DLA SMD-5962-87719 REV E-2010 MICROCIRCUIT LINEAR PROGRAMMABLE GAIN INSTRUMENTATION AMPLIFIER MONOLITHIC SILICON.pdf

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1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add case outline 2. Editorial changes throughout. 90-06-20 Monica Poelking B Changes in accordance with NOR 5962-R027-95. 94-11-04 Michael Frye C Update boilerplate to meet current requirements. -rrp 00-11-02 Raymond Monnin D Update drawing as pa

2、rt of 5 year review. -rrp 05-12-20 Raymond Monnin E Update drawing as part of 5 year review. - jt 10-11-17 C. SAFFLE THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHEET REV SHEET REV STATUS REV E E E E E E E E E E OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY JOSEPH A.

3、KERBY DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY D. A. DiCENZO APPROVED BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, PROGRAMMABLE GAIN INSTR

4、UMENTATION AMPLIFIER, MONOLITHIC SILICON DRAWING APPROVAL DATE 87-12-08 AMSC N/A REVISION LEVEL E SIZE A CAGE CODE 67268 5962-87719 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E083-11 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT

5、 DRAWING SIZE A 5962-87719 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Pa

6、rt or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-87719 01 E A Drawing number Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device type. The device type identify the circuit function as follows: Device type Generic number Cir

7、cuit function 01 AD625 Programmable gain instrumentation amplifier 1.2.2 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carri

8、er 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage (VS) . 18 V dc Internal power dissipation . 280 mW Input voltage VSmaximum Storage temperature range . -55C to +150C Lead temperature (soldering, 10 seconds) +300C Thermal

9、 resistance: Junction-to-case (JC) See MIL-STD-1835 Junction-to-ambient (JA) . 95C/W 1.4 Recommended operating conditions. Supply voltage range (VS) . 6 V dc to 18 V dc Ambient operating temperature range (TA) . -55C to +125C Provided by IHSNot for ResaleNo reproduction or networking permitted witho

10、ut license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87719 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks

11、 form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEF

12、ENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are

13、available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text o

14、f this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN clas

15、s level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance wi

16、th the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device.

17、These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be

18、 as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Functional diagram. The functional diagram shall be as specified on fi

19、gure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be

20、 the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For pa

21、ckages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-

22、38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRC

23、UIT DRAWING SIZE A 5962-87719 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Gain error

24、 1 GE1 G = 1 1 01 0.05 % Gain error 10 GE10 G = 10 2/ 3/ 1 01 0.05 % Gain error 100 GE100 G = 100 2/ 3/ 1 01 0.05 % Gain error 1000 GE1000 G = 1000 2/ 3/ 1 01 0.05 % Gain error drift 1 TCGE1 G = 1 2/ 3/ 1 01 5 ppm/C Gain error drift 10 TCGE10 G = 10 2/ 3/ 1 01 5 ppm/C Gain error drift 100 TCGE100 G

25、= 100 2/ 3/ 1 01 5 ppm/C Gain error drift 1000 TCGE1000 G = 1000 2/ 3/ 1 01 5 ppm/C Input offset voltage VOSVIN= 0 1 01 200 V Input offset voltage drift TCVOSVIN= 0 2, 3 01 2 V/C Output offset voltage VOSOVIN= 0 1 01 5 mV Output offset voltage drift TCVOSOVIN= 0 2, 3 01 50 V/C Input bias current IBG

26、 = 1 1 01 50 nA Input offset current IOSIOS= (IB+) (IB-) 1 01 20 nA Common mode rejection CMRR G = 1 1 01 70 dB Common mode rejection -CMRR G = 1 1 01 70 dB Common mode rejection CMRR G = 10 2/ 1 01 90 dB Common mode rejection -CMRR G = 10 2/ 1 01 90 dB Common mode rejection CMRR G = 100 2/ 1 01 100

27、 dB Common mode rejection -CMRR G = 100 2/ 1 01 100 dB Common mode rejection CMRR G = 1000 1 01 110 dB Common mode rejection -CMRR G = 1000 1 01 110 dB Power supply current ICCG = 1 1 01 5 mA Power supply rejection PSRR G = 1 1 01 70 dB See footnotes at end of table. Provided by IHSNot for ResaleNo

28、reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87719 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C T

29、A+125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Power supply rejection PSRR G = 10 2/ 1 01 85 dB Power supply rejection PSRR G = 100 2/ 1 01 95 dB Power supply rejection PSRR G = 1000 1 01 100 dB 1/ VS= 15 V, RL= 2 k, unless otherwise specified. 2/ Guaranteed if n

30、ot tested to the limits specified. 3/ Gain error is a function of external resistors. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance

31、 submitted to DLA Land and Maritime -VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38

32、535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DLA Land and Maritime -VA shall be required for any change that affects this drawing. 3.9 Verification and review. DLA Land and Maritime, DLA Land and Mar

33、itimes agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. Provided by IHSNot for ResaleNo reproduction or networking permitted without li

34、cense from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87719 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 6 DSCC FORM 2234 APR 97 Case outline E FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from I

35、HS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87719 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 7 DSCC FORM 2234 APR 97 Case outline 2 FIGURE 1. Terminal connections Continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS

36、-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87719 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 8 DSCC FORM 2234 APR 97 FIGURE 2. Functional diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DR

37、AWING SIZE A 5962-87719 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 9 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordanc

38、e with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer und

39、er document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C,

40、minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accord

41、ance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) 1 Final electrical test parameters (method 5004) 1*, 2, 3 Group A test requirements (method 5005) 1, 2, 3 Groups C and D end-point electrical parameters (method 5005) 1 * PDA applies to subgroup 1. 4.3 Quality c

42、onformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, 6,

43、7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87719 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 10 DSC

44、C FORM 2234 APR 97 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under documen

45、t revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (

46、3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use fo

47、r Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared specification or drawing. 6.3 Configuration control of SMDs. All p

48、roposed changes to existing SMDs will be coordinated with the users of record for the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal. 6.4 Record of users. Military and industrial users shall inform DLA Land and Maritime when a system application requires configuration control and the applicable SMD to that system. DLA Land and Maritime will mainta