DLA SMD-5962-90627 REV D-2011 MICROCIRCUIT LINEAR VOLTAGE COMPARATOR MONOLITHIC SILICON.pdf

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1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A TABLE I. Output saturation voltage test. With condition ISINK= 8 mA, subgroup 2, delete 0.4 V and substitute 0.45 V. Changes in accordance with N.O.R. 5962-R046-95. 94-12-13 M. A. FRYE B Drawing updated to reflect current requirements. Redrawn. -

2、 ro 00-07-24 R. MONNIN C Replace reference to MIL-STD-973 with reference to MIL-PRF-38535. - ro 03-04-17 R. MONNIN D Update boilerplate paragraphs to current MIL-PRF-38535 requirements. - ro 11-05-02 C. SAFFLE THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS R

3、EV D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY RICK OFFICER DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY

4、 CHARLES E. BESORE APPROVED BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, VOLTAGE COMPARATOR, MONOLITHIC SILICON DRAWING APPROVAL DATE 92-04-02 AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-90627 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E247-11 Provided by IHSNot for ResaleNo reproduction or netw

5、orking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90627 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B

6、 microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-90627 01 G A Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) id

7、entify the circuit function as follows: Device type Generic number Circuit function 01 LT1011A Voltage comparator 02 1011 Voltag comparator 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style G MAC

8、Y1-X8 8 Can P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Positive supply voltage (+VS) . +18 V dc Negative supply voltage (-VS) . -18 V dc Supply voltage (+VSto VS) . 36 V dc Output to negative su

9、pply (OUTPUT to VS) 50 V dc Ground to negative supply (GROUND to VS) . 30 V dc Differential input voltage . 36 V dc Voltage at strobe pin . 5 V dc Power dissipation (PD) . 200 mW Input voltage (VIN) Equal to supplies 1/ Output strobe current (ISTR) . 5 mA Output strobe current (ISINK) 50 mA Output s

10、hort circuit duration 10 seconds Storage temperature range . -65C to +150C Lead temperature (soldering, 10 seconds) . +300C Junction temperature (TJ) . +150C _ 1/ Inputs may be clamped to supplies with diodes so that maximum input voltage actually exceeds supply voltage by one diode drop. Provided b

11、y IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90627 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings -continued. Thermal resistance, junction

12、-to-case (JC) . See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA): Case G 150C/W Case P 100C/W 1.4 Recommended operating conditions. Supply voltage (VS) 15 V dc Ambient operating temperature range (TA) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and han

13、dbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits

14、, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - St

15、andard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the tex

16、t of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be

17、in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to M

18、IL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifica

19、tions shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. Provided by IHSNot for ResaleNo reproduction or

20、networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90627 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall

21、be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics. Unless otherwise specified her

22、ein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are d

23、escribed in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space lim

24、itations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “Q

25、ML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certifica

26、te of compliance submitted to DLA Land and Maritime -VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as requir

27、ed in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DLA Land and Maritime -VA shall be required for any change that affects this drawing. 3.9 Verification and review. DLA Land and Maritime,

28、DLA Land and Maritime s agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. Provided by IHSNot for ResaleNo reproduction or networking per

29、mitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90627 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group

30、A subgroups Device type Limits 2/ Unit Min Max Input offset voltage VOS3/ 1 01 -0.5 +0.5 mV 2,3 -1.0 +1.0 1 02 -1.5 +1.5 2,3 -3.0 +3.0 RS 50 k 4/ 1 01 -0.75 +0.75 2,3 -1.5 +1.5 1 02 -2.0 +2.0 2,3 -3.0 +3.0 Input offset current IOS4/ 1 01 -3 +3 nA 2,3 -5 +5 1 02 -4 +4 2,3 -6 +6 Input bias current IB3

31、/ 1 01 -25 +25 nA 02 -50 +50 4/ 1 01 -35 +35 2,3 -50 +50 1 02 -65 +65 2,3 -80 +80 Input offset voltage drift VOS/ 5/ 6/ 2,3 01 -15 +15 V/C T 02 -25 +25 Common mode rejection ratio CMRR VCM= -14.5 V and 13 V 1 01 94 dB 2,3 88 1 02 90 2,3 84 See footnotes at end of table. Provided by IHSNot for Resale

32、No reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90627 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55

33、C TA+125C unless otherwise specified Group A subgroups Device type Limits 2/ Unit Min Max Input voltage range IVR 6/ 1,2,3 All -14.5 13 V +VS= +5 V, -VS= 0 V 6/ 0.5 3.0 Output saturation voltage VOL+VS= +5 V, VIN= 5 mV, ISINK= 8 mA, 1,3 All 0.4 V GROUND pin = 0 V 2 0.45 ISINK= 50 mA, GROUND pin = 0

34、V 1,2,3 1.5 Output leakage current ILKGVIN= 5 mV, VOUT= 35 V, 1 All 10 nA GROUND pin = -15 V 2,3 500 Positive supply current +IS7/ 1 All 4.0 mA 2,3 9.0 Negative supply current -IS7/ 1 All -2.5 mA 2,3 -6.5 Strobe current ISTRTA= +25C, 6/ 7/ 8/ minimum to ensure output transistor is turned off 1 All 5

35、00 A Large signal voltage gain AVOLRL= 1 k to +15 V, -10 V VOUT 14.5 V, TA= +25C 4 All 200 V/mV RL= 500 to +5 V, 0.5 V VOUT 4.5 V, TA= +25C 50 Response time TRTA= +25C 6/ 9/ 9 All 250 ns See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without licen

36、se from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90627 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. 1/ Unless otherwise specified, VS= 15 V, VCM= 0 V, and RS= 50 . 2/ The algebraic c

37、onvention, whereby the most negative value is a minimum and the most positive is a maximum, is used in this table. 3/ Output is sinking 1.5 mA with VOUT= 0 V. 4/ These specifications apply for all supply voltages from a single +5 V to 15 V, the entire input voltage range, and for both high and low o

38、utput states. The high state is ISINK 100 A, VOUT (+VS- 1 V) and the low state is ISINK 8 mA, VOUT 0.8 V. Therefore, this specification defines a worst case error band that includes effects due to common mode signals, voltage gain, and output load. 5/ Drift is calculated by dividing the offset volta

39、ge difference measured at minimum and maximum temperatures by the temperature difference. 6/ Guaranteed by design, characterization, or correlation to other tested parameters. 7/ These specifications apply for all supply voltages from a single +5 V to 15 V. 8/ Do not short the strobe pin to ground.

40、It should be current driven at 3 mA to 5 mA for the shortest strobe time. Currents as low as 500 A will strobe the device if speed is not important. External leakage on the strobe pin in excess of 0.2 A when the strobe is “off“ can cause offset voltage shifts. 9/ Response time is measured with a 100

41、 mV step and 5 mV overdrive. The output load is a 500 resistor tied to +5 V. Time measurement is taken when the output crosses 1.4 V. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90627 DLA LAND AND MARITIM

42、E COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 Device types 01 and 02 Case outlines G and P Terminal number Terminal symbol 1 GROUND 2 +INPUT 3 -INPUT 4 -VS5 BALANCE 6 BALANCE / STROBE 7 OUTPUT 8 +VSFIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduct

43、ion or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90627 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 9 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordan

44、ce with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test cond

45、ition C. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance wit

46、h the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conforman

47、ce inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 5, 6, 7, 8, 10, a

48、nd 11 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition C. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipati