EN 60122-1-2002 en Quartz crystal units of assessed quality Part 1 Generic specification (Incorporates Amendment A1 2018)《经质量评定的石英晶体振荡器 第1部分 总规范 IEC 60122-1-2002 替代 EN 168000-1993+.pdf

《EN 60122-1-2002 en Quartz crystal units of assessed quality Part 1 Generic specification (Incorporates Amendment A1 2018)《经质量评定的石英晶体振荡器 第1部分 总规范 IEC 60122-1-2002 替代 EN 168000-1993+.pdf》由会员分享，可在线阅读，更多相关《EN 60122-1-2002 en Quartz crystal units of assessed quality Part 1 Generic specification (Incorporates Amendment A1 2018)《经质量评定的石英晶体振荡器 第1部分 总规范 IEC 60122-1-2002 替代 EN 168000-1993+.pdf（46页珍藏版）》请在麦多课文档分享上搜索。

1、BRITISH STANDARD BS EN 60122-1:2002 Quartz crystal units of assessed quality Part 1: Generic specification The European Standard EN 60122-1:2002 has the status of a British Standard ICS 31.140 BS EN 60122-1:2002 This British Standard was published under the authority of the Standards Policy and Stra

2、tegy Committee on 5 February 2003 BSI 5 February 2003 ISBN 0 580 41183 4 National foreword This British Standard is the official English language version of EN 60122-1:2002. It is identical with IEC 60122-1:2002. It supersedes BS EN 168000:1996 which is withdrawn. The UK participation in its prepara

3、tion was entrusted to Technical Committee EPL/49, Piezoelectric devices for frequency control and selection, which has the responsibility to: A list of organizations represented on this committee can be obtained on request to its secretary. Cross-references The British Standards which implement inte

4、rnational or European publications referred to in this document may be found in the BSI Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Search” facility of the BSI Electronic Catalogue or of British Standards Online. This publication does not pur

5、port to include all the necessary provisions of a contract. Users are responsible for its correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. aid enquirers to understand the text; present to the responsible international/European committ

6、ee any enquiries on the interpretation, or proposals for change, and keep the UK interests informed; monitor related international and European developments and promulgate them in the UK. Summary of pages This document comprises a front cover, an inside front cover, the EN title page, pages 2 to 42,

7、 an inside back cover and a back cover. The BSI copyright date displayed in this document indicates when the document was last issued. Amendments issued since publication Amd. No. Date CommentsEUROPEAN STANDARD EN 60122-1 NORME EUROPENNE EUROPISCHE NORM December 2002 CENELEC European Committee for E

8、lectrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 2002 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. R

9、ef. No. EN 60122-1:2002 E ICS 31.140 Supersedes EN 168000:1993 + A2:1998 English version Quartz crystal units of assessed quality Part 1: Generic specification (IEC 60122-1:2002) Rsonateurs quartz sous assurance de la qualit Partie 1: Spcification gnrique (CEI 60122-1:2002) Schwingquarze mit bewerte

10、ter Qualitt Teil 1: Fachgrundspezifikation (IEC 60122-1:2002) This European Standard was approved by CENELEC on 2002-10-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard

11、 without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other l

12、anguage made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic, Denmark, Finland, Fra

13、nce, Germany, Greece, Hungary, Iceland, Ireland, Italy, Luxembourg, Malta, Netherlands, Norway, Portugal, Slovakia, Spain, Sweden, Switzerland and United Kingdom.EN 62102-:10022 - 2 Foreword The text of document 49/551/FDIS, future edition 3 of IEC 60122-1, prepared by IEC TC 49, Piezoelectric and d

14、ielectric devices for frequency control and selection, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 60122-1 on 2002-10-01. This European Standard supersedes EN 168000:1993 + A2:1998. The following dates were fixed: latest date by which the EN has to be implemented

15、 at national level by publication of an identical national standard or by endorsement (dop) 2003-07-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2005-10-01 Annexes designated “normative“ are part of the body of the standard. In this standard, anne

16、x ZA is normative. Annex ZA has been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 60122-1:2002 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following notes have to be added for the standar

17、ds indicated: IEC 60068-2-58 NOTE Harmonized as EN 60068-2-58:1999 (not modified). IEC 60068-2-64 NOTE Harmonized as EN 60068-2-64:1994 (not modified). _ Page2 EN601221:2002CONTENTS 1 General 6 1.1 Scope6 1.2 Normative references 6 1.3 Order of precedence8 2 Terminology and general requirements.8 2.

18、1 General .8 2.2 Terms, definitions and classification of phenomena.8 2.3 Preferred ratings and characteristics .23 2.3.1 Temperature ranges in degrees Celsius ( o C) suitable for ambient operation23 2.3.2 Elevated temperature ranges in degrees Celsius ( o C) suitable for oven control .23 2.3.3 Freq

19、uency tolerance (110 6 )23 2.3.4 Circuit conditions.23 2.3.5 Levels of drive.23 2.3.6 Drive level dependency .24 2.3.7 Climatic category.24 2.3.8 Bump severity24 2.3.9 Vibration severity.25 2.3.10 Shock severity.25 2.3.11 Leak rate .25 2.4 Marking .25 3 Quality assessment procedures26 3.1 Primary st

20、age of manufacture26 3.2 Structurally similar components.26 3.3 Subcontracting 26 3.4 Manufacturers approval26 3.5 Approval procedures .26 3.5.1 General .26 3.5.2 Capability approval26 3.5.3 Qualification approval27 3.6 Procedures for capability approval.27 3.6.1 General .27 3.6.2 Eligibility for ca

21、pability approval.27 3.6.3 Application for capability approval .27 3.6.4 Granting of capability approval 27 3.6.5 Capability manual27 3.7 Procedures for qualification approval.27 3.7.1 General .27 3.7.2 Eligibility for qualification approval.27 3.7.3 Application for qualification approval .28 3.7.4

22、Granting of qualification approval 28 3.7.5 Quality conformance inspection.28 3.8 Test procedures 28 3.9 Screening requirements.28 Page3 EN601221:2002061-221 EI:C0022 4 3.10 Rework and repair work.28 3.10.1 Rework28 3.10.2 Repair work .28 3.11 Certified records of released lots.28 3.12 Validity of r

23、elease28 3.13 Release for delivery.29 3.14 Unchecked parameters29 4 Test and measurement procedures.29 4.1 General .29 4.2 Alternative test methods29 4.3 Precision of measurement .29 4.4 Standard conditions for testing 29 4.5 Visual inspection .30 4.5.1 Visual test A 30 4.5.2 Visual test B 30 4.5.3

24、Visual test C30 4.6 Dimensioning and gauging procedures30 4.6.1 Dimensions, test A.30 4.6.2 Dimensions, test B.30 4.7 Electrical test procedures 30 4.7.1 Frequency and resonance resistance 30 4.7.2 Drive level dependency .30 4.7.3 Frequency and resonance resistance as a function of temperature31 4.7

25、.4 Unwanted responses .31 4.7.5 Shunt capacitance.31 4.7.6 Load resonance frequency and resistance.32 4.7.7 Frequency pulling range (f L1 , f L2 ).32 4.7.8 Motional parameters32 4.7.9 Insulation resistance32 4.8 Mechanical and environmental test procedures .32 4.8.1 Robustness of terminations (destr

26、uctive) .32 4.8.2 Sealing tests (non-destructive) 33 4.8.3 Soldering (solderability and resistance to soldering heat) (destructive)35 4.8.4 Rapid change of temperature, two-fluid bath method (non-destructive)35 4.8.5 Rapid change of temperature with prescribed time of transition (non-destructive) .3

27、5 4.8.6 Bump (destructive) 35 4.8.7 Vibration (destructive) .36 4.8.8 Shock (destructive)36 4.8.9 Free fall (destructive).36 4.8.10 Acceleration, steady state (non-destructive) 36 4.8.11 Dry heat (non-destructive) .36 4.8.12 Damp heat, cyclic (destructive)36 4.8.13 Cold (non-destructive) .36 4.8.14

28、Climatic sequence (destructive).37 4.8.15 Damp heat, steady state (destructive)37 4.8.16 Immersion in cleaning solvents (non-destructive).37 Page4 EN601221:20024.9 Endurance test procedure .37 4.9.1 Ageing (non-destructive)37 4.9.2 Extended ageing (non-destructive) 38 Annex ZA (normative) Normative

29、references to international publications with their corresponding European publications .39 Bibliography42 Figure 1 Symbol and equivalent electrical circuit of a piezoelectric resonator.10 Figure 2 Impedance |Z|, resistance R e , reactance X e , series arm reactance X 1of a piezoelectric resonator a

30、s a function of frequency13 Figure 3 Impedance and admittance diagram of a piezoelectric resonator14 Figure 4 Resonance, anti-resonance and load resonance frequencies .15 Figure 5 Equivalent circuit of a piezoelectric resonator with a series (load) capacitance C L .22 Figure 6 Terminal bend test too

31、l.34 Table 1 List of symbols used for the equivalent electric circuit of a piezoelectric resonator.18 Table 2 Solutions for the various characteristic frequencies .20 Table 3 Minimum values for the ratio r Q 2to be expected for various types of piezoelectric resonators20 Table 4 Approximate relation

32、s between the characteristic frequencies and the series resonance frequency f sof a piezoelectric resonator21 Page5 EN601221:2002061-221 EI:C0022 6 QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY Part 1: Generic specification 1 General 1.1 Scope This part of IEC 60122 specifies the methods of test and gene

33、ral requirements for quartz crystal units of assessed quality using either capability approval or qualification approval procedures. 1.2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applie

34、s. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60027(all parts), Letter symbols to be used in electrical technology IEC 60050(561):1991, International Electrotechnical Vocabulary (IEV) Chapter 561: Piezoelectric devices for frequency

35、control and selection IEC 60068-1:1988, Environmental testing Part 1: General and guidance IEC 60068-2-1:1990, Environmental testing Part 2: Tests Tests A: Cold IEC 60068-2-2:1974, Environmental testing Part 2: Tests Tests B: Dry heat IEC 60068-2-3:1969, Environmental testing Part 2: Tests Test Ca:

36、Damp heat, steady state IEC 60068-2-6:1995, Environmental testing Part 2: Tests Test Fc: Vibration (sinusoidal) IEC 60068-2-7:1983, Environmental testing Part 2: Tests Test Ga: Acceleration, steady state IEC 60068-2-13:1983, Environmental testing Part 2: Tests Test M: Low air pressure IEC 60068-2-14

37、:1984, Environmental testing Part 2: Tests Test N: Change of temperature IEC 60068-2-17:1994, Basic environmental testing procedures Part 2: Tests Test Q: Sealing IEC 60068-2-20:1979, Environmental testing Part 2: Tests Test T: Soldering IEC 60068-2-21:1999, Environmental testing Part 2-21: Tests Te

38、st U: Robustness of terminations and integral mounting devices Page6 EN601221:2002061-221 EI:C0022 7 IEC 60068-2-27:1987, Environmental testing Part 2: Tests Test Ea and guidance: Shock IEC 60068-2-29:1987, Environmental testing Part 2: Tests Test Eb and guidance: Bump IEC 60068-2-30:1980, Environme

39、ntal testing Part 2: Tests Test Db and guidance: Damp heat, cyclic (12 + 12-hour cycle) IEC 60068-2-32:1975, Environmental testing Part 2: Tests Test Ed: Free fall (Procedure 1) IEC 60068-2-45:1980, Environmental testing Part 2: Tests Test XA and guidance: Immersion in cleaning solvents IEC 60122-3:

40、2001, Quartz crystal units of assessed quality Part 3: Standard outlines and lead connections IEC 60444-1:1986, Measurement of quartz crystal unit parameters by zero phase technique in a -network Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz cryst

41、al units by zero phase techniques in a -network IEC 60444-2:1980, Measurement of quartz crystal unit parameters by zero phase technique in a -network Part 2: Phase offset method for the measurement of motional capacitance of quartz crystal units IEC 60444-4:1988, Measurement of quartz crystal unit p

42、arameters by zero phase technique in a -network Part 4: Method for the measurement of the load resonance frequency f L , load resonance resistance R Land the calculation of other derived values of quartz crystal units, up to 30 MHz IEC 60444-5:1995, Measurement of quartz crystal unit parameters Part

43、 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error corrections IEC 60444-6:1995, Measurement of quartz crystal unit parameters Part 6: Measurement of drive level dependence (DLD) IEC 60617 (all parts), Graphical symbols for dia

44、grams IEC 61178-2:1993, Quartz crystal units A specification in the IEC Quality Assessment System for Electronic Components (IECQ) Part 2: Sectional specification Capability approval IEC 61178-3:1993, Quartz crystal units A specification in the IEC Quality Assessment System for Electronic Components

45、 (IECQ) Part 3: Sectional specification Qualification approval IEC QC 001001:2000, IEC Quality Assessment System for Electronic Components (IECQ) Basic Rules IEC QC 001002-2:1998, ICQ Quality Assessment System for Electronic Components (IECQ) Rules of Procedure Part 2: Documentation IEC QC 001002-3:

46、1998, IEC Quality Assessment System for Electronic Components (IECQ) Rules of Procedure Part 3: Approval Procedures Page7 EN601221:2002061-221 EI:C0022 8 IEC QC 001005:2000, Register of firms, products and services approved under the IECQ System, including ISO 9000 ISO 1000:1992, Sl units and recomm

47、endations for the use of their multiples and of certain other units 1.3 Order of precedence Where any discrepancies occur for any reason, documents shall rank in the following order of precedence: the detail specification; the sectional specification; the generic specification; any other internation

48、al documents (for example of the IEC) to which reference is made. The same order of precedence shall apply to equivalent national documents. 2 Terminology and general requirements 2.1 General Units, graphical symbols, letter symbols and terminology shall, wherever possible, be taken from the followi

49、ng standards: IEC 60027, IEC 60050(561), IEC 60617 and ISO 1000. 2.2 Terms, definitions and classification of phenomena The following paragraphs contain additional terminology applicable to quartz crystal units and describe certain phenomena in this context. 2.2.1 crystal element (crystal blank) piez