DLA SMD-5962-85500 REV D-2005 MICROCIRCUIT LINEAR QUAD 2-INPUT NAND DRIVER MONOLITHIC SILICON《硅单块 四列2输入是非驱动器 直线型微型电路》.pdf

《DLA SMD-5962-85500 REV D-2005 MICROCIRCUIT LINEAR QUAD 2-INPUT NAND DRIVER MONOLITHIC SILICON《硅单块 四列2输入是非驱动器 直线型微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-85500 REV D-2005 MICROCIRCUIT LINEAR QUAD 2-INPUT NAND DRIVER MONOLITHIC SILICON《硅单块 四列2输入是非驱动器 直线型微型电路》.pdf（9页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Change to military drawing format. Page 1, change title. Page 2, change generic number and circuit function. Page 6, correct switching test circuit. Page 9, correct vendor similar part number. 86-10-20 M. A. Frye B Add vendor CAGE 34333. Editoria

2、l changes throughout. Change current CAGE code to 67268. 88-07-26 M. A. Frye C Drawing updated to reflect current requirements. Change circuit function. Change to figure 1, terminal connections. Editorial changes throughout. drw 00-11-30 R. Monnin D Make correction to Marking paragraph 3.5. Add “VOU

3、T=100 V” under the conditions column of IOFFtest specified in Table I. - ro 05-04-05 R. Monnin CURRENT CAGE CODE 67268 THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 PMIC N/A PREPARED BY Donald R. Osborne D

4、EFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY D. A. DiCenzo COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY N. A. Hauck AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 86-03-28 MICROCIRCUIT, LI

5、NEAR, QUAD 2-INPUT NAND DRIVER, MONOLITHIC SILICON AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 14933 85500 SHEET 1 OF 8 DSCC FORM 2233 APR 97 5962-E263-05 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 85500 DEFEN

6、SE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Numbe

7、r (PIN). The complete PIN is as shown in the following example: 85500 01 C A Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 UH-508 Q

8、uad 2-input NAND driver high-output voltage and current 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style C GDIP1-T14 or CDIP2-T14 14 Dual-in-line D GDFP1-F14 or CDFP2-F14 14 Flat pack 1.2.3 Lead

9、 finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage (VCC) 7.0 V dc Input voltage (VIN) 5.5 V dc Output off-state voltage 100 V dc Output on-state sink current . 500 mA Storage temperature range . -65C to +150C Lead temperature, (solderi

10、ng 10 seconds) . +300C Junction temperature (TJ) . +150C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA): Case C 90C/W Case D 140C/W 1.4 Recommended operating conditions. Supply voltage (VCC) 4.5 V to 5.5 V Current into any output (on-state)

11、. 250 mA maximum Minimum high-level input voltage (VIH) . 2.0 V Maximum low-level input voltage (VIL) 0.8 V Ambient operating temperature range (TA) . -55C to +125C Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A

12、85500 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified here

13、in. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microci

14、rcuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch

15、/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes preceden

16、ce. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as spec

17、ified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved

18、 program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not

19、 affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-3853

20、5, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Switching circuit and waveforms. The switching circuit and waveforms shall be as specified on figur

21、e 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be th

22、e subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. 3.5.1 Cer

23、tification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option

24、is used. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 85500 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristic

25、s. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Input current high IIN(1)other input = 0 V, driven input = 2.4 V 1, 2, 3 All 40 A other input = 0 V, driven input = 5.5 V 1000 Input current low IIN(0)VCC= 5.5 V, VOUT= 100 V, other i

26、nput = 4.5 V, driven input = 0.4 V 1, 2, 3 All -800 A Output reverse current IOFF other input = VCC, VOUT= 100 V, driven input = 0.8 V, VCC= 4.5 V 1, 2, 3 All 100 A Output voltage low VON -55C TA +25C, VCC= 4.5 V, all inputs = 2.0 V, output = 150 mA 1, 3 All 0.5 V -55C TA +25C, VCC= 4.5 V, all input

27、s = 2.0 V, output = 250 mA 0.7 TA= +125C, VCC= 4.5 V, all inputs = 2.0 V, output = 150 mA 2 0.6 TA= +125C, VCC= 4.5 V, all inputs = 2.0 V, output = 250 mA 0.8 Level supply current, high ICC(1)TA= +25C, VCC= 5.5 V, all inputs = 0 V 1 All 30 mA Level supply current, low ICC(0)TA= +25C, VCC= 5.5 V, all

28、 inputs = 5.0 V 1 All 106 mA Propagation delay time, “Turn-on” tpdONVS= 100 V, CL= 15 pF VCC= 5.0 V, RL= 670 9, 10, 11 All 500 ns Propagation delay time, “Turn-off” tpdOFFVS= 100 V, CL= 15 pF VCC= 5.0 V, RL= 670 9, 10, 11 All 750 ns Provided by IHSNot for ResaleNo reproduction or networking permitte

29、d without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 85500 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 Device type 01 Case outline C D Terminal number Terminal symbol 1 1A 1A 2 1B 1B 3 1Y 1Y 4 2A VCC5 2B 2Y 6 2Y 2B 7 GND 2A 8

30、 3Y 3Y 9 3B 3B 10 3A 3A 11 4Y GND 12 4B 4A 13 4A 4B 14 VCC4Y FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 85500 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION

31、LEVEL D SHEET 6 DSCC FORM 2234 APR 97 Input pulse: VIN(0) = 0 V VIN(1) = 3.5 V tf= 7 ns tr= 14 ns tp= 1 s PLR = 500 KHz VS= 100 V NOTE: Includes probe and test fixture capacitance. FIGURE 2. Switching circuit and waveforms. Provided by IHSNot for ResaleNo reproduction or networking permitted without

32、 license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 85500 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approv

33、ed source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of co

34、nformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and

35、review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspecti

36、on procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method

37、1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power

38、 dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discret

39、ion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in t

40、able II herein. b. Subgroups 4, 5, 6, 7, and 8 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition

41、A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordan

42、ce with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE

43、A 85500 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) - Final e

44、lectrical test parameters (method 5004) 1*, 2, 3, 9 Group A test requirements (method 5005) 1, 2, 3, 9, (10,11)* Groups C and D end-point electrical parameters (method 5005) 1, 2, 3 * PDA applies to subgroup 1. * Subgroups 10 and 11, if not tested, shall be guaranteed to the limits specified in tabl

45、e I. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applicati

46、ons, and logistics purposes. 6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared specification or drawing. 6.3 Configuration control of SMDs. All proposed changes to existing SMDs will be coordinated with the users of record

47、 for the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal. 6.4 Record of users. Military and industrial users shall inform Defense Supply Center Columbus (DSCC) when a system application requires configuration control and the applicable SMD

48、. DSCC will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronics devices (FSC 5962) should contact DSCC-VA, telephone (614) 692-0544. 6.5 Comments. Comments on this drawing should be directed t

49、o DSCC-VA, Columbus, Ohio 43218-3990, or telephone (614) 692-0547. 6.6 Approved sources of supply. Approved sources of supply are listed in MIL-HDBK-103. The vendors listed in MIL-HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted by DSCC-VA.