EN 61788-15-2011 en Superconductivity - Part 15 Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies《超导性 第15部分 电子特性.pdf
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1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI Standards PublicationSuperconductivityPart 15: Electronic characteristic measurements Intrinsic surface impedance of superconductor films at microwave frequenciesBS EN 61788-15:2011Incorporating corr
2、igendum March 2012National forewordThis British Standard is the UK implementation of EN 61788-15:2011. It is identical to IEC 61788-15:2011.The UK participation in its preparation was entrusted to Technical Committee L/-/90 Super Conductivity.A list of organizations represented on this committee can
3、 be obtained on request to its secretary.This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. The British Standards Institution 2012Published by BSI Standards Limited 2012ISBN 978 0 580 78739 3 ICS 17.220.20; 29.0
4、50Compliance with a British Standard cannot confer immunity from legal obligations.This British Standard was published under the authority of the Standards Policy and Strategy Committee on 29 February 2012.Amendments/corrigenda issued since publicationAmd. No. Date Text affectedBRITISH STANDARDBS EN
5、 61788-15:201131 March 2012 Missing CENELEC pages insertedEUROPEAN STANDARD EN 61788-15 NORME EUROPENNE EUROPISCHE NORM December 2011 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Manag
6、ement Centre: Avenue Marnix 17, B - 1000 Brussels 2011 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 61788-15:2011 E ICS 29.050 English version Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surf
7、ace impedance of superconductor films at microwave frequencies (IEC 61788-15:2011) Supraconductivit - Partie 15: Mesures de caractristiques lectroniques - Impdance de surface intrinsque de films supraconducteurs aux frquences micro-ondes (CEI 61788-15:2011) Supraleitfhigkeit - Teil 15: Messungen der
8、 elektronischen Charakteristik - Oberflchenimpedanz von Supraleiterschichten bei Mikrowellenfrequenzen (IEC 61788-15:2011) This European Standard was approved by CENELEC on 2011-11-28. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for gi
9、ving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in thre
10、e official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are the national elect
11、rotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden
12、, Switzerland and the United Kingdom. BS EN 61788-15:2011 EN 61788-15:2011 Foreword The text of document 90/280/FDIS, future edition 1 of IEC 61788-15, prepared by IEC/TC 90 “Superconductivity“ was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 61788-15:2011. The following
13、dates are fixed: latest date by which the document has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2012-08-28 latest date by which the national standards conflicting with the document have to be withdrawn (dow) 2014-11-28 Attention is
14、drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC and/or CEN shall not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 61788-15:2011 was approved by CENELEC
15、 as a European Standard without any modification. BS EN 61788-15:2011 EN 61788-15:2011 Annex ZA (normative) Normative references to international publications with their corresponding European publications The following referenced documents are indispensable for the application of this document. For
16、 dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publication Y
17、ear Title EN/HD Year IEC 60050-815 2000 International Electrotechnical Vocabulary (IEV) - Part 815: Superconductivity - - IEC 61788-7 2006 Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of superconductors at microwave frequencies EN 61788-7 2006 61788-15 IEC:
18、2011 CONTENTS FOREWORD 4 INTRODUCTION . 6 1 Scope . . 7 2 Normative references . 7 3 Terms and definitions . 7 4 Requirements . 8 5 Apparatus . 9 5.1 Measurement equipment . 9 5.2 Measurement apparatus . 9 5.3 Dielectric rods . 13 5.4 Superconductor films and copper cavity . 14 6 Measurement procedu
19、re . 14 6.1 Set-up . 14 6.2 Measurement of the reference level. 14 6.3 Measurement of the RSof oxygen-free high purity copper . 14 6.4 Determination of the effective RSof superconductor films and tan of standard dielectric rods . 17 6.5 Determination of the penetration depth 18 6.6 Determination of
20、the intrinsic surface impedance . 20 7 Uncertainty of the test method . . 21 7.1 Measurement of unloaded quality factor . 21 7.2 Measurement of loss tangent. . 21 7.3 Temperature . 22 7.4 Specimen and holder support structure . . 22 8 Test Report 22 8.1 Identification of test specimen . . 22 8.2 Rep
21、ort of the intrinsic ZSvalues . 22 8.3 Report of the test conditions 22 Annex A (informative) Additional information relating to clauses 1 to 8 . . 24 Annex B (informative) Uncertainty considerations . 41 Bibliography . 45 Figure 1 Schematic diagram for the measurement equipment for the intrinsic ZS
22、of HTS films at cryogenic temperatures 10 Figure 2 Schematic diagram of a dielectric resonator with a switch for thermal connection . 10 Figure 3 Typical dielectric resonator with a movable top plate . 11 Figure 4 Switch block for thermal connection . 12 Figure 5 Dielectric resonator assembled with
23、a switch block for thermal connection 13 Figure 6 A typical resonance peak. Insertion attenuation IA, resonant frequency f0 and half power bandwidth f3dBare defined . 16 Figure 7 Reflection scattering parameters S11and S2218 Figure 8 Definitions for terms in Table 5 . 22 Figure A.1 Schematic diagram
24、 for the measurement system . 24 Figure A.2 A motion stage using step motors . 25 BS EN 61788-15:201161788-15 IEC:2011 Figure A.3 Cross-sectional view of a dielectric resonator . 26 Figure A.4 A diagram for simplied cross-sectional view of a dielectric resonator . 30 Figure A.5 Mode chart for a sapp
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