DLA SMD-5962-97540 REV B-2012 MICROCIRCUIT DIGITAL 3 3 V PHASE LOCK LOOP CLOCK DRIVER WITH THREE-STATE OUTPUTS MONOLITHIC SILICON.pdf

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1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Make change to the tphaseerror test in table I. Update boilerplate to reflect current requirements. -rrp 02-06-28 R. MONNIN B Update drawing as part of five year review. rrp 12-04-09 C. SAFFLE REV SHEET REV B B B SHEET 15 16 17 REV STATUS REV B B

2、 B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Rajesh Pithadia DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPA

3、RTMENT OF DEFENSE CHECKED BY Rajesh Pithadia APPROVED BY Raymond Monnin MICROCIRCUIT, DIGITAL, 3.3 V PHASE LOCK LOOP CLOCK DRIVER WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON DRAWING APPROVAL DATE 97-04-29 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-97540 SHEET 1 OF 17 DSCC FORM 2233 APR 9

4、7 5962-E305-12 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97540 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents t

5、wo product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assura

6、nce (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 97540 01 Q X A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Device class designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing nu

7、mber 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA desig

8、nator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54CDC586 3.3 V Phase Lock Loop Clock Driver with 3-State Outputs, TTL Compatible Inputs 1.2.3 Device class designator. The d

9、evice class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q o

10、r V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X GDFP1-F56 56 Flat pack 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535

11、 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97540 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC

12、 FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) -0.5 V dc to +4.6 V dc DC input voltage range (VIN) -0.5 V dc to +7.0 V dc 4/ Voltage range applied to any output in the high state or power-off state (VOUT) . -0.5 V dc to VCC+ 0.5 V dc 4/ Current into any output in

13、 the low state, IO.+64 mA DC input clamp current (IIK) (VIN 0.0) -20 mA DC output clamp current (IOK) (VOUT 0.0) -50 mA Maximum power dissipation at TA= +55C (in still air) (PD) . 1.2 W 5/ Storage temperature range (TSTG) . -65C to +150C Lead temperature (soldering, 10 seconds) +300C Thermal resista

14、nce, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) +175C 1.4 Recommended operating conditions. 2/ 3/ 6/ Supply voltage range (VCC) +3.0 V dc to +3.6 V dc Minimum high level input voltage (VIH) . +2.0 V Maximum low level input voltage (VIL) +0.8 V Input voltage range (VIN) +0.0 V

15、 dc to 5.5 V dc Maximum high level output current (IOH) -32 mA Maximum low level output current (IOL) +32 mA Case operating temperature range (TC) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks for

16、m a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE

17、 STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are avai

18、lable online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels m

19、ay degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages are referenced to GND. 3/ The limits for the parameters specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 4/ The input and output negative-voltage ratings m

20、ay be exceeded provided that the input and output clamp-current ratings are observed. 5/ The maximum package power dissipation is calculated using a junction temperature of 150C and a board trace length of 750 mils. 6/ Unused inputs must be held high or low to prevent them from floating. Provided by

21、 IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97540 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 2.2 Order of precedence. In the event of a conflict between the text o

22、f this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device c

23、lasses Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class

24、 M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL

25、-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth tables. The truth tables shall be as specified on figure 2. 3.2.4 B

26、lock diagram. The block diagram shall be as specified on figure 3. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall

27、 apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 here

28、in. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked.

29、 Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535

30、. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see

31、6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of

32、 supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as requir

33、ed for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime -VA of change of prod

34、uct (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritimes agent, and the acquiring activity retain the option to review the ma

35、nufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 38 (see MIL-PR

36、F-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97540 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance chara

37、cteristics. Test and MIL-STD-883 test method 1/ Symbol Conditions 2/ -55C TC +125C +3.0 V VCC +3.6 V unless otherwise specified Group A subgroups Device type Limits 3/ Unit Min Max Input clamp voltage VIKVCC= 3 V, II= -18 mA 1, 2, 3 01 -1.2 V High-level output voltage (3006) VOH4/ VCC= 3 V to 3.6 V,

38、 IOH= -100 A 1, 2, 3 01 VCC- 0.2 V VCC= 3 V, IOH= -32 mA 2 Low-level output voltage (3007) VOL4/ VCC= 3 V, IOL= 100 A 1, 2, 3 01 0.2 V VCC= 3 V, IOL= 32 mA 0.5 Input current high (3010) IIH5/ VCC= 0 V or 3.6 V , VI= 3.6 V 1, 2, 3 01 +10.0 A VCC= 3.6 V, VI= VCCor GND +1.0 Input current low (3009) IIL

39、6/ VCC= 0 V or 3.6 V, VI= 3.6 V 1, 2, 3 01 -10.0 A VCC= 3.6 V, VI= VCCor GND -1.0 Three-state output leakage current high (3021) IOZHVCC= 3.6 V, VOUT= 3 V 1, 2, 3 01 +10.0 A Three-state output leakage current low (3020) IOZLVCC= 3.6 V, VOUT= 0 V 1, 2, 3 01 -10.0 A Quiescent supply current (3005) ICC

40、VCC= 3.6 V, IO= 0, VIN= VCCor GND, outputs high 1, 2, 3 01 1.0 mA VCC= 3.6 V, IO= 0, VIN= VCCor GND, outputs low 1.0 VCC= 3.6 V, IO= 0, VIN= VCCor GND, outputs disabled 1.0 Input capacitance (3012) CINTC= +25 C, VCC= 3.0 V, See 4.4.1d 4 01 4.0 pF Output capacitance (3012) COUTTC= +25 C, VCC= 3.0 V,

41、See 4.4.1d 4 01 8.0 pF Functional tests (3014) 7/ VIN= VIHor VIL, VCC= 3.0 V, Verify output VOUT, See 4.4.1c 7, 8 01 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97540 DLA LA

42、ND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test and MIL-STD-883 test method 1/ Symbol Conditions 2/ -55C TC +125C +3.0 V VCC +3.6 V unless otherwise specified Group A subgroups Device type Limi

43、ts 3/ Unit Min Max Clock frequency fCLKVCO is operating at four times the CLKIN frequency. VCC= 3.0 V 9, 10, 11 01 25.0 50.0 MHz VCO is operating at double the CLKIN frequency. VCC= 3.0 V 50.0 100.0 Input clock duty cycle - VCC= 3.0 V 9, 10, 11 01 40 60 % Stabilization time 8/ After SEL1, SEL0, VCC=

44、 3.0 V 9, 10, 11 01 50.0 s After OE 50.0 After power up, VCC= 3.0 V 50.0 After CLKIN, VCC= 3.0 V 50.0 Maximum operating frequency fMAX9/ CL= 30 pF minimum See figure 4 VCC= 3.0 V 9, 10 ,11 01 100.0 MHz Duty cycle to Y - 9/ CL= 30 pF minimum See figure 4 VCC= 3.0 V 9, 10, 11 01 42 58 % Propagation de

45、lay tphaseerror 9/ 10/ CL= 30 pF minimum See figure 4 CLKIN to Y VCC= 3.0 V 9, 10, 11 01 -500 500 ps Output skew tsk(o)9/ 10/ CL= 30 pF minimum See figure 4 VCC= 3.0 V 9, 10, 11 01 0.75 ns Process skew tsk(pr)9/ 10/ CL= 30 pF minimum See figure 4 VCC= 3.0 V 9, 10, 11 01 1.1 ns Rise time tr 9/ CL= 30

46、 pF minimum See figure 4 VCC= 3.0 V 9, 10, 11 01 1.4 ns Fall time tf 9/ CL= 30 pF minimum See figure 4 VCC= 3.0 V 9, 10, 11 01 1.4 ns See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A

47、5962-97540 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. 1/ For tests not listed in the referenced MIL-STD-883, utilize the general test procedure of 883 under the conditions listed herein.

48、2/ Each input/output, as applicable, shall be tested at the specified temperature, for the specified limits, to the tests in table I herein. Output terminals not designated shall be high level logic, low level logic, or open, except for the ICCtest, where the output terminals shall be open. When performing the ICCtest, the current meter shall be placed in the circuit such that all current flows through the meter. The values to be used for VIHand VILshall be the VIHminimum and VILmaximum values listed in section 1.4 herein. 3/ For negative and posi