EN 140401-804-2011 en Detail Specification Fixed low power film high stability SMD resistors - Rectangular - Stability classes 0 1 0 25 (Incorporating corrigenda October 2011 and J.pdf

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1、BSI Standards PublicationDetail Specification: Fixed low power film high stability SMD resistors Rectangular Stability classes 0,1; 0,25Incorporating corrigenda October 2011 and January 2012BS EN 140401-804:2011+A1:2013BS EN 140401-804:2011+A1:2013National forewordThis British Standard is the UK imp

2、lementation of EN 140401-804:2011+A1:2013, incorporating corrigenda October 2011 and January 2012. It supersedes BS EN 140401-804:2011, which is withdrawn.The start and finish of text introduced or altered by corrigendum is indicated in the text by tags. Text altered by CENELEC corrigendum October 2

3、011 is indicated in the text by . Text altered by CENELEC corrigendum January 2012 is indicated in the text by .The start and finish of text introduced or altered by amendment is indicated in the text by tags. Tags indicating changes to CENELEC text carry the number of the CENELEC amendment. For exa

4、mple, text altered by CENELEC amendment A1 is indicated by !“. The UK participation in its preparation was entrusted to Technical Committee EPL/40X, Capacitors and resistors forelectronic equipment.A list of organizations represented on this committee can be obtained on request to its secretary.This

5、 publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. The British Standards Institution 2014. Published by BSI Standards Limited 2014ISBN 978 0 580 83119 5ICS 31.040.10Compliance with a British Standard cannot confer i

6、mmunity fromlegal obligations.This British Standard was published under the authority of the Standards Policy and Strategy Committee on 31 July 2011.Amendments/corrigenda issued since publicationDate Text affectedImplementation of CENELEC corrigendumOctober 2011Implementation of CENELEC corrigendum

7、January 201231 January 2012 30 April 2012 30 April 2014 Implementation of CENELEC amendment A1:2013BRITISH STANDARDEUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr

8、Elektrotechnische Normung Management Centre: Avenue Marnix 17, B - 1000 Brussels 2011 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 140401-804:2011 E ICS 31.040.10 English version Detail Specification: Fixed low power film high

9、stability SMD resistors - Rectangular - Stability classes 0,1; 0,25 Spcification particulire: Rsistances fixes couche de haute stabilit et faible dissipation CMS - Rectangulaires - Catgories de stabilit 0,1; 0,25 Bauartspezifikation: SMD Schicht-Festwiderstnde niedriger Belastbarkeit mit hoher Stabi

10、litt - Rechteckig - Stabilittsklassen 0,1; 0,25 This European Standard was approved by CENELEC on 2011-05-09. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any a

11、lteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made b

12、y translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denm

13、ark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom. Incorporating corrigenda October 2011 and January 2012EN

14、140401-804:2011+A1November 2013 2 Foreword This European Standard was prepared by Technical Committee CENELEC TC 40XB, Resistors. The text of the draft was submitted to the Unique Acceptance Procedure and was approved by CENELEC as EN 140401-804 on 2011-05-09. This document supersedes EN 140401-804:

15、2005. Preceding documents on the subject covered by this specification have been: only on resistors without established reliability, now version A: CECC 40 401-010:1995-02; CECC 40 401-010:1997-10. EN 140401-804:2011 the following significant technical changes with respect to EN 140401-804:2005: mod

16、ification of the title; introduction of a test on the resistance to electrostatic discharge in 1.6 and Annex A; introduction of description and test methods for lead-free soldering in 1.8, 1.10.3 and Annex A; introduction of the code letters for temperature coefficient as given in EN 60062; revision

17、 of the ordering information in 1.9.4; revised information on pulse load capability in 1.10.6; revised information on resistance value drift in 1.10.7; revised information on current noise in 1.10.9; adoption of the IECQ rules of procedure, IEC QC 001002-3; revision of the sample quantities and the

18、sequence of tests in Annex A. Additionally, EN 140401-804:2011 is also an editorial revision of EN 140401-804:2005. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2012-05-09

19、latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2014-05-09 This specification is part of four documents describing fixed resistors for surface mount technology as follows: EN 60115-1 Fixed resistors for use in electronic equipment Part 1: Generic specif

20、ication (IEC 60115-1, mod.) EN 140400 Sectional Specification: Fixed low power surface mount (SMD) resistors EN 140401 Blank Detail Specification: Fixed low power film surface mount (SMD) resistors EN 140401-804 Detail Specification: Fixed low power film high stability surface mount (SMD) resistors

21、Rectangular Stability classes 0,1; 0,25 _ This document (EN 140401-804:2011/A1:2013) has been prepared by CLC/TC/40XB “Resistors“. The following dates are fixed: latest date by which this document has to be implemented at national level by publication of an identical national standard or by endorsem

22、ent (dop) 2014-10-14 latest date by which the national standards conflicting with this document have to be withdrawn (dow) 2016-10-14 Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC and/or CEN shall not be held responsible

23、 for identifying any or all such patent rights. Foreword to amendment A1BS EN 140401-804:2011+A1:2013 EN 140401-804:2011+A1:2013 (E) 3 Contents Foreword 2Contents . 31 Characteristics and ratings 51.1 Dimensions and ratings . 51.2 Derating curve . 71.3 Resistance range and tolerance on rated resista

24、nce 71.3.1 Version A 71.3.2 Version E 91.4 Variation of resistance with temperature and temperature rise. 101.5 Climatic categories 101.6 Limits for change of resistance at tests . 111.7 Non-linear properties . 121.8 Tests related to soldering 121.8.1 Severities for solderability testing . 121.8.2 S

25、everities for testing resistance to soldering heat 131.9 Marking, packaging and ordering designation 141.9.1 Marking of the component 141.9.2 Taping. 141.9.3 Marking of the packaging . 141.9.4 Ordering information . 141.10 Additional information (not for inspection purpose) . 151.10.1 Storage . 151.

26、10.2 Mounting . 151.10.3 Soldering process . 151.10.4 Conductive gluing . 151.10.5 Use of cleaning solvents 161.10.6 Pulse load capability . 161.10.7 Variation of resistance value (drift) for lifetimes up to 200 000 h . 191.10.8 Dissipation notes 221.10.9 Current noise 231.10.10Temperature range ext

27、ension 232 Quality assessment procedures 232.1 General 232.1.1 Zero defect approach . 232.1.2 100 %-test 242.1.3 0 resistor . 242.1.4 Certificate of Conformity (CoC) 242.1.5 Certified test records 242.1.6 Failure rate level . 242.2 Qualification approval 252.2.1 Version A 252.2.2 Version E 252.3 Qua

28、lity conformance inspection 252.3.1 Qualification approval according to IEC QC 001002-3:2005, Clause 3 . 252.3.2 Technology approval according to IEC QC 001002-3:2005, Clause 6 . 252.3.3 Non-conforming items 25BS EN 140401-804:2011+A1:2013 EN 140401-804:2011+A1:2013 (E) 4 Annex A (normative) Fixed s

29、ample size Qualification Approval and Quality Conformance Inspection test schedule for fixed low power surface mount (SMD) resistors 26Annex B (informative) Letter symbols and abbreviations . 35Annex C (normative) Normative references 37Figures Figure 1 Outline and dimensions (see Table 1) . 5Figure

30、 2 Derating curve 7Figure 3 Limits of non-linearity of resistors 12Figure 4 Pulse parameter for rectangular and exponential pulses. 17Figure 5 Maximum permissible pulse load Pi, max. 17Figure 6 Maximum permissible pulse load Pi, maxfor single pulses 18Figure 7 Maximum permissible pulse voltage Ui, m

31、ax19Figure 8 Drift factor M 21Figure 9 Temperature rise for high packaging density . 22Figure 10 Current noise 23Tables Table 1 Style and dimensions 5Table 2a Ratings for stability class 0,25 . 6Table 2b Ratings for stability class 0,1 . 6Table 2c Ratings for 0 resistors 6Table 3a Resistance range,

32、tolerance on rated resistance for version A 8Table 3b Resistance range, tolerance on rated resistance for version E 9Table 4 Temperature coefficients and percentage change of resistance (according to EN 140400:2003, Table 2) . 10Table 5 Limit of temperature rise . 10Table 6 Climatic categories 10Tab

33、le 7a Limits for change of resistance at tests . 11Table 7b Limits for change of resistance at tests . 11Table 8 Test method for resistance to soldering heat test . 13Table 9 Maximum thermal resistance in applications 20Table A.1 Test schedule for qualification approval and quality conformance inspe

34、ction, lot-by-lot tests, assessment level EZ . 26Table A.2 Test schedule for qualification approval and quality conformance inspection, periodic tests, assessment level EZ . 29BS EN 140401-804:2011+A1:2013 EN 140401-804:2011+A1:2013 (E) 5 Specification available from CENELEC Central Secretariat, Ave

35、nue Marnix 17, B 1000 Brussels, Belgium or from the National Committees members of CENELEC EN 140401-804 Electronic components of assessed quality in accordance with: EN 60115-1:2011EN 140400:2003 EN 140401:2009 Issue 2 Other shapes are permitted within the given dimensions. Figure 1 Outline and dim

36、ensions (see Table 1) Fixed low power high stability film chip resistors with rectangular base for surface mounting Style: RR Ceramic substrate with protected, insulated, resistance film and solder terminations, typically thin film Assessment level EZ aVersion A: with-100-%-test Version E: with fail

37、ure rate level and 100-%-test Stability classes 0,1 and 0,25 aFor explanations on assessment level EZ, see 2.1.1. 1 Characteristics and ratings Various parameters of this component are precisely specified in this specification. Unspecified parameters may vary from one component to another. 1.1 Dimen

38、sions and ratings Information about manufacturers who have components qualified to this detail specification is available in the approvals section of the website http:/www.iecq.org. June 2011 Table 1 Styles and dimensions Style Length L mm Width W mm Height H mm Termination T mm Mass bmg metric inch

39、 amin. max. min. max. min. max. min. max. max. RR1005M RR0402 0,95 1,05 0,45 0,55 0,30 0,40 0,05 / 0,1 c0,35 0,8 RR1608M RR0603 1,50 1,70 0,70 0,90 0,35 0,55 0,10 0,50 2,1 RR2012M RR0805 1,90 2,10 1,10 1,40 0,40 0,60 0,15 0,60 6,0 RR3216M RR1206 3,00 3,40 1,45 1,75 0,45 0,65 0,25 0,75 10,0 RR5025M R

40、R2010 4,80 5,20 2,30 2,70 0,35 0,75 0,35 0,85 30,0 aHistorical style codes, for information only. bFor information only. cThe first figure indicates the termination width on the film side, the second figure the termination width on the reverse side. Termination: WT 0,75 W Thickness: 0,005 mm to 0,05

41、 mm !“BS EN 140401-804:2011+A1:2013 EN 140401-804:2011+A1:2013 (E) 6 Table 2a Ratings for stability class 0,25 Table 2b Ratings for stability class 0,1 Style Stability class Rated dissipation P70Limiting element voltaged.c. or a.c. (r.m.s.) UmaxInsulation voltage d.c. or a.c. (peak) UinsmW V V 1 min

42、 continuousRR 1005M 0,1 63 25 75 75 RR 1608M 0,1 100 50 100 75 RR 2012M 0,1 125 75 200 75 RR 3216M 0,1 250 150 300 75 RR 5025M 0,1 330 200 300 75 Table 2c Ratings for 0 resistors Style Maximum current ImaxMaximum resistance aRres maxInsulation voltage d.c. or a.c. (peak) UinsA m V 1 min continuousRR

43、 1005M 0,63 20 75 75 RR 1608M 1 20 100 75 RR 2012M 1,5 20 200 75 RR 3216M 2,0 20 300 75 RR 5025M 3,0 20 300 75 aThe resistance value shall be measured on the film side. Style Stability class Rated dissipation P70Limiting element voltaged.c. or a.c. (r.m.s.) UmaxInsulation voltage d.c. or a.c. (peak)

44、 UinsmW V V 1 min continuousRR 1005M 0,25 100 50 75 75 RR 1608M 0,25 150 75 100 75 RR 2012M 0,25 200 150 200 75 RR 3216M 0,25 400 200 300 75 RR 5025M 0,25 500 300 300 75 !“BS EN 140401-804:2011+A1:2013 EN 140401-804:2011+A1:2013 (E) 7 1.2 Derating curve Resistors covered by this specification are de

45、rated according to Figure 2. Ambient temperature aPercentage ofrated dissipation-50 C 100 C50 C0 C 150 C0 %60 %40 %20 %100 %80 %70 C-55 C 155 CLower category temperature (LCT) Upper category temperature (UCT)-100 C 200 CStability class 0,25 125 CStability class 0,1 Figure 2 Derating curve For the ca

46、tegory temperatures of stability classes, refer to Table 6. 1.3 Resistance range and tolerance on rated resistance 1.3.1 Version A The following combinations of temperature coefficient and tolerance on rated resistance may be approved only. Products from this extent shall be used for the qualificati

47、on approval according to 2.2.1 and for the quality conformance inspection according to 2.3. Resistance values of an E-series according to IEC 60063 shall be used. The qualification of resistance values below or beyond the specified resistance values is permitted, if they fulfil the requirements of t

48、he closest stability class (e.g. RR 1608M, 1 % 499 k shall fulfil the requirements of stability class 0,25). ! “BS EN 140401-804:2011+A1:2013 EN 140401-804:2011+A1:2013 (E) 8 Table 3a Resistance range, tolerance on rated resistance for version A Style Tolerance on rated resistance Temperature coefficient Resistance range Stability class % Code appm/K RR 1005M 1 F 25 100 to 49,9 k 0,1 24,9 to 100 k 0,25 0,5 D 10;