ECA EIA-364-83-1999 TP-83 Shell-to-Shell and Shell-to-Bulkhead Resistance Test Procedure for Electrical Connectors《TP-83 电连接器外壳对外壳和外壳对体热电阻试验程序》.pdf

《ECA EIA-364-83-1999 TP-83 Shell-to-Shell and Shell-to-Bulkhead Resistance Test Procedure for Electrical Connectors《TP-83 电连接器外壳对外壳和外壳对体热电阻试验程序》.pdf》由会员分享，可在线阅读，更多相关《ECA EIA-364-83-1999 TP-83 Shell-to-Shell and Shell-to-Bulkhead Resistance Test Procedure for Electrical Connectors《TP-83 电连接器外壳对外壳和外壳对体热电阻试验程序》.pdf（12页珍藏版）》请在麦多课文档分享上搜索。

1、 EIA STANDARD TP-83 Shell-to-Shell and Shell-to-Bulkhead Resistance Test Procedure for Electrical Connectors EIA-364-83 August 1999 EIA-364-83 ANSI/EIA-364-83-1999 (R2013) Approved: April 7, 1999 Reaffirmed: January 28, 2013 NOTICE EIA Engineering Standards and Publications are designed to serve the

2、 public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such Standards

3、and Publications shall not in any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than ECIA members, wheth

4、er the standard is to be used either domestically or internationally. Standards and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not assume any liability to any patent owner, nor does it assume any oblig

5、ation whatever to parties adopting the Standard or Publication. This EIA Standard is considered to have International Standardization implication, but the International Electrotechnical Commission activity has not progressed to the point where a valid comparison between the EIA Standard and the IEC

6、document can be made. This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applicability of regu

7、latory limitations before its use. Created under Standards Proposal No. 2907-A and reaffirmed under Standards Proposal No. 5253.03 formulated under the cognizance of the CE-2.0 Committee on EIA National Connector and Socket Standards). Published by Electronic Components Industry Association 2013 Eng

8、ineering Department 2214 Rock Hill Road, Suite 170 Herndon, VA 20170 PLEASE! DONT VIOLATE THE LAW! This document is copyrighted by the ECIA and may not be reproduced without permission. Organizations may obtain permission to reproduce a limited number of copies through entering into a license agreem

9、ent. For information, contact: IHS 15 Inverness Way East Englewood, CO 80112-5704 or call USA and Canada (1-877-413-5184), International (303-397-7956) i Clause 1 CONTENTS Introduction Page11.1 Scope . 11.2 Object . 12 Test resources 12.1 Equipment 12.2 Fixture 23 Test specimen . 23.1 Description .

10、23.2 Preparation . 24 Test procedure 24.1 Shell to shell resistance . 24.2 Mated connector to bulkhead resistance 25 Details to be specified . 36 Test documentation 3ii (This page left blank) EIA-364-83 Page 1 TEST PROCEDURE No. 83 SHELL-TO-SHELL AND SHELL-TO-BULKHEAD RESISTANCE TEST PROCEDURE FOR E

11、LECTRICAL CONNECTORS (From EIA Standards Proposal No. 2907-A, formulated under the cognizance EIA CE-2.0 Committee on National Connector Standards.) 1 Introduction 1.1 Scope This standard test procedure applies to mated plugs and receptacles or mated plugs and receptacles mounted to a bulkhead with

12、conductive shells and/or mounting flange. 1.2 Object The object of this procedure is to determine the electrical bonding of mated plugs and receptacles or the electrical bonding of mated plug and receptacles mounted to a bulkhead. 2 Test resources 2.1 Equipment 2.1.1 Voltmeter Capable of measuring t

13、he applied voltage within 2%. 2.1.2 Ammeter Capable of measuring the applied current within 1%. 2.1.3 Regulated current power supply Capable of delivering up to 1.0 ampere 0.1 ampere. 2.1.4 Test probes with spherical end of 1.27 mm (0.050 in) minimum radius shall be used to make voltage measurements

14、 on the mated connectors or connector bodies to mounting surfaces. EIA-364-83 Page 2 2.2 Fixture Mounting fixture for testing mated connectors shall be of a nonconductive material and may be adjustable to accept various mated connectors. 3 Test specimen 3.1 Description The test specimen shall consis

15、t of a mated connector (plug and receptacle) or a mated connector mounted to a conductive surface (bulkhead). Test specimen shall be wired or unwired as specified in the referencing document. When assessing shell-to-shell resistance the mated connectors shall be placed on a nonconductive surface. 3.

16、2 Preparation Connectors to be tested shall be free from foreign matter that can affect their operation. 4 Test procedure Unless otherwise specified, a test current of 1.0 +/- 0.1 ampere dc at 1.5 volts maximum shall be caused to pass through the mated connector or through the mated connector and th

17、e mounting surface (bulkhead). The test probe shall not puncture or otherwise damage the connector finish. 4.1 Shell-to-shell resistance Unless otherwise specified, the voltage drop across the mated connector shall be measured from a point on the rear accessory thread on the plug to the mounting fla

18、nge on the receptacle. On square flange receptacles the point of measurement shall be adjacent to the mounting hole. On single hole mount receptacles the point of measurement shall be adjacent to the o-ring on the front or mounting side of the flange. 4.2 Mated connector to bulkhead resistance Unles

19、s otherwise specified, the voltage drop across the receptacle mounted to the bulkhead shall be measured from a point on the rear accessory thread on the plug to a point on the bulkhead next to the mounting flange. Be careful that the probe does not touch the mounting flange. EIA-364-83 Page 3 5 Deta

20、ils to be specified The following details shall be specified in the referencing document. 5.1 Number of specimens to be tested 5.2 Test current if other than specified herein 5.3 Point of voltage drop measurement if other than specified herein 5.4 Allowable voltage drop 5.5 Wired or unwired connecto

21、rs; see 3.1 5.6 Receptacle mounting, if applicable 6 Test documentation Documentation shall contain the details specified in clause 5, with any exceptions, and the following: 6.1 Title of test 6.2 Specimen description including fixture, if applicable 6.3 Test equipment used, and date of last and nex

22、t calibration 6.4 Values and observations 6.5 Name of operator ECIA Document Improvement Proposal If in the review or use of this document, a potential change is made evident for safety, health or technical reasons, please fill in the appropriate information below and mail or FAX to: Electronic Comp

23、onents Industry Association EIA Standards & Technology Department 2214 Rock Hill Rd., Suite 170 Herndon, VA 20170 FAX: (571-323-0245) Document No.: Document Title: Submitters Name: Telephone No.: FAX No.: e-mail: Address: Urgency of Change: Immediate: At next revision: Problem Area: a. Clause Number

24、 and /or Drawing: b. Recommended Changes: c. Reason/Rationale for Recommendation: Additional Remarks: Signature: Date: FOR ECIA USE ONLY Responsible Committee: Chairman: Date comments forwarded to Committee Chairman: Electronic Components Industry Association 2214 Rock Hill Road, Suite 170 * Herndon, VA 20170 * tel 571-323-0294 * fax 571-323-0245 www.eciaonline.org