DLA SMD-5962-87688 REV C-2008 MICROCIRCUIT HYBRID LINEAR 8-BIT DIGITAL TO ANALOG CONVERTER《线性混合微电路 8位数字到模拟转换器》.pdf

《DLA SMD-5962-87688 REV C-2008 MICROCIRCUIT HYBRID LINEAR 8-BIT DIGITAL TO ANALOG CONVERTER《线性混合微电路 8位数字到模拟转换器》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-87688 REV C-2008 MICROCIRCUIT HYBRID LINEAR 8-BIT DIGITAL TO ANALOG CONVERTER《线性混合微电路 8位数字到模拟转换器》.pdf（11页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Added case outline Y. Updated to reflect MIL-H-38534 processing. Editorial changes throughout. 91-04-16 W. Heckman B Updated drawing to the latest requirements. -sld 05-04-05 Raymond Monnin C Table I; changed the min and max limits for A+FS, devi

2、ce type 02 from -1.920 and -2.040 to 1.9602 and 2.0398. Changed the min and max limits for A-FSdevice type 02 from -2.024 and -1.944 to -2.0238 and -1.9442. Changed the min and max limits for AZS, device type 02 from +1.9652 and +2.0038 to -0.0398 and +0.0398. -sld 08-08-19 Robert M. Heber REV SHEET

3、 REV SHEET REV STATUS REV C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY Donald R. Osborne DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Robert M. Heber COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil/ THIS DRAWING IS AVAILABLE FOR USE BY ALL

4、 DEPARTMENTS APPROVED BY William K. Heckman MICROCIRCUIT, HYBRID, LINEAR, 8-BIT DIGITAL TO ANALOG CONVERTER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 88-10-11 AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-87688 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E504-08 Provided b

5、y IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87688 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requiremen

6、ts for class H hybrid microcircuits to processed in accordance with MIL-PRF-38534. 1.2 PIN. The PIN shall be as shown in the following example: 5962-87688 01 X X Drawing number Device type Case outline Lead finish (see 1.2.1) (see 1.2.2) (see 1.2.3) 1.2.1 Device type(s). The device type(s) identify

7、the circuit function as follows: Device type Generic number Circuit function 01 MN3008 8-bit D/A converter, 0 V to +4 V output 02 MN3009 8-bit D/A converter, -2 V to +2 V output 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive de

8、signator Terminals Package style X See figure 1 16 Dual-in-line Y See figure 1 16 Flat package 1.2.3 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ +15 V supply voltage (VCC) +18 V dc -15 V supply voltage (VEE) . -18 V dc Digital input voltage r

9、ange . -0.5 V dc to +15 V dc Storage temperature range -65C to +150C Power dissipation (PD) . 750 mW 2/ Lead temperature (soldering, 10 seconds). +300C Thermal resistance, junction-to-case (JC) . 56C/W 1.4 Recommended operating conditions. Ambient operating temperature range (TA) -55C to +125C _ 1/

10、Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Applies up to TA= +125C.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-

11、STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87688 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of

12、 this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 -

13、 Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/as

14、sist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes preceden

15、ce. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements shall be in accordance with MIL-PRF-38534. 3.2 Design, construction, and physical dimen

16、sions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.2 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3

17、Truth table(s). The truth table(s) shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electri

18、cal test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN liste

19、d in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality c

20、onformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made av

21、ailable to the preparing activity (DSCC-VA) upon request. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87688 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234

22、 APR 97 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38

23、534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38

24、534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWIN

25、G SIZE A 5962-87688 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device type Min Max Unit Input high

26、voltage VIH1,2,3 All 2.0 V Input low voltage VIL1,2,3 All 0.8 V Input high currernt IIH VIH= 2.4 V 1,2,3 All 40 A Input low current IILVIL= 0.4 V 1,2,3 All -1.0 mA +Full scale output accuracy (unipolar) Input bits = 1111 1111 01 +3.9442 +4.0238 +Full scale output accuracy (bipolar) A+FSInput bits =

27、0000 0000 4,5,6 02 +1.9602 +2.0398 V -Full scale output accuracy (bipolar) A-FSInput bits = 1111 1111 4,5,6 02 -2.0238 -1.9442 V Zero scale output accuracy (unipolar) Input bits = 0000 0000 01 -0.0398 +0.0398 Zero scale output accuracy (bipolar) AZS Input bits = 1000 0000 4,5,6 02 -0.0398 +0.0398 V

28、Linearity error LE 1,2,3 All -0.5 +0.5 LSB Output load current IO 1,2,3 All -3.0 +3.0 mA +ICC +25 Power supply drain current -ICCInput bits = all 1s and all 0s, TA= +25C 1 All -25 mA +PSRR VCC= +14.550 V dc to +15.450 V dc, TA= +25C, input bits = 0000 0000 2/ 2/ Power supply rejection ratio -PSRR VE

29、E= -14.550 V dc to -15.450 V dc, TA= +25C, input bits = 0000 0000 1 All 3/ 3/ Settling time tSInput bits = all 1s and all 0s, TA= +25C 9 All 1.0 s 1/ Unless otherwise specified, VCC(pin 16) = +15 V dc and VEE(pin 11) = -15 V dc. 2/ +PSRR = 0.010 V dc 0.04 percent FSR/percent VSmaximum. 3/ -PSRR = 0.

30、005 V dc 0.02 percent FSR/percent VSmaximum.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87688 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 Case X

31、 FIGURE 1. Case outline(s). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87688 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 Case Y Inches mm Inche

32、s mm Inches mm .002 0.05 .070 1.78 .480 12.19 .004 0.10 .082 2.08 .495 12.57 .005 0.13 .100 2.54 .520 13.21 .008 0.20 .115 2.92 .695 17.65 .010 0.25 .118 3.00 .700 17.78 .013 0.33 .172 4.37 .705 17.91 .015 0.38 .200 5.08 .821 20.85 .016 0.41 .230 5.84 .870 22.10 .020 0.51 .295 7.49 .895 22.73 .035 0

33、.89 .305 7.75 .925 23.50 .060 1.52 NOTES: 1. Dimensions are in inches. 2. Metric equivalents are given for general information only. FIGURE 1. Case outline(s) - Continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING

34、SIZE A 5962-87688 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 Device types 01 and 02 Pin Function Pin Function 1 Bit 1 MSB 9 No connection 2 Bit 2 10 Bit 8 LSB 3 Bit 3 11 VEE(-15 V supply) 4 Bit 4 12 Ground 5 Bit 5 13 No connection 6 Bit 6

35、14 Analog output 7 Bit 7 15 No connection 8 No connection 16 VCC(+15 V supply) FIGURE 2. Terminal connections. Digital input Analog input (V dc) MSB LSB Device 01 Device 02 1111 1111 +3.984 -1.984 1111 1110 +3.969 -1.969 1000 0000 +2.000 0.00 0111 1111 +1.984 +0.016 0000 0001 +0.016 +1.984 0000 0000

36、 0.000 +2.000 FIGURE 3. Truth table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87688 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 9 DSCC FORM 2234 APR 97 TABLE II. Ele

37、ctrical test requirements. MIL-PRF-38534 test requirements Subgroups (in accordance with MIL-PRF-38534, group A test table) Interim electrical parameters 1 Final electrical parameters 1*,2,3,4,5,6 Group A test requirements 1,2,3,4,5,6,9 Group C end-point electrical parameters 1,2,3 End-point electri

38、cal parameters for Radiation Hardness Assurance (RHA) devices Not applicable * PDA applies to subgroup 1. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D.

39、The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance w

40、ith the intent specified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at th

41、e discretion of the manufacturer. 4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance with MIL-PRF-38534 and as specified herein. 4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with MIL-PRF-38534 and as f

42、ollows: a. Tests shall be as specified in table II herein. b. Subgroups 7, 8, 10, and 11 shall be omitted. 4.3.2 Group B inspection (PI). Group B inspection shall be in accordance with MIL-PRF-38534. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-ST

43、ANDARD MICROCIRCUIT DRAWING SIZE A 5962-87688 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 10 DSCC FORM 2234 APR 97 4.3.3 Group C inspection (PI). Group C inspection shall be in accordance with MIL-PRF-38534 and as follows: a. End-point electrical parameters shall

44、be as specified in table II herein. b. Steady-state life test, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon req

45、uest. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1005 of MIL-STD-883. (3) Test duration: 1,000 hours, except as

46、permitted by method 1005 of MIL-STD-883. 4.3.4 Group D inspection (PI). Group D inspection shall be in accordance with MIL-PRF-38534. 4.3.5 Radiation Hardness Assurance (RHA) inspection. RHA inspection is not currently applicable to this drawing. 5. PACKAGING 5.1 Packaging requirements. The requirem

47、ents for packaging shall be in accordance with MIL-PRF-38534. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.2 Replaceability. Microcircuits covered

48、 by this drawing will replace the same generic device covered by a contractor-prepared specification or drawing. 6.3 Configuration control of SMDs. All proposed changes to existing SMDs will be coordinated as specified in MIL-PRF-38534. 6.4 Record of users. Military and industrial users shall inform Defense Supply Center Columbus (DSCC) when a system application requires configuration control and the applicable SMD. DSCC will maintain a r