EN ISO 20339-2017 en Non-destructive testing - Equipment for eddy current examination - Array probe characteristics and verification《涡流检测探头阵列特征和验证无损检测设备(ISO 20339 2017)》.pdf

《EN ISO 20339-2017 en Non-destructive testing - Equipment for eddy current examination - Array probe characteristics and verification《涡流检测探头阵列特征和验证无损检测设备(ISO 20339 2017)》.pdf》由会员分享，可在线阅读，更多相关《EN ISO 20339-2017 en Non-destructive testing - Equipment for eddy current examination - Array probe characteristics and verification《涡流检测探头阵列特征和验证无损检测设备(ISO 20339 2017)》.pdf（32页珍藏版）》请在麦多课文档分享上搜索。

1、Non-destructive testing Equipment for eddy current examination Array probe characteristics and verificationBS EN ISO 20339:2017BSI Standards PublicationWB11885_BSI_StandardCovs_2013_AW.indd 1 15/05/2013 15:06National forewordThis British Standard is the UK implementation of EN ISO 20339:2017. It is

2、identical to ISO 20339:2017. The UK participation in its preparation was entrusted to Technical Committee WEE/46, Non-destructive testing.A list of organizations represented on this committee can be obtained on request to its secretary.This publication does not purport to include all the necessary p

3、rovisions of a contract. Users are responsible for its correct application. The British Standards Institution 2017 Published by BSI Standards Limited 2017ISBN 978 0 580 91038 8ICS 19.100Compliance with a British Standard cannot confer immunity from legal obligations. This British Standard was publis

4、hed under the authority of the Standards Policy and Strategy Committee on 30 June 2017.Amendments/corrigenda issued since publicationDate Text affectedBRITISH STANDARDBS EN ISO 20339:2017EUROPEAN STANDARDNORME EUROPENNEEUROPISCHE NORMEN ISO 20339April 2017ICS 19.100EUROPEAN COMMITTEE FOR STANDARDIZA

5、TIONCOMIT EUROPEN DE NORMALISATIONEUROPISCHES KOMITEE FR NORMUNGCEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels 2017 CEN Ref. No. EN ISO 20339:2017: EAll rights of exploitation in any form and by any means reserved worldwide for CEN national MembersNon-destructive testing - Equipmen

6、t for eddy current examination - Array probe characteristics and verification (ISO 20339:2017)Essais non destructifs - Appareillage pour examen par courants de Foucault - Caractristiques des capteurs multilments et vrifications (ISO 20339:2017)Zerstrungsfreie Prfung - Technische Ausrstung fr die Wir

7、belstromprfung - Kenngren von Sensorarrays und deren Verifizierung (ISO 20339:2017)This European Standard was approved by CEN on 5 February 2017.CEN members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a

8、national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CEN member.This European Standard exists in three official versions (English, French, German). A

9、version in any other language made by translation under the responsibility of a CEN member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions.CEN members are the national standards bodies of Austria, Belgium, Bulgaria, Croatia, Cyprus

10、, Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and Unit

11、ed Kingdom.English VersionEN ISO 20339:2017 (E)European forewordThis document (EN ISO 20339:2017) has been prepared by Technical Committee ISO/TC 135 “Non-destructive testing“ in collaboration with Technical Committee CEN/TC 138 “Non-destructive testing” the secretariat of which is held by AFNOR.Thi

12、s European Standard shall be given the status of a national standard, either by publication of an identical text or by endorsement, at the latest by October 2017, and conflicting national standards shall be withdrawn at the latest by October 2017.Attention is drawn to the possibility that some of th

13、e elements of this document may be the subject of patent rights. CEN and/or CENELEC shall not be held responsible for identifying any or all such patent rights.According to the CEN-CENELEC Internal Regulations, the national standards organizations of the following countries are bound to implement th

14、is European Standard: Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Romania, Serbia

15、, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom.Endorsement noticeThe text of ISO 20339:2017 has been approved by CEN as EN ISO 20339:2017 without any modification.iiBS EN ISO 20339:2017ISO 20339:2017(E)Foreword v1 Scope . 12 Normative references 13 Terms and definiti

16、ons . 14 Probe and interconnecting elements characteristics 24.1 General characteristics . 24.1.1 Application 24.1.2 Probe types . 24.1.3 Interconnecting elements 24.1.4 Physical characteristics 24.1.5 Safety 34.1.6 Environmental conditions . 34.2 Electrical characteristics 34.3 Functional character

17、istics . 35 Verification . 45.1 Level of verifications 45.2 Characteristics to be verified 46 Measurement of electrical and functional characteristics of an array probe . 56.1 Electrical characteristics 56.1.1 General 56.1.2 Measurement conditions 56.1.3 Impedance of coil elements 56.1.4 Impedance o

18、f a pattern 56.1.5 Channel assignment Sequencing 66.1.6 Cross-talk 66.2 Functional characteristics . 66.2.1 General 66.2.2 Measurement conditions 67 Surface array probes 87.1 Reference blocks 87.2 Probe motion 97.3 Reference signal Normalization 97.4 Edge effect (measurable in the case of simple geo

19、metry, e.g. metal sheets, disks).107.5 Response to a slot 117.6 Response to a hole 127.7 Length of coverage 127.8 Variation in sensitivity between patterns. 127.9 Minimum slot length for constant probe response 137.10 Lift-off effect . 137.11 Effect of probe clearance on slot response 137.12 Effecti

20、ve depth of detection of a sub-surface slot 147.13 Resolution 147.14 Defective element or pattern . 148 Coaxial array probes 148.1 General conditions 148.2 Reference blocks . 148.3 Reference signal 168.4 Absence of defective elements 178.5 Position mark of the probe (mainly for positioning) 178.6 En

21、d effect 178.7 Length of coverage 178.8 Homogeneity of axial response 18 ISO 2017 All rights reserved iiiContents PageBS EN ISO 20339:2017ISO 20339:2017(E)8.9 Eccentricity effect 198.10 Fill effect 198.11 Effective depth of penetration 198.12 Effective depth of detection under ligament 199 Influence

22、 of interconnecting elements .19Annex A (informative) Simulation of surface probe resolution 20iv ISO 2017 All rights reservedBS EN ISO 20339:2017ISO 20339:2017(E)ForewordISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO member bodie

23、s). The work of preparing International Standards is normally carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been established has the right to be represented on that committee. International organizations, governmental and n

24、on-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.The procedures used to develop this document and those intended for its further maintenance are descr

25、ibed in the ISO/IEC Directives, Part 1. In particular the different approval criteria needed for the different types of ISO documents should be noted. This document was drafted in accordance with the editorial rules of the ISO/IEC Directives, Part 2 (see www.iso.org/directives).Attention is drawn to

26、 the possibility that some of the elements of this document may be the subject of patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of any patent rights identified during the development of the document will be in the Introduction and/or on the I

27、SO list of patent declarations received (see www.iso.org/patents).Any trade name used in this document is information given for the convenience of users and does not constitute an endorsement.For an explanation on the voluntary nature of standards, the meaning of ISO specific terms and expressions r

28、elated to conformity assessment, as well as information about ISOs adherence to the World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT) see the following URL: www.iso.org/iso/foreword.html.This document was prepared by Technical Committee ISO/TC 135, Non-destructive te

29、sting, Subcommittee SC 4, Eddy current testing. ISO 2017 All rights reserved vBS EN ISO 20339:2017This page deliberately left blankNon-destructive testing Equipment for eddy current examination Array probe characteristics and verification1 ScopeThis document identifies the functional characteristics

30、 of eddy current array probes and their interconnecting elements and provides methods for their measurement and verification.The evaluation of these characteristics permits a well-defined description and comparability of eddy current array probes.Where relevant, this document gives recommendations f

31、or acceptance criteria for the characteristics.2 Normative referencesThe following documents are referred to in the text in such a way that some or all of their content constitutes requirements of this document. For dated references, only the edition cited applies. For undated references, the latest

32、 edition of the referenced document (including any amendments) applies.ISO 12718 , Non-destructive testing Eddy current testing VocabularyISO 15548-1 , Non-destructive testing Equipment for eddy current examination Part 1: Instrument characteristics and verificationISO 15548-2:2013 , Non-destructive

33、 testing Equipment for eddy current examination Part 2: Probe characteristics and verification3 Terms and definitionsFor the purposes of this document, the terms and definitions given in ISO 12718 and the following apply.ISO and IEC maintain terminological databases for use in standardization at the

34、 following addresses: ISO Online browsing platform: available at http:/www.iso.org/obp IEC Electropedia: available at http:/www.electropedia.org/ 3.1elementsingle physical component such as a coil, a GMR or a Hall probe which has a basic function of excitation or reception3.2patternsingle physical a

35、nd electronic arrangement of simultaneously active elements3.3sequencingchronology of the activation of patterns3.4thresholdlowest acceptable sensitivity value defined in an application documentINTERNATIONAL STANDARD ISO 20339:2017(E) ISO 2017 All rights reserved 1BS EN ISO 20339:2017ISO 20339:2017(

36、E)4 Probe and interconnecting elements characteristics4.1 General characteristics4.1.1 ApplicationProbes and interconnecting elements are selected to satisfy the requirements of the intended application.The design is influenced by the instrument with which they are used.4.1.2 Probe typesThe probe is

37、 described by the following: type of material to be examined, i.e. ferromagnetic, non-ferromagnetic with high or low conductivity; the geometry of the examined zone; whether it is conformable or not; family, e.g. coaxial probe, surface probe; the receiver type; the number of elements (transmitters a

38、nd/or receivers); shape and assembly of elements and spacing; purpose of the examination, e.g. detection of discontinuities, sorting or thickness measurement, etc.; specific features, e.g. focused, shielded, etc.; the function of the elements (transmission or reception) as well as the type of measur

39、ement (absolute or differential) may coexist in the same array probe depending on the patterns, the sequencing and the instrument software.4.1.3 Interconnecting elementsThey may include the following: active devices, e.g. multiplexer (built-in or external), amplifier; cables and/or extensions; conne

40、ctors; slip rings; rotating heads; polarizers.4.1.4 Physical characteristicsThe following are to be stated among others: external size and shape; weight; information for mechanical mounting;2 ISO 2017 All rights reservedBS EN ISO 20339:2017ISO 20339:2017(E) model number and serial number; material o

41、f probe housing; composition and thickness of facing material; presence and purpose of core or shield; type of interconnecting elements (see 4.1.3); at least one position mark (electrical centre; see 8.5).4.1.5 SafetyThe probe and its interconnecting elements shall meet the applicable safety regulat

42、ions regarding electrical hazard, surface temperature, or explosion.Normal use of the probe should not create a hazard.4.1.6 Environmental conditionsThe temperature and humidity for normal use, storage and transport should be specified for the probe and its interconnecting elements.The tolerance of

43、the probe and its interconnecting elements to the effects of interference noise and electromagnetic radiation shall conform to electromagnetic compatibility (EMC) regulations.Materials used in the manufacture of the probe should be resistant to contaminants.4.2 Electrical characteristicsThe electric

44、al characteristics of a probe connected to a specified length and type of cable are the following: recommended range of excitation voltage for safe operation; recommended range of excitation frequencies.The electrical characteristics of any extension cable are the following: resistance and capacitiv

45、e reactance per length unit.4.3 Functional characteristicsThe functional characteristics of an array probe shall be determined for a defined system.The measurement of the functional characteristics of a probe requires the use of reference blocks. The material used for the reference block is determin

46、ed by the application.The functional characteristics of a probe are the following: angular sensitivity; response to elementary discontinuities or variations (hole, slot, deposit, etc.); length and width of coverage for a given pattern; area of coverage for a given pattern; minimum dimensions of disc

47、ontinuities for constant response; penetration characteristics; ISO 2017 All rights reserved 3BS EN ISO 20339:2017ISO 20339:2017(E) geometric effects; cross-talk; number of dead elements.These characteristics cannot be used alone to establish the performance (e.g. resolution, largest undetectable di

48、scontinuity, etc.) of the probe in a given test system for a given application.When relevant, the functional characteristics shall be measured on the probe with the interconnecting elements required by the application.5 Verification5.1 Level of verificationsTwo levels of verification may be required

49、:a) basic level: addresses detection performance;b) advanced level: addresses characterization performance: verification of a motion system where there is a need for mechanization of some measurements (movement of the probe); digitization and scanning speed: number of measurement points per millimetre.The qualification of a process which may imply an agreement between manufacturer and customer is not considered in this document.5.2 Characteristics to be verifiedThe characteristics to