ECA EIA-364-20E-2015 TP-20E Withstanding Voltage Test Procedure for Electrical Connectors Sockets and Coaxial Contacts (2).pdf

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1、 EIA STANDARD TP-20E Withstanding Voltage Test Procedure for Electrical Connectors, Sockets and Coaxial Contacts EIA-364-20E (Revision of EIA-364-20D) February 2015 Electronic Components Industry Association ANSI/EIA-364-20E-2015 Approved: February 11, 2015 EIA-364-20E NOTICE EIA Engineering Standar

2、ds and Publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his

3、particular need. Existence of such Standards and Publications shall not in any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntar

4、y use by those other than ECIA members, whether the standard is to be used either domestically or internationally. Standards and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not assume any liability to a

5、ny patent owner, nor does it assume any obligation whatever to parties adopting the Standard or Publication. This standard is based upon the major technical content of International Electrotechnical Commission standard 60512-4-1, voltage proof, 2003-05. It conforms in all essential respects this IEC

6、 standard. This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applicability of regulatory limi

7、tations before its use. (From Standards Proposal No. 5322, formulated under the cognizance of the CE-2.0 Committee on EIA National Connector and Sockets Standards.) Published by Electronic Components Industry Association 2015 EIA Standards see 2.1.5. EIA-364-20E Page 5 4.6.1 Number of contacts (Only

8、 applicable to methods A, B and C) Unless otherwise specified in the referencing document, a minimum of five measurements (5 adjacent contacts and/or 5 contacts-to-shell and/or 5 contacts-to-base plate) or 10% of the total number of contacts (whichever is greater) shall be made for each case, per te

9、st specimen. 5 Details to be specified The following details shall be specified in the referencing document: 5.1 Special high voltage source, if applicable; see 2.1.1 5.2 Minimum kilovolt ampere rating, if applicable; see 2.1.1 5.3 Current surge limits, and limiting device, if applicable; see 2.1.1

10、5.4 Voltmeter accuracy, if other than at least 5 %; see 2.1.2 5.5 Leakage current if other than specified in 2.1.5 5.6 Define test specimen (mated or unmated); see 3.1 5.7 Special preparations or conditions, if required; see 3.2 5.8 Method of connection of test voltage to specimen, if significant; s

11、ee 3.2 5.9 Points of application of test voltage; see 4.1 5.10 Barometric pressure; see 4.2 5.10.1 Dielectric withstanding voltage requirements at sea level; see 4.2 5.10.2 Dielectric withstanding voltage requirements at reduced pressure, if applicable; see 4.2 5.10.3 Test during and after subjectio

12、n to reduced pressure; see 4.2.1 5.10.4 Method of mounting in test chamber; see 4.2.1 5.11 Magnitude of test voltage; see 4.3 5.12 Nature of potential (ac or dc); see 4.3 EIA-364-20E Page 6 5.13 Test voltage and duration for implant quality conformance testing; see 4.5 5.14 Duration of application o

13、f test voltage for qualification testing if other than 60 seconds; see 4.5 5.15 Examination and measurement of specimen, detail requirements (if required) ; see 4.6 5.16 Number of specimens to be tested. 6 Test documentation Documentation shall contain the details specified in clause 5, with any exc

14、eptions, and the following: 6.1 Title of test 6.2 Specimen description include fixturing 6.3 Test equipment used, and date of last and next calibration 6.4 Test procedure 6.5 Values and observations 6.6 Name of operator and start/finish date(s) of test EIA-364-20E Page A-1 Annex A A Normative A.1 Th

15、e test consists of the application of a voltage higher than rated voltage for a specific time between mutually insulated portions of a connector or between insulated portions and ground. For purposes of standardization, the withstanding voltage shall be established as 75% of the minimum breakdown vo

16、ltage of the connector, and it is suggested that the operating rated voltage of the connector be established as 1/3 of the withstanding voltage. EIA-364-20E Page B-1 Annex B B Informative B.1 This test is often erroneously termed a voltage breakdown or dielectric strength test. It is not intended th

17、at this test cause insulation breakdown or that it be used for detecting corona. It serves to determine whether insulating materials and spacings in the component parts are adequate. When a connector is faulty in these respects, application of the test voltage will result in either disruptive discha

18、rge or deterioration. Disruptive discharge is evidenced by flashover (surface discharge), sparkover (air discharge), or breakdown (puncture discharge). B.2 Dielectric behavior of gases and solids is affected in various degrees by many factors, such as atmosphere temperature, humidity, and pressure;

19、condition and form of electrodes; frequency, waveform, rate of application, and duration of test voltage; geometry of the specimens; rate of application, and duration of test voltage; geometry of the specimens; mechanical stresses; and previous test history. Unless these factors are properly selecte

20、d as required by the type of dielectric, or suitable correction factors can be applied, comparison of the results of individual dielectric withstanding voltage test may be extremely difficult. B.3 The withstanding voltage shall never be used as the operating rated voltage of the connector. The withs

21、tanding voltage test should be used with caution particularly in implant quality conformance testing, as even an overpotential less than a breakdown voltage may injure the insulation and thereby reduce its safety factor. Therefore, repeated application of the test voltage on the same specimen is not

22、 recommended. In cases when subsequent application of the test potential is specified in the test routine, it is recommended that the succeeding tests be made at reduced potential. When either alternating-current (ac) or direct-current (dc) test voltage is free of recurring transients or high peaks.

23、 Direct potentials are less damaging than alternating potentials that are equivalent in ability to detect flaws in design and construction. However, the latter are usually specified because high alternating potentials are more readily obtainable. Since deterioration due to excessive leakage currents

24、 may have an adverse effect on the electrical parameters or physical characteristics of the connector, the leakage current during the withstanding voltage test shall be limited to a maximum of 5 mA. Suitable precautions shall be taken to protect test personnel and apparatus because of the high poten

25、tials used. ECIA Document Improvement Proposal If in the review or use of this document, a potential change is made evident for safety, health or technical reasons, please fill in the appropriate information below and mail or FAX to: Electronic Components Industry Association EIA Standards & Technol

26、ogy Department 2214 Rock Hill Rd., Suite 265 Herndon, VA 20170 FAX: (571-323-0245) Document No.: Document Title: Submitters Name: Telephone No.: FAX No.: e-mail: Address: Urgency of Change: Immediate: At next revision: Problem Area: a. Clause Number and /or Drawing: b. Recommended Changes: c. Reason

27、/Rationale for Recommendation: Additional Remarks: Signature: Date: FOR ECIA USE ONLY Responsible Committee: Chairman: Date comments forwarded to Committee Chairman: Revision History Revision letter Project number Publication date Additions, changes and deletions - SP-1016 December 1969 Initially pu

28、blished in EIA RS-364 A SP-1555 February 1983 B SP-4212 April 1999 C SP-5051 June 2004 D SP-5160 March 2008 E SP-5322 Revise paragraph 3.1 to clarify specimen test condition Electronic Components Industry Association 2214 Rock Hill Road, Suite 265 * Herndon, VA 20170 * tel 571-323-0294 * fax 571-323-0245 www.ecianow.org