DLA SMD-5962-86879 REV D-2002 MICROCIRCUIT LINEAR BUS INTERFACE DRIVER CIRCUIT MONOLITHIC SILICON《硅单块 总线界面激励电路直线式微型电路》.pdf

《DLA SMD-5962-86879 REV D-2002 MICROCIRCUIT LINEAR BUS INTERFACE DRIVER CIRCUIT MONOLITHIC SILICON《硅单块 总线界面激励电路直线式微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-86879 REV D-2002 MICROCIRCUIT LINEAR BUS INTERFACE DRIVER CIRCUIT MONOLITHIC SILICON《硅单块 总线界面激励电路直线式微型电路》.pdf（13页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Make changes to paragraphs 1.3, 4.3.1c, table I, and figure 3. Make editorial changes throughout. 89-01-30 M. A. FRYE B Add one vendor, CAGE 07933. Make changes to table I and editorial changes throughout. Remove vendor CAGE 34371. Device 013X is

2、 not available from an approved source of supply. 90-05-30 M. A. FRYE C Changes in accordance with N.O.R. 5962-R013-91. 91-09-27 M. A. FRYE D Drawing updated to reflect current requirements. - ro 02-07-08 R. MONNIN THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STA

3、TUS REV D D D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY DONALD R. OSBORNE DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY RAY MONNIN COLUMBUS, OHIO 43216 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROV

4、ED BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, BUS INTERFACE DRIVER CIRCUIT, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 88-05-05 AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-86879 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E375-02 DISTRIBUTION STATEMENT A.

5、 Approved for public release; distribution is unlimited.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86879 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL D SHEET 2 DSCC FORM 2234 A

6、PR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-86879 01 E X Drawing num

7、ber Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 HS-3182, HI-8382 Bus interface line driver circuit 1.2.2 Case outline(s). The case outline(s)

8、 are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line 3 CQCC1-N28 28 Square leadless chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum

9、ratings. V+ minus V- (differential voltage) . 40 V dc V17 V dc VREF6 V dc Logic input voltage range . (GND - 0.3 V) to (V1+ 0.3 V) Maximum power dissipation (PD): Case E 1.725 W 1/ Case 3 1.12 W 1/ Junction temperature (TJ) +175C Lead temperature (soldering, 10 seconds) +275C Storage temperature ran

10、ge -65C to +150C Thermal resistance, junction-to-case (JC) See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA): Case E 86.5C/W Case 3 133.7C/W _ 1/ Derate above +25C, 11.5 mW/C for case E, and 7.5 mW/C for case 3. Provided by IHSNot for ResaleNo reproduction or networking permitted without

11、 license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86879 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.4 Recommended operating conditions. 2/ Supply voltage: V+ 15 V dc 10% V- -15 V dc 10% V15 V dc 5% VREF5 V dc 5% Ambient oper

12、ating temperature range (TA) -55C to +125C Maximum load: Data rate at 12.5 KBPS: RL= 800 , CL= 30 nF; RL= 400 , CL= 6.9 nF. Data rate at 100 KBPS: RL= 800 , CL= 4 nF. 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks

13、 form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the solicitation. SPECIFICATION DEPARTMENT

14、 OF DEFENSE MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. HANDBOOKS DEPARTMENT OF DEFENSE MIL-HDBK-103 - List of St

15、andard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of prec

16、edence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. _ 2/ All voltages referenced to

17、 GND Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86879 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The in

18、dividual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been gra

19、nted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the

20、 requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design,

21、construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as sp

22、ecified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specif

23、ied in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accorda

24、nce with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked as listed in MIL-HDBK-103 (see 6.6 herein). For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manu

25、facturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification

26、mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance s

27、ubmitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shal

28、l be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required in accordance with MIL-PRF-38535, appendix A. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review

29、 the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86879 D

30、EFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Supply current V+ (operating) ICCO

31、P(V+) No load (0-100 k bits/s) 1,2,3 01 16 mA Supply current V- (operating) ICCOP(V-) No load (0-100 k bits/s) 1,2,3 01 -16 mA Supply current V1(operating) ICCOP(V1) No load (0-100 k bits/s) 1,2,3 01 975 A Supply current VREF(operating) ICCOP(VREF) No load (0-100 k bits/s) 1,2,3 01 -1.0 mA Supply cu

32、rrent V- (during short circuit test) ISC(V-) Short to ground 1/ 1,2,3 01 -150 mA Supply current V+ (during short circuit test) ISC(V+) Short to ground 1/ 1,2,3 01 150 mA Output short circuit current (output high) IOSHCShort to ground, 2/ Vmin= 0 V 1,2,3 01 -80 mA Output short circuit current (output

33、 low) IOSLCShort to ground, 2/ Vmin= 0 V 1,2,3 01 +80 mA Input current (input high) IIH1,2,3 01 10 A Input current (input low) IIL1,2,3 01 -20 A Output voltage high (output to ground) VOHNo load (0-100 k bits/s) 1,2,3 01 +VREF- .25 +VREF+ .25 V Output voltage low (output to ground) VOLNo load (0-100

34、 k bits/s) 1,2,3 01 -VREF- .25 -VREF+ .25 V Output voltage null VNULLNo load (0-100 k bits/s) 1,2,3 01 -250 +250 mV Input capacitance CINSee 4.3.1c, TA= +25C 4 01 30 pF Functional tests VIH= 2.0 V, 3/ VIL= 0.5 V, see 4.3.1d 7,8 01 See footnotes at end of table. Provided by IHSNot for ResaleNo reprod

35、uction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86879 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions -55C T

36、A +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Rise time (AOUT, BOUT) trSee figure 4, 3/ CL = 75 pF 9,10,11 01 0.9 2.4 s Fall time (AOUT, BOUT) tfSee figure 4, 3/ CL = 75 pF 9,10,11 01 0.9 2.4 s Propagation delay input to output tPLHSee figure 4, 3/ CL = 75 pF 9

37、,10,11 01 3.3 s Propagation delay input to output tPHLSee figure 4, 3/ CL = 75 pF 9,10,11 01 3.3 s 1/ Not tested, but characterized at initial device design and after major process or design change which affects this parameter. 2/ Interchangeability of force and sense is acceptable. 3/ V+ = 15 V, V-

38、 = 15 V, V1= VREF= 5.0 V. 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prio

39、r to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the prepari

40、ng or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as spe

41、cified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86879 DEFENSE SUPPLY C

42、ENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 Device type 01 Case outlines E 3 Terminal number Terminal symbol 1 VREFVREF2 GND NC 3 SYNC GND 4 DATA (A) SYNC 5 CANC 6 AOUTDATA (A) 7 -V NC 8 GND NC 9 +V CA10 NC NC 11 BOUTNC 12 CBNC 13 DATA (B) AOUT14 CLOCK -V

43、15 NC GND 16 V1+V 17 - BOUT18 - NC 19 - NC 20 - NC 21 - NC 22 - CB23 - DATA (B) 24 - NC 25 - CLOCK 26 - NC 27 - NC 28 - V1NC = No connection FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING

44、 SIZE A 5962-86879 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 SYNC CLOCK DATA (A) DATA (B) AOUTBOUTCOMMENTS X L X X 0 V 0 V NULL L X X X 0 V 0 V NULL H H L L 0 V 0 V NULL H H L H -VREF+VREFLOW H H H L +VREF-VREFHIGH H H H H 0 V 0 V NULL FI

45、GURE 2. Truth table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86879 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL D SHEET 9 DSCC FORM 2234 APR 97 FIGURE 3. Logic diagram. Prov

46、ided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86879 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL D SHEET 10 DSCC FORM 2234 APR 97 NOTE: trmeasured 50 percent to 90 percent times two.

47、tfmeasured 50 percent to 90 percent times two. VIH= 2.0 V VOL= -4.75 V to -5.25 V VIL= 0.5 V VOH= 4.75 V to 5.25 V FIGURE 4. Switching waveforms. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86879 DEFENSE

48、SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL D SHEET 11 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) - Final electrical test parameters (method 5004) 1*,2,3,7,8,9 Group A test requirements (method 5005) 1,2,3,4,7,8,9,10,11 Groups C and D end-point electrical parameters (method 5005) 1,2,3 * PDA ap