FORD WSF-M22P5-A1-2014 PRINTED CIRCUIT BOARDS PTF DOUBLE SIDED FLEXIBLE TO BE USED WITH FORD WSS-M99P1111-A .pdf
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1、 ENGINEERING MATERIAL SPECIFICATION Material Name Specification Number Date Action Changes 2014 06 11 N Status No replacement named. L. Sinclair, NA 1996 10 23 Revised Add 3.4.1.4, 3.6.2, 3.8.4; Rev. 3.8.7 R. Gordon 1996 08 05 Activated R. Gordon WP 3948-a Page 1 of 9 PRINTED CIRCUIT BOARDS, PTF, DO
2、UBLE SIDED, WSF-M22P5-A1 FLEXIBLE NOT TO BE USED FOR NEW DESIGN 1. SCOPE This specification defines the performance requirements for a double sided flexible circuit board with polymer thick film (PTF) conductors via connections. A double sided flexible circuit board is defined as a circuit board man
3、ufactured with two layers and is capable of being flexed 180 degrees without damage. 2. APPLICATION This specification was originally released as the performance requirements for flexible circuit boards to be used as the interconnect for electronic modules. 3. REQUIREMENTS 3.1 QUALITY SYSTEM REQUIRE
4、MENTS Material suppliers and part producers must conform to Quality System Requirements, QS-9000. Material specification requirements are to be used for initial qualification of materials. A Control Plan for ongoing production verification is required. This plan must be reviewed and approved by the
5、relevant Ford Materials activity and/or Ford Supplier Technical Assistance (STA) prior to production parts submission. Appropriate statistical tools must be used to analyze process/product data and assure consistent processing of the materials. Part producers using this material in their products, m
6、ust use Ford approved materials and must conform to a process control plan which has been approved by STA and/or the relevant Materials Activity. 3.2 INFRARED SPECTROPHOTOMETRY AND/OR THERMAL ANALYSIS Ford Motor Company, at its option, may conduct infrared and/or thermal analysis of material/parts s
7、upplied to this specification. The IR spectra and thermograms established for initial approval shall constitute the reference standard and shall be kept on file at the designated material laboratory. All samples shall produce IR spectra and thermograms that correspond to the reference standard when
8、tested under the same conditions. 3.3 CONDITIONING AND TEST CONDITIONS ENGINEERING MATERIAL SPECIFICATION WSF-M22P5-A1 WP 3948-b Page 2 of 9 All test values indicated herein are based on material conditioned in a controlled atmosphere of 23 +/- 2 C and 50 +/- 5 % relative humidity for not less than
9、24 h prior to testing and tested under the same conditions unless otherwise specified. 3.4 APPEARANCE Visually inspect the double sided, polymer thick film circuit board under a minimum magnification of 1.75X for the following criteria. 3.4.1 Circuit Traces 3.4.1.1 Conductor width reduction from des
10、ign, max . Conductors greater or equal 20 % to 0.3 mm . Conductors less than 0.3 mm 0.08 mm . Isolated width reduction, max 50 % (Circuit trace width reduction must be less than 2.5 mm in length.) 3.4.1.2 Cracks are not permitted Thickness reductions are allowable provided they meet the minimum cond
11、uctor thickness requirements as designated on the print. 3.4.1.3 Rework of shorts between traces is permitted provided that reworked circuit meets the requirements in para 3.4.1.1. 3.4.1.4 Voids and pinholes are permitted provided the conductor width reduction meets the requirements in para 3.4.1.1.
12、 3.4.2 Spacing Width The minimum width between non-common conductors is 0.15 mm. Small specks or stray, nonelectrically connected, metallization are permitted provided the specks are covered with soldermask that extends a minimum of 0.050 beyond the edge of each speck and a minimum of 0.100 spacing
13、exists to any circuit trace. 3.4.3 Soldermask (Covercoat) ENGINEERING MATERIAL SPECIFICATION WSF-M22P5-A1 WP 3948-b Page 3 of 9 Cracked, peeled or delaminated soldermask is not permissible. Missing soldermask is allowable provided that all conductors intended to be soldermask covered are covered and
14、 have 0.050 overlap into the adjacent space. Voids are allowable provided that voids will not allow entrapment of corrosive liquids. Soldermask on key pads or solder pads is not allowable unless specified by the design. 3.4.4 Component Diagram (Legend Silkscreen) The component diagram must be legibl
15、e from a distance of 25 cm to an observer with vision corrected to 20/20. The component diagram ink is not permitted on key pads or solderable surfaces. 3.4.5 Carbon Ink Missing or smeared carbon ink is permissible provided silver PTF ink is covered and conductor width (para 3.4.1) and spacing (para
16、 3.4.2) are met. 3.4.6 General 3.4.6.1 Conductive Paste Vias All conductive paste vias shall not have evidence of exposed base laminate. Missing holes are not permitted. 3.4.6.2 Nonscreened Through Hole Conductive pastes, metallic nodules, plating, legend silkscreen ink, soldermask or other obstruct
17、ions are not permitted in holes designated to be clear of conductive pastes. Missing holes are not permitted. 3.4.6.3 Delamination Edge delamination shall not extend in from the edge of the part to the nearest conductor by more than 20 % of the nominal conductor to edge spacing. 3.4.6.4 Coverlay Del
18、amination Coverlay delaminations are permissible as long as ENGINEERING MATERIAL SPECIFICATION WSF-M22P5-A1 WP 3948-b Page 4 of 9 the delaminations are random, no larger than 0.025 mm2, and laminated cover coat between parallel conductors is not reduced by more than 50 %. 3.5 DIMENSIONAL 3.5.1 Nonsc
19、reened Through Hole Meets Design and Print requirements The diameter of each nonscreened through hole size on each board on a panel shall be measured using pin gages or an alternative measuring instrument approved by ELD Materials Engineering. 3.5.2 Hole Location Measure the X and Y coordinates of 4
20、 holes, one selected from each of the outer corners of a representative flex circuit. Hole locations shall be determined using an optical comparator. All measurements are to be determined to four decimal places with three place accuracy and be based on the datums defined on the applicable drawing. 3
21、.5.3 External Registration Visually inspect the double sided flexible circuit board under a minimum magnification of 1.75X. 3.5.3.1 Conductive Paste to Hole Location The minimum annular ring is 0.050. 3.5.3.2 Soldermask (Covercoat) or Coverlay to Conductive Paste Conductor Measure the true position
22、location of the soldermask pattern relative to the conductive paste conductor pattern using an optical comparator. All measurements must be determined to four decimal places with three place accuracy. True Position Misregistration, 0.50 mm max 3.5.3.3 Component Diagram (Legend Silkscreen) to Conduct
23、ive Paste Conductor Pattern Measure the true position location of the component ENGINEERING MATERIAL SPECIFICATION WSF-M22P5-A1 WP 3948-b Page 5 of 9 diagram pattern relative to the conductive paste conductor pattern using an optical comparator. All measurements must be determined to four decimal pl
24、aces with three place accuracy. True Position Misregistration, 0.50 mm max 3.6 CONSTRUCTION 3.6.1 Conductive Paste Circuit Thickness (IPC-TM-650, Method 2.1.1) The thickness of each conductive paste layer shall be measured using a microsection per IPC-TM-650, Method 2.1.1. 3.6.2 Conductive Paste Thr
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