EN 62779-2-2016 en Semiconductor devices - Semiconductor interface for human body communication - Part 2 Characterization of interfacing performances.pdf
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1、Semiconductor devices Semiconductor interface forhuman body communicationPart 2: Characterization of interfacing performancesBS EN 62779-2:2016BSI Standards PublicationNational forewordThis British Standard is the UK implementation of EN 62779-2:2016. It isidentical to IEC 62779-2:2016.The UK partic
2、ipation in its preparation was entrusted to TechnicalCommittee EPL/47, Semiconductors.A list of organizations represented on this committee can be obtained onrequest to its secretary.This publication does not purport to include all the necessary provisions ofa contract. Users are responsible for its
3、 correct application. The British Standards Institution 2016.Published by BSI Standards Limited 2016ISBN 978 0 580 78702 7ICS 31.080.01Compliance with a British Standard cannot confer immunity fromlegal obligations.This British Standard was published under the authority of theStandards Policy and St
4、rategy Committee on 30 June 2016.Amendments/corrigenda issued since publicationDate Text affectedBRITISH STANDARDBS EN 62779-2:2016EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 62779-2 May 2016 ICS 31.080.01 English Version Semiconductor devices - Semiconductor interface for human body commun
5、ication - Part 2: Characterization of interfacing performances (IEC 62779-2:2016) Dispositifs semiconducteurs - Interface semiconducteurs pour les communications via le corps humain - Partie 2: Caractrisation des performances dinterfaage (IEC 62779-2:2016) Halbleiterbauelemente - Halbleiterschnittst
6、elle zur Kommunikation ber den menschlichen Krper - Teil 2: Beschreibung der Schnittstellenfunktion (IEC 62779-2:2016) This European Standard was approved by CENELEC on 2016-03-24. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving
7、 this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in three of
8、ficial versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are the national electrote
9、chnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania
10、, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels 2
11、016 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members. Ref. No. EN 62779-2:2016 EBS EN 62779-2:2016EN 62779-2:2016 2 European foreword The text of document 47/2268/FDIS, future edition 1 of IEC 62779-2, prepared by IEC/TC 47 “Semiconductor devices
12、“ was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 62779-2:2016. The following dates are fixed: g120 latest date by which the document has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2016-12-24 g120 latest d
13、ate by which the national standards conflicting with the document have to be withdrawn (dow) 2019-03-24 Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC and/or CEN shall not be held responsible for identifying any or all su
14、ch patent rights. Endorsement notice The text of the International Standard IEC 62779-2:2016 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following note has to be added for the standard indicated : IEC 62779 NOTE Harmonized i
15、n EN 62779 series. BS EN 62779-2:2016 2 IEC 62779-2:2016 IEC 2016 CONTENTS FOREWORD . 3 INTRODUCTION . 5 1 Scope 6 2 Normative references. 6 3 Terms, definitions and letter symbols . 6 3.1 General terms . 6 3.2 Signal characteristics 9 3.3 Letter symbols 11 4 Measurement of electrical performances o
16、f electrode . 11 4.1 Measurement setup . 11 4.2 Measurement apparatus and signal specifications 12 4.2.1 Transmitter and receiver module 12 4.2.2 Synchronization module . 13 4.2.3 Measurement equipment 13 4.2.4 Signal specifications 13 4.3 Measurement procedure 14 4.3.1 General . 14 4.3.2 Attachment
17、 of transmitter and receiver modules 14 4.3.3 Transmission of pulse and synchronization signals . 14 4.3.4 Synchronization of measurement equipment . 14 4.3.5 Signal processing in receiver module 14 4.3.6 Measurement of pulse and processed signal . 14 4.3.7 Compensation for signal processing . 14 4.
18、3.8 Computation of impulse response and complex transfer function . 14 4.4 Post processing for electrode performances . 14 4.4.1 General . 14 4.4.2 In-band average signal-loss . 14 4.4.3 In-band average phase-shift . 15 4.4.4 RMS delay . 15 4.4.5 Coherent bandwidth . 15 Bibliography . 17 Figure 1 Pu
19、lse signal . 8 Figure 2 Synchronization signal 9 Figure 3 Measurement setup 12 Table 1 Letter symbols . 11 BS EN 62779-2:2016IEC 62779-2:2016 IEC 2016 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ SEMICONDUCTOR DEVICES SEMICONDUCTOR INTERFACE FOR HUMAN BODY COMMUNICATION Part 2: Characterization of
20、interfacing performances FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerni
21、ng standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their p
22、reparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates close
23、ly with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevan
24、t subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the tec
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