREACTORMEASUREMENTANDCONTROLPDF

链接地址:http://www.mydoc123.com/p-789832.html