DLA DSCC-DWG-09004-2010 RESISTOR CHIP FIXED FILM PRECISION TOP CONTACT STYLE 2020.pdf

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1、 REVISIONS LTR DESCRIPTION DATE APPROVED Prepared in accordance with ASME Y14.100 Source control drawing REV STATUS OF PAGES REV PAGES 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Andrew R. Ernst DESIGN ACTIVITY DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OH Original date of drawing 16 April 2010 CHEC

2、KED BY Andrew R. Ernst TITLE: RESISTOR, CHIP, FIXED, FILM, PRECISION, TOP CONTACT, STYLE 2020 APPROVED BY Michael Radecki SIZE A CODE IDENT. NO. 037Z3 DWG NO. 09004 REV PAGE 1 OF 11 AMSC N/A 5905-E680Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DE

3、FENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO SIZE A CODE IDENT NO. 037Z3 DWG NO. 09004 REV PAGE 2 1. SCOPE 1.1 Scope. This drawing describes the requirements for a fixed, film, chip, top contact, .020 X .020 resistors. 1.2 Part or Identifying Number (PIN). The complete PIN is as follows: 09202- 1K05

4、0 T C H Drawing number Resistance (see 3.3.1 and 3.6) Resistance tolerance (see 3.3.2) Temperature characteristic (see 3.4) Process code (see 3.5) 2. APPLICABLE DOCUMENTS 2.1 General. The documents listed in this section are specified in sections 3 and 4 of this specification. This section does not

5、include documents cited in other sections of this specification or recommended for additional information or as examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements of documents in sections 3 a

6、nd 4 of this specification, whether or not they are listed. 2.2 Government documents. 2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these do

7、cuments are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38534 - Hybrid Microcircuits, General Specification For. MIL-PRF-55342 - Resistors, Chip, Fixed, Film, Nonestablished Reliability, Established Reliability, Space Level, General Specification For. DE

8、PARTMENT OF DEFENSE STANDARDS MIL-STD-202 - Tests Methods for Electronic and Electrical Components Parts. MIL-STD-690 - Failure Rate Sampling Plans and Procedures. MIL-STD-790 - Standard Practice for Established Reliability and High Reliability Qualified Products List (QPL) Systems for Electrical El

9、ectronic, and Fiber Optic Parts Specifications. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.3 Non-Government publications. The following do

10、cuments form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. NATIONAL CONFERENCE OF STANDARDS LABORATORIES (NCSL) NCSL Z540.3 - Requirements for Calibration of Measuring and Test Equipm

11、ent. (Copies of this document are available from http:/www.ncsli.org or from the National Conference of Standards Laboratories (NCSL) International, 1800 30thStreet, Suite 305, Boulder, CO 80301-1026.) 2.4 Order of precedence. Unless otherwise noted herein or in the contract, in the event of a confl

12、ict between the text of this document and the references cited herein, the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. Provided by IHSNot for ResaleNo reproduction or networking p

13、ermitted without license from IHS-,-,-DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO SIZE A CODE IDENT NO. 037Z3 DWG NO. 09004 REV PAGE 3 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be as specified herein. 3.2 Interface and physical dimensionsfigure 1. The chip resi

14、stor shall meet the interface and physical dimensions as specified herein (see ). NOTES: 1. Dimensions are in inches. 2. Metric equivalents are given for general information only. 3. Unless other wise specified tolerance is .003 inches (0.076 mm). 4. Chip thickness is .010 .002 inches (0.254 0.05 mm

15、). FIGURE 1. Resistor, chip, fixed, film, top contact. Ltr Inches mm Min Max Min Max A B C D .001 .011 .005 .017 .007 .017 .011 .023 0.03 0.28 0.13 0.43 0.18 0.43 0.28 0.58 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DEFENSE SUPPLY CENTER, COLUMB

16、US COLUMBUS, OHIO SIZE A CODE IDENT NO. 037Z3 DWG NO. 09004 REV PAGE 4 3.3 Electrical characteristics3.3.1 Resistance. The nominal resistance is expressed in ohms and identified by five characters, consisting of four digits and a letter. The letter is used simultaneously as a decimal point and as a

17、multiplier. For resistance values: . a. Greater than or equal to 10 ohms but less than 1 kilohm, the letter “R” is used to represent a decimal point. b. Greater than or equal to 1 kilohm but less than 510 kilohms, the letter “K” is used to represent the decimal point. All digits preceding and follow

18、ing the letters R and K of the group represent significant figures. Minimum and maximum resistance values shall be as specified herein (see 3.6). The standard values for every decade shall follow the sequence specified in table I for the resistance tolerances D, F, G, J, and K. The resistance values

19、 for tolerances B and C may be any value within the limits specified herein, but it is preferred that the values be chosen from the tighter tolerance columns of table I. 3.3.2 Resistors tolerance(F) 1.0 percent, (G) 2.0 percent, (J) 5.0 percent, and (K) 10.0 percent. . Resistors are available in tol

20、erances (B) .1 percent, (C) .2 percent, (D) .5 percent, 3.3.3 Operating temperature range. The operating temperature range shall -55C to +125C. TABLE I. Standard resistance values for the 10 to 100 decade. Resistance tolerance B, C, D F B, C, D F B, C, D F B, C, D F B, C, D F B, C, D F 10.0 10.1 10.

21、2 10.4 10.5 10.6 10.7 10.9 11.0 11.1 11.3 11.4 11.5 11.7 11.8 12.0 12.1 12.3 12.4 12.6 12.7 12.9 13.0 13.2 13.3 13.5 13.7 13.8 14.0 14.2 14.3 14.5 10.0 10.2 10.5 10.7 11.0 11.3 11.5 11.8 12.1 12.4 12.7 13.0 13.3 13.7 14.0 14.3 14.7 14.9 15.0 15.2 15.4 15.6 15.8 16.0 16.2 16.4 16.5 16.7 16.9 17.2 17.

22、4 17.6 17.8 18.0 18.2 18.4 18.7 18.9 19.1 19.3 19.6 19.8 20.0 20.3 20.5 20.8 21.0 21.3 14.7 15.0 15.4 15.8 16.2 16.5 16.9 17.4 17.8 18.2 18.7 19.1 19.6 20.0 20.5 21.0 21.5 21.8 22.1 22.3 22.6 22.9 23.2 23.4 23.7 24.0 24.3 24.6 24.9 25.2 25.5 25.8 26.1 26.4 26.7 27.1 27.4 27.7 28.0 28.4 28.7 29.1 29.

23、4 29.8 30.1 30.5 30.9 31.2 21.5 22.1 22.6 23.2 23.7 24.3 24.9 25.5 26.1 26.7 27.4 28.0 28.7 29.4 30.1 30.9 31.6 32.0 32.4 32.8 33.2 33.6 34.0 34.4 34.8 35.2 35.7 36.1 36.5 37.0 37.4 37.9 38.3 38.8 39.2 39.7 40.2 40.7 41.2 41.7 42.2 42.7 43.2 43.7 44.2 44.8 45.3 45.9 31.6 32.4 33.2 34.0 34.8 35.7 36.

24、5 37.4 38.3 39.2 40.2 41.2 42.2 43.2 44.2 45.3 46.4 47.0 47.5 48.1 48.7 49.3 49.9 50.5 51.1 51.7 52.3 53.0 53.6 54.2 54.9 55.6 56.2 56.9 57.6 58.3 59.0 59.7 60.4 61.2 61.9 62.6 63.4 64.2 64.9 65.7 66.5 67.3 46.4 47.5 48.7 49.9 51.1 52.3 53.6 54.9 56.2 57.6 59.0 60.4 61.9 63.4 64.9 66.5 68.1 69.0 69.

25、8 70.6 71.5 72.3 73.2 74.1 75.0 75.9 76.8 77.7 78.7 79.6 80.6 81.6 82.5 83.5 84.5 85.6 86.6 87.6 88.7 89.8 90.9 92.0 93.1 94.2 95.3 96.5 97.6 98.8 68.1 69.8 71.5 73.2 75.0 76.8 78.7 80.6 82.5 84.5 86.6 88.7 90.9 93.1 95.3 97.6 Provided by IHSNot for ResaleNo reproduction or networking permitted with

26、out license from IHS-,-,-DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO SIZE A CODE IDENT NO. 037Z3 DWG NO. 09004 REV PAGE 5 TABLE I. Standard resistance values for the 10 to 100 decade - continued. Resistance tolerance G, J K G, J K G, J K G, J K G, J K 10.0 11.0 12.0 13.0 15.0 10.0 12.0 15.0 16.0

27、18.0 20.0 22.0 24.0 18.0 22.0 27.0 30.0 33.0 36.0 39.0 27.0 33.0 39.0 43.0 47.0 51.0 56.0 47.0 56.0 62.0 68.0 75.0 82.0 91.0 68.0 82.0 91.0 3.4 Temperature characteristics table II. Resistors are available with temperature characteristics as specified in . TABLE II. Characteristic. Resistance temper

28、ature characteristic (referenced to 25C) Code letter ppm/C Resistance range C 10 1k ohms to 510k ohms E 25 100 ohms to 510k ohms H 50 50 ohms to 510k ohms K 100 10 ohms to 510k ohms 3.5 Process code MIL-PRF-38534. The process codes are available in class H, or class K as specified in . 3.6 Resistanc

29、e range3.7 . The resistance range shall be from 10 ohms to 510 kilohms. Power rating. The power rating shall be 0.250 watt at +70C. For operation at temperature in excess of +70C, derate in accordance with figure 2. NOTE: This curve indicates the percentage of nominal wattage to be applied at temper

30、atures higher than 70C for the same R that would occur at 70C during life testing. However, at no time shall the applied voltage exceed the maximum rated voltage. FIGURE 2. Derating curves for various ambient temperatures. Provided by IHSNot for ResaleNo reproduction or networking permitted without

31、license from IHS-,-,-DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO SIZE A CODE IDENT NO. 037Z3 DWG NO. 09004 REV PAGE 6 3.8 Voltage rating3.9 . The maximum continuous working voltage shall not exceed 100 volts. Termination finish MIL-PRF-55342. Termination material shall be in accordance with , cod

32、e letter W. 3.9.1 Pure tin6.3. The use of pure tin, as an underplate or final finish is prohibited both internally and externally. Tin content of resistor components and solder shall not exceed 97 percent, by mass. Tin shall be alloyed with a minimum of 3 percent lead, by mass (see ). 3.10 Thermal s

33、hock. When resistors are tested as specified in 4.5, there shall be no evidence of mechanical damage; the change in resistance shall not exceed (.25 percent +.001 ohm) for power conditioning, thermal shock, and short time overload tests combined (see 3.10 and 3.17). 3.11 DC resistance. When resistor

34、s are tested as specified in 4.6, the dc resistance shall be within the specified tolerance of the nominal resistance (see 3.3.1) for all products deliverable on the contract. 3.12 Visual inspection. Resistors shall be inspected as specified in 4.7, to verify that the interface, physical dimensions,

35、 marking, and workmanship are in accordance with the applicable requirements (see 3.2 and 3.22). 3.13 Current noise. When resistors are tested as specified in 4.8, the current noise index shall not exceed -35 dB from 100 ohms to 250 kilohms, and -20 dB from 251 kilohms. 3.14 Marking. Marking is not

36、required on the resistor; however, each unit package shall be marked with the PIN assigned herein (see 1.2), manufacturers identification code and date and lot codes. 3.15 Power conditioning. When resistors are tested as specified in 4.9, there shall be no evidence of mechanical damage; the change i

37、n resistance shall not exceed (.25 percent +.001 ohm) for power conditioning, thermal shock, and short time overload test combined (see 3.10 and 3.17). 3.16 Resistance temperature characteristic. When resistors are tested as specified in 4.10, the resistance temperature characteristic, at each of th

38、e temperatures specified in table VI, referred to 25C 5C, and shall not exceed the value specified in table II for the applicable characteristic. 3.17 Short time overload. When resistors are tested as specified in 4.11, there shall be no evidence of arching, burning, or charring; the change in resis

39、tance shall not exceed (.25 percent +.001 ohm) for power conditioning, thermal shock, and short time overload tests combined (see 3.10 and 3.17). 3.18 Wire bonding integrity. When resistors are tested as specified in MIL-PRF-55342 and 4.12 herein there shall be no evidence of mechanical damage. 3.19

40、 Manufacturer eligibility. To be eligible for listing as an approved source of supply, a manufacturer shall perform the group A and group B inspections specified herein on a sample of parts agreed upon by the manufacturer and DSCC-VA. 3.20 Certificate of compliance3.21 . A certificate of compliance

41、shall be required from manufacturers requesting to be a approved source of supply. Recycled, recovered, or environmentally preferable materials3.22 . Recycled, recovered, or environmentally preferable materials should be used to the maximum extent possible provided that the material meets or exceeds

42、 the operational and maintenance requirements, and promotes economically advantageous life cycle costs. Workmanship4. VERIFICATION . Resistors shall be uniform in quality and free from defects that will affect life, serviceability, or appearance. 4.1 Qualification inspection. Qualification inspectio

43、n is not applicable to this document. 4.2 Reliability assurance program MIL-PRF-55342. The reliability assurance provisions specified in and maintained in accordance with MIL-STD-790 are not applicable to this document. 4.3 Failure rate qualification MIL-PRF-55342. Failure rate qualification specifi

44、ed in and MIL-STD-690is not applicable to this document. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-DEFENSE SUPPLY CENTER, COLUMBUS COLUMBUS, OHIO SIZE A CODE IDENT NO. 037Z3 DWG NO. 09004 REV PAGE 7 4.4 Conformance inspection. 4.4.1 Inspection

45、of product for delivery. Inspection of product for delivery shall consist of group A and group B inspections: 4.4.2 Group A inspection table III. Group A inspection shall consist of the inspections specified in , and shall be made on the same set of sample units, in the order shown. 4.4.2.1 Subgroup

46、 I. Subgroup I tests shall be performed on 100 percent of the product supplied under this specification. Resistors that are out of resistance tolerance or which experience a change in resistance greater than that permitted for the tests of this subgroup shall be removed from the lot. Lots having mor

47、e than 5 percent total rejects or one resistor, which ever is greater, due to exceeding the specified resistance change limit, shall not be furnished on the contract. TABLE III. Group A inspection. Inspection Requirement paragraph Test method paragraph Number of samples Subgroup I Thermal shock DC r

48、esistance 3.10 3.11 4.5 4.6 100 percent Subgroup II Visual inspection 3.12 4.7 13 Subgroup III Current noise 3.13 4.8 5 4.4.2.2 Subgroup II. A sample of 13 parts shall be randomly selected, if one or more defects are found, the lot shall be rescreened and defects removed. A new sample of 13 parts sh

49、all then be randomly selected. If one or more defects are found in this second sample, the lot shall be rejected and shall not be supplied against this document. 4.4.2.3 Subgroup III4.4.3 . A sample of 5 parts shall be randomly selected, if one or more defects are found, the lot shall be rescreened and defects removed. A new sample of 5 parts shall then be ra