DLA SMD-5962-90634 REV B-2004 MICROCIRCUIT HYBRID LINEAR 12-BIT DIGITAL-TO-ANALOG CONVERTER《12位数字模拟转变器 线性数字微型电路》.pdf

《DLA SMD-5962-90634 REV B-2004 MICROCIRCUIT HYBRID LINEAR 12-BIT DIGITAL-TO-ANALOG CONVERTER《12位数字模拟转变器 线性数字微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-90634 REV B-2004 MICROCIRCUIT HYBRID LINEAR 12-BIT DIGITAL-TO-ANALOG CONVERTER《12位数字模拟转变器 线性数字微型电路》.pdf（12页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Paragraph 1.4, change ambient to case. Table I, correct note 1. Update drawing boilerplate. 02-06-06 Raymond Monnin B Rewrite paragraphs 4.2.a.2. and 4.3.3.b.2 to add TC. 04-04-23 Raymond Monnin THE ORIGIANAL FIRST PAGE OF THIS DRAWING HAS BEEN R

2、EPLACED. REV SHEET REV SHEET REV STATUS REV B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Gary Zahn DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones POST OFFICE BOX 3990 COLUMBUS, OHIO 43216-5000 http:/www.dscc.dla.mil THIS

3、 DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Greg A. Lude MICROCIRCUIT, HYBRID, LINEAR, 12-BIT, DIGITAL-TO-ANALOG CONVERTER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 91-10-29 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-90634 SHEET 1 OF 11 DSCC FORM 223

4、3 APR 97 5962-E201-04 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90634 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This dra

5、wing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in t

6、he PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 90634 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardnes

7、s assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic nu

8、mber Circuit function 01 ADH-030 12-bit D/A converter 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Clas

9、s H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for u

10、se in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufa

11、cturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition

12、document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temp

13、erature range. 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 24 Dual-in-line 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. Provided by IHSNot for R

14、esaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90634 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Positive supply voltage (VCC). +18 V dc N

15、egative supply voltage (VEE) . -18 V dc Logic supply (VDD) . -1.6 V dc Digital inputs (pins 13 through 24): High 0 V Low -6 V dc Output current range . 0 to -16 mA Analog output voltage +5 V dc Junction temperature (TJ) +150C Storage temperature . -55C to +125C Lead temperature (soldering, 10 second

16、s) +300C Power dissipation (PD). 1.50 W Thermal resistance: Junction-to-case (JC) 2C/W Junction-to-ambient (JA) . 20C/W 1.4 Recommended operating conditions. Supply voltage ranges Positive supply (VCC) . +14.7 V dc to +15.3 V dc Negative supply (VEE) -15.3 V dc to -14.7 V dc Logic supply (VDD) . -1.

17、3 V dc Case operating temperature range (TC) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these

18、 documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Componen

19、t Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or www.dodssp.daps.mil or from the Standardization Document

20、 Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws a

21、nd regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking p

22、ermitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90634 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G

23、, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or op

24、timize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design,

25、construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be

26、as specified on figure 2. 3.2.3 Functional block diagram. The functional block diagram shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the ful

27、l specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-

28、38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical tes

29、t data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revis

30、ion level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted t

31、o DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION

32、4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening

33、 shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A or B. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC

34、-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAor TCas specified in the approved manufacturers QM plan. b. Interim and fin

35、al electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCU

36、IT DRAWING SIZE A 5962-90634 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions 1/ -55C TC +125C unless otherwise specified Group A subgroups Device type Min Max Unit R

37、esolution RES Complementary 4,5,6 01 12 bits 4 -.0125 +.0125 5 -.0425 +.0425 Linearity error LE No major sums 6 01 -.0525 +.0525 %FSR 4 -.025 +.025 5 -.0850 +.0850 Differential linearity error DLE 6 01 -.0105 +.0105 %FSR 4 -.1 +.1 5 -.35 +.35 Gain error GE VO= +FS, -0.5 V to +0.5 V range 6 01 -.30 +

38、.30 %FSR 4 -1 +1 5 -17 +17 Unipolar offset error 2/ UOE VO= 0 V, -0.5 V to +0.5 V range 6 01 -13.8 +13.8 A 4 -4 +4 5 -20 +20 Bipolar offset error BOE VO= 0 V, -0.5 V to +0.5 V range 6 01 -16.8 +16.8 A Reference error VREFEVREF= +10 V 1,2,3 01 -.01 +.01 V Reference current IREFFor external use 2/ 3/

39、1,2,3 01 4.4 mA F. S. output 50 Settling time 2/ tS LSB 9,10,11 01 20 ns Bipolar output voltage positive (full scale) 2/ +VBO0 to +0.5 V range, input = 0000 0000 0000 7,8 01 +5 V Bipolar output voltage negative (full scale) 2/ -VBO0 to +0.5 V range, input = 1111 1111 1111 7,8 01 -5 V See footnotes a

40、t end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90634 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance ch

41、aracteristics - Continued. Limits Test Symbol Conditions 1/ -55C TC +125C unless otherwise specified Group A subgroups Device type Min Max Unit Unipolar output voltage positive (full scale) 2/ +VOU0 to -0.5 V range, input = 1111 1111 1111 7,8 01 0 V Unipolar output voltage negative (full scale) 2/ -

42、VOU0 to -0.5 V range, input = 0000 0000 0000 7,8 01 -.5 V Output current (bipolar) IOVO= -0.5 to +0.5 V 7,8 01 -8.16 +8.16 mA Power supply rejection ratio PSRR VS= +15, -15, -1.3 V 4,5,6 01 .001 %FSR /%VS ICCVCC= +15.0 V 1,2,3 01 35 Supply current IEEVEE= -15.0 V 1,2,3 01 60 mA Digital input voltage

43、 (high) 2/ VIHIIH= 100 A 1,2,3 01 -.81 -.96 V Digital input voltage (low) 2/ VILIIL= 1 mA 1,2,3 01 -1.6 -1.85 V Digital input current (high) 2/ IIHVIH= -0.81 V 1,2,3 01 100 A Digital input current (low) 2/ IILVIL= -0.81 V 1,2,3 01 1 A 1/ VCC= +15.0 V dc, VEE= -15.0 V dc, logic “0“ = -.89 V dc, and l

44、ogic “1“ = -1.75 V dc. FSR = 1 V with testing over -0.5 V to +0.5 V range. Device is tested with no load applied and using the internal reference. 2/ Parameter shall be tested as part of device initial characterization and after design and process changes. Parameter shall be guaranteed to limits spe

45、cified in table I for all lot(s) not specifically tested. 3/ If more than 15 mA is drawn externally, the reference temperature coefficient will increase resulting in a proportional change in the gain and bipolar offset performance. If reference is used by external circuits only, load must be 5 mA mi

46、nimum. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90634 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 Inches mm Inches mm .002 0.05 .125 3.18 .00

47、5 0.13 .150 3.81 .015 0.38 .170 4.32 .016 0.41 .200 5.08 .019 0.48 .600 15.24 .080 2.03 .805 20.45 .100 2.54 1.100 27.94 .103 2.62 1.400 35.54 NOTES: 1. Dimensions are in inches. 2. Metric equivalents are given for general information only. 3. Load identification numbers are for reference only. 4. L

48、ead spacing dimensions apply at seating plane. 5. Unless otherwise specified, tolerances are .005 (0.13 mm). FIGURE 1. Case outline X. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90634 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 Device type 01 Case outline X Terminal number Terminal symbol 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19