EN 61300-3-17-1999 en Fibre Optic Interconnecting Devices and Passive Components Basic Test and Measurement Procedures Part 3-17 Examinations and Measurements Endface Angle of Angl.pdf

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1、STD=BSI BS EN b2300-3-17-ENGL 2000 lb29bb7 085Li707 T77 m BRITISH STANDARD Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 3-17: Examinations and measurements - Endface angle of angle -polished ferrules The European Standard EN 61300517:1999

2、has the status of a British Standard ICs 33.180.20 NO COPYING WITHOUT BSI PERMISSION EXCEPT AS PEBMITED BY COPYBIGT LAW BS EN 6 1300-3-1 7:ZOOO IEC 61300-3-17:1999 STD.BS1 BS EN bL300-3-17-ENGL 2000 Lb24bb 085Li7LO 709 M been prepared under the Sector Committee, was published under the authority of

3、the Standards Committee and comes into effect on 15 July 2000 direction of the Electrotechnical Amd. No. O BSI 07-2000 BS EN 61300-3-172000 Date Comments National foreword This British Standard is the official English language version of EN 61300-3-171999. It is identical with IEC 613003-171999. It

4、supersedes BS EN 61300-3-171997 which is withdrawn The UK participation in its preparation was entrusted by Technical Committee GEId86, Fibre optics, to Subcommittee GEY86/2, Interconnecting devices and passive components, which has the responsibility to: - aid enquirers to understand the text; - pr

5、esent to the responsible internationaYEuropean committee any enquiries on the interpretation, or proposals for change, and keep the UK interests informed; them in the UK - monitor related international and European developments and promulgate A list of organizations represented on this subcommittee

6、can be obtained on request to its secretary. From 1 January 1997, all IEC publications have the number 60000 added to the old number. For instance, IEC 27-1 has been renumbered as IEC 60027-1. For a period of time during the change over from one numbering system to the other, publications may contai

7、n identifiers from both system. Cross-references Attention is drawn to the fact that CEN and CENELEC Standards normally include an annex which lists normative references to international publications with their corresponding European publications. The British Standards which implement these internat

8、ional or European publications may be found in the BSI Standards Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Find facility of the BSI Standards Electronic Catalogue. A British Standard does not purport to include ali the necessary provisions

9、of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Summary of pages This document comprises a front cover, an inside front cover, the EN title page, pages 2 to 15 and a

10、 back cover. The BSI copyright notice displayed in this document indicates when the document was last issued. ISBN O 580 35901 8 I l STDmBSI BS EN bL300-3-17-ENGL 2000 Lb24bbS 0854?ll b45 EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 6 I 300-3- I 7 October 1999 ICs 33.1 80.20 Supersed88 EN 81

11、300-3-17:1997 English version Fibre optic interconnecting devices and passive components Basic test and measurement procedures Part 3-1 7: Examinations and measurements Endface angle of angle-polished ferrules (IEC 61 300-3-1 7:1999) Dispositifs dinterconnexion et composants passifs fibres optiques

12、Mthodes fondamentales dessais et de mesures Partie 3-17: Examens et mesures Angle de la face terminale des embouts Lichtwellenleiter - Verbindungselemente und passive Bauteile - Grundlegende Prf- und Meverfahren Teil 3-1 7: Untersuchungen und Messungen - Anschliffwinkel schrg polierter Stifte polis

13、angulairement (CE1 61 300-3-1 7:1999) (IEC 61 300-3-1 7: 1999) This European Standard was approved by CENELEC on 1999-10-01. CENELEC members are bound to comply with the CWCENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard

14、without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other la

15、nguage made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Auda, Belgium, Czech Republic, Denmark, Finland, France,

16、 Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom. CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Centra

17、l Secretariat: rue de Stassart 35, B - 1050 Brussels (o 1999 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 81300-317:1999 E STD-BSI BS EN bL300-3-L7-ENL 20110 m Lb24bb 0854712 581 I Page 2 EN 61300-3-17:1999 Foreword The text of

18、 document 868/1225/FDIS, future edition 2 of IEC 61 300-3-1 7, prepared by SC 86B, Fibre optic interconnecting devices and passive components, of IEC TC 86, Fibre optics, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 6 1 300-3-1 7 on 1 999-1 0-0 1 . This European S

19、tandard supersedes EN 61 300-3-1 7: 1997. The following dates were fixed: - latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dp) 2000-07-01 - latest date by which the national standards conflicting with the EN hav

20、e to be withdrawn (dOW) 2002-1 0-01 Endorsement notice The text of the International Standard IEC 61 300-3-1 7: 1999 was approved by CENELEC as a European Standard without any modification. Page 3 EN 61300-3-17:1999 CONTENTS Page Clause General . 4 1 . 1 Scope and object 4 1.2 Normative references 4

21、 General description . 4 2.1 Method 1 - Automatic interferometric method 5 2.2 Method 2 - Manual interferometric method 6 2.3 2.4 Method 3 - Mechanical profilometer method . 6 Apparatus 8 Method 4 - Reflected light method 7 3.1 Method 1 - Automatic interferometric method 8 3.2 Method 2 - Manual inte

22、rferometric method 8 3.3 Method 3 - Mechanical profilometer method . 9 3.4 Method 4 - Reflected light method 10 Procedure 10 4.1 Method 1 - Automatic interferometric method 10 4.2 4.3 Method 3 - Mechanical profilometer method . 11 4.4 Method 4 - Reflected light method 14 Details to be specified . 14

23、 Method 2 - Manual interferometric method 14 Method 4 - Reflected light method 15 Method 2 - Manual interferometric method 11 5.1 5.2 5.3 5.4 Method 1 - Automatic interferometric method 14 Method 3 - Mechanical profilometer method . 14 ES1 07-2000 STD-BSI BS EN bL300-3-17-ENGL ZOOO E Lb24bb9 0854734

24、 354 E Page 4 EN 61300-3-17:1999 FIBRE OPTIC INTERCONNECTING DEVICES AND PASSIVE COMPONENTS - BASIC TEST AND MEASUREMENT PROCEDURES - Part 3-17: Examinations and measurements - Endface angle of angle-polished ferrules I General 1.1 Scope and object The object of this part of IEC 61300 is to describe

25、 the methods to measure the endface angle of flat or convex angle-polished ferrules. 1.2 Normative references The following normative documents contain provisions which, through reference in this text, constitute provisions of this part of IEC 61300. For dated references, subsequent amendments to, o

26、r revisions of, any of these publications do not apply. However, parties to agreements based on this part of IEC 61300 are encouraged to investigate the possibility of applying the most recent editions of the normative documents indicated below. For undated references, the latest edition of the norm

27、ative document referred to applies. Members of IEC and IS0 maintain registers of currently valid International Standards. IS0 2538:1998, Geometrical Product Specifications (GPS) - Series of angles and slopes on prisms 2 General description The ferrule endface angle for flat endface angle-polished fe

28、rrules is defined as the angle between the plane perpendicular to the axis of the ferrule and the plane of the flat endface. The endface angle for spherically polished angled endface ferrules is the angle between the plane perpendicular to the axis of the ferrule and the straight line tangent to the

29、 polished surface at the fibre core in the direction of the nominal angle (see figure 1). Plane perpendicular to this fibre axis Plane perpendicular to this fibre axis Fibre / axis IEC 1047D9 Straight line tangent to the polished surface Figure la - Convex polished ferrules Figure 1 b - Flat polishe

30、d ferrules Figure 1 - Definition of ferrule endface angle for convex and flat polished ferrules BSI 07-2000 Page 6 EN 61300-3-171999 Four methods are described for measuring the ferrule endface angle: - method I: automatic interferometric method (reference method); - method 2: manual interferometric

31、 method; - method 3: mechanical profilometer method; - method 4: reflected light method. 2.1 Method 1 - Automatic interferometric method Due to its greater accuracy, method 1 is considered to be the reference method. In this method, the ferrule endface is placed in a tiltable micropositioner under a

32、 microscope with in terfero m e tri c capa b i I i ty . NOTE - A fixed holder at the nominal value of the angle that has to be measured may be used, but in this case the alignment procedure described is not applicable and it is necessary to use a reference angled plug measured with other methods. Fi

33、gure 2 - Example of set-up of angle measurement by means of interferometer Phase differences between the reference wavefront and the wavefront from the surface of the ferrule under test create a fringe pattern. The ferrule is tilted by a micropositioner at the nominal value 0, of the angle that has

34、to be measured. For a convex polished ferrule, the curvature radius R and the apex offset component in the direction of the angle Ex are measured from the analysis of the interferometric pattern (see figure 3). The value of the angle is evaluated from the values of R and E,. Fringes centre Interfero

35、metric Fibre axis -Fibre Figure 3 - Example of interference pattern of a convex polished ferrule BSI 07-2000 STD-BSI BS EN bL300-3-L7-ENGL 2000 H Lb24bb7 08547Lb 127 H Page 6 EN 61300-3-17:1999 For a flat polished ferrule, the angle is evaluated from the frequency of the interferometric fringes in t

36、he angle direction (see figure 4), that is, from the number of waves in the length unit IiA. Figure 4 - Example of interference pattern of a flat polished ferrule 2.2 Method 2 - Manual interferometric method As in method 1, the ferrule endface is placed in a tiltable micropositioner under a microsco

37、pe with interferometric capability. In this method, however, the ferrule is tilted by a micro- positioner until the surface of the endface is normal to the optical axis of the interferometer: this happens when the real value of the angle is reached. In the case of a convex polished ferrule endface,

38、this position is reached when the interference rings and the fibre are both symmetrical to the rotation axis (see figure 5). In the case of a flat polished ferrule, this position is reached when the interference fringes disappear or are at a minimum number. Fringes centre . Interferometric fringes R

39、otation axis Fibre axis -Fibre - .- - IEC 1051/99 Figure 5 - Example of interference pattern of a convex polished ferrule adjusted for method 2 measurement The endface angle of the ferrule can be read at the dial of the micropositioner 2.3 Method 3 - Mechanical profilometer method In this method, th

40、e endface angle is evaluated by profiling the endface ferrule with a surface analyser. The ferrule is placed in a fixed holder under the stylus of mechanical profilometer. The ferrule axis shall be parallel to the stylus axis and the plug shall be positioned with the angle in the direction of the st

41、ylus scan. The endface angle of the ferrule is evaluated from the analysis of the acquired profile. BSI 07-2000 STD-BSI BS EN b1300-3-37-ENGL 2000 E Lb24bb7 0854737 OL3 E Flat polished ferrule Page 7 EN 61300-3-17:1999 Convex polished ferrule Airy disk 2.4 In this method, a visible light He-Ne beam

42、aligned along the ferrule axis is reflected by the ferrule endface to impinge upon a screen as a spot pattern. The screen is normal to and surrounding the ferrule axis (see figure 6). Method 4 - Reflected light method I V-groove or precision sleeve IEC 1052199 NOTE - For convex polished ferrules, a

43、suitable length L may be between 20 cm and 50 cm and may be recorded in the test result. Figure 6 - Example of Set-up for ferrule endface angle measurement In the case of a flatly polished ferrule endface, the spot pattern is typically a small visible, approximately uniformly illuminated circle show

44、ing little additional divergence of the laser beam. In the case of a spherically polished ferrule endface, the pattern is typically a small ring (Airy disk) located at the centre of a large visible circle of beam diverged from the original laser beam (see figure 7). This small ring results from Frau

45、nhofer diffraction of the He-Ne beam reflected from the spherical ferrule endface containing a fibre or fibre hole as a centrally located aperture. Ring Circle IEC 1053/99 Figure 7 - Typical spot pattern The ferrule endface angle g is determined by measuring the deviation angle of the He-Ne beam mea

46、sured to the centre of the visible circle or ring of the spot pattern as the ferrule is rotated around its axis. The reflected beam resolution will be affected by the surface finish of the ferrule endface. This surface shall be polished to a sufficient level to form a well defined specular reflectio

47、n of the He-Ne beam. This method shall be applicable only on flat polished ferrules. O BSI 07-2000 Page 8 EN 61300-3-17:1999 3 Apparatus 3.1 For method 1, an apparatus as shown in figure 8 consists of the following elements: Method 1 - Automatic interferometric method Computer for the Monitor to vie

48、w the image .- micropositioner IEC 1054/99 Figure 8 - Example of apparatus for the angle measurement by method 1 a) Microscope A microscope with interferometric capability associated with a video camera for image acquisition. An angular micropositioner with a resolution better than 0,Ol O. A suitabl

49、e fixture such as a V-groove or a precision alignment sleeve to hold the ferrule in a fixed position. A mechanical fixture able to hold the plug such that the relevant key lies in the exact position in respect to the nominal angle direction. An analyser system able to evaluate for the interferometric image, the curvature radius, the dome offset component along the angle direction and, from these, the value of the angle using formula (1). b) Angular micropositioner c) Ferrule holder d) Plug holder e) Image analyser The monitor shall display th