DLA SMD-5962-91653 REV D-2013 MICROCIRCUIT LINEAR HIGH SPEED DUAL DRIVER MONOLITHIC SILICON.pdf

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1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R211-94. 94-06-07 Michael A. Frye B Changes in accordance with NOR 5962-R073-95. 95-03-06 Michael A. Frye C Drawing updated to reflect current requirements. - gt 03-02-27 Raymond Monnin D Make correction to sup

2、ply current, ICCL and ICCH, condition in Table I. -rrp 13-09-26 Charles F. Saffle THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHEET REV SHEET REV STATUS REV D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY SANDRA ROONEY DLA LAND AND MARITIME COLUMBUS,

3、 OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY CHARLES BESORE APPROVED BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, HIGH SPEED, DUAL DRIVER, MONOLITHIC SILICON DRAW

4、ING APPROVAL DATE 92-10-14 AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-91653 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E510-13 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91653 DLA LAND AND MARIT

5、IME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are ava

6、ilable and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 91653 01 M C A Federal stock class designator RHA designator (see 1.2.1) Devi

7、ce type (see 1.2.2) Device class designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M R

8、HA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 SG164

9、4 Dual high speed driver 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B m

10、icrocircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style C GDIP1-T14 or CDIP2-T14 14 Dua

11、l-in-line G MACY1-X8 8 Can P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or

12、 networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91653 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Supply voltage (VCC) . +22 V dc Logic input voltage (VIN) . +7.0 V dc Sou

13、rce/sink output current (each output): Continuous 0.5 A Pulse, 500 ns 3.0 A Storage temperature range -65C to +150C Power dissipation at TA= 25C (PD): Case C 1.4 W 2/ Case G 0.6 W 2/ Case P 1.0 W 2/ Case 2 . 1040 mW 2/ Lead temperature (soldering, 10 seconds) 300C Thermal resistance, junction-to-cas

14、e (JC) . See MIL-STD-1835 Junction temperature (TJ). +150C 1.4 Recommended operating conditions. Supply voltage range 4.5 V dc to 20 V dc 3/ Frequency range DC to 1.5 MHz Peak pulse current (IOUT) 3.0 A Logic input voltage (VIN) . -0.5 V dc to 5.5 V dc Ambient operating temperature range (TA) . -55C

15、 to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or

16、 contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE

17、HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/quicksearch.dla.mil/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.

18、) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. _ 1/ Stresse

19、s above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Derate linearly above TA= +25C, for case C derate to 11.2 mW/C, case G derate to 4.8 mW/C, case P derate to 8.0 mW/C, and case 2 d

20、erate to 8.3 mW/C. 3/ AC performance has been optimized for VCC= 8.0 V dc to 20 V dc. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91653 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHE

21、ET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 as specified herein, or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall

22、not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction,

23、 and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shal

24、l be as specified on figure 1. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operati

25、ng temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer

26、s PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classe

27、s Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for

28、device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device

29、class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing s

30、hall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q an

31、d V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime-VA of change of product (see 6.2 herein) involv

32、ing devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritimes agent, and the acquiring activity retain the option to review the manufacturers facility and ap

33、plicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 53 (see MIL-PRF-38535, appendix A). Provi

34、ded by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91653 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Con

35、ditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Logic 1 input voltage VIH 1, 2, 3 01 2.0 V Logic 0 input voltage VIL 1, 2, 3 01 0.7 V Input high current IIH VIN = 2.4 V 1, 2, 3 01 500 A VIN = 5.5 V 1.0 mA Input low current IIL VIN = 0 V 1, 2, 3 0

36、1 -4.0 mA Input clamp voltage VIC IIN = -10 mA 1, 2, 3 01 -1.5 V Output high voltage VOH IOUT = -200mA, 10 V VCC 20 V 1, 2, 3 01 VCC-3 V Output low voltage VOL IOUT = 200mA, 10 V VCC 20 V 1, 2, 3 01 1.0 V Supply current ICCL VIN = 0 V (both inputs) 1, 2, 3 01 27 mA ICCH VIN = 2.4 V (both inputs) 12

37、Propagation delay time, high to low level output tPHLVCC= 15 V, See figures CL= 1000 pF 2/ 9 01 30 ns 2 and 3 10, 11 40 CL = 2500 pF 9 35 10, 11 50 Propagation delay time, low to high level output tPLHVCC= 15 V, See figures CL= 1000 pF 2/ 9 01 25 ns 2 and 3 10, 11 30 CL = 2500 pF 9 30 10, 11 40 Outp

38、ut transition time, low to high level tTLHVCC= 15 V, See figures CL= 1000 pF 2/ 9 01 30 ns 2 and 3 10, 11 35 CL = 2500 pF 9 40 10, 11 50 Output transition time, high to low level tTHLVCC= 15 V, See figures CL= 1000 pF 2/ 9 01 25 ns 2 and 3 10, 11 30 CL = 2500 pF 9 40 10, 11 50 Dynamic supply current

39、 (both outputs) ICCCL= 2500 pF, f = 200 kHz, Duty cycle = 50%, See figure 2 4 01 35 mA 5, 6 40 1/ All tests are measured at VCC = 4.5 V and 20 V, unless otherwise specified. 2/ If not tested, shall be guaranteed to the limits specified in table I. Provided by IHSNot for ResaleNo reproduction or netw

40、orking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91653 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 Device types 01 Case outlines C G P 2 Terminal number Terminal symbol 1 NC OUT A IN A NC 2 NC PWR GND A PWR GND

41、 A PWR GND A 3 OUT A IN A PWR GND B NC 4 PWR GND A LOGIC GND IN B IN A 5 IN A IN B OUT B NC 6 NC PWR GND B LOGIC GND LOGIC GND 7 LOGIC GND OUT B VCC NC 8 NC VCC OUT A IN B 9 NC - - NC 10 IN B - - PWR GND B 11 PWR GND B - - NC 12 OUT B - - NC 13 NC - - OUT B 14 VCC - - NC 15 - - - VCC 16 - - - NC 17

42、- - - VCC 18 - - - NC 19 - - - OUT A 20 - - - NC NC = No connection NOTE: Case and mounting tab are internally connected to substrate ground. FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWIN

43、G SIZE A 5962-91653 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 FIGURE 2. Output load circuit. FIGURE 3. Switching time waveform. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT

44、 DRAWING SIZE A 5962-91653 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device

45、 manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. For device classes Q and V, scree

46、ning shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance

47、 inspection. 4.2.1 Additional criteria for device class M. a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity

48、upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein. 4.2.2 Additional criteria for device classes Q and V. a. The burn-in