DLA SMD-5962-88624-1988 MICROCIRCUIT DIGITAL HIGH-SPEED CMOS PROGRAMMABLE DIVIDE-BY-N COUNTER TTL COMPATIBLE INPUTS MONOLITHIC SILICON《硅单片TTL兼容可编程N计数器高速互补型金属氧化物半导体数字微电路》.pdf
《DLA SMD-5962-88624-1988 MICROCIRCUIT DIGITAL HIGH-SPEED CMOS PROGRAMMABLE DIVIDE-BY-N COUNTER TTL COMPATIBLE INPUTS MONOLITHIC SILICON《硅单片TTL兼容可编程N计数器高速互补型金属氧化物半导体数字微电路》.pdf》由会员分享,可在线阅读,更多相关《DLA SMD-5962-88624-1988 MICROCIRCUIT DIGITAL HIGH-SPEED CMOS PROGRAMMABLE DIVIDE-BY-N COUNTER TTL COMPATIBLE INPUTS MONOLITHIC SILICON《硅单片TTL兼容可编程N计数器高速互补型金属氧化物半导体数字微电路》.pdf(13页珍藏版)》请在麦多课文档分享上搜索。
1、LTR PME WA DATE (YR-MO-DA) APPROVED DESCRIPTION STANDARDIZED MILITARY DRAWING THIS DRAWING IS AVAILABLE OR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPAnTMENT OF DEFENSE DRAWING APPROVAL b1E 10 AUGUST 1988 REVISION LEVEL - -, dlstribullon is unlimited. Provided by IHSNot for ResaleNo reproduction
2、or networking permitted without license from IHS-,-,- _i_l-_. ._ _ DESC-DWG-88624 57 m 7779775 0033277 7 1. SCOPE 1.1 SCO e. This drawinglldescribes device requirements for class B microcircuits in accordance with l.Decification and standard, of the issue listed in that issue of the Department of De
3、fense Index of MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 pecifications and Standards specified in the solicitation, form a part of this drawing to the Nxtent specified herein. SPECIFICATION MI L I TARY MIL-M-38510 - Wicrocircuits, General Specification for. STANDARD REVIS
4、ION LEVEL SHEET 3 MILITARY MIL-STD-883 - Test Methods and Procedures for Microelectronics. (Copies of the specification and standard required by manufacturers in connection with specific cquisition functions should be obtained from the contracting activity or as directed by the ontracting activity.)
5、 -eferences cited herein, the text of this drawing shall take precedence. 2.2 Order of precedence. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with 1.2.1 of In the event of a conflict between the text of this drawing and the IIL-STD-883, “Provisions
6、 for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“ nd as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical imensions shall be as specified in MIL-M-38510 and herein. 3.2.1 Terminal connections. The terminal connections
7、 shall be as specified on figure 1. 3.2.2 Mode Selection table. The mode selection table shall be specified on figure 2. 3.2.3 Functional diagram. 3.2.4 Case outline. The case outline shall be in accordance with 1.2.2 herein. The functional diagram shall be as specified on figure 3. 3.3 Electrical p
8、erformance characteristics. Unless otherwise specified, the electrical erfomance characteristics are as specified in table I and apply over the full case lperating temperature range. e marked with the part number listed in 1.2 herein. iay also be marked as listed in 6.4 herein n order to be listed a
9、s tn approved source of supply in 6.4. The certificate of compliance ,ubmitted to DESC-ECS prior to listing as an approved source of supply shall state that the ianufacturers product meets the requirements of MIL-STD-883 (see 3.1 herein) and the requirements ierein. 3.4 Marking. Marking shall be in
10、accordanc with MIL-STD-883 (see 3.1 herein). The part shall In addition, the manufacturers part number 3.5 Certificate of com liance. A certificate of compliance shall be required from a manufacturer 3.6 Certificate of conformance. A certificate of conformance as required in MIL-STD-883 (see 3.1 ier
11、ein) shall be provided with each lot of microcircuits delivered to this drawing. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-_ I_-_ ._.II_ DESC-DWG-b24 57 7777775 0033277 2 m TABLE I. Electrical performance characteristics. I I I I -55C 5 TC 5 +1
12、25OC L/ Isubgroupsl Min I Max I Condi ti ons I Group A I Limits IUnit ISymbo1 I I I I I I I Test High level output voltage VOH IVIN = VIH or VIL, IVcc = 4.5 VI 1,2,3 14.4 I IV IV N = V H or YIL, /Vcc = 4.5 VI 1,2,3 13.7 I IV l I doi 5 1.0 mA I I I I I IOv1 IV dol 5 4.0 mA I I I IOn4 IV I High level
13、input voltage VIH 12/ IVcc = 4.5 VI 1,2,3 12.0 I IV IOa8 IV 1l PA IIIol 5 20 PA I I I I I I I I I I I I I I I I I I I I I l VOL iypl=;$l VIL, IVCC = 4.5 VI 1,2,3 I l I I I I I I I I I I I l I I I I I I I I- I I I I I l I I I I I I I I I I I I I IIIN IVcc = 5.5 Y, VIN = Vcc or GND I I I VIN = Vcc or
14、GND, other inputs I I I I I IVCC = 5.5 v I I I I I I I I I I I I I I I I I Functional tests I (See 4.3.ld 171 I I I I I l I I Maximum clock frequency ?/ I fmax I I Low level output vol tage I !Vcc = 4.5 Vi 1,2,3 i IV N = V H or VIL, IVcc = 4.5 VI 1,2,3 I Low level input voltage /VIL 121 Quiescent cu
15、rrent /Ice IVcc = 5.5 V, VIN = Vcc or GND 1 1,2,3 i I160 IriA Input leakage current Additional quiescent currentlAICC IVIN 2.4 or 0.5 Y, any 1 input I 1,2,3 I 13.0 ImA _. . I 1,2,3 I I I Input capacitance /GIN /VIN = O Y, Tc = +25C, See 4.3.1 4 Il0 IPF 191 125 1MHz III I I I I I I I IVcc = 4*5 iee f
16、ootnotes at end of table. SIZE A 5962-88624 STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONES SUPPLY CENTER REVISION LEVEL SHEET RAYTON. OHIO 45444 A DESC FORM 193A SEP a7 e- -: I Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DESC-DWG-BBb24 57 W 777
17、7775 0013300 5 W SIZE A STANDARDIZED TABLE I. Electrical performance characteristics - Continued. I I I I I -55C 5 TC 5 +125OC L/ Isubgroupsl Min I Max i I I I I I I I I I 191 I ItpHL1, Ivcc = 5.0 V *lo%, I l, and clock to output I I I 10,ll I 169 I ns I I I I I I 1- I I 191 115 I ns I 1- ITHL I I 1
18、0,ll I 122 I ns Test Conditions I Group A I Limits IUnit ISymbol I I Propagation delay time, LE ltpLH1 ICL E 50 pF *IO% (see figure 4) (see figure 4) ITLH, I I I I I Transition time ?/ I I I I I I ,/ For a power supply of 5 V 110 percent, the worst case output voltages (VOH and VOL) occur for HCT at
19、 4.5 V. Thus, the 4.5 V values should be used when designing with this supply. Worst case VIH and VIL occur at Vcc = 5.5 V and 4.5 V respectively. !/ Test not required if applied as a forcing function for VOH or VOL. !/ Guaranteed, if not tested, to the specified limits. 5962-88624 3.7 Notification
20、of change. iith MIL-STD-883 ( see 3.1 herein). 3.8 Verification and review. DESC, DESCS agent, and the acquiring activity retain the option to *eview the manufacturers facility and applicable required documentation. Offshore documentation ;hall be made available onshore at the option of the reviewer
21、. Notification of change to DESC-ECS shall be required in accordance 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with iection 4 of MIL-M-38510 to the extent specified in MIL-STD-883 (see 3.1 herein). DESC FORM 193A SEP 87 , *
22、U. 8. GOMRNMENT PRINTING OFFCE 1888-549-W4 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-I I I I Device type I o1 I I I I I J I ITerminal number ITerminal symbol I I I I I I 1 I CP I I Package I I 5962-88624 CIZE A STANDARDIZED MILTTAW DRAWING DEFE
23、NSE ELECTRONICS SUPPLY CENTER RMSION LEVEL SHEET DAYTON, OH0 45444 LE i J1 I 52 I 53 I 54 I 516 I J 15 I 514 I 10 I J 13 I I I 11 I KC 12 I GND I 13 I I 14 I 15 I I I J 11 I J 10 I I 18 I J9 I 16 17 I I 58 I J1 I 19 I 56 I 20 I I 21 I I I 22 I 55 I 23 I Q I I I I 24 I “cc I I I I I FIGURE 1. Teminal
- 1.请仔细阅读文档,确保文档完整性,对于不预览、不比对内容而直接下载带来的问题本站不予受理。
- 2.下载的文档,不会出现我们的网址水印。
- 3、该文档所得收入(下载+内容+预览)归上传者、原创作者;如果您是本文档原作者,请点此认领!既往收益都归您。
下载文档到电脑,查找使用更方便
10000 积分 0人已下载
下载 | 加入VIP,交流精品资源 |
- 配套讲稿:
如PPT文件的首页显示word图标,表示该PPT已包含配套word讲稿。双击word图标可打开word文档。
- 特殊限制:
部分文档作品中含有的国旗、国徽等图片,仅作为作品整体效果示例展示,禁止商用。设计者仅对作品中独创性部分享有著作权。
- 关 键 词:
- DLASMD5962886241988MICROCIRCUITDIGITALHIGHSPEEDCMOSPROGRAMMABLEDIVIDEBYNCOUNTERTTLCOMPATIBLEINPUTSMONOLITHICSILICON

链接地址:http://www.mydoc123.com/p-699283.html