CIE 114-1994 CIE Collection in Photometry and Rodiometry (E)《光度学和Rodiometry(E)的CIE集合》.pdf

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1、 CIE 114 94 m 7006345 0005224 653 m ISBN 3 900 734 58 5 COMMISSION INTERNATIONALE DE LCLAIRAGE INTERNATIONAL COMMISSION ON ILLUMINATION INTERNATIONALE BELEUCHTUNGSKOMM ISSION CIE COLLECTION in Photometry and Rad i o rn etry tents: 11411 1 1412 1 1413 1 1414 1 14/5 I 14/6 Survey of Reference Material

2、s for Testing the Performance of Spectrophotometers and Colorimeters (reprint) International Intercomparison on Transmittance Measurement - Report of Results and Conclusions (reprint) Intercomparison of Luminous Flux Measurements on HPMV Lamps Distribution Temperature and Ratio Temperature Terminolo

3、gy relating to Non-Selective Detectors Photometry of thermally sensitive lamps Abstracts of CIE Publications prepared within Division 2 CIE 114-1994 COPYRIGHT International Commission on IlluminationLicensed by Information Handling ServicesCIE I114 94 e 9006145 0005225 59T W The Technical Reports in

4、 this publication have been prepared by various CIE Technical Committees within Division 2 “Physical Measurement of Light and Radiation“. Part of them were published in the “CIE Journal“ between 1 987 and 1988. The reports draw on current knowledge and experience within the specific field of light a

5、nd lighting described, and are intended to be used by the CIE membership and other interested parties. It should be noted, however, that the status of the reports is advisory and not mandatory. The latest CIE proceedings, CIE NEWS, future issues in the “CIE Collection“ Series or publication listings

6、 should be consulted regarding possible subsequent amendments. Les rapports techniques ont t prpars par diffrents Comits Techniques dans la CIE de la Division “Mesures physiques de la lumire et des radiations“. Ils ont t publis en partie dans le “CIE Journal“ entre 1987 et 1988. Les rapports traiten

7、t des connaissances courantes et de lexprience dans le domaine spcifique indiqu de la lumire et de lclairage, et ils ont t tablis pour lusage des membres de la CIE et autres groupements intresss. li faut cependant noter que les rapports sont indicatifs et non obligatoires. Pour connaitre dventuels a

8、mendements, consulter les plus rcents comptes rendus de la CIE, CIE NEWS, ditions futures de la srie “CIE Collection“ ou les listes de publications de la CIE. Die Technischen Berichte wurden von verschiedenen Technischen Komitees der CIE in Division 2 “Physikalische Messungen von Licht und Strahlung

9、 ausgearbeitet. Sie wurden zum Teil irn “CIE Journal“ in den Jahren 1987 und 1988 verffentlicht. Die Berichte behandeln den derzeitigen Stand des Wissens und Erfahrungen auf dem Gebiet Licht und Beleuchtung; sie sind zur Verwendung durch CIE-Mitglieder und durch andere Interessierte bestimmt. Es sol

10、lte jedoch beachtet werden, da die Berichte Empfehlungen und keine Vorschriften sind. Die neuesten CIE-Tagungsberichte, das CIE NEWS, zukntige Ausgaben in der Sene “CIE Collection“ oder die Publikationsliste sollten im Hinblick auf mgliche sptem nderungen zu Rate gezogen werden. Any mention of organ

11、isations or products does not imply endorsement by the CIE. Whilst every care has been taken in the cornpilation of any lists, up to the time of going tu press, these may not be comprehensive. Toute mention dorganisme ou de produit nimplique pas une prfrence de la CIE. Malgr le soin apport la compil

12、ation de tous les documents jusqu la mise sous presse, ce travail ne saurait tre exhaustif. Die Erwhnung wn Organisationen oder Erzeugnissen bedeutet keine Billigung durch die CIE. Obgleich groe Sorgfalt bei der Erstellung von Verzeichnissen bis zum Zeitpunkt der Drucklegung angewendet wurde, ist es

13、 mglich, da diese nicht vollstndig sind. O CIE 1994 II COPYRIGHT International Commission on IlluminationLicensed by Information Handling ServicesCIE 11Li 9Li E 9006345 0005226 426 W Contents Survey of Reference Materials for Testing the Performance of Spectrophotometers and Colorimeters Internation

14、al Intercomparison on Transmittance Measurement - Report of Results and Conclusions Intercomparison of Luminous Flux Measurements on HPMV Lamps Distribution Temperature and Ratio Temperature Terminology relating to Non-Selective Detectors Photometry of Thermally Sensitive Lamps Abstracts of CIE Publ

15、ications Prepared within Division 2: CIE 18.2-1983 The Basis of Physical Photometry CIE 24-1973 CIE 27-1973 CIE 38-1977 CIE 43-1979 CIE 44-1979 CI E 46-1 979 CIE 53-1982 CIE 54-1982 CIE 59-1 984 CIE 63-1984 CIE 64-1984 CIE 65-1985 CIE 69-1987 CIE 70-1 987 CIE 76-1 988 CIE 85-1 989 CIE 89/1-1991 CIE

16、105-1 993 Photometry of Indoor Type Luminaires with Tubular Fluoreccen t Lamps Photometry of Luminaires for Street Lighting Radiometric and Photometric Characteristics of Materials and their Measurement Photometry of Floodlights Absolute Methods for Reflection Measurements A Review of Publications o

17、n Properties and Reflection Values of Material Reflection Standards Methods of Characterizing the Performance of Radio- meters and Photometers Retroreflection: Definitions and Measurement Polarization: Definitions and Nomenclature, Instrument Polarization The Spectroradiometric Measurement of Light

18、Sources Determination of the Spectral Responsivity of Optical Radiation Detectors Electrically Calibrated Thermal Detectors of Optical Radiation (Absolute Radiometers) Methods of Characterizing Illuminance Meters ad Luminance Meters The Measurement of Absolute Luminous Intensity Distributions Interc

19、omparison of Measurements of (Total) Spectral Radiance Factor of Luminescent Specimens Solar Spectral Irradiance Results of a CIE Detector Response Intercomparison (in: CIE Technical Collection 1990) Spectroradiometric Measurement of Pulsed Optical Radiation Status of Papers Published in CIE Technic

20、al Collections Page 1 10 18 24 29 33 34 34 34 34 35 35 35 36 36 36 37 37 37 38 38 38 39 40 40 41 COPYRIGHT International Commission on IlluminationLicensed by Information Handling Services - CIE 334 94 M 9006345 0005227 362 /ILI- I CIE 114-1994 Originally published in: CIE Journal, Vol. 6, No. 1, pp

21、. 23-31, 1987. CI RESEARCH NOTE SURVEY OF REFERENCE FWTERIALS FOR TESTING THE PERFORMNCE OF SPECTROPHOTOMETERS AND COLORIPIETERS Summary: A list of reference materials for testing the performance of spectrophotometers and colori- meters is given. Particular attention is paid to materials for the mea

22、surement of regular trans- mittance and for regular (specular) and diffuse reflectance. Materials for the calibration of wavelength scales and the measurement of stray light are also included. No examples were found of reference materials for the measurement of diffuse transmittance. Information on

23、type of materials, suppliers, sizes available and calibration details is supplied. Apercu des matires de rf SRM 9300. Alternatively a single filter of trans- mittance 30% and calibrated at 465 nm only may be supplied; SRM 2030 Cl61. Neutral -density fi 1 ters of Schott gl ass in three sizes: 38mm di

24、ameter aperture in 51x51 mm holder, 25 m dtameter aperture in 51x28 mm holder and 30x8 mm aperture In a cuvette holder, with nominal transmittance values of 92%, 70%, 50%, 25%, lo%, 1% and 0.1%. Supplier: Hire by NBS. C) d) el f) CIE 114-1994 The filters are calibrated at a wavelength of 548.5 nm on

25、ly C171. Neutral-density filters of Schott glass mounted in frames for 10 m pathlength cuvette holders with transmittance values of 91%, 75%, 55%, 32%, lo%, 3.2%, 1%, 0.32% and 0.1%. Suppliers: Pye Unicam, NPL. The filters are available in boxed sets of nine or short sets of four with trans- mittanc

26、e values of 55%, lo%, 3.2% and 0.1% from Pye Unicam calibrated for trans- mittance, traceable to NPL, for the wave- length 546.1 nm only, or as individual items from NPL calibrated at wavelengths of the customers choice from 350 nm to 2300 nm ClSI. The extension of the wavelength range to 4500 nm ha

27、s recently been suggested 1193. Metal on quartz filters, mounted in frames to fit 10 mm pathlength cuvette holders, with transmittance values of lo%, 30%, 90%. Supplier: NBS. The filters are made from two silica plates assembled by optical contact. With the 10% and 30% filters; one of the silica pla

28、tes is coated with a partly transmitting thin film of chromium. The transmittance of the filters is calibrated at each of the following ten wavelengths: 250, 280, 340, 360, 400, 465, 500, 546.1, 590 and 635 nm; SRM 2031 C201. Metal on fused silica neutral density filters mounted in frames to fit hol

29、ders for 10 m internal pathlength cuvettes. Trans- mittance values of 921, 55%, 32x9 IO%, 3.2% and 1% can be supplied. Suppl i er: NPL. The filters are available as individual items Cali brated at wavelengths of the customers choice from 200 nm to 2300 nm CS, 181. Liquid filters made from a solution

30、 of cobalt and nickel salts in a mixture of nitric and perchloric acid. Three solutions of different concentrations are supplied in vials each containing 10 mT of solution. The absorbances are in the range 0.1 to 0.9; SRM 931b. Supp) i er : N8S. The absorbance of the solutions is cali- brated at wav

31、elengths of 302, 395, 512 and 678 nrn. This material requires the use of the NBS standard cuvettes SRM 932. 3 COPYRIGHT International Commission on IlluminationLicensed by Information Handling Services - - CIE 334 94 m 9006345 0005233 893 m CIE 114-1994 9) hl 2.2 a) b) CI Solutions of nickel nitrate

32、 and cobalt nitrate. Supplier: Laboratoires BIOTROL. The filters are known as Holnicob and the set consists of three ampoules of nickel nitrate, three ampoules of cobalt nitrate and one of holmium nitrate. The first two materi al s are for cal i brati on of the abS.orbance scales at wavelengths from

33、 345 to 720 nm over the range 0.1 to 2.0 and the third for wavelength calibration over the range 345 Po 640 nm ZlI. Crystal 1 ine potassium dichromate for use as an u1 travi 01 et absorbance standard. Supplier : NBS . Absorbance is certified for five concen- trations at wavelengths of 235, 257, 313,

34、 345 and 350 nm; SRM 935 E221. This material requires preparation of solutions of potassium dichromate in 0.001N perchloric acid. This material also requires the use of the NBS standard cuvettes SRM 932. Regular (Specular) Reflectance First-surface aluminium mirror on a glass substrate. Supplier: NB

35、S. The mirrors are 51 mn in dlameter and the ref1 ectance i s cal i brated at 50 nm intervals from 250 nm to 900 nm, at 100 nm intervals from 900 nm to 1300 nm and at 250 nm inter- vals from 1500 nm to 2500 mn. In addition the mirrors are also calibrated a$ the laser wavelengths 632.8 nm and 1060 nm

36、. Certified values of reflectance are for 6 angle .of incidence but in addition non-certified values are also available for 30 and 45 angles of incidence; SRM 2003a. Second-surf ace aluminium mi rror . Suppl ler: NBS. These mirrors are available in two sizes: 51 nun square, SRM 2023, and 25 mn x 102

37、 m, SRM 2024. The aluminium i s deposited on a 2 mn thick fused-quartz plate. The mirrors are protected by a second similar plate attached to the first with epoxy cement. Calibrations are the same as for item a. Second-surface aluminium mirror with wedge. Supplier: NBS. This mirror has dimensions of

38、 25 mn x 102 m and the aluminium is deposited on the back surface of a 2 mn thick optical quality vitreous quartz plate with a wedge of 10 mrad (0.573) between its long faces. The d) 2.3 a) b) mirror is protected by a second similar plate cemented to the first plate so that the front and back surfac

39、es are parallel. Values of reflectance are certified for 6 angle of incidence on the first surface for the same wavelengths as item a; SRM 2025. First-surface gold mirror on a metallic substrate. Supplier : NBS . The mirrors are 51 nm in diameter and the reflectance is calibrated at 50 nm intervals

40、from 600 to 1000 nm, at 100 nm intervals from 1000 nm to 1300 nm and at 250 nm inter- vals from 1500 nm to 2500 nm. The mirrors are also calibrated at the laser wavelengths 632.8 nm and 1060 nm. Certified values of reflectance are for 6 angle of incidence but in addition non-certified values are als

41、o available for 30 and 45O angle of incidence; SRM 2011. Diffuse Reflectance Pressed barium sulphate powder Specially purified barium sulphate is available from several manufacturers. An extensi ve revi ew of the properti es of barium sulphate pressings is contained in CI Publication No.46 C131. Cla

42、rke et al C233 give detai 1 s of goniophotometric properties. The quality varies from one manufacturer to another and skill is needed in making pressings if reproducible values are to be obtained. Al though barium sulphate pressings represent a good practical approximation to the perfect reflecting

43、diffuser, their fragility precludes their use as calibrated transfer standards. Reflectances up to 2500 nm are quoted in the literature E241 but the infrared reflectance is shown to be a functfon of grain size. Sources of supply include : Eastman White Reflectance Standard. Merck, Barium Sulfat rein

44、st, No.1750. Hopkin and Williams (purified, but not to the highest grade I. Union Chimique Belge No.1184. Mako Pure Chemical Industries, Japan. VNI IH. Pressed polytetrafluorethylene( PTFE) powder* supplier: Allied Chemical Company. * The following US patents are assigned to J A Seiner of PPG Indust

45、ries, Inc. Pittsburgh, Pa: US Patent No 3764364, October 9 1973 and US Patent No 3956201, May 11 1976. 4 COPYRIGHT International Commission on IlluminationLicensed by Information Handling Services CIE 114 94 W 9006345 0005232 72T CIE 114-1994 This material is marketed under the trade name of Halon.

46、It was first proposed as a reference white to the CIE by Grum and Saitzman 25 and is being increasingly used as an alternative to barium sulphate. A full report of the properties has been given by Weidner and Hsia C261. c) Eastman White Reflectance Paint Supplier: Eastman Kodak Company. This materia

47、l, which is a composition of barium sulphate, binder and solvent is intended primarily for use as an integrating sphere coating. Although not, strictly speaking, a standard reference material, it is included in this. list because of its very widespread use. Erb il) includes a survey of integrating s

48、phere paints. d) Russian Opal Supplier: Mashpriborintorg. Resale by NPL. Hire by NRC. NPL has been fortunate to receive a supply of this material over the last twelve years, most of which is cut into 50 m square samples approximately 10 mn thick which are then calibrated in the Oo/45O, Oo/diffuse or

49、 8“/total geometries. The wavelength range of calibration is usually 320 nni to 770 nm in 5 nm intervals but can be extended up to 2000 nm at intervals of 10 nm. Samples are also available from NRC on a hire-out basis. Russian opal combines high reflectance with durabi 1 i ty, and f 1 uorescence is not excited above 320 nm. The regular reflected component from the polished surface can be considered as a disadvantage. However, the cleanliness of a polished surface can be maintained whereas a matt surface pick