ECA EIA-364-83A-2017 TP-83A Shell-To-Shell and Shell-To- Bulkhead Resistance Test Procedure for Electrical Connectors.pdf

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1、EIA STANDARDTP-83A Shell-To-Shell and Shell-To- Bulkhead Resistance Test Procedure for Electrical Connectors EIA-364-83A (Revision of EIA-364-83) November 2017 Electronic Components Industry Association EIA-364-83AANSI/EIA-364-83A-2017 Approved: November 20, 2017NOTICEEIA Engineering Standards and P

2、ublications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particul

3、ar need. Existence of such Standards and Publications shall not in any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by

4、 those other than ECIA members, whether the standard is to be used either domestically or internationally. Standards and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not assume any liability to any paten

5、t owner, nor does it assume any obligation whatever to parties adopting the Standard or Publication. This EIA Standard is considered to have International Standardization implications, but the International Electrotechnical Commission activity has not progressed to the point where a valid comparison

6、 between the EIA Standard and the IEC document can be made. This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and

7、to determine the applicability of regulatory limitations before its use. (From Standards Proposal No. 5351, formulated under the cognizance of the CE-2.0 Committee on EIA National Connector and Sockets Standards.) Published by Electronic Components Industry Association 2017 EIA Standards see 3.1 5.6

8、 Receptacle mounting, if applicable 6 Test documentation Documentation shall contain the details specified in clause 5, (when provided), and the following: 6.1 Title of test 6.2 Specimen description including fixture, if applicable 6.3 Test equipment used, and date of last and next calibration 6.4 V

9、alues and observations 6.5 Name of operator and start/finish date(s) of test EIA-364-83A Page A-1 Annex A Study of shell-to-shell conductivity and measurement techniques for composite connectors (informative) A.1 Background The shell to shell connector conductivity test is defined by EIA-364-83. Thi

10、s procedure describes a generic method for testing that requires creative interpretation and exercise of test techniques. The method describes the use of a voltmeter ( 2% of full scale accuracy), ammeter (1% accuracy), power supply (1.0 ampere 0.1 ampere), test probes 1.27 millimeters (0.050 inch) m

11、inimum spherical radius) and fixture (non-conductive). It then states to apply the current of 1 ampere maximum at 1.5 volts dc maximum across the connector and measure the millivolt drop at points described by the individual connector specification with the 1.27 millimeters (0.050 inch) minimum radi

12、us probes. A.2 Problem A.2.1 The problem that occurs from the creative interpretation is that a variety of test techniques have been incorporated to determine the conductivity of a mated connector. Where in fact, the whole purpose of the testing is to determine the true ability of the mated connecto

13、r to carry current, the test becomes one of “technique” rather than connector performance. A.2.2 The question of application of current arises. This may appear to be obvious, but it is not. The current should flow through the connector from one end to the other. It could be applied using an alligato

14、r (or similar) clip on the end of the connector shell. This presents a number of questions: Do you place the clip on the castellations or the threads? How far onto the shell do you place it? Maybe a band should be used to distribute the current more evenly around the shell. If you use a band, how mu

15、ch force should it exert? Where should it be placed? Around the castellations or the threads? A.2.3 How far up the shell? Maybe a pressure pad on the end of the shell should be used this will then interface with the tops of the castellations and distribute current evenly. How much pressure should it

16、 exert on the shell to assure good contact? Should the pressure be the same for mated connectors and/or shell components? As the reader can see, there is a great variety of ways to just apply the current. A.2.4 A similar problem is inherent in the probing of the connector. It is not always clear whe

17、re the pick-up points should be or how far apart the probes should be or how much pressure the probes should exert. This is especially true when the probes are not spring loaded and are subject to technician hand pressure. Some connector finishes are sensitive to probe pressure and probe finish. EIA

18、-364-83A Page A-2 A.3 Solution A.3.1 The solution would then be to define a test method and fixture that would give a true picture of the connector performance and take away the creative interpretation. In doing this, there would result a standardized test procedure that all would use to obtain simi

19、lar data. The variability in the technique would be eliminated and more consistency in the results from various test houses would result. The fixture would have to eliminate both the subjective nature of the testing and any technician judgment. It would also have to be independent of technician tech

20、nique. A.3.2 One company has worked on this problem and proposes a test fixture that takes away inconsistencies in technique and operator variability. It provides all the criteria to take “the people factor” out of the testing and the test results. A.4 Fixture A.4.1 One company designed a test fixtu

21、re that controls variances in the setup, application of the current and reading of the millivolt drop. The test fixture applies uniform and consistent pressure on the ends of the shell components/or mated connectors, (Note: The force has to be sufficient to make good contact but not so high that it

22、drives the mated connector together). It also applies consistent pressure and distance for the pick-up probes that measure the millivolt drop. A.4.2 The current is applied through a weighted slide mechanism with plated gauze pads. The weighting of the slide assures that the pressure is the same each

23、 time the test is run. The gauze pads “mesh” with the castellations and assure uniform distribution of the current over the diameter of the part. The gold plating assures a clean conductive surface each time the test is performed. A.4.3 The test probes are spring loaded to apply the same pressure ea

24、ch and every time a test is performed. The probes are contained in a dielectric block that separates them to consistently apply the probing distance. The probes are gold plated with a 1.27 millimeter (0.050 inch) spherical tip 2.54 millimeters (0.100 inch) diameter probe to assure a clean and consis

25、tent pick up. A.5 Results Several tests were performed using various techniques prior to determining the effectiveness of the fixture. The progression of the test techniques follows: EIA-364-83A Page A-3 A.5.1 Alligator clips were used to apply the current and the millivolt drop was measured by prob

26、ing with hand pressure. This resulted in inconsistent readings depending on where the alligator clips were placed and how much pressure was applied to the probes. The alligator clips were placed on opposite ends of the connector in line on the same plane or 180 off on the opposite end. They were att

27、ached to the castellations and also to the threads. The probes were applied by hand. Figure A.1 Test fixture A.5.2 Bands were placed around the back of the connector to apply the current and the millivolt drop was measured by probing with hand pressure. This resulted in inconsistent readings dependi

28、ng on where the bands were placed and how much pressure was applied to the probes. The bands were placed on opposite ends of the connector, they were attached to the castellations and also to the threads. The probes were applied by hand. EIA-364-83A Page A-4 A.5.3 The connectors were also placed in

29、a vise between pressure pads to apply the current with the millivolt drop measurement being made by probing with hand pressure. This was an improvement over the alligator clips and the bands but was highly dependent on amount of pressure exerted by the vise. A.5.4 A wire mesh was inserted into the v

30、ise over the pressure pads to give better distribution of the current and take up some of the pressure variances exerted by the vise. The probing was still done with hand pressure. More consistent values were obtained but some inconsistencies were still noticed. A.5.5 This led to a weighted fixture

31、without wire mesh and probing with spring loaded probes. This displayed very consistent values but somewhat higher than the wire mesh in the vise. A.5.6 The fixture was then modified with gold plated wire mesh and probing with spring loaded probes. This fixture then displayed very consistent values

32、that were equivalent to the lowest values obtained by the other methods. This method was the best but was limited to testing only unwired connectors that is not always practical. A.5.6 The fixture was then modified with gold plated wire mesh and probing with spring loaded probes, see figure A.2. Thi

33、s fixture then displayed very consistent values that were equivalent to the lowest values obtained by the other methods obtained by the other methods. This method was the best but was limited to testing only unwired connectors that is not always practical. Figure A.2 - Plug shell under test EIA-364-

34、83A Page A-5 A.5.7 A final design was created, but not built, that conceptually allows for the testing consistency of the above solution and allow for the testing of wired connectors. This solution has the probes mounted to the end plates and the end plates are a shutter design allowing for wire tai

35、ls to pass through the end plates, see figure A.1. A.6 Conclusion A.6.1 This study resulted in a uniform test fixture and method (independent of technique) for unwired connectors that produces repeatable and accurate results. This fixture and technique eliminates most variables that affect results.

36、The proposed fixture/technique is applicable to most cylindrical connector types and finishes. A second fixture is proposed that allows for the testing of wired connectors while preserving the design features of the weighed fixture. ECIA Document Improvement Proposal If in the review or use of this

37、document, a potential change is made evident for safety, health or technical reasons, please fill in the appropriate information below and mail or FAX to: Electronic Components Industry Association EIA Standards & Technology Department 2214 Rock Hill Rd., Suite 265 Herndon, VA 20170 FAX: (571-323-02

38、45) Document No.: Document Title: Submitters Name: Telephone No.: FAX No.: e-mail: Address: Urgency of Change: Immediate: At next revision: Problem Area: a. Clause Number and /or Drawing: b. Recommended Changes: c. Reason/Rationale for Recommendation: Additional Remarks: Signature: Date: FOR ECIA US

39、E ONLYResponsible Committee: Chairman: Date comments forwarded to Committee Chairman: Revision History Revision letterProject numberPublication date Additions, changes and deletions - SP-2907-A August 1999 Initial publication A SP-5351 General revision and added informative annex A Electronic Components Industry Association 2214 Rock Hill Road, Suite 265 * Herndon, VA 20170 * tel 571-323-0294 * fax 571-323-0245 www.ecianow.org