EN 62435-1-2017 en Electronic components - Long-term storage of electronic semiconductor devices - Part 1 General.pdf

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1、Electronic components Long-term storage of electronic semiconductor devicesPart 1: General (IEC 62435-1:2017)BS EN 62435-1:2017BSI Standards PublicationWB11885_BSI_StandardCovs_2013_AW.indd 1 15/05/2013 15:06EUROPEAN STANDARDNORME EUROPENNEEUROPISCHE NORMEN 62435-1April 2017ICS 31.020English Version

2、Electronic components - Long-term storage of electronicsemiconductor devices - Part 1: General(IEC 62435-1:2017)Composants lectroniques - Stockage de longue dure desdispositifs lectroniques semiconducteurs -Partie 1: Gnralits(IEC 62435-1:2017)Elektronische Bauteile - Langzeitlagerung elektronischerH

3、albleiterbauelemente - Teil 1: Allgemeines(IEC 62435-1:2017)This European Standard was approved by CENELEC on 2017-02-24. CENELEC members are bound to comply with the CEN/CENELECInternal Regulations which stipulate the conditions for giving this European Standard the status of a national standard wi

4、thout any alteration.Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member.This European Standard exists in three official versions (English, French, German). A version in any ot

5、her language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions.CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cypr

6、us, the Czech Republic,Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden,Switzerland, Turkey a

7、nd the United Kingdom.European Committee for Electrotechnical StandardizationComit Europen de Normalisation ElectrotechniqueEuropisches Komitee fr Elektrotechnische NormungCEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels 2017 CENELEC All rights of exploitation in any form and by any

8、means reserved worldwide for CENELEC Members.Ref. No. EN 62435-1:2017 ENational forewordThis British Standard is the UK implementation of EN 62435-1:2017. It is identical to IEC 62435-1:2017.The UK participation in its preparation was entrusted to Technical Committee EPL/47, Semiconductors.A list of

9、 organizations represented on this committee can be obtained on request to its secretary.This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. The British Standards Institution 2017 Published by BSI Standards Limit

10、ed 2017ISBN 978 0 580 83548 3ICS 31.020Compliance with a British Standard cannot confer immunity from legal obligations.This British Standard was published under the authority of the Standards Policy and Strategy Committee on 31 August 2017.Amendments/corrigenda issued since publicationDate Text aff

11、ectedBRITISH STANDARDBS EN 624351:2017EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 62435-1 April 2017 ICS 31.020 English Version Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General (IEC 62435-1:2017) Composants lectroniques - Stockage de longue dur

12、e des dispositifs lectroniques semiconducteurs - Partie 1: Gnralits (IEC 62435-1:2017) Elektronische Bauteile - Langzeitlagerung elektronischer Halbleiterbauelemente - Teil 1: Allgemeines (IEC 62435-1:2017) This European Standard was approved by CENELEC on 2017-02-24. CENELEC members are bound to co

13、mply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENEL

14、EC Management Centre or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre

15、has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy,

16、Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee

17、 fr Elektrotechnische Normung CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels 2017 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members. Ref. No. EN 62435-1:2017 E BS EN 624351:2017EN 62435-1:2017 2 European foreword The text of docu

18、ment 47/2326/FDIS, future edition 1 of IEC 62435-1, prepared by IEC/TC 47 “Semiconductor devices“ was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 62435-1:2017. The following dates are fixed: latest date by which the document has to be implemented at national level by pub

19、lication of an identical national standard or by endorsement (dop) 2017-11-24 latest date by which the national standards conflicting with the document have to be withdrawn (dow) 2020-02-24 Attention is drawn to the possibility that some of the elements of this document may be the subject of patent

20、rights. CENELEC and/or CEN shall not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 62435-1:2017 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the f

21、ollowing notes have to be added for the standards indicated: IEC 60068-2-17:1994 NOTE Harmonized as EN 60068-2-17:1994 (not modified). IEC 60068-2-20:2008 NOTE Harmonized as EN 60068-2-20:2008 (not modified). IEC 60749-20-1 NOTE Harmonized as EN 60749-20-1. IEC 60749-21 NOTE Harmonized as EN 60749-2

22、1. IEC 61340-5-1:2007 NOTE Harmonized as EN 61340-5-1:2007 (not modified). IEC/TR 61340-5-2:2007 NOTE Harmonized as CLC/TR 61340-5-2:2008 (not modified). IEC 62258 NOTE Harmonized in EN 62258 / CLC/TR 62258 series. IEC/TR 62258-3 NOTE Harmonized as CLC/TR 62258-3. IEC 62402 NOTE Harmonized as EN 624

23、02. IEC 62435-2 NOTE Harmonized as EN 62435-2. IEC 62435-5 NOTE Harmonized as EN 62435-5. ISO 14644 NOTE Harmonized in EN ISO 14644 series. BS EN 624351:2017EN 62435-1:2017 2 European foreword The text of document 47/2326/FDIS, future edition 1 of IEC 62435-1, prepared by IEC/TC 47 “Semiconductor de

24、vices“ was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 62435-1:2017. The following dates are fixed: latest date by which the document has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2017-11-24 latest date b

25、y which the national standards conflicting with the document have to be withdrawn (dow) 2020-02-24 Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC and/or CEN shall not be held responsible for identifying any or all such pa

26、tent rights. Endorsement notice The text of the International Standard IEC 62435-1:2017 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following notes have to be added for the standards indicated: IEC 60068-2-17:1994 NOTE Harmo

27、nized as EN 60068-2-17:1994 (not modified). IEC 60068-2-20:2008 NOTE Harmonized as EN 60068-2-20:2008 (not modified). IEC 60749-20-1 NOTE Harmonized as EN 60749-20-1. IEC 60749-21 NOTE Harmonized as EN 60749-21. IEC 61340-5-1:2007 NOTE Harmonized as EN 61340-5-1:2007 (not modified). IEC/TR 61340-5-2

28、:2007 NOTE Harmonized as CLC/TR 61340-5-2:2008 (not modified). IEC 62258 NOTE Harmonized in EN 62258 / CLC/TR 62258 series. IEC/TR 62258-3 NOTE Harmonized as CLC/TR 62258-3. IEC 62402 NOTE Harmonized as EN 62402. IEC 62435-2 NOTE Harmonized as EN 62435-2. IEC 62435-5 NOTE Harmonized as EN 62435-5. I

29、SO 14644 NOTE Harmonized in EN ISO 14644 series. EN 62435-1:2017 3 Annex ZA (normative) Normative references to international publications with their corresponding European publications The following documents, in whole or in part, are normatively referenced in this document and are indispensable fo

30、r its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the relevant EN/H

31、D applies. NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here: www.cenelec.eu. Publication Year Title EN/HD Year IEC 60749-20-1 - Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling

32、and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat EN 60749-20-1 - BS EN 624351:2017This page deliberately left blank 2 IEC 62435-1:2017 IEC 2017 CONTENTS FOREWORD . 4 INTRODUCTION . 6 1 Scope 8 2 Normative references 8 3 Terms definitions and abbre

33、viated terms . 8 3.1 Terms and definitions 8 3.2 Abbreviations 9 4 Purpose of long-term storage 9 4.1 General . 9 4.2 Storage decision criteria . 10 4.2.1 Advantages . 10 4.2.2 Hazards . 10 4.2.3 Storage cost 11 4.2.4 Decision criteria . 12 4.3 Reasons and methodology 12 4.4 Market forces 13 4.5 Ris

34、k mitigation and insurance . 13 4.6 Obsolescence mitigation . 13 5 Logistics 13 5.1 Procurement requirements 13 5.1.1 List of components 13 5.1.2 Quantity of components to be stored . 14 5.1.3 When is it worth keeping in stock? . 14 5.1.4 Procurement recommendations . 14 5.2 Elementary storage unit

35、15 5.3 Stock management . 15 5.4 Redundancy 15 5.5 Storage regimen . 15 5.5.1 Storage concerns 15 5.5.2 Identification and traceability . 15 5.6 Removal from storage . 16 5.6.1 Precautions . 16 5.6.2 Stock rotation 16 5.7 Periodic check of the components . 16 5.7.1 General . 16 5.7.2 Objectives . 17

36、 5.7.3 Periodicity . 17 5.7.4 Tests during periodic check . 17 6 Storage considerations for devices after card (or other) attachment. 17 7 Handling 18 8 Inspection 18 9 Inventory control process . 18 10 Transportation . 18 11 Lead finishes . 18 12 Kitting and lot control . 18 2 IEC 62435-1:2017 IEC

37、2017 CONTENTS FOREWORD . 4 INTRODUCTION . 6 1 Scope 8 2 Normative references 8 3 Terms definitions and abbreviated terms . 8 3.1 Terms and definitions 8 3.2 Abbreviations 9 4 Purpose of long-term storage 9 4.1 General . 9 4.2 Storage decision criteria . 10 4.2.1 Advantages . 10 4.2.2 Hazards . 10 4.

38、2.3 Storage cost 11 4.2.4 Decision criteria . 12 4.3 Reasons and methodology 12 4.4 Market forces 13 4.5 Risk mitigation and insurance . 13 4.6 Obsolescence mitigation . 13 5 Logistics 13 5.1 Procurement requirements 13 5.1.1 List of components 13 5.1.2 Quantity of components to be stored . 14 5.1.3

39、 When is it worth keeping in stock? . 14 5.1.4 Procurement recommendations . 14 5.2 Elementary storage unit 15 5.3 Stock management . 15 5.4 Redundancy 15 5.5 Storage regimen . 15 5.5.1 Storage concerns 15 5.5.2 Identification and traceability . 15 5.6 Removal from storage . 16 5.6.1 Precautions . 1

40、6 5.6.2 Stock rotation 16 5.7 Periodic check of the components . 16 5.7.1 General . 16 5.7.2 Objectives . 17 5.7.3 Periodicity . 17 5.7.4 Tests during periodic check . 17 6 Storage considerations for devices after card (or other) attachment. 17 7 Handling 18 8 Inspection 18 9 Inventory control proce

41、ss . 18 10 Transportation . 18 11 Lead finishes . 18 12 Kitting and lot control . 18 BS EN 624351:2017IEC 62435-1:2017 IEC 2017 3 13 Validation 19 14 Unplanned storage and types of storage 19 14.1 Types of storage . 19 14.2 Unplanned storage 19 15 Other things to store in addition to the components

42、. 20 15.1 Relevant data . 20 15.2 Equipment 20 16 Storage facility 20 16.1 Cost of ownership . 20 16.2 Physical security and safety 20 16.3 Location and ambient environment 20 17 Policies . 21 17.1 General . 21 17.2 Supply chain . 21 17.3 Re-starting the manufacturing chain 21 18 Legislation and env

43、ironmental issues 21 Annex A (informative) Example checklist for project managers 22 Annex B (normative) Example checklist for long-term storage facilities 24 Annex C (informative) Example of a component list . 26 C.1 Component list 26 C.2 Data description 27 Annex D (informative) Examples of period

44、ic and/or de-stocking tests . 28 Annex E (informative) Parameters influencing the quantity of components to be stored 30 Bibliography 31 Table 1 Storage hazards 11 Table A.1 Example checklist for project managers . 22 Table B.1 Example checklist for storage facilities . 24 Table C.1 Component list .

45、 26 Table D.1 Periodic and/or de-stocking tests . 28 BS EN 624351:2017IEC 62435-1:2017 IEC 2017 3 13 Validation 19 14 Unplanned storage and types of storage 19 14.1 Types of storage . 19 14.2 Unplanned storage 19 15 Other things to store in addition to the components . 20 15.1 Relevant data . 20 15.

46、2 Equipment 20 16 Storage facility 20 16.1 Cost of ownership . 20 16.2 Physical security and safety 20 16.3 Location and ambient environment 20 17 Policies . 21 17.1 General . 21 17.2 Supply chain . 21 17.3 Re-starting the manufacturing chain 21 18 Legislation and environmental issues 21 Annex A (in

47、formative) Example checklist for project managers 22 Annex B (normative) Example checklist for long-term storage facilities 24 Annex C (informative) Example of a component list . 26 C.1 Component list 26 C.2 Data description 27 Annex D (informative) Examples of periodic and/or de-stocking tests . 28

48、 Annex E (informative) Parameters influencing the quantity of components to be stored 30 Bibliography 31 Table 1 Storage hazards 11 Table A.1 Example checklist for project managers . 22 Table B.1 Example checklist for storage facilities . 24 Table C.1 Component list . 26 Table D.1 Periodic and/or de

49、-stocking tests . 28 4 IEC 62435-1:2017 IEC 2017 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ ELECTRONIC COMPONENTS LONG-TERM STORAGE OF ELECTRONIC SEMICONDUCTOR DEVICES Part 1: General FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization