DLA SMD-5962-88574 REV A-1994 MICROCIRCUIT DIGITAL HCMOS 8-INPUT NOR OR GATE MONOLITHIC SILICON《硅单片H互补型金属氧化物半导体8位输入或无通道数字微电路》.pdf

《DLA SMD-5962-88574 REV A-1994 MICROCIRCUIT DIGITAL HCMOS 8-INPUT NOR OR GATE MONOLITHIC SILICON《硅单片H互补型金属氧化物半导体8位输入或无通道数字微电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-88574 REV A-1994 MICROCIRCUIT DIGITAL HCMOS 8-INPUT NOR OR GATE MONOLITHIC SILICON《硅单片H互补型金属氧化物半导体8位输入或无通道数字微电路》.pdf（12页珍藏版）》请在麦多课文档分享上搜索。

1、m b 00556112 b37 m DEFENSE LOGlCnCS AGENCY DELECTRONiCSSUPPLY(=PCIER 1S7 WlLMiNGW PIKE DAMON, OH 45444-5 7 6 5 IN REPLY REFEATO DESC-ELDC (Mr. Ricciuti/(AV 986) 513-296-60231tjr) 96 MAY 1991 SUBJECT: Notice of Revision (NOR) 5962-R83-94 for Standardized Military Drawing (SMD) 5962-88574. MilitarylIn

2、dustry Distribution The enclosed NOR is approved for use effective as of the date of the NOR. In accordance with MIL-STD-100 SKD holders should, as a minimum, handwrite those changes described in the NOR to sheet 1 of the subject SMD. completion, the NOR should be attached to the subject SMD for fut

3、ure reference. Those companies-who were listed as approved sources of supply prior to this action have agreed to actions taken on devices for which they had previously provided DESC a certificate of compliance. This is evidenced by an existing active current certificate of compliance on file at DESC

4、 along with a DESC record of verbal coordination. The certificate of compliance for these devices is considered concurrence with the new revision unless DESC is otherwise notified. After If you have comments or questions, please contact Tom Ricciuti at (AVI986- 6023 1(513)296-6023. 1 Encl Chief, Cus

5、tom Microelectronics Branch Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-b 0055643 573 H I 94-04-28 This revision described below has been authorized for the document listed. Public ryprting.burden.for this collection-is estiqted to average 2 hour

6、s per response jncluding the tlw or review? instructions, searching exist7g distribuilon is unlimited. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-9999996 0055645 346 1. SCOPE 1.1 Scope. This drawing describes device requirements for class B micr

7、ocircuits in accordance with 1.Z.if MIL-STO-883, “Provisions for the use of MIL-STD-883 in conjunction with conpliant non-JAN devices“. I 1.2 Part number. The complete part number shall be as shown in the following example: I 5962-88574 I I I I Drawinq number o1 1 I l I Device tuDe C T I I I Case ou

8、tline X -I- l I i Lead finish Der ( 1.2. li. (1.2.2) MIL-M- 385 10 I 1.2.1 Device type. The device type shall identify the circuit function as follows: Device type - Generic number Circuit function O1 54HC4078 %input, NOR/OR gate 1.2.2 Case outlines. The case outlines shall be as designated in appen

9、dix C of MIL-M-38510, and as follows: Outline letter Case outline C 0-1 (14-lead, .785“ x .310“ x .200“). dual-fn-line 2 package C-2 (20-terminal , .358“ x .358“ x.lOO“), square chip carrier package 1.3 Absolute maximum ratings. L/ supply voltage range - - - - - - - - - - - - - - - - - Clamp diode c

10、urrent - - - - - - - - - - - - - - - - - DC output current (per pin) - - - - - - - - - - - - - OC VCC or GND current (per pin) - - - - - - - - - - - Storage temperature range - - - - - - - - - - - - - - Maximum power dissipation (PD) 2/,- - - - - - - - - - Lead temperature (soldering, 10 Seconds) -

11、- - - - - - Thermal resistance, junction-to-case (01: Junction temperature (TJ) - - - - - - - - - - - - - - DC input voltage - - - - - - - - - - - - - - - - - - - DC output voltage - - - - - - - - - - - - - - - - - - Cases C and 2- - - - - - - - - - - - - - - - - -0.5 V dC to t7.0 V dc -0.5 V dC to

12、Vcc + 0.5 V dc -0.5 V dC to VCC + 0.5 V dc *20 mA *25 mA *50 mA -65C to +15OoC 500 mW +26OoC See MIL-M-38510, +175C appendix C i/ Unless otherwise specified, all voltages are referenced to ground. Z/ For TC +lOOC to +125C, derate linearly at 12 mW/C. - 5962-88574 STANDARDIZED SUE A MILITARY DRAWING

13、DEFENSE ELECTRONICS SUPPLY CENTER REVWONLEVEL SHEET 2 MYTN, OHIO 4!i444 * U 8 OOVERNMENT PHHTINO OFFCE WJT- 549098 DECC FORM 193A SEP a7 i Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-= 999999b 0055b4b 282 STANDARDIZED MILTTARY DRAWING 1.4 Recomme

14、nded operating conditions. Supply voltage (VCC) - - - - - - - - - - - - - - - - - t2.0 V dc to t6.0 V dc Case operating temperature range (TC) - - - - - - - - -55C to t125C Input rise or fall time: vcc = 2.0 v - - - - - - - - - - - - - - - - - - - - O to 1000 ns vcc = 4.5 v - - - - - - - - - - - - -

15、 - - - - - - - O to 500 ns Vcc=6.OV - -_-_-_-_- O to 400 ns 2, APPLICABLE DOCUMENTS 2.1 Government specification and standard. Ilnless otherwise specified, the following ipeclfi-and standard, of the lssue lrsted in that issue of the Department of Defense Index of ;peclfications and Standards specifi

16、ed in the solicitation, form a part of this drawing to the !xtent specified herein. SPECIFICATION MILITARY 5962-88574 SIZE A MIL-M-38510 - Microcircuits, General Specification for. STANDARD MILITARY MIL-STO-883 - Test Methods and Procedures for Microelectronics. (Copies of the specification and stan

17、dard required by manufacturers in connection with specific icquisitlon functions should be obtained from the contracting activity or as directed by the :ontracting activity. 1 *eferences cited herein, the text of this drawing shall take precedence. 2.2 Order of precedence. 3. REQUIREMENTS 3.1 Item r

18、equirements. The individual item requirements shall be in accordance with 1.2.1 of (IL-STD-883, “Provlslons for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“ ind as specified herein. In the event of a conflict between the text of this drawing and the 3.2 Design, construction,

19、 and physical dimensions. The design, construction, and physical iimensions shall be as specified in MIL-M-38510 and herein . 3.2.1 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.2 Truth table. The truth table shall be as specified on figure 2. 3.2.3 Case outli

20、ne. The case outline shall be in accordance with 1.2.2 herein. 3.3 Electrical performance characteristics. Unless otherwise specified, the electrical ierformance characteristics are as specified in table I and apply over the full case operating temperature range. DEFENSE ELECTRONICS SUPPLY CEMER REV

21、WONLEVEL SHEET 3 1 MYTON, OHIO 45444 * U S GOVERNMENT PRNTING OFFEE 1987-ypw8 ESC FORM 193A SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-I iymbol I Conditions I -55C Tc 5 +125“C i/ I unless otherwise speciffed I I I V N = V H or VIL I I I I

22、 vcc = 4.5 v I I I I- I I I I I 1101 5 6.0 mA I I /OH I Vcc = 2.0 V I lroup A subgroup! T Min I II Max I II 7 1.9 I I IV II II 5.9 I I II II 3.7 I I II 11 5.2 I I 4.4 II I I II v 10.1 I v II II i 0.1 i I 10.1 I II II +I I I I I 11 1.5 I I V II il 3.151 I li II 4.2 I I II 7 TI I 0.9 I II II I 1.2 I S

23、ee footnotes at end of table. 5962-88574 STANDARDIZED SIZE MILITARY DRAWING A DEFENSE ELECTROF(CS SUPPLY CEHIIER 8MET4 DA.OHlO45444 f? U S OOMRNMENT PW4llN OFFEE lW7-54- DESC FORM 193A SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-TABLE 1. E

24、lectrical performance characteristics - Continued. STANDARMZU) MILITARY DRAWING EFENSE ELECTRONICS SUPPLY CENTER DAY“, iil 45444 Test 5962-88574 SIZE A REVISION LEVU SHEET 5 Input capacitance pu I escent current Input leakage current Functional tests Propagatlon delqy time any input to outputs X and

25、 Y 31 - See figure 3 _ Transition time il See figure 3 I I Symbol :IN IC c IIN %HL +LH THL 9 TL H ;ee footnotes at top of next page. I I Limits I Conditions (Group A I I Unit -55C 5 Tc 5 +125C 11 Isubgroupsl Min I Max I I I VI unless otherwise specifTed I I I I I VIN = O V; TC = +25C I 4 I Il0 I pF

26、See 4.3.1 I I I I I VCC = 6.0 V; VIN = Vcc or GND I 40 I UA Vcc I 6.0 Y; VIN I Vcc or GND I 1, 2, 3 I I il I UA I I. 2, 3 I I I I I I I I I I .- 1 7i i i See 4.3.ld I I I I I IiI I I I I 150 I ns TC +25OC, I vcc = 2.0 v I 9 CL = 50 PF *lo% I I I VCC = 6.0 V I I I III I TC = -55C, +125CI VCC = 2.0 V

27、I I I CL = 50 pF *lo% I I 10, 11 I vcc = 4.5 v I I I I I I Vcc = 6.0 V I I I TC = +25C, i vcc = 2.0 v i 9 CL = 50 PF *lo% I I I I l I vcc = 4.5 v I I I I VCC = 6.0 V 1 I I I I I TC = -55C, +125OCI VCC = 2.0 v I 10, 11 CL = 50 pF *lo% 1 I I vcc 4.5 v I I I I I I VCC = 6.0 V I I 225 I II II II I 451 I

28、 I 38 I II II I 75 I ns I I i15 1 II 113 I II II I 11* I II 122 I II 1191 II . I ESC FORM 193A * U.S. OOVERNLIENT PRHllNOFFCE 1087-540086 SEP a7 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-9999b 0055649 TL I STANDARDIZED MILITARY DRAWING DEFENSE

29、ELECTRONICS SUPPLY CWWl IMM. OHIO 45444 1/ For a power supply of 5 V *10 percent the worst case output voltage (V H and VOL) occur for HC - at 4.5 V. Thus the 4.5 V values should be used when designing with th?s supply. Worst case VIH and VIL occur at V c The worst case leaiagi current (11, Ice, and

30、 I ) occur for !MOS at the higher voltage and so the 6.0 V values should be used. Power 8ssipation capacitance (CPD), typically 100 pF, determines the no load dynamic power consumption, CPD Vcc2 f + ICC VCC, and the no load dynamic current consumption, Is = CpD VCC f +!,c. 2/ Test not required if ap

31、plied as a forcing function for VOH or V - 3/ AC testing at VCC = 2.0 V and Vcc = 6.0 V shall be guaranteed, Pbnot tested, to the specified parameters. - 41 Transition time (tTLH, tTHL), if not tested, shall be guaranteed to the specified parameters. 5.5 V and 4.5 V respectively. (The VI value at 5.

32、5 V is 3.85 W. 5962-88574 SIZE A REVISION LEVU SHEET 6 3.4 Markin . Marking shall be in accordance with MIL-STO-883 (see 3.1 herein), The part shall bt marked d w t t e part number listed in 1.2 herein. In addition, the manufacturers part number may also be marked as listed in U.4 herein. in order t

33、o be listed as an approved source of supply in 6.4. The certificate of compliance submitted to DES-ECS prior to listing as an approved source of supply shall state that the manufacturers product meets the requirements of MIL-STD-883 (see 3.1 herein) and the requirements herein. herein) shall be prov

34、ided with each lot of microcircuits delivered to this drawing. 3.5 Certificate of compliance. A certificate of compliance shall be required from a manufacturer 3.6 Certificate of conformance. A certificate of conformance as required in MIL-STD-883 (see 3.1 3.7 Notification of change. Notification of

35、 change to DESC-ECS shall be required in accordance with MIL-STO-883 (see 3.1 herein). I 3.8 Verification and review. DESC, DESCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made avail

36、able onshore at the option of the reviewer, 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. section 4 of MIL -_ M 38510 to the extent specified in MIL-STD-883 (see 3.1 herein). 4.2 Screcnin . Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conductd devices

37、 prior to qualfty conformance inspection. The following additional criteria shall apply: Sampling and inspection procedures shall be in accordance with a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, 8, C, or D using the circuit submitted with the certificate of (2) TA = +125C, mi

38、nimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. compliance (see 3.5 herein). I I I I * U 8 GOVERNMENT PRINTING ORCE IB7-54WW DESC FORM 193A

39、SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-= 9999996 0055650 i03 STANDARDIZED SIZE A MILTTARY DRAWING ievice Case 5962-88574 erminal number 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 reminal symbol o1 C 2 NC X A B NC C NC D NC GND

40、 NC NC E F NC G NC H Y vcc Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-b 0055653 b4T = I SIZE A 5962-88574 STANDARDIZED tltlBe1 II RCVIMON LCVtL I MILITARY DRAWING tiEFtlNSL LLECf HONICB BUPPI CCNlCR DAYTON. OHIO 45444 ,ri iiWiYNL1tNI IWNIINi,iIb

41、hII WH7 Iu(119-UWL DESL FUHM 193A SFP a7 ANY INPUT GND OUTPUT Y NOTE: tr = tf = 6 ns. DEV I CE I UNDER TEST I- - FIGURE 3. Switching time waveforms and test circuit. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-= b 0055b52 58b I 5962-88574 STANDAR

42、DIZED SIZE A MILITARY DRAWING DEFENSEU#=TRONICSSUPPLYCENlER RMSIONLEVEL SHEET 9 MY“, OHi 45444 i TABLE II. Electrical test requirements. I I Subgroups I I MIL-STD-883 test requirements I (per method I I I 5005. table I) I I I I Ilnterim electrical parameters I I I I (method 5004) I - I I I Final ele

43、ctrical test parameters I I I (method 5004) I 1*, 2,9 I I I I 16roup A test requirements I I (method 5005) I ;: ;&: * I I l I Ixroups C and D-e-fX-1 I electrical parameters 1 1, 2, 3 I I (method 5005) I I * PDA applies to subgroup 1. * Subgroups 10 and 11, if not tested shall be guaranteed to the sp

44、ecified limits in table I. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 6005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in

45、 table II herein. b. Subgroups 5, 6, and 8 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroup 4 (CI measurement) shall be measured only for the initial test and after d. Subgroup 7 tests sufficiently to verify truth table. process or desygn changes which may affect input capacitanc

46、e. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state 1 ife test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D using the circuit submitted with the certificate of (2) TA = +125OC, minimum. compl ia

47、nce ( see 3.5 herein) . (3) Test duration: 1,000 hours, except as permitted by appendix B of MIL-M-38510 and method 1005 Of MIL-STO-883. I Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-b 0055653 412 I 5. PACKAGING 5.1 Packaging requirements. The re

48、quirements for packaging shall be in accordance with MIL-M-385m. I I 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use when military specifications do not exlst and qualifled military devices that will perform the required function are not available for OEM application. by this drawlng has been qualified for listing on QPL-38510, the device s ecifled herein will be inactivated and will not be used for new design. The QPL-38510 product slall be the preferred Item for all applications. 6.2 Replaceability. Microcircuits covered by this drawing wi