DLA SMD-5962-87670 REV A-2005 MICROCIRCUITS LINEAR QUAD THREE-STATE LINE DRIVER MONOLITHIC SILICON《硅单块 四列三态行驱动线 直线型微型电路》.pdf

《DLA SMD-5962-87670 REV A-2005 MICROCIRCUITS LINEAR QUAD THREE-STATE LINE DRIVER MONOLITHIC SILICON《硅单块 四列三态行驱动线 直线型微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-87670 REV A-2005 MICROCIRCUITS LINEAR QUAD THREE-STATE LINE DRIVER MONOLITHIC SILICON《硅单块 四列三态行驱动线 直线型微型电路》.pdf（11页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update drawing to current requirements. Editorial changes throughout. - drw 05-06-08 Raymond Monnin THE FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC

2、N/A PREPARED BY Joseph A. Kerby DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Charles Reusing COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Michael A. Frye MICROCIRCUIT, LINEAR, QUAD THREE-STATE AND AGENCIE

3、S OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 88-01-15 LINE DRIVER, MONOLITHIC SILICON AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-87670 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E641-05 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,

4、-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87670 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MI

5、L-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-87670 01 E A Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type. The device type identify the circuit function as follows: De

6、vice type Generic number Circuit function 01 26LS29 Quad three-state RS-423 line driver 1.2.2 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line F GDFP2-F16 or CDFP3

7、-F16 16 Flat pack 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage range (VCC) -0.5 V dc to +7.0 V dc Supply voltage range (VEE) +0.5 V dc to -7.0 V dc Input voltage range -1.5 V dc to +15.0 V dc Storage temperature range -

8、65C to +150C Maximum power dissipation PD1/. 600 mW Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC): Cases E and F . See MIL-STD-1835 Junction temperature (TJ) +175C Thermal resistance, junction-to-ambient (JA): Cases E and F . 89C/W maximum 1.4 Recommended o

9、perating conditions. Supply voltage (VCC) +4.75 V dc to +5.5 V dc Supply voltage (VEE) -4.75 V dc to -5.5 V dc Minimum high level input voltage (VIH). 2.0 V dc Maximum low level input voltage (VIL) 0.8 V dc Ambient operating temperature range (TA) -55C to +125C _ 1/ Must withstand the added PDdue to

10、 short circuit test; e.g., IOS. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87670 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCU

11、MENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEF

12、ENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - Lis

13、t of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, P

14、A 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained.

15、 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified m

16、anufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Mana

17、gement (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify

18、when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connec

19、tions. The terminal connections shall be as specified on figure 1 3.2.3 Block diagram. The block diagram shall be as specified on figure 2 3.2.4 Waveforms. The waveforms shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical p

20、erformance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I.

21、3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufac

22、turer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mar

23、k in accordance with MIL-PRF-38535 to identify when the QML flow option is used.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87670 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A

24、SHEET 4 DSCC FORM 2234 APR 97 |V| TTABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C +4.75 V VCC +5.5 V -4.75 V VEE -5.5 V Group A subgroups Device type Limits Unit unless otherwise specified 1/ Min Max High level output voltage VOHRL= 2/ VIH= 2.4 V 1, 2, 3 All 4.

25、0 6.0 V Low level output voltage VOL|VCC| = |VEE| = 4.75 V VIL= 0.4 V -4.0 -6.0 Output voltage 3/ VTRL= 450 VIN= 2.4 V 1, 2, 3 All 3.6 V TV |VCC| = |VEE| = 4.75 V VIN= 0.4 V -3.6 Output unbalance |VT| - 3/ RL= 450, |VCC| = |VEE| 1, 2, 3 All 0.4 V Output leakage power off IX+ VCC= VEE= 0 V VOUT= 10.0

26、 V 1, 2, 3 All 100 A IX- VOUT= -10.0 V -100 Output short circuit current 4/ IOS+ VOUT= 0 V VIN= 2.4 V 1, 2, 3 All -20 -150 mA IOS- |VCC| = |VEE| = 5.5 V VIN= 0.4 V 20 150 Off-state output current IO+ |VCC| = |VEE| = 5.5 V VOUT= 10.0 V 1, 2, 3 All 100 A (high impedance) IO- VOUT= -10.0 V -100 Positiv

27、e supply current ICCVIN= 0.4 V, RL= , |VCC| = |VEE| = 5.5 V 1, 2, 3 All 30 mA Negative supply current IEEVIN= 0.4 V, RL= , |VCC| = |VEE| = 5.5 V 1, 2, 3 All -22 mA Input high current IIH|VCC| = |VEE| = 5.5 V, VIN= 2.4 V 1, 2, 3 All 40 A VCC= 5.5 V, VEE= -5.0 V, VIN= 15 V 100 Input low current IIL|VC

28、C| = |VEE| = 5.5 V, VIN= 0.4 V 1, 2, 3 All -200 A Input clamp voltage VICVCC= 4.75 V, VEE= -4.75 V, IIN= -12 mA 1, 2, 3 All -1.5 V Rise time tR RL= 450, CL= 500 pF, CC= 0 pF, See rise time control, figure 3 9 5/ All 300 ns 10, 11 450 Fall time tFRL= 450, CL= 500 pF, CC= 0 pF, See rise time control,

29、figure 3 9 5/ All 300 ns 10, 11 450 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87670 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC

30、FORM 2234 APR 97 TABLE I. Electrical performance characteristics - continued. Test Symbol Conditions -55C TA +125C +4.75 V VCC +5.5 V -4.75 V VEE -5.5 V Group A subgroups Device type Limits Unit unless otherwise specified 1/ Min Max Output high propagation delay tPDHRL= 450, CL= 500 pF, CC= 0 pF, Se

31、e rise time control, figure 3 9 5/ All 300 ns 10, 11 450 Output low propagation delay tPDLRL= 450, CL= 500 pF, CC= 0 pF, See rise time control, figure 3 9 5/ All 300 ns 10, 11 450 Output enable to output delay tLZRL= 100, CL= 500 pF, CC= 0 pF 9 5/ All 300 ns 10, 11 400 tHZ9 5/ 350 10, 11 400 tZL9 5/

32、 350 10, 11 400 tZH9 5/ 300 10, 11 400 1/ Symbols and definition correspond to EIA RS-423 where applicable. 2/ Output voltage is +3.9 V minimum for VOHand -3.9 V minimum for VOLat -55C. 3/ This parameter is tested by forcing an equivalent current. 4/ Not more than one output should be shorted at a t

33、ime and the duration of the short circuit condition should not exceed one second. 5/ Supply voltage VCC5.0 V, supply voltage VEE= -5.0 V. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87670 DEFENSE SUPPLY C

34、ENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 Device type 01 Case outlines E and F Terminal number Terminal symbol 1 VCC2 INPUT A 3 INPUT B 4 ENABLE 5 GND 6 INPUT C 7 INPUT D 8 VEE9 SLEW RATE CONTROL D 10 OUTPUT D 11 OUTPUT C 12 SLEW RATE CONTROL C 13 SLEW R

35、ATE CONTROL B 14 OUTPUT B 15 OUTPUT A 16 SLEW RATE CONTROL A FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87670 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVI

36、SION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 FIGURE 2. Block diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87670 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC

37、 FORM 2234 APR 97 NOTE: VSSmeans steady-state swing voltage and is defined as equal to |V - V| TT . FIGURE 3. Waveforms.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87670 DEFENSE SUPPLY CENTER COLUMBUS COL

38、UMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 9 DSCC FORM 2234 APR 97 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DS

39、CC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided

40、with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers

41、 facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall

42、 be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the

43、manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883.

44、 (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall b

45、e in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, 6, 7, and 8 in table I, method 5005 of MIL-STD-883 shall be omit

46、ted. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision lev

47、el control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test durati

48、on: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87670 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 10 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) - - - Final electrical