DLA SMD-5962-95553 REV B-2013 MICROCIRCUIT LINEAR PRECISION DUAL OPERATIONAL AMPLIFIER MONOLITHIC SILICON.pdf

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1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Drawing updated to reflect current requirements. gt 03-03-14 R. Monnin B Update drawing to current MIL-PRF-38535 requirement. Remove class M references. jt 13-09-03 C. SAFFLE REV SHEET REV SHEET REV STATUS REV B B B B B B B B B B B B OF SHEETS SH

2、EET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY RAJESH PITHADIA DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY RAJESH PITHADI

3、A APPROVED BY MICHAEL FRYE MICROCIRCUIT, LINEAR, PRECISION DUAL OPERATIONAL AMPLIFIER, MONOLITHIC SILICON DRAWING APPROVAL DATE 94-12-28 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-95553 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E553-13 Provided by IHSNot for ResaleNo reproduction or networ

4、king permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95553 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents three product assurance class levels consisting of space application (

5、device class V), high reliability (device class Q), and nontraditional performance environment (device class N). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels

6、is reflected in the PIN. For device class N, the user is cautioned to assure that the device is appropriate for the application environment. 1.2 PIN. The PIN is as shown in the following example: 5962 - 95553 01 N X D Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)

7、Device class designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes N, Q, and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA d

8、evice. 1.2.2 Device type. The device type identify the circuit function as follows: Device type Generic number Circuit function 01 TLC27L7M precision dual operational amplifier 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as fo

9、llows: Device class Device requirements documentation N Certification and qualification to MIL-PRF-38535 with a nontraditional performance environment (encapsulated in plastic) 1/ Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outlines. The case outlines are as designated in MIL-

10、STD-1835, and as follows: Outline letter Descriptive designator Terminals Package style Document X See figure 1 14 Plastic small-outline package MIL-STD-1835 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes N, Q, and V. 2/ Any device outside the traditional perf

11、ormance environment (encapsulated in plastic). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95553 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.2.5.1 Lead

12、 finish D. Lead finish D shall be designated by a single letter as follows: Finish letter Process D Palladium 1.2.6 Device class N manufacturer PIN. For device class N, plastic encapsulated microcircuits (PEMs) the following manufacturer PIN (see 3.5.1 herein) shall be marked: Standard microcircuit

13、drawing PIN 2/ Manufacturer PIN 5962-9555301NXD 27L7M 1.3 Absolute maximum ratings. 3/ Supply voltage (VDD) 4/ +18 V dc Differential input voltage (VID) 5/ VDDInput voltage range (VI) -0.3 V dc to VDDInput current (II) 5 mA Output current (IO) (each output) 30 mA Total current into VDDterminal . +45

14、 mA Total current out of ground terminal . +45 mA Duration of short-circuit current (TA 25C) 6/ Unlimited Continuous total power dissipation (PD) 7/ 725 mW Storage temperature range -65C to +150C Lead temperature (soldering, 10 seconds) +260C 1.4 Recommended operating conditions. Supply voltage (VDD

15、) . +4 V dc min to +16 V dc max Common mode input voltage (VIC) VDD= 5 V 0 V dc min to 3.5 V dc max VDD= 10 V 0 V dc min to 8.5 V dc max Operating free-air temperature (TA) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, stan

16、dards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification fo

17、r. 2/ The SMD PIN is provided for cross reference information, see 3.5.1 herein. 3/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 4/ All voltage values except differential

18、voltages are with respect to network ground. 5/ Differential voltages are at the non-inverting input terminal with respect to the inverting input terminal. 6/ The output may be shorted to either supply. Temperature and/or supply voltages must be limited to ensure that the maximum dissipation rating

19、is not exceeded. 7/ Above +25C, derate at a factor of 5.8 mW/C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95553 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 AP

20、R 97 DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies o

21、f these documents are available online at http:/quicksearch.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, th

22、e text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes N, Q, and V shall be in accordance with MIL

23、-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimen

24、sions shall be as specified in MIL-PRF-38535 and herein for device classes N, Q, and V. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance cha

25、racteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The e

26、lectrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the e

27、ntire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes N, Q, and V shall be in accordance with MIL-PRF-38535. 3.5.

28、1 Marking for device class N. For PEM packages the SMD PIN in 1.2 herein and the MIL-PRF-38535 marking is not required. Marking on the device shall include; a traceable date code, country of origin, pin one indicator and manufacturers identification. In addition, the QML certification mark and the m

29、anufacturer PIN as shown in 1.2.6 herein shall be marked on the topside of the package. Manufacturer may at their option place the QML certification mark adjacent to the manufacturer pin. In all cases, the purchase order shall reflect the SMD PIN as shown in 1.2 herein. 3.5.2 Certification/complianc

30、e mark. The certification mark for device classes N, Q, and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95553 DLA LAND AND MARITIME COLUMBUS, OHIO 4

31、3218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 3.6 Certificate of compliance. For device classes N, Q, and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). The certificate of com

32、pliance submitted to DLA Land and Maritime -VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes N, Q, and V, the requirements of MIL-PRF-38535 and herein. 3.7 Certificate of conformance. A certificate of conforman

33、ce as required for device classes N, Q, and V in MIL-PRF-38535 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. For device classes N, Q, and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as m

34、odified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. For device classes N, Q, and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices

35、 prior to qualification and technology conformance inspection. 4.2.1 Additional criteria. a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturers QM plan in accordance with MIL-PRF-38535. The burn-in test circuit s

36、hall be maintained under document revision level control of the device manufacturers Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power d

37、issipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein. c. Additional screening for device class V beyond the requirements of device class Q shall be as specified

38、in MIL-PRF-38535, appendix B. 4.3 Qualification inspection. Qualification inspection for device classes N, Q, and V shall be in accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups A, B, C, D, and E inspections (see 4.4.1 through

39、4.4.4). 4.4 Conformance inspection. Technology conformance inspection for classes N, Q, and V shall be in accordance with MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified. 4.4.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, 6,

40、7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table II herein. 4.4.2.1 Additional criteria. The steady-state life test duration, test condition and test temperatur

41、e, or approved alternatives shall be as specified in the device manufacturers QM plan in accordance with MIL-PRF-38535. The test circuit shall be maintained under document revision level control by the device manufacturers TRB, in accordance with MIL-PRF-38535, and shall be made available to the acq

42、uiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL-STD-883. Provided by IHSNot for ResaleNo reproduction or networking permitted without licens

43、e from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95553 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device t

44、ype Limits 2/ Unit Min Max Input offset voltage VIOVDD= 5 V, VOUT= 1.4 V, VIC= 0 V, RS= 50 , 1 All 500 V RL= 1 M 2,3 3750 VDD= 10 V, VOUT= 1.4 V, VIC= 0 V, 1 800 RS= 50 , RL= 1 M 2,3 4300 Input offset current IIOVDD= 5 V, VOUT= 2.5 V, VIC= 2.5 V 2 All 15 nA VDD= 10 V, VOUT= 5 V, VIC= 5 V 2 15 Input

45、bias current IIBVDD= 5 V, VOUT= 2.5 V, VIC= 2.5 V 2 All 35 nA VDD= 10 V, VOUT= 5 V, VIC= 5 V 2 35 Common-mode input voltage range (also VICRVDD= 5 V 1 All 0 to 4 V applies to each input individually) 2,3 0 to 3.5 VDD= 10 V 1 0 to 9 2,3 0 to 8.5 High-level output voltage VOHVDD= 5 V, VID= 100 mV, 1 A

46、ll 3.2 V RL= 1 M 2,3 3.0 VDD= 10 V, 1 8.0 VID= 100 mV, RL= 1 M 2,3 7.8 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95553 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVI

47、SION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits 2/ Unit Min Max Low-level output voltage VOLVDD= 5 V, VID= -100 mV, IOL= 0 1,2,3 All 50 mV V

48、DD= 10 V, VID= -100 mV, IOL= 0 Large-signal differential AVDVDD= 5 V, RL= 1 M, 1 All 50 V/mV voltage amplification VOUT= 0.25 V to 2 V 2,3 25 VDD= 10 V, RL= 1 M, 1 50 VOUT= 1 V to 6 V 2,3 25 Common-mode rejection CMRR VDD= 5 V, 1 All 65 dB ratio VICR= VICRmin 2,3 60 VDD= 10 V, 1 65 VICR= VICRmin 2,3 60 Supply-voltage rejection kSVRVDD= 5 V to 10 V, 1 All 70 dB ratio (VDD/ VIO) VOUT = 1.4 V 2,3 60 Supply current (four IDDVDD= 5 V, 1 All 34 A amplifiers) VOUT= 2.5 V, 2 24 VIC= 2.5 V, no lo