EN 60749-13-2002 en Semiconductor Devices Mechanical and Climatic Test Methods Part 13 Salt Atmosphere《半导体器件 机械和气候试验方法 第13部分 盐性环境 IEC 60749-13-2002 部分替代 EN 60749 1999+A1-2000 和 A2-.pdf

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1、BRITISH STANDARD BS EN 60749-13:2002 Incorporating Corrigendum No. 1 Semiconductor devices Mechanical and climatic test methods Part 13: Salt atmosphere The European Standard EN 60749-13:2002 has the status of a British Standard ICS 31.080.01 BS EN 60749-13:2002 This British Standard, having been pr

2、epared under the direction of the Electrotechnical Sector Policy and Strategy Committee, was published under the authority of the Standards Policy and Strategy Committee on 28 August 2002 BSI 17 September 2002 ISBN 0 580 40293 2 National foreword This British Standard is the official English languag

3、e version of EN 60749-13:2002. It is identical with IEC 60749-13:2002. It partially supersedes BS EN 60749:1999. The UK participation in its preparation was entrusted to Technical Committee EPL/47, Semiconductors, which has the responsibility to: A list of organizations represented on this committee

4、 can be obtained on request to its secretary. Cross-references The British Standards which implement international or European publications referred to in this document may be found in the BSI Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Searc

5、h” facility of the BSI Electronic Catalogue or of British Standards Online. This publication does not purport to include all the necessary provisions of a contract. Users are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal o

6、bligations. aid enquirers to understand the text; present to the responsible international/European committee any enquiries on the interpretation, or proposals for change, and keep the UK interests informed; monitor related international and European developments and promulgate them in the UK. Summa

7、ry of pages This document comprises a front cover, an inside front cover, the EN title page, pages 2 to 6, an inside back cover and a back cover. The BSI copyright date displayed in this document indicates when the document was last issued. Amendments issued since publication Amd. No. Date Comments

8、14113 Corrigendum No. 1 17 September 2002 Addition of supersession details to national foreword.EUROPEAN STANDARD EN 60749-13 NORME EUROPENNE EUROPISCHE NORM August 2002 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komite

9、e fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 2002 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 60749-13:2002 E ICS 31.080.01 Partly supersedes EN 60749:1999 + A1:2000 + A2:2001 Engli

10、sh version Semiconductor devices - Mechanical and climatic test methods Part 13: Salt atmosphere (IEC 60749-13:2002) Dispositifs semiconducteurs - Mthodes dessais mcaniques et climatiques Partie 13: Atmosphre saline (CEI 60749-13:2002) Halbleiterbauelemente - Mechanische und klimatische Prfverfahren

11、 Teil 13: Salzatmosphre (IEC 60749-13:2002) This European Standard was approved by CENELEC on 2002-07-02. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alter

12、ation. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by tr

13、anslation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Gree

14、ce, Hungary, Iceland, Ireland, Italy, Luxembourg, Malta, Netherlands, Norway, Portugal, Slovakia, Spain, Sweden, Switzerland and United Kingdom.Foreword The text of document 47/1599/FDIS, future edition 1 of IEC 60749-13, prepared by IEC TC 47, Semiconductor devices, was submitted to the IEC-CENELEC

15、 parallel vote and was approved by CENELEC as EN 60749-13 on 2002-07-02. This mechanical and climatic test method, as it relates to salt atmosphere, is a complete rewrite of the test contained in clause 6, chapter 3 of EN 60749:1999. The following dates were fixed: latest date by which the EN has to

16、 be implemented at national level by publication of an identical national standard or by endorsement (dop) 2003-04-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2005-07-01 Annexes designated “normative“ are part of the body of the standard. In this

17、 standard, annex ZA is normative. Annex ZA has been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 60749-13:2002 was approved by CENELEC as a European Standard without any modification. _ Page2 EN6074913:2002SEMICONDUCTOR DEVICES MECHANICAL AND CLIMATIC TEST METHOD

18、S Part 13: Salt atmosphere 1 Scope This part of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those

19、 devices specified for a marine environment. The salt atmosphere test is considered destructive In general, this salt atmosphere test is in conformity with IEC 60068-2-11 but, due to specific requirements of semiconductors, the clauses of this standard apply. 2 Normative references The following ref

20、erenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60749-14, Semiconductor devices Mechanical and climatic test m

21、ethods Part 14: Robustness of terminations 1) IEC 60068-2-11, Environmental testing Part 2: Tests Test Ka: Salt mist 3 Test apparatus The following items are required for performing the salt atmosphere test: a) Temperature-controlled exposure with suitable non-corrodible rack for supporting devices.

22、 b) Salt solution reservoir. The salt used shall be sodium chloride containing, on a dry basis, not more than 0,1 % of sodium iodide and not more than 0,3 % by weight of total impurities. Distilled, or other water used, should not contain more than 200 10 6of total solids. The solution should be kep

23、t free from solids by filtration or recantation. The salt concentration shall be 0,5 % to 3 % by weight in deionized or distilled water as required to achieve the deposition rates required by clause 4. c) Means for atomizing the salt solution, including suitable nozzles and compressed air supply. d)

24、 Means for humidifying the air at a temperature above the chamber temperature. e) Magnifier, 10 to 20 . 1)To be published. Page3 EN6074913:20024 Procedure After initial conditioning in accordance with 4.1, the devices shall be placed in the test chamber in such a way that they do not contact each ot

25、her or shield each other from the freely settling fog and that corrosion product and condensate from one specimen does not fall on another. A salt atmosphere fog shall be maintained in the test chamber for the time specified by the required test condition listed in 4.2. During the test, the chamber

26、shall be held at a temperature of 35 (2) C. The fog concentration and velocity shall be such that the rate of salt deposit in the test area is 30 (10) g/m 2per 24 h. The pH of the salt solution shall be maintained between 6,0 and 7,5 when measured at 35 C minimum (only CP grade (dilute solution) hyd

27、rochloric acid or sodium hydroxide shall be used to adjust the pH). 4.1 Initial conditioning When initial conditioning is specified, the device terminals shall be subjected to a stress in accordance with test condition B of method specified in IEC 60749-14 before the specimens are mounted for the sa

28、lt atmosphere test. When the sample devices being subjected to the salt atmosphere have already received the required initial conditioning, as part of another test employing the same sample devices, the terminal bend need not be repeated. 4.2 Length of test The minimum duration of exposure of the sa

29、lt atmosphere test shall be chosen from table 1. Unless otherwise specified, test condition A shall apply. Table 1 Minimum duration of exposure Test condition Length of test h A 24 2 B 48 4 C 96 4 D 240 8 4.3 Examination Upon completion of the test, unless otherwise specified, the device deposits sh

30、all be prepared in the following manner. Salt deposits shall be removed by a gentle wash or dip in water at a temperature not higher than 40 C and a light brushing using a soft hair or plastic bristle brush. 4.4 Failure criteria A device shall be considered as having failed if a) Specified markings

31、are illegible when viewed under normal room lighting with a magnification of 1 to 3 . Page4 EN6074913:2002b) There is evidence of corrosion in excess of 5 % of the area of the finish or base metal of any package element (e.g. lid, terminal or cap), missing or broken terminals, parametric limits are

32、exceeded, or any corrosion that completely crosses the element when viewed with a magnification of 10 to 20 . In this test method, corrosion is defined as actual damage to the structure of the material or finish. Stains or discoloration, including those associated with spots of corrosion, are not to

33、 be considered as part of the damaged area. Corrosion at the tip of the terminals (and corrosion product resulting from such corrosion) shall be disregarded. NOTE The finish should include the package and the entire exposed terminal areas from meniscus to the terminal tip (excluding designated shear

34、ed-off areas) and all other exposed metal surfaces. 5 Summary The following details shall be specified in the applicable procurement document: a) Initial conditioning, if required (see 4.1). b) Test condition, if other than test condition A (see 4.2). c) Cleaning procedure, if different from 4.3. d)

35、 Failure criteria, if different from 4.4. e) Sample size and accept number. _ Page5 EN6074913:2002Annex ZA (normative) Normative references to international publications with their corresponding European publications This European Standard incorporates by dated or undated reference, provisions from

36、other publications. These normative references are cited at the appropriate places in the text and the publications are listed hereafter. For dated references, subsequent amendments to or revisions of any of these publications apply to this European Standard only when incorporated in it by amendment

37、 or revision. For undated references the latest edition of the publication referred to applies (including amendments). NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publication Year Title EN/HD Year IEC 60749-14 - 1)

38、 Semiconductor devices - Mechanical and climatic test methods Part 14: Robustness of terminaisons (lead integrity) - IEC 60068-2-11 1981 Environmental testing Part 2: Tests - Test Ka: Salt mist EN 60068-2-11 19991)To be published. Page6 EN6074913:2002BS EN 60749-13:2002 BSI 389 Chiswick High Road Lo

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