DLA SMD-5962-93191 REV F-2012 MICROCIRCUIT HYBRID LINEAR 5 VOLT DUAL CHANNEL DC-DC CONVERTER.pdf

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1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R250-94. 94-07-25 K. A. Cottongim B Add case outlines T, U, Y, and Z. 97-10-22 K. A. Cottongim C Update drawing boilerplate. 04-07-28 Raymond Monnin D Paragraph 1.3, add note to input voltage range. Add device

2、type 02. Table I, add Radiation Hardness Assurance (RHA) test limits for device type 02. Paragraph 4.3.5, add RHA requirements. Table I, TTLINEtest, device types 01 and 02, non-RHA, correct limits from 300 ms max to -300 ms min and +300 ms max for both test conditions. Figure 2, note 2, last sentenc

3、e, change 185 watts and 15 volts to 142.5 watts and 5 volts. -gz 07-07-12 Robert M. Heber E Added footnote 1 to table II, under group C end-point electricals. Updated drawing paragraphs. -sld 09-10-14 Charles F. Saffle F Figure 1, Case outline X; Changed dimension from “E1“ to “E“ and the dimension

4、from “E2“ to “E1“. Updated drawing paragraphs. -sld 12-06-01 Charles F. Saffle REV SHEET REV F F SHEET 15 16 REV STATUS REV F F F F F F F F F F F F F F OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Steve L. Duncan DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.land

5、andmaritime.dla.mil/ STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael Jones THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID, LINEAR, 5 VOLT, DUAL CHANNEL, DC-DC CONVERTER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 94-05-

6、26 AMSC N/A REVISION LEVEL F SIZE A CAGE CODE 67268 5962-93191 SHEET 1 OF 16 DSCC FORM 2233 APR 97 5962-E353-12 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93191 DLA LAND AND MARITIME COLUMBUS, OHIO 43218

7、-3990 REVISION LEVEL F SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). W

8、hen available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 93191 01 H X A Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designat

9、or (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). Th

10、e device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 MFL2805D DC-DC converter, 50 W, 5 V outputs 02 SMFL2805D DC-DC converter, 50 W, 5 V outputs 1.2.3 Device class designator. This device class designator shall be a single letter identifying the p

11、roduct assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliabil

12、ity class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses

13、the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the other

14、classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufac

15、turer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93

16、191 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style T See figure 1 12 Tabbed flange mount, lead fo

17、rmed up U See figure 1 12 Flange mount, lead formed down X See figure 1 12 Flange mount, short lead Y See figure 1 12 Tabbed flange mount, short lead Z See figure 1 12 Tabbed flange mount, lead formed down 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximu

18、m ratings. 1/ Input voltage range (VIN) 2/ -0.5 V dc to +50 V dc Power dissipation (PD): Device types 01 and 02 (non-RHA) 18 W Device type 02 (RHA levels P, L, and R) 20 W Lead soldering temperature (10 seconds) . +300 C Storage temperature range -65 C to +150 C 1.4 Recommended operating conditions.

19、 Input voltage range (VIN) . +16 V dc to +40 V dc Output power . 50 W Case operating temperature range (TC) -55 C to +125 C 1.5 Radiation features. Maximum total dose available (dose rate = 9 rad(Si)/s): Device type 02 (RHA levels P, L, and R) 100 krad (Si) 3/ 2. APPLICABLE DOCUMENTS 2.1 Government

20、specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MI

21、L-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the

22、device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ An under voltage lockout circuit shuts the unit off when the input voltage drops to approximately 12 V. Operation of the unit between 12 V and 16 V is nondestructive. At reduced output power, regulati

23、on may be maintained but performance is not guaranteed. 3/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end-point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883, method

24、1019, condition C, tested at 9 rad(Si)/s. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93191 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 4 DSCC FORM 2234 APR 97 DEPARTMENT OF DEF

25、ENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelph

26、ia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obta

27、ined. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality

28、 Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in

29、 the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) s

30、hall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Radiation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document revision level control and shall be ma

31、de available to the preparing and acquiring activity upon request. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical

32、 test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed i

33、n 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conf

34、ormance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made avail

35、able to the preparing activity (DLA Land and Maritime-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime-VA shall affir

36、m that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and insp

37、ection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. Provided by IHSNot for ResaleNo reproduction

38、or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93191 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 5 DSCC FORM 2234 APR 97 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria sh

39、all apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DLA Land and Maritime-VA or the acquiring activity upon request. Also, the te

40、st circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as

41、specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93191 DLA LAND AND

42、MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ 2/ -55 C TC +125 C VIN= 28 V dc 0.5 V dc no external sync, CL= 0 unless otherwise specified Group A subgroups Device type Limits Unit Min Max O

43、utput voltage VOUT IOUT= 5.0 A dc, (main) 1 01,02 +4.95 +5.05 V 2,3 +4.85 +5.15 P,L,R 1,2,3 02 +4.70 +5.30 IOUT= 5.0 A dc, (dual) 1 01,02 -4.92 -5.08 2,3 -4.82 -5.18 P,L,R 1,2,3 02 -4.67 -5.33 Output current 3/ IOUT VIN= 16 V, 28 V, and 1,2,3 01,02 10.0 A 40 V dc, sum of both outputs P,L,R 1,2,3 02

44、10.0 VOUTripple voltage VRIPIOUT= 5.0 A, (main) BW = 10 kHz to 2 MHz 1 01,02 50 mV p-p 2,3 100 P,L,R 1,2,3 02 125 IOUT= 5.0 A, (dual) BW = 10 kHz to 2 MHz 1 01,02 50 2,3 100 P,L,R 1,2,3 02 125 VOUTline regulation VRLINEIOUT= 5.0 A, (main) 1,2,3 01,02 50 mV VIN = 16 V dc to 40 V dc P,L,R 1,2,3 02 100

45、 IOUT= 5.0 A, (dual) 1,2,3 01,02 100 VIN = 16 V dc to 40 V dc P,L,R 1,2,3 02 150 VOUTload regulation VRLOADIOUT= 0 to 5.0 A, (main) 1,2,3 01,02 50 mV P,L,R 1,2,3 02 75 IOUT= 0 to 5.0 A, (dual) 1,2,3 01,02 100 P,L,R 1,2,3 02 150 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduct

46、ion or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93191 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 2/ -55 C TC +

47、125 C VIN= 28 V dc 0.5 V dc no external sync, CL= 0 unless otherwise specified Group A subgroups Device type Limits Unit Min Max Input current IINIOUT= 0 A, inhibit 1 1,2,3 01,02 14 mA (pin 4) = 0 P,L,R 1,2,3 02 17 IOUT= 0 A, inhibit 2 1,2,3 01,02 70 (pin 12) = 0 P,L,R 1,2,3 02 90 IOUT= 0 A, inhibit

48、 1 1,2,3 01,02 120 (pin 4) and inhibit 2 (pin 12) = open P,L,R 1,2,3 02 150 IINripple current IRIPIOUT= 5.0 A, BW = 10 kHz to 10 MHz 1 01,02 45 mA p-p 2,3 50 P,L,R 1,2,3 02 75 Efficiency Eff IOUT= 5.0 A 1 01 77 % 02 75 2,3 01 75 02 73 P,L,R 1,2,3 02 71 Isolation ISO Input to output or any pin to 1 01,02 100 MW case at 500 V dc, TC= +25 C P,L,R 1 02 100 Capacitive load 4/ 5/ (each output) CL No effect on dc performance 4 01,02 500 mF TC= +25 C P,L,R 4 02 500 Power dissipation load fault