DLA SMD-5962-91716 REV A-2010 MICROCIRCUIT DIGITAL BIPOLAR ADVANCED SCHOTTKY TTL CLOCK DRIVER QUAD D-TYPE FLIP-FLOP WITH MATCHED PROPAGATION DELAYS MONOLITHIC SILICON.pdf

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1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update drawing to current requirements. Editorial changes throughout. - gap 10-05-14 Charles F. Saffle REV SHET REV SHET REV STATUS REV A A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY Larry T. Gauder DEFENS

2、E SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY Thomas M. Hess APPROVED BY Thomas M. Hess MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED SCHOTTK

3、Y TTL, CLOCK DRIVER, QUAD D-TYPE FLIP-FLOP WITH MATCHED PROPAGATION DELAYS, MONOLITHIC SILICON DRAWING APPROVAL DATE 94-05-18 AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-91716 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E155-10 Provided by IHSNot for ResaleNo reproduction or networking permit

4、ted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91716 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (devic

5、e classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown

6、in the following example: 5962 - 91716 01 M C X Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Leadfinish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet

7、the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The de

8、vice type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54F803 clock driver quad D-type flip-flops 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requi

9、rements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MI

10、L-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style C GDIP1-T14 or CDIP2-T14 14 dual-in-line package D GDFP1-F14 or CDFP2-F14 14 flat package 2 CQCC1-N20 20 square chip carrier package 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device

11、 classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91716 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC F

12、ORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Supply voltage range (VCC) . -0.5 V dc to +7.0 V dc Input voltage range (VIN) . -1.2 V dc at -18 mA to +7.0 V dc Storage temperature range . -65C to +150C Lead temperature (soldering, 10 seconds) +300C Junction temperature (TJ) +175C Maximum power dis

13、sipation (PD) 2/ 385 mW Thermal resistance, junction-to-case (JC) See MIL-STD-1835 1.4 Recommended operating conditions. Supply voltage range (VCC) . 4.5 V dc to 5.5 V dc Maximum input clamp current, (IIK) -1.2 mA Maximum high level output current, (IOH) . -1 A Maximum low level output current, (IOL

14、) 20 mA Input rise and fall times, (tr, tf) . 2.5 ns Maximum feedback time, tF(tF= tP+ tS) 11.5 max ns High level input voltage, (VIH) 2.0 V Low level input voltage, (VIL) . 0.8 V Case operating temperature range (TC) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and

15、 handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circ

16、uits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780

17、- Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the

18、 text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to

19、 the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Maximum power dissipation is defined as VCCx ICCand must withstand the added PDdue to the short circuit output test (e.g., IOS). Provided by IHSNot for ResaleNo reproduction or networking permitt

20、ed without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91716 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accor

21、dance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with M

22、IL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herei

23、n for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram

24、shall be as specified on figure 3. 3.2.5 Test circuit and switching waveforms. The test circuit and switching waveforms shall be as specified on figure 4. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance ch

25、aracteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are d

26、efined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “596

27、2-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The cer

28、tification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required fr

29、om a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificat

30、e of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and

31、herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. F

32、or device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain t

33、he option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit g

34、roup number 30 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91716 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TA

35、BLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC +125C 4.5 V VCC 5.5 V Group A subgroups Limits Unit unless otherwise specified Min Max High level output voltage VOHVCC= 4.5 V, VIH= 2.0 V, VIL= 0.8 V, IOH= -1.0 mA 1, 2, 3 2.5 V Low level output voltage VOLVCC= 4.5 V, VIH

36、= 2.0 V, VIL= 0.8 V, IOL= 20 mA 1/ 1, 2, 3 0.5 V Supply current ICCVCC= 5.5 V, VIN= 4.5 V 1, 2, 3 70 mA Input clamp voltage VIKVCC= 4.5 V, II= -18 mA 1 -1.2 V High level input current IIH1VCC= 5.5 V, VIH= 2.7 V 1, 2, 3 20 A IIH2VCC= 5.5 V, VIHH= 7.0 V 1, 2, 3 100 A Diode current IODVCC= 5.5 V, VIN=

37、5.5 V, VOUT= 2.5 V 1, 2, 3 35 mA Low level input current IILVCC= 5.5 V, VIN= 0.5 V 1, 2, 3 -0.03 -0.6 mA Short circuit output current IOSVCC= 5.5 V 2/ 1, 2, 3 -60 -150 mA Functional test VCC= 4.5 V and 5.5 V See 4.4.1b 7, 8 Propagation delay, Data to output tPLH1VCC= 5.0 V, CL= 50 pF, RL= 500 , See

38、figure 4 9 4.0 7.5 ns 10, 11 3.0 8.5tPHL19 4.0 7.5 ns 10, 11 3.0 8.5PS01 9, 10, 11 1.0 ns tPS 9, 10, 11 1.5 ns POS1 9, 10, 11 1.5 ns tPOS2 9, 10, 11 1.5 ns POS3 9, 10, 11 1.5 ns tPOS4 9, 10, 11 1.5 ns See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted

39、 without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91716 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TC +125C 4.5 V VCC 5.5 V Grou

40、p A subgroups Limits Unit unless otherwise specified Min Max Maximum clock frequency fMAXVCC= 5.0 V, CL= 50 pF, RL= 500 , See figure 4 9, 10, 11 70 MHz Setup time, Dnto CP tS(H), tS(L) 9, 10, 11 3.0 ns Hold time, Dnto CP th(H), th(L) 9, 10, 11 2.0 ns Pulse width tW(H), tW(L) 9, 10, 11 7.0 ns 1/ Due

41、to test equipment limitations actual test conditions for VIH= 2.2 V. However, the specified test limits and conditions are guaranteed. 2/ Not more than one output should be shorted at a time. For testing IOS, the use of high speed test apparatus and/or sample and hold techniques are preferable in or

42、der to minimize internal heating and more accurately reflect operational values. Otherwise prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOStests should be performe

43、d last. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91716 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 Device type 01 Case outline C and D 2 Term

44、inal number Terminal symbol Terminal symbol 1 GND NC 2 NC GND 3 O%0NC 4 D0NC 5 D1NC 6 O%1O%07 GND D08 CP D19 O%2O%110 D2GND 11 D3NC 12 O%3CP 13 NC O%214 VCCD215 NC16 D317 NC18O%319 NC20 VCCFIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without li

45、cense from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91716 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 Inputs Output DnCP O%nH L to H H L L to H L X X Z H = High voltage level L = Low voltage level X = Irrelevant Z = High impedance

46、L to H = Low to High transition. FIGURE 2. Truth table. FIGURE 3. Logic diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91716 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A

47、 SHEET 9 DSCC FORM 2234 APR 97 NOTES: 1. Pulse generator characteristics: PRR = 1 MHz, tr 2.5 ns, tf 2.5 ns, tP= 200 ns, ZOUT= 50 . 2. CL= 50 pF. 3. RL= 500 . 4. CLincludes probe and jig capacitance. FIGURE 4. Test circuit and switching waveforms. Provided by IHSNot for ResaleNo reproduction or netw

48、orking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91716 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 10 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the fo