DLA SMD-5962-90730 REV C-2009 MICROCIRCUIT HYBRID HIGH SPEED TRACK AND HOLD AMPLIFIER.pdf

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1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add vendor CAGE 34031. Add case outline Y. Editorial changes throughout. 92-01-06 Monica Poelking B Changes in accordance with NOR 5962-R191-93. 93-06-22 Kendall A. Cottongim C Add note to table II, Group C end-point test parameters. -gz 09-04-02

2、 Joseph D. RodenbeckTHE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV C C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY Robert M. Heber DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Gary Zahn C

3、OLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY William K. Heckman MICROCIRCUIT, HYBRID, HIGH SPEED TRACK AND HOLD AMPLIFIER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 90-12-18 AMSC N/A REVISION LEVEL C SIZE A CAGE

4、 CODE 67268 5962-90730 SHEET 1 OF 1 DSCC FORM 2233 APR 97 5962-E254-09Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90730 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DS

5、CC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiat

6、ion hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 90730 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see

7、 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the cir

8、cuit function as follows: Device type Generic number Circuit function 01 MN376, HTC-0300A High speed track and hold amplifier 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MI

9、L-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space application

10、s. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited

11、 temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of tha

12、t class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufact

13、urers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90730 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION L

14、EVEL C SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 24 Dual-in-line Y See figure 1 24 Dual-in-line 1.2.5 Lead finish. The lead finish shall be as

15、 specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Positive supply voltage (VCC) . +18 V dc Negative supply voltage (VEE) -18 V dc Logic supply voltage (VDD) . -0.5 V dc to +7 V dc Analog input channels VCCDigital input -0.5 V dc to +5.5 V dc Power dissipation 1.025 W Junction temperature

16、 (TJ) +175C Thermal resistance, junction-to-case (JC). 50C/W Thermal resistance, junction-to-ambient (JA) 70C/W Lead temperature (soldering, 10 seconds) 300C Storage temperature range -65C to +150C 1.4 Recommended operating conditions. Positive supply voltage range (VCC) . +14.55 V dc to +15.45 V dc

17、 Negative supply voltage range (VEE) -14.55 V dc to -15.45 V dc Logic supply voltage range (VDD). +4.75 V dc to +5.25 V dc Input voltage range -10.0 V dc to +10.0 V dc Output current 20 mA Case operating temperature range (TC). -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, stan

18、dards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybri

19、d Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780

20、- Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the tex

21、t of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the

22、device. Extended operation at the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90730 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990

23、REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as des

24、ignated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable dev

25、ice class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3

26、.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristi

27、cs are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s)

28、. Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of th

29、e device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are gua

30、ranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing

31、. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot o

32、f microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit

33、, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document

34、 revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAas specif

35、ied in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo repro

36、duction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90730 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions 1/ -55C

37、TC+125C unless otherwise specified Group A subgroups Device type Min Max Unit ANALOG INPUTS 1 -10.3 +10.2 Input voltage range VIN2,3 2/ 01 -10.3 +10.2 V Input resistance RINVIN= +10 V 2/ V(pin 11) = 0 V V(pin 12) = 0 V TA= +25C 4 01 0.75 2.00 k DIGITAL INPUTS (high) VIHLogic “1“ +2.0 Input voltage (

38、low) VILLogic “0“ for all digital inputs 1,2,3 01 +0.8 V (high) IIHVIH= +2.4 V +1.0 Input current (low) IILVIL= +0.4 V 1,2,3 01 -2.4 mA TRANSFER CHARACTERISTICS Initial -55C TC +125C 2,3 -35 +35 TC= +25C 1 -5.0 +5.0 Input offset voltage VIO End-points TC= +25C V(pin 13) = 0 V 1 01 -12.5 +12.5 mV Hol

39、d step (pedestal voltage) VHSTC= +25C4 01 -20 +20 mV Pedestal voltage temperature sensitivity VHS/TC4,5,6 01 -80 +200 V/C Initial -55C TC +125C 5,6 0.15 TC= +25C 4 0.1 Gain error AE End-points TC= +25C 4 01 0.2 % Gain linearity error ALBest straight line (5 points) 4,5,6 01 0.01 %FSR See footnotes a

40、t end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90730 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance ch

41、aracteristics. Limits Test Symbol Conditions 1/ -55C TC+125C unless otherwise specified Group A subgroups Device type Min Max Unit ANALOG OUTPUTS Output resistance RO1,2,3 01 1.0 DYNAMIC CHARACTERISTICS Initial -55C TC +25C 4,6 -5.0 +5.0 V/s TC= +125C 5 -3.0 +3.0 Hold mode droop VHD End-points TC= +

42、25C 4 01 -10 mV/s Track-to-hold transient voltage VTTHT2/ 9,10,11 01 380 mVp-p 10 V step to 1 mV 2/ 200 10 V step to 10 mV 2/ 170 Acquisition time ta1 V step to 10 mV 2/ 9,10,11 01 100 ns Settling to 1 mV 2/ 100 Transient response (settling time, track-to-hold) tr(ts) Settling to 10 mV 2/ 9,10,11 01

43、 85 ns Feedthrough rejection ratio FRR VIN= 20 Vp-p at 2.5 MHz TC= +25C 4 01 64 dB Slew rate SR VIN= -5 V to + 5 V step, 2/ V(pin 11) = 0 V, V(pin 12) = 0 V, TC= +25C 4 01 120 V/s Bandwidth, small signal (-3 dB) BW VIN= 1 Vp-p, 2/ V(pin 11) = 0 V, V(pin 12) = 0 V, TC= +25C 4 01 8 MHz Aperture time t

44、ap2/ 9,10,11 01 16 ns Aperture jitter jap2/ TC= +25C 4 01 -50 +50 ps See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90730 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-39

45、90 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions -55C TC+125C unless otherwise specified Group A subgroups Device type Min Max Unit POWER SUPPLY ICC+30 IEE-30 Supply current: positive supply (VCC) negative su

46、pply (VEE) logic supply (VDD) IDD1,2,3 01 +25mA Power consumption PDTC= +25C 1 01 1025 mW PSSR1 -5 +5 PSSR2 -5 +5 Power supply rejection ratio: positive supply (VCC) negative supply (VEE) logic supply (VDD) PSSR3 1,2,3 01 -5 +5mV/V 1/ VCC= +15 V, VEE= -15 V, VDD= 5 V, unless otherwise specified. 2/

47、Parameter shall be tested as part of device initial characterization and after design and process changes. Parameter shall be guaranteed to the limits specified in table I for all lots not specifically tested. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from

48、IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90730 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 Case outline X. Inches mm Inches mm Inches mm Inches mm .001 0.03 .035 0.89 .120 3.05 .810 20.57 .002 0.05 .087 2.21 .170 4.32 1.100 27.94 .010 0.25 .100 2.54 .600 15.24 1.275 32.38