DLA SMD-5962-89541 REV B-2007 MICROCIRCUIT LINEAR LOW-DROOP-RATE ACCURATE SAMPLE AND HOLD AMPLIFIER MONOLITHIC SILICON《硅单片精确采样保持扬声器低下降率线性微电路》.pdf

《DLA SMD-5962-89541 REV B-2007 MICROCIRCUIT LINEAR LOW-DROOP-RATE ACCURATE SAMPLE AND HOLD AMPLIFIER MONOLITHIC SILICON《硅单片精确采样保持扬声器低下降率线性微电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-89541 REV B-2007 MICROCIRCUIT LINEAR LOW-DROOP-RATE ACCURATE SAMPLE AND HOLD AMPLIFIER MONOLITHIC SILICON《硅单片精确采样保持扬声器低下降率线性微电路》.pdf（11页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Drawing updated to reflect current requirements. -ro 01-05-15 R. MONNIN B Update drawing as part of 5 year review. -rrp 07-07-16 ROBERT M. HEBER THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV B B B B B

2、 B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY RICK OFFICER DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY CHARLES E. BESORE COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY MICHAEL A. FRY

3、E MICROCIRCUIT, LINEAR, LOW-DROOP-RATE, ACCURATE SAMPLE AND HOLD AMPLIFIER, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 89-08-15 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-89541 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E410-06 Provided by IHSNot for

4、ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89541 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-ST

5、D-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-89824 01 C X Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1

6、 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 SMP-11A Low-droop-rate, accurate sample and hold amplifier 02 SMP-11B Low-droop-rate, accurate sample and hold amplifier 03 SMP-10A Low-droop-rate, accurate sample and hold am

7、plifier 04 SMP-10B Low-droop-rate, accurate sample and hold amplifier 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style C GDIP1-T14 or CDIP2-T14 14 Dual-in-line 2 CQCC1-N20 20 Square leadless chi

8、p carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Positive supply voltage (+VS) +18 V dc Negative supply voltage (-VS) . -18 V dc Power dissipation (PD) 500 mW For cases C and 2, derate above TA= 100C . 10 mW /C Input voltage (VI

9、N) . Equal to supply voltage Logic and logic reference voltage Equal to supply voltage Output short-circuit duration Indefinite Hold capacitor short-circuit duration 60 seconds Junction temperature (TJ) . +175C Storage temperature range . -65C to +150C Lead temperature (soldering, 10 seconds) +300C

10、Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Thermal resistance, junction-to-case (JA): Case C 100C/W Case 2 . 110C/W Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89541 DEFENSE SUPPLY CENTE

11、R COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.4 Recommended operating conditions. Positive supply voltage range (+VS) +15 V dc Negative supply voltage range (-VS) . 15 V dc Hold capacitor (CH) . 0.005 F Logic control (VLC) Connected to ground, or 3.5 V below p

12、ositive supply and 2.0 V above negative supply Ambient operating temperature range (TA) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Un

13、less otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits

14、. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or h

15、ttp:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. No

16、thing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified

17、herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved progr

18、am plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affec

19、t the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, app

20、endix A and herein. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance charact

21、eristics are as specified in table I and shall apply over the full ambient operating temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89541 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 4321

22、8-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appe

23、ndix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1

24、 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow opt

25、ion is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply sh

26、all affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.

27、 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore

28、 documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and sh

29、all be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and sh

30、all be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical

31、test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including

32、 groups A, B, C, and D inspections. The following additional criteria shall apply. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89541 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL

33、 B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Zero scale error (hold mode) VZSVS/H= 3.5 V ( 500 s after 1 01,03 +1.5 mV hold), VIN= 0 V 2,3 +3.0 1

34、02,04 +3.0 2,3 +5.5 Input bias current IIBVIN= 0 V 1 01,03 65 nA 2,3 180 1 02,04 90 2,3 280 Input voltage range or output voltage swing VSWRL= 2.5 k 1 01,03 11 V 2,3 10.5 1,2,3 02,04 10.5 Power supply rejection (sample mode) PSR +VS= +9 V to +18 V, 1 01,03 82 dB -VS= -9 V to 18 V 2,3 78 1 02,04 77 2

35、,3 72 Differential logic threshold VTH1 All 0.8 2.0 V 2,3 0.6 2.0 Logic control input current ILCVLC= 0 V 1 01,03 -2 A 2,3 -3 1 02,04 -3 2,3 -5 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWI

36、NG SIZE A 5962-89541 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max

37、 Supply current ISY1 01,03 2.0 6.0 mA 2,3 2.0 8.4 1 02,04 2.0 7.0 2,3 2.0 8.4 Logic input current (sample mode) IS/H VS/H= 0.6 V 1,2,3 All -15 A Logic input current (hold mode) IS/H VS/H= 5 V 1,2,3 All -1 1 A Droop rate dVCH/ 4 01 200 V/ms dt 5 4000 6 1500 4 02 500 5 5000 6 2000 4 03 20 5 4000 6 100

38、 4 04 50 5 5000 6 250 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89541 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR

39、97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Leakage (droop) current IDR4 01 1.0 A/ms 5 20.0 6 7.5 4 02 2.5 5 25.0 6 10.0 4 03 0.10 5 20.0 6 0.5 4 04 0.25 5 25.0 6 1.

40、22 Voltage gain (sample mode) AVVIN= 10 V, RL= 5 k 4 01,03 0.99963 V/V or 5,6 0.99950 VIN= 5 V, RL= 2.5 k 4 02,04 0.99953 5,6 0.99940 Hold capacitor charging current +ICHVIN VOUT +3 V 4,5,6 01,03 20 mA 02,04 15 -ICHVIN VOUT -3 V 01,03 -20 02,04 -15 Sample / Hold current ratio ICH/ 1,2,3 01,02 2x106m

41、A/mA IDR03,04 0.6x1061/ Unless otherwise specified, +VS= +15 V, -VS= -15 V, CH= 5000 pF, and VLC= connected to ground. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89541 DEFENSE SUPPLY CENTER COLUMBUS COLU

42、MBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 Device types 01, 02, 03, and 04 Case outlines C 2 Terminal number Terminal symbol 1 NC 1/ NC 2 INPUT NC 3 NULL INPUT 4 NULL NULL 5 -VSNC 6 NC NULL 7 OUTPUT NC 8 NC 1/ -VS9 +VSNC 10 NC OUTPUT 11 CHNC 12 NC NC 13 VLC+VS14 S/H 2/ NC 1

43、5 - NC 16 - CH17 - NC 18 - NC 19 - VLC20 - S/H 2/ 1/ Pins 1 and 8 are not internally connected. 2/ Sample / Hold control FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89541 D

44、EFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 9 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) 1 Final electrical

45、 test parameters (method 5004) 1*, 2, 3, 4, 5, 6 Group A test requirements (method 5005) 1, 2, 3, 4, 5, 6 Groups C and D end-point electrical parameters (method 5005) 1 * PDA applies to subgroup 1. For device types 01 and 03, VZSis excluded from PDA. 4.3.1 Group A inspection. a. Tests shall be as sp

46、ecified in table II herein. b. Subgroups 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) T

47、est condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicabl

48、e, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original