ETSI TS 102 922-1-2011 Smart Cards Test specification for the ETSI aspects of the IC USB interface Part 1 Terminal features (V7 2 0 Release 7 Includes Diskette)《智能卡 IC USB接口在ETSI方面.pdf
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1、 ETSI TS 102 922-1 V7.2.0 (2011-11) Smart Cards; Test specification for the ETSI aspects of the IC_USB interface; Part 1: Terminal features (Release 7) floppy3Technical Specification ETSI ETSI TS 102 922-1 V7.2.0 (2011-11)2Release 7 Reference RTS/SCP-00USBTv720 Keywords smart card, terminal, USB ETS
2、I 650 Route des Lucioles F-06921 Sophia Antipolis Cedex - FRANCE Tel.: +33 4 92 94 42 00 Fax: +33 4 93 65 47 16 Siret N 348 623 562 00017 - NAF 742 C Association but non lucratif enregistre la Sous-Prfecture de Grasse (06) N 7803/88 Important notice Individual copies of the present document can be d
3、ownloaded from: http:/www.etsi.org The present document may be made available in more than one electronic version or in print. In any case of existing or perceived difference in contents between such versions, the reference version is the Portable Document Format (PDF). In case of dispute, the refer
4、ence shall be the printing on ETSI printers of the PDF version kept on a specific network drive within ETSI Secretariat. Users of the present document should be aware that the document may be subject to revision or change of status. Information on the current status of this and other ETSI documents
5、is available at http:/portal.etsi.org/tb/status/status.asp If you find errors in the present document, please send your comment to one of the following services: http:/portal.etsi.org/chaircor/ETSI_support.asp Copyright Notification No part may be reproduced except as authorized by written permissio
6、n. The copyright and the foregoing restriction extend to reproduction in all media. European Telecommunications Standards Institute 2011. All rights reserved. DECTTM, PLUGTESTSTM, UMTSTMand the ETSI logo are Trade Marks of ETSI registered for the benefit of its Members. 3GPPTM and LTE are Trade Mark
7、s of ETSI registered for the benefit of its Members and of the 3GPP Organizational Partners. GSM and the GSM logo are Trade Marks registered and owned by the GSM Association. ETSI ETSI TS 102 922-1 V7.2.0 (2011-11)3Release 7 Contents Intellectual Property Rights 6g3Foreword . 6g3Introduction 6g31 Sc
8、ope 7g32 References 7g32.1 Normative references . 7g32.2 Informative references 8g33 Definitions, symbols and abbreviations . 8g33.1 Definitions 8g33.2 Symbols 8g33.3 Abbreviations . 9g33.4 Formats . 9g33.4.1 Format of the table of optional features 9g33.4.2 Format of the applicability table . 9g33.
9、4.3 Status and Notations . 10g34 Test environment 10g34.1 Table of optional features . 10g34.2 Applicability table 11g34.3 Information provided by the device supplier 11g34.4 Test Equipment (TE) 12g34.4.1 Measurement/setting uncertainties 12g34.4.2 Default conditions for DUT operation 12g34.4.2.1 Te
10、mperature 12g34.4.3 Minimum/maximum conditions for DUT operation . 12g34.4.4 Void 12g34.4.5 ATRs to be used by the UICC simulator 12g34.4.5.1 ATR that indicates that UICC is USB capable and indicates support of classes B and C 13g34.4.5.2 Void. 13g34.4.5.3 Void. 13g34.4.6 USB Descriptors to be used
11、by the UICC simulator . 13g34.4.6.1 Single configuration, Single interface . 13g34.4.6.1.1 Device Descriptor (Single Configuraton) 13g34.4.6.1.2 Configuration Descriptor (ICCD Control B) . 14g34.4.6.2 Multiple configurations, Single interface 14g34.4.6.2.1 Device Descriptor (Multiple Configuraton 1)
12、 . 14g34.4.6.2.2 Configuration Descriptors (ICCD Control B and ICCD Bulk) . 15g34.4.6.3 Multiple Configurations, Multiple interfaces 16g34.4.6.3.1 Device Descriptor (Multiple Configuraton 2) . 16g34.4.6.3.2 Configuration Descriptors (ICCD Control B, ICCD Bulk, EEM and MSC) . 17g34.4.6.4 Multiple con
13、figurations, Single interface, Extended APDU . 20g34.4.6.4.1 Device Descriptor (Multiple Configuraton 3) . 20g34.4.6.4.2 Configuration Descriptors (ICCD Control B and ICCD Bulk, Extended APDU) . 21g34.4.6.5 Single Configuration, No ICCD interface support 22g34.4.6.5.1 Device Descriptor (Single Confi
14、guraton) 22g34.4.6.5.2 Configuration Descriptor (EEM and MSC) . 23g34.4.6.6 Multiple configurations, Alternative Single interface . 24g34.4.6.6.1 Device Descriptor (Multiple Configuraton 4) . 24g34.4.6.6.2 Configuration Descriptors (ICCD Bulk and ICCD Control B) . 24g34.5 Test execution 26g34.5.1 Pa
15、rameter variations . 26g34.6 Pass criterion 26g35 Conformance Requirements . 27g35.1 USB UICC system architecture 27g3ETSI ETSI TS 102 922-1 V7.2.0 (2011-11)4Release 7 5.2 Physical characteristics . 27g35.3 Electrical characteristics . 28g35.4 Initial communication establishment procedures . 28g35.5
16、 USB interface operational features . 30g35.6 Protocol stacks for USB UICC applications . 31g35.7 USB Descriptors of a USB UICC 31g35.8 Assigned values for vendor specific USB requests 31g36 Test cases 32g36.1 Void 32g36.2 Void 32g36.3 Basic Electrical Tests . 32g36.3.1 Supply Voltage Value . 32g36.
17、3.1.1 Test case 1: Phase preceding Terminal power on . 32g36.3.1.1.1 Test execution 32g36.3.1.1.2 Initial conditions 32g36.3.1.1.3 Test procedure . 32g36.4 Activation Tests 32g36.4.1 Voltage-Activation 32g36.4.1.1 Test case 1: Selection of voltage class C as lowest supported voltage, no support of c
18、lass B . 32g36.4.1.1.1 Test execution 32g36.4.1.1.2 Initial conditions 33g36.4.1.1.3 Test procedure . 33g36.4.1.2 Test case 2: Selection of voltage class C as lowest supported voltage, with support of class B 33g36.4.1.2.1 Test execution 33g36.4.1.2.2 Initial conditions 33g36.4.1.2.3 Test procedure
19、. 34g36.4.1.3 Void. 34g36.4.1.4 Void. 34g36.4.1.5 Void. 34g36.4.1.6 Test case 6: USB Interface Activation 34g36.4.1.6.1 Test execution 34g36.4.1.6.2 Initial conditions 34g36.4.1.6.3 Test procedure . 35g36.4.1.7 Void. 35g36.5 Initialization Tests 35g36.5.1 Configuration 35g36.5.1.1 Test Case 1: Set a
20、ddress Test at USB Full Speed . 35g36.5.1.1.1 Test execution 35g36.5.1.1.2 Initial conditions 35g36.5.1.1.3 Test procedure . 36g36.5.2 Power Negotiation 36g36.5.2.1 Test case 1: Power Negotiation support 36g36.5.2.1.1 Test execution 36g36.5.2.1.2 Initial conditions 36g36.5.2.1.3 Test procedure . 36g
21、36.5.2.2 Test case 2: Power Negotiation, Voltage Class not supported 36g36.5.2.2.1 Test execution 36g36.5.2.2.2 Initial conditions 36g36.5.2.2.3 Test procedure . 37g36.5.2.3 Test case 3: Power Negotiation, Class B Activation preferred . 37g36.5.2.3.1 Test execution 37g36.5.2.3.2 Initial conditions 3
22、7g36.5.2.3.3 Test procedure . 37g36.5.2.4 Test case 4: Power Negotiation with more than minimum current . 37g36.5.2.4.1 Test execution 37g36.5.2.4.2 Initial conditions 37g36.5.2.4.3 Test procedure . 38g36.5.3 Resume Time Negotiation 38g36.5.3.1 Test case 1: Resume Time Negotiation . 38g36.5.3.1.1 Te
23、st execution 38g36.5.3.1.2 Initial conditions 38g3ETSI ETSI TS 102 922-1 V7.2.0 (2011-11)5Release 7 6.5.3.1.3 Test procedure . 38g36.6 Descriptors . 39g36.6.1 Standard-Descriptors 39g36.6.1.1 Device Descriptor . 39g36.6.1.1.1 Test Case 1: Device Descriptor Test . 39g36.6.1.2 Configuration and Interf
24、ace Descriptors . 39g36.6.1.2.1 Test Case 1: ICCD Control Transfer configuration Test, single interface . 39g36.6.1.2.2 Test Case 2: Multiple ICCD configuration, single interface test . 40g36.6.1.2.3 Test Case 3: Multiple configuration, multiple interfaces test 40g36.6.1.2.4 Test Case 4: Configurati
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