DLA SMD-5962-86888 REV F-2002 MICROCIRCUIT LINEAR QUAD LINE RECEIVER MONOLITHIC SILICON《硅单块 四列线接收器 直线式微型电路》.pdf

《DLA SMD-5962-86888 REV F-2002 MICROCIRCUIT LINEAR QUAD LINE RECEIVER MONOLITHIC SILICON《硅单块 四列线接收器 直线式微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-86888 REV F-2002 MICROCIRCUIT LINEAR QUAD LINE RECEIVER MONOLITHIC SILICON《硅单块 四列线接收器 直线式微型电路》.pdf（12页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add vendor CAGE 34333. Delete vendor CAGE 01295. 87-12-10 M. A. FRYE B Delete vendor CAGE 34333. Add vendor CAGE 01295 for device 02 case outlines C and 2. Page 9, figure 3: ZOUTshould read 50 ; tWshould read 500 ns. Device 01 is no longer availa

2、ble from an approved source. Editorial changes throughout. 88-10-06 M. A. FRYE C Add a flat package, F-2 and make editorial changes throughout. 90-03-19 M. A. FRYE D Changes in accordance with N.O.R. 5962-R168-95. 95-08-03 M. A. FRYE E Changes in accordance with N.O.R. 5962-R262-97. 97-05-08 R. MONN

3、IN F Drawing updated to reflect current requirements. - ro 02-06-25 R. MONNIN THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV F F F F F F F F F F F OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY MARCIA B. KELLEHER DEFENSE SUPPLY CENTER COLUM

4、BUS STANDARD MICROCIRCUIT DRAWING CHECKED BY RAY MONNIN COLUMBUS, OHIO 43216 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, QUAD LINE RECEIVER, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL

5、 DATE 87-07-30 AMSC N/A REVISION LEVEL F SIZE A CAGE CODE 67268 5962-86888 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E372-02 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,

6、-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86888 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL F SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with

7、MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-86888 01 C X Drawing number Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device type(s). The device type(s) identify the circuit function as

8、follows: Device type Generic number Circuit function 01 1489, 55189 Quad line receiver 02 1489A, 55189A Quad line receiver 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style C GDIP1-T14 or CDIP2-T

9、14 14 Dual-in-line D GDFP1-F14 or CDFP2-F14 14 Flat pack 2 CQCC1-N20 20 Square leadless chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage (VCC) . +10 V dc Input voltage . 30 V dc Maximum power dissipation (PD) .

10、 1 W 1/ 2/ Junction temperature (TJ) +150C Storage temperature range -65C to +150C Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) See MIL-STD-1835 1.4 Recommended operating conditions. Supply voltage range (VCC) . +4.5 V dc to +5.5 V dc High level output cur

11、rent (IOH) . -0.5 mA Low level output current (IOL) . +10 mA Ambient operating temperature range (TA) -55C to +125C _ 1/ Must withstand the added PDdue to short circuit test; e.g., IOS. 2/ Derate linearly above TA= +25C at the rate of 6.7 mW/C for cases C and 2 and 8.0 mW/C for case D. Provided by I

12、HSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86888 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL F SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards

13、, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and s

14、upplement thereto, cited in the solicitation. SPECIFICATION DEPARTMENT OF DEFENSE MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Ca

15、se Outlines. HANDBOOKS DEPARTMENT OF DEFENSE MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the Standardization Document Order Desk, 700 Robbin

16、s Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a

17、 specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer L

18、isting (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML

19、flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with

20、MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance wi

21、th 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Schematic diagram. The schematic diagram shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance charact

22、eristics are as specified in table I and shall apply over the full ambient operating temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86888 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 4321

23、6-5000 REVISION LEVEL F SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ 2/ -55C TA +125C 4.95 V VCC 5.05 V Group A subgroups Device type Limits Unit unless otherwise specified Min Max Positive going threshold voltage +VT1,2,3 01 0.6 1.9 V 02 1

24、.30 2.65 Negative going threshold voltage -VT1,2,3 All 0.35 1.60 V Output low voltage VOLVC= maximum, VI= 3 V, IOL= 10 mA 1,2,3 All 0.45 V Output high voltage VOHVC= minimum, IOH= -0.5 mA, VI= 0.75 V 1,2,3 All 2.6 V VC= minimum, IOH= -0.5 mA, Input open 2.6 Input low current IILVI= -25 V 1,2,3 All -

25、3.6 -8.3 mA VI= -3 V -0.43 Input high current IIHVI= 25 V 1,2,3 All 3.6 8.3 mA VI= 3 V 3/ 1,3 0.43 2 0.37 Output short circuit current IOSVI= 0 V, VCC= maximum 1,2,3 All -4.0 mA Supply current ICCVI= 5 V, outputs open, VCC= maximum, TA= +25C 1 All 26 mA Propagation delay input to output tPLHSee figu

26、res 3 and 4, 9 All 85 ns RL= 3.9 k, CL= 15 pF 10,11 127 tPHLSee figures 3 and 4, 9 50 RL= 390 , CL= 15 pF 10,11 75 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86888 DEFENSE

27、SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL F SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ 2/ -55C TA +125C 4.95 V VCC 5.05 V Group A subgroups Device type Limits Unit unless otherwise specified Min Max Transit

28、ion time tTLHSee figures 3 and 4, 9 All 175 ns RL= 3.9 k, CL= 15 pF 10,11 262 tTHLSee figures 3 and 4, 9 20 RL= 390 , CL= 15 pF 10,11 30 1/ All voltage values are with respect to network ground terminal. 2/ All characteristics measured with response control terminal open. 3/ May not meet EIA-RS232C

29、standard at +125C. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked wi

30、th the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked as listed in MIL-HDBK-103 (see 6.6 herein). For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the devic

31、e. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML

32、flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of s

33、upply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this

34、drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required in accordance with MIL-PRF-38535, appendix A. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentati

35、on. Offshore documentation shall be made available onshore at the option of the reviewer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86888 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISIO

36、N LEVEL F SHEET 6 DSCC FORM 2234 APR 97 Device types 01 and 02 Case outlines C and D 2 Terminal number Terminal symbol 1 1A NC 2 1 CONTROL 1A 3 1Y 1 CONTROL 4 2A 1Y 5 2 CONTROL NC 6 2Y 2A 7 GND NC 8 3Y 2 CONTROL 9 3 CONTROL 2Y 10 3A GND 11 4Y NC 12 4 CONTROL 3Y 13 4A 3 CONTROL 14 VCC3A 15 - NC 16 -

37、4Y 17 - NC 18 - 4 CONTROL 19 - 4A 20 - VCCNC = No connection FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86888 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVI

38、SION LEVEL F SHEET 7 DSCC FORM 2234 APR 97 Resistor Device types 01 02 R1 10 k 2 k Resistor values shown are nominal and in ohms. FIGURE 2. Schematic diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-8

39、6888 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL F SHEET 8 DSCC FORM 2234 APR 97 NOTES: 1. The pulse generator has the following characteristics: ZOUT 50 , tW= 500 ns. 2. CLincludes probe and jig capacitance. 3. All diodes are 1N3064 or equivalent. 4. AC switching charact

40、eristics are measured using single pulse techniques ( PRR = 0 ). FIGURE 3. Test load circuit. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86888 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REV

41、ISION LEVEL F SHEET 9 DSCC FORM 2234 APR 97 FIGURE 4. Voltage waveforms. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86888 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL F SHEET 1

42、0 DSCC FORM 2234 APR 97 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior

43、to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing

44、 or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as speci

45、fied in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspection

46、s. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, 6, 7, and 8 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as spec

47、ified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request

48、. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD